CN102708814B - Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module - Google Patents

Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module Download PDF

Info

Publication number
CN102708814B
CN102708814B CN201110216961.2A CN201110216961A CN102708814B CN 102708814 B CN102708814 B CN 102708814B CN 201110216961 A CN201110216961 A CN 201110216961A CN 102708814 B CN102708814 B CN 102708814B
Authority
CN
China
Prior art keywords
voltage value
voltage
value
test period
module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201110216961.2A
Other languages
Chinese (zh)
Other versions
CN102708814A (en
Inventor
张智
陈维涛
张新宇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Beijing BOE Display Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN201110216961.2A priority Critical patent/CN102708814B/en
Publication of CN102708814A publication Critical patent/CN102708814A/en
Application granted granted Critical
Publication of CN102708814B publication Critical patent/CN102708814B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention provides an alternating-current test method and system for Module V-T. The alternating-current test method comprises the following steps of: A) determining the practical voltage value of square wave alternating current voltage which needs to be output by a voltage source in each test period; B) in the Nth test period, sending the Nth practical voltage value to the voltage source, and controlling the voltage source to output corresponding square wave alternating current voltage to pressurize to the Data signal of an LCD (liquid crystal display) module; C) after the Nth test period is finished, measuring and reading the luminance value of the LCD module, and drawing a V-T curve corresponding to the Nth test period according to the Nth practical voltage value and the read luminance value; and D) enabling N to be equal to N+1, and returning to the step B), wherein N is a positive integer. According to the alternating-current test method and system disclose by the invention, the alternating current test of the Module V-T can be realized.

Description

The alternating-current measurement method and system of the voltage of LCD module and the relation curve of transmitance
Technical field
The present invention relates to liquid crystal display (LCD, Liquid Crystal Display) module (Module) measuring technology, refer to the alternating-current measurement method and system of a kind of voltage of LCD module and the relation curve (Module V-T) of transmitance especially.
Background technology
Module V-T test is the curved line relation of the voltage (V) of the Data signal measuring LCD module (Module) and the transmitance (T) of now corresponding LCD (Panel), wherein, transmitance (T)=LCD module measures brightness/LCD module high-high brightness, and LCD module high-high brightness is also measured and obtained.
When Module V-T tests, the voltage of Data signal is provided by voltage source, and the voltage of Gate signal is provided by the PCB of module itself.Changed the voltage of Data signal by the change of voltage source output voltage, thus change module brightness; Try to achieve the transmitance of LCD Panel by measuring module brightness, thus obtain V-T curve.The backlight that Module V-T tests is that module itself provides, and the voltage of Data signal is DC voltage.
Module V-T test has been that liquid crystal industry carries out gamma tuning (Gamma Tuning) indispensable part, according to Module V-T curve, the voltage be loaded on Data signal is shown with correct GTG; Further, the relation character of this GTG and transmitance unifies fixed gamma curve.In the test of present stage, achieved the automatic test utilizing the VBA of Excel (Visual Basic For Application) technology to realize direct current Module V-T, and the alternating-current measurement of Module V-T is difficult to realize.
Summary of the invention
In view of this, fundamental purpose of the present invention is the alternating-current measurement method and system providing a kind of Module V-T, is difficult to the problem realized with the alternating-current measurement solving Module V-T.
For achieving the above object, technical scheme of the present invention is achieved in that
The invention provides a kind of alternating-current measurement method of Module V-T, the method comprises:
A, determine that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period;
B, within N number of test period, N number of described actual voltage value is sent to described voltage source, and the Data signal of square wave alternating voltage to liquid crystal display (LCD) module (Module) controlling the output of described voltage source corresponding pressurizes;
C, at the end of described N number of test period, measure and read the brightness value of LCD module, and drawing V-T curve corresponding to described N number of test period according to the brightness value of described N number of actual voltage value and reading;
D, make N=N+1, return step B;
Wherein, described N is positive integer.
Wherein, before described steps A, the method also comprises:
Initialization is carried out to the reference voltage value determined needed for described actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length;
Described initial voltage value is described reference voltage value and described voltage deviation value sum.
Described actual voltage value comprises high-voltage value and low voltage value;
Described high-voltage value described initial voltage value relative to low voltage value is symmetrical.
Described steps A comprises:
Determine that total number of test period is: Int (initial voltage value/change in voltage step-length)+1;
The actual voltage value arranging the 1st test period is: described high-voltage value equals described initial voltage value, and described low voltage value equals described initial voltage value;
Determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: described high-voltage value carries out increasing progressively by test period according to described change in voltage step-length based on described initial voltage value, and described low voltage value carries out successively decreasing by test period according to described change in voltage step-length based on described initial voltage value.
The maximal value of described N is Int (initial voltage value/change in voltage step-length)+1.
In described step B, N number of actual voltage value is sent to voltage source, for:
Step B11, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B12, waits for the time interval of presetting;
Step B13, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B14, waits for the described default time interval;
Or,
Step B21, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B22, waits for the time interval of presetting;
Step B23, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B24, waits for the described default time interval.
The method also comprises: within N number of test period, according to the cycle index preset, repeats described step B11 to step B14 or repeats described step B21 to step B24.
In described step B, control voltage source exports corresponding square wave alternating voltage, for:
Step B31, described voltage source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B32, described voltage source, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Or,
Step B41, described voltage source, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B42, described voltage source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval.
The method also comprises: within N number of test period, and described voltage source, according to the cycle index preset, repeats described step B31 to step B32 or repeats described step B41 to step B42.
Present invention also offers the alternating-current measurement system of a kind of Module V-T, comprising: VBA functional module, voltage source and color analysis instrument; Wherein,
Described VBA functional module, for determining that described voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period;
Within N number of test period, described VBA functional module, also for executable operations A: N number of actual voltage value is sent to described voltage source, controls described voltage source and exports corresponding square wave alternating voltage;
Described voltage source, for executable operations B: the actual voltage value sent according to described VBA functional module, exports the corresponding Data signal of square wave alternating voltage to LCD module (Module) and pressurizes;
Described color analysis instrument, for executable operations C: at the end of N number of test period, measures and reads the brightness value of LCD module, and described brightness value is supplied to described VBA functional module;
Described VBA functional module, also at the end of executable operations D: the N number of test period, the brightness value of the LCD module provided according to described color analysis instrument and described actual voltage value draw V-T curve corresponding to N number of test period;
At the end of N number of test period, described VBA functional module, described voltage source and described color analysis instrument, also for performing described operation A corresponding to N=N+1 test period to operating D.
Wherein, described VBA functional module, also for carrying out initialization to the reference voltage value determined needed for described actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length; Described initial voltage value is described reference voltage value and described voltage deviation value sum.
Described actual voltage value comprises high-voltage value and low voltage value;
Described high-voltage value described initial voltage value relative to low voltage value is symmetrical.
Described VBA functional module, also for determining that total number of test period is: Int (initial voltage value/change in voltage step-length)+1;
Also for, the actual voltage value arranging the 1st test period is: described high-voltage value equals described initial voltage value, and described low voltage value equals described initial voltage value;
Determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: described high-voltage value carries out increasing progressively by test period according to described change in voltage step-length based on described initial voltage value, and described low voltage value carries out successively decreasing by test period according to described change in voltage step-length based on described initial voltage value.
The maximal value of described N is Int (initial voltage value/change in voltage step-length)+1.
Described VBA functional module, also for the cycle index that basis is preset, repeats following steps B11 to step B14 or repeats following steps B21 to step B24:
Step B11, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B12, waits for the time interval of presetting;
Step B13, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B14, waits for the described default time interval;
Or,
Step B21, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B22, waits for the time interval of presetting;
Step B23, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B24, waits for the described default time interval.
Described voltage source, also for according to described default cycle index, repeats following steps B31 to step B32 or repeats following steps B41 to step B42:
Step B31, source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B32, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Or,
Step B41, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B42, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval.
The alternating-current measurement method and system of Module V-T provided by the invention, utilizes the VBA function control voltage source of Excel to export the Data signal of square wave alternating voltage to LCD module and pressurizes; Data is pressurizeed and carries out the brightness of LCD module after a test period and read, then change and carry out the brightness of LCD module again after magnitude of voltage carries out a test period of pressurization to Data again and read, and so forth, finally complete Module V-T alternating-current measurement.So, the alternating-current measurement of Module V-T can be Thin Film Transistor (TFT) LCD (TFT-LCD, Thin Film Transistor-LCD) Gamma Tuning stronger test data support is provided, thus support the realization of Module V-T alternating-current measurement.
Accompanying drawing explanation
Fig. 1 is the alternating-current measurement process flow diagram of Module V-T of the present invention;
Fig. 2 is the alternating-current measurement process flow diagram of the Module V-T of the embodiment of the present invention one;
Fig. 3 is the test result schematic diagram of the present invention by the alternating-current measurement of the VBA functional realiey Module V-T of Excel;
Fig. 4 is the alternating-current measurement process flow diagram of the Module V-T of the embodiment of the present invention two;
Fig. 5 is the square wave alternating voltage schematic diagram that in the alternating-current measurement of Module V-T of the present invention, voltage source exports.
Embodiment
The basic thought of the alternating-current measurement method of Module V-T of the present invention is, utilizes the alternating voltage of square to realize exchanging Module V-T test, specifically as shown in Figure 1, comprising:
Steps A, determine that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period.
Before this step, first initialization is carried out to the reference voltage value determined needed for actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length; Wherein, initial voltage value is reference voltage value and voltage deviation value sum; Reference voltage value, voltage deviation value and change in voltage step-length pre-set according to testing requirement.
Wherein, actual voltage value comprises high-voltage value and low voltage value; High-voltage value initial voltage value relative to low voltage value is symmetrical, and what namely voltage source exported is symmetrical square wave alternating voltage.
After above-mentioned initialization operation, determine that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period, be specially:
First, determine that total number N of test period is: Int (initial voltage value/change in voltage step-length)+1; Then the maximal value of N is Int (initial voltage value/change in voltage step-length)+1;
Secondly, the actual voltage value arranging the 1st test period is: high-voltage value equals initial voltage value, and low voltage value equals initial voltage value;
Then, determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: high-voltage value carries out increasing progressively by test period according to change in voltage step-length based on initial voltage value, and low voltage value carries out successively decreasing by test period according to change in voltage step-length based on initial voltage value.
Step B, within N number of test period, N number of actual voltage value is sent to voltage source, control voltage source exports the corresponding Data signal of square wave alternating voltage to LCD module (Module) and pressurizes.
Concrete, N number of actual voltage value is sent to voltage source by any one that can adopt in two kinds of modes below, and control voltage source exports the corresponding Data signal of square wave alternating voltage to LCD module and pressurizes.
Mode one comprises the following steps:
Step B11, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B12, waits for the time interval of presetting;
Step B13, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B14, waits for the time interval of presetting.
It is to be noted: two default time intervals are equal.
Further, within N number of test period, according to the cycle index preset, repeated execution of steps B11 is to step B14.
Accordingly, voltage source can be handled as follows after receiving N number of actual voltage value: voltage source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the default time interval; According to the low voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval.Further, within N number of test period, voltage source, according to the cycle index preset, repeats above-mentioned process.
Mode two comprises the following steps:
Step B21, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B22, waits for the time interval of presetting;
Step B23, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B24, waits for the time interval of presetting.
It is to be noted: two default time intervals are equal.
Further, within N number of test period, according to the cycle index preset, repeated execution of steps B21 is to step B24.
Accordingly, voltage source can be handled as follows after receiving N number of actual voltage value: voltage source, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the default time interval; According to the high-voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval.Further, within N number of test period, voltage source, according to the cycle index preset, repeats above-mentioned process.
It is pointed out that above-mentioned default cycle index corresponding to each test period is identical.
Step C, at the end of N number of test period, measure and read the brightness value of LCD module, and drawing V-T curve corresponding to N number of test period according to the brightness value of N number of actual voltage value and reading.
Concrete, first draw out the curve relation figure between the square wave alternating voltage (namely to the magnitude of voltage of Data signal pressurization) of voltage source output and screen intensity (i.e. the brightness value of LCD module), this curve relation figure needs the relation curve, the V-T curve that convert between voltage and transmitance when disposal data.Concrete method for drafting is identical with the method for drafting of DC test, repeats no more.
Step D, make N=N+1, return step B;
Wherein, N is positive integer.It is pointed out that the maximal value of N is Int (initial voltage value/change in voltage step-length)+1, that is: at the end of+1 test period of Int (initial voltage value/change in voltage step-length), this testing process is complete.
As can be seen here, in the present invention, in a complete test process, each test period, corresponding cycle index that is equal, that preset of the above-mentioned default time interval was equal, and namely in this test process, the frequency of the square wave alternating voltage that voltage source exports is fixing; But the actual voltage value of the square wave alternating voltage that each test period is corresponding is different.
In the present invention, mainly utilize the VBA function of Excel to come control voltage source and export square wave alternating voltage, utilize color analysis instrument to measure and read the brightness value of LCD module, thus realize the automatic test exchanging Module V-T.
In the embodiment of the present invention, the alternating-current measurement process of a complete Module V-T is divided into multiple test period.
The alternating-current measurement method of Module V-T of the present invention is described for N number of test period below.Suppose: the voltage source needs determined by the VBA functional module (being called for short VBA functional module) of Excel at N number of actual voltage value that N number of test period exports are: high-voltage value 7.44V, low voltage value are 7.04V, and relative initial voltage value 7.24V is symmetrical; The time interval t preset is 0.03 second, and the cycle index preset is 4 times, then as shown in Figure 2, the testing process of N number of test period comprises:
Step 201, enters N number of test period;
Step 202, VBA functional module judges currently to send to the number of times K of voltage source whether to be less than or equal to default cycle index 4 N number of actual voltage value, if so, enters step 203; Otherwise enter step 207;
Step 203, when K is less than or equal to 4, represent that this test period does not also terminate, now, high-voltage value 7.44V is sent to voltage source by VBA functional module;
Step 204, after waiting for t=0.03s, enters step 205; Accordingly, in the duration of this 0.03s, the Data signal of alternating voltage to LCD module that voltage source continues to export 7.44V pressurizes, and enters step 205 afterwards;
Step 205, low voltage value 7.04V is sent to voltage source by VBA functional module;
Step 206, after waiting for t=0.03s, returns step 202; In the duration of this 0.03s, the Data signal of alternating voltage to LCD module that voltage source continues to export 7.04V pressurizes, and returns step 202 afterwards, that is: N number of actual voltage value is sent to voltage source again.
Step 207, accept step 202, when K is greater than 4, then N number of test period terminates, and now, color analysis instrument is measured and read the brightness value of LCD module, and is supplied to VBA functional module; Then, VBA functional module draws V-T curve corresponding to N number of test period according to the brightness value of this reading and N number of actual voltage value; Wherein, described actual voltage value comprises high voltage 7.44V, low-voltage 7.04V.
Through multiple test period, the V-T curve that whole test process is corresponding can be obtained, as shown in Figure 3.
Within the test period of above-described embodiment, VBA functional module exports square wave alternating voltage with the sequential control voltage source of high-voltage value → low voltage value, can certainly export square wave alternating voltage with the sequential control voltage source of low voltage value → high-voltage value.
The alternating-current measurement flow process of the Module V-T that the present invention one is complete is described below by specific embodiment, in this embodiment, each test period corresponding preset the time interval equal, the cycle index preset is equal, the alternating-current measurement process of Module V-T is divided into initial phase and test phase, as shown in Figure 3, first arranging two buttons by VBA functional module connects grand: initialization and start to test; As shown in Figure 4, testing process comprises:
Step 401, carries out initialization operation.
Press the button and connect grand " initialization ", enter initial phase, in this stage, initialization need be carried out to following items: reference voltage value (Vcom), voltage deviation value (DVp), initial voltage value and change in voltage step-length (step), wherein:
Vcom and DVp is precalculated according to testing requirement, is illustrated in figure 3 Vcom=7.04V, DVp=0.2V;
Initial voltage value, equals Vcom+ Δ Vp, in the present invention, needs the actual voltage value of square wave alternating voltage exported to be set to initial voltage value voltage source in the 1st test period, and namely the high-voltage value of the 1st test period is 7.24V, low voltage value is 7.24V.
Step can pre-set according to testing requirement, be such as 0.1V, represent in current test process, the high-voltage value of the actual voltage value of square wave alternating voltage carries out increasing progressively by test period according to step based on initial voltage value, and low voltage value carries out successively decreasing by test period according to step based on initial voltage value.
In addition, also need to carry out initial configuration to color analysis instrument at initial phase, color analysis instrument is used for measuring the brightness of LCD module and carrying out brightness value reading.
For CA210, need the driver installing CA210, comprising the communications protocol and built-in function etc. that arrange in some CA210, the function of configuration is as follows:
Sub start()
Set objCa200=New CA200
objCa200.AutoConnect
Set objCa=objCa200.SingleCa
Set objProbe=objCa.SingleProbe
MsgBox objCa.ID
End Sub
After initial phase terminates, enter test phase.
Step 402, after starting test, determines that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period.
Wherein, total number I=Int (initial voltage value/change in voltage step-length)+1 of test period, namely the value of initial voltage value divided by change in voltage step-length gained is rounded, represent initial voltage value with change in voltage increments to the number of times be not less than needed for 0, as shown in Figure 3, during initial voltage value=7.24V, step=0.1V, I=Int (7.24/0.1)+1=73, namely this test process has 73 test periods.
Then, determine that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period, Volt (+) represents high-voltage value as shown in Figure 3, and Volt (-) represents low voltage value.
For the 1st test period: as mentioned above, needed by voltage source in the 1st test period the actual voltage value of the square wave alternating voltage exported to be set to initial voltage value, namely high-voltage value is 7.24V, low voltage value is 7.24V;
For the 2nd to the 73rd test period, the high-voltage value of the actual voltage value of square wave alternating voltage carries out increasing progressively by test period according to step based on initial voltage value, low voltage value carries out successively decreasing by test period according to step based on initial voltage value, as shown in Figure 3, in 2nd test period, high-voltage value=7.34V, low voltage value=7.14V; 3rd test period high voltage appearance value=7.44V, low voltage value=7.04V, by that analogy, the 73rd test period high voltage appearance value=14.44V, low voltage value=0.04V.
Further, as shown in Figure 3, the actual voltage value corresponding each test period determined is packed in the form made by VBA functional module by the present invention.
In addition, the invention allows for the concept of relative voltage value: relative voltage value equals the maximal value of square-wave voltage and the difference of initial voltage value, as shown in Figure 3, the relative voltage value of the 1st test period is 7.24-7.24=0V; The relative voltage value of the 2nd test period is 7.34-7.24=0.1V, and by that analogy, the 73rd the relative voltage value that test period is corresponding is 14.44-7.24=7.2V.
Step 403, judges whether N is less than or equal to I, if so, performs step 201 to 207.
After the actual voltage value filling of the symmetrical square wave alternating voltage of the voltage source needs output that each test period is corresponding, from the 1st cycle, actual voltage value is sent to voltage source, control voltage source exports square wave alternating voltage.First, need to judge that (N is positive integer for the numbering N of current test period, maximal value is I) whether be less than or equal to total number I of test period, namely judge whether N is less than or equal to I, if, then enter N number of test period, perform the testing process of single test period as shown in Figure 2, repeat no more herein.In this embodiment, the square wave alternating voltage that voltage source exports as shown in Figure 5.
In addition, in step 207, after N number of test period terminates, perform step 404, make N=N+1, enter next test period, return step 403.
When N is greater than I, then represent that whole test process terminates.
Certainly, the test process repeatedly shown in Fig. 4 can also be carried out, be illustrated in figure 35 times.
In order to realize above-mentioned method of testing, present invention also offers the alternating-current measurement system of a kind of Module V-T, comprising: VBA functional module, voltage source and color analysis instrument; Wherein,
VBA functional module, for determining that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period;
Within N number of test period,
VBA functional module, also for executable operations A: N number of actual voltage value is sent to voltage source, control voltage source exports corresponding square wave alternating voltage;
Voltage source, for executable operations B: the actual voltage value sent according to VBA functional module, exports the corresponding Data signal of square wave alternating voltage to LCD module (Module) and pressurizes;
Color analysis instrument, for executable operations C: at the end of N number of test period, measures and reads the brightness value of LCD module, and brightness value is supplied to VBA functional module;
VBA functional module, also at the end of executable operations D: the N number of test period, the brightness value of the LCD module provided according to color analysis instrument and actual voltage value draw V-T curve corresponding to N number of test period;
At the end of N number of test period, VBA functional module, voltage source and color analysis instrument, also for performing operation A corresponding to N=N+1 test period to operating D.
Further, VBA functional module, also for carrying out initialization to the reference voltage value determined needed for actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length; Initial voltage value is reference voltage value and voltage deviation value sum.
Wherein, actual voltage value comprises high-voltage value and low voltage value; High-voltage value initial voltage value relative to low voltage value is symmetrical.
VBA functional module, also for determining that total number of test period is: Int (initial voltage value/change in voltage step-length)+1;
Also for, the actual voltage value arranging the 1st test period is: high-voltage value equals initial voltage value, and low voltage value equals initial voltage value;
Determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: high-voltage value carries out increasing progressively by test period according to change in voltage step-length based on initial voltage value, and low voltage value carries out successively decreasing by test period according to change in voltage step-length based on initial voltage value.Wherein, the maximal value of N is Int (initial voltage value/change in voltage step-length)+1.
VBA functional module, also for the cycle index that basis is preset, repeats following steps B11 to step B14 or repeats following steps B21 to step B24:
Step B11, sends to voltage source by the high-voltage value of N number of actual voltage value;
Step B12, waits for the time interval of presetting;
Step B13, sends to voltage source by the low voltage value of N number of actual voltage value;
Step B14, waits for the time interval of presetting;
Or,
Step B21, sends to voltage source by the low voltage value of N number of actual voltage value;
Step B22, waits for the time interval of presetting;
Step B23, sends to voltage source by the high-voltage value of N number of actual voltage value;
Step B24, waits for the time interval of presetting.
Voltage source, also for the cycle index that basis is preset, repeats following process:
According to the high-voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval; According to the low voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval;
Or, according to the low voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval; According to the high-voltage value of the N number of actual voltage value received, export corresponding square wave alternating voltage, and continue the default time interval.
The above, be only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.

Claims (13)

1. an alternating-current measurement method of Module V-T, it is characterized in that, the method comprises:
A, determine that voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period;
B, within N number of test period, N number of described actual voltage value is sent to described voltage source, control described voltage source and export the corresponding Data signal of square wave alternating voltage to LCD module (Module) and pressurize;
C, at the end of described N number of test period, measure and read the brightness value of LCD module, and drawing V-T curve corresponding to described N number of test period according to the brightness value of described N number of actual voltage value and reading;
D, make the value of N add 1, return step B;
Wherein, described N is positive integer;
In described step B, N number of actual voltage value is sent to voltage source, for:
Step B11, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B12, waits for the time interval of presetting;
Step B13, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B14, waits for the described default time interval;
Or,
Step B21, sends to described voltage source by the low voltage value of N number of actual voltage value;
Step B22, waits for the time interval of presetting;
Step B23, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Step B24, waits for the described default time interval;
Within N number of test period, according to the cycle index preset, repeat described step B11 to step B14 or repeat described step B21 to step B24.
2. the alternating-current measurement method of Module V-T according to claim 1, it is characterized in that, before described steps A, the method also comprises:
Initialization is carried out to the reference voltage value determined needed for described actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length;
Described initial voltage value is described reference voltage value and described voltage deviation value sum.
3. the alternating-current measurement method of Module V-T according to claim 2, it is characterized in that, described actual voltage value comprises high-voltage value and low voltage value;
Described high-voltage value described initial voltage value relative to low voltage value is symmetrical.
4. the alternating-current measurement method of Module V-T according to claim 3, it is characterized in that, described steps A comprises:
Determine that total number of test period is: Int (initial voltage value/change in voltage step-length)+1;
The actual voltage value arranging the 1st test period is: described high-voltage value equals described initial voltage value, and described low voltage value equals described initial voltage value;
Determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: described high-voltage value carries out increasing progressively by test period according to described change in voltage step-length based on described initial voltage value, and described low voltage value carries out successively decreasing by test period according to described change in voltage step-length based on described initial voltage value.
5. the alternating-current measurement method of Module V-T according to claim 4, it is characterized in that, the maximal value of described N is Int (initial voltage value/change in voltage step-length)+1.
6. the alternating-current measurement method of Module V-T according to claim 4 or 5, is characterized in that, in described step B, control voltage source exports corresponding square wave alternating voltage, for:
Step B31, described voltage source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B32, described voltage source, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Or,
Step B41, described voltage source, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B42, described voltage source, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval.
7. the alternating-current measurement method of Module V-T according to claim 6, it is characterized in that, the method also comprises: within N number of test period, and described voltage source, according to the cycle index preset, repeats described step B31 to step B32 or repeats described step B41 to step B42.
8. an alternating-current measurement system of Module V-T, is characterized in that, comprising: VBA functional module, voltage source and color analysis instrument; Wherein,
Described VBA functional module, for determining that described voltage source needs the actual voltage value of the square wave alternating voltage exported in each test period;
Within N number of test period, described VBA functional module, also for executable operations A: N number of actual voltage value is sent to described voltage source, controls described voltage source and exports corresponding square wave alternating voltage;
Described voltage source, for executable operations B: the actual voltage value sent according to described VBA functional module, exports the corresponding Data signal of square wave alternating voltage to LCD module (Module) and pressurizes;
Described color analysis instrument, for executable operations C: at the end of N number of test period, measures and reads the brightness value of LCD module, and described brightness value is supplied to described VBA functional module;
Described VBA functional module, also at the end of executable operations D: the N number of test period, the brightness value of the LCD module provided according to described color analysis instrument and described actual voltage value draw V-T curve corresponding to N number of test period;
At the end of N number of test period, described VBA functional module, described voltage source and described color analysis instrument, also make the value of N add described operation A corresponding to the test period after 1 to operating D for performing;
In described operation A, N number of actual voltage value is sent to described voltage source, for:
Steps A 11, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Steps A 12, waits for the time interval of presetting;
Steps A 13, sends to described voltage source by the low voltage value of N number of actual voltage value;
Steps A 14, waits for the described default time interval;
Or,
Steps A 21, sends to described voltage source by the low voltage value of N number of actual voltage value;
Steps A 22, waits for the time interval of presetting;
Steps A 23, sends to described voltage source by the high-voltage value of N number of actual voltage value;
Steps A 24, waits for the described default time interval;
Within N number of test period, described VBA functional module, according to the cycle index preset, repeats described steps A 11 to steps A 14 or repeats described steps A 21 to steps A 24.
9. the alternating-current measurement system of Module V-T according to claim 8, it is characterized in that, described VBA functional module, also for carrying out initialization to the reference voltage value determined needed for described actual voltage value, voltage deviation value, initial voltage value and change in voltage step-length; Described initial voltage value is described reference voltage value and described voltage deviation value sum.
10. the alternating-current measurement system of Module V-T according to claim 9, it is characterized in that, described actual voltage value comprises high-voltage value and low voltage value;
Described high-voltage value described initial voltage value relative to low voltage value is symmetrical.
The alternating-current measurement system of 11. Module V-T according to claim 10, is characterized in that,
Described VBA functional module, also for determining that total number of test period is: Int (initial voltage value/change in voltage step-length)+1;
Also for, the actual voltage value arranging the 1st test period is: described high-voltage value equals described initial voltage value, and described low voltage value equals described initial voltage value;
Determine that the 2nd to Int (initial voltage value/change in voltage step-length)+1 test period each self-corresponding actual voltage value is: described high-voltage value carries out increasing progressively by test period according to described change in voltage step-length based on described initial voltage value, and described low voltage value carries out successively decreasing by test period according to described change in voltage step-length based on described initial voltage value.
12. according to the alternating-current measurement system of Module V-T described in claim 11, and it is characterized in that, the maximal value of described N is Int (initial voltage value/change in voltage step-length)+1.
13. according to claim 11 or 12 the alternating-current measurement system of Module V-T, it is characterized in that,
Described voltage source, also for according to described default cycle index, repeats following steps B31 to step B32 or repeats following steps B41 to step B42:
Step B31, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B32, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Or,
Step B41, according to the low voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval;
Step B42, according to the high-voltage value of the N number of actual voltage value received, exports corresponding square wave alternating voltage, and continues the described default time interval.
CN201110216961.2A 2011-07-29 2011-07-29 Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module Expired - Fee Related CN102708814B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110216961.2A CN102708814B (en) 2011-07-29 2011-07-29 Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110216961.2A CN102708814B (en) 2011-07-29 2011-07-29 Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module

Publications (2)

Publication Number Publication Date
CN102708814A CN102708814A (en) 2012-10-03
CN102708814B true CN102708814B (en) 2015-04-29

Family

ID=46901520

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110216961.2A Expired - Fee Related CN102708814B (en) 2011-07-29 2011-07-29 Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module

Country Status (1)

Country Link
CN (1) CN102708814B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104036742B (en) 2014-05-26 2016-07-20 京东方科技集团股份有限公司 Gamma reference voltage generation circuit, V-T curve method of testing and display device
CN104282249B (en) * 2014-10-23 2017-02-15 京东方科技集团股份有限公司 Method for testing voltage-transmittance curve
CN104464674B (en) 2014-12-26 2017-12-08 小米科技有限责任公司 Liquid crystal display method of adjustment and device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101685207A (en) * 2008-09-27 2010-03-31 北京京东方光电科技有限公司 Measuring method and device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM326153U (en) * 2007-07-10 2008-01-21 Princeton Technology Corp Circuit testing apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101685207A (en) * 2008-09-27 2010-03-31 北京京东方光电科技有限公司 Measuring method and device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
扭转丝状液晶电光效应及电场响应的研究;李涛等;《大学物理》;20071231;第26卷(第12期);48-52 *

Also Published As

Publication number Publication date
CN102708814A (en) 2012-10-03

Similar Documents

Publication Publication Date Title
CN103325357B (en) A kind of gamma voltage method of adjustment, system and electronic equipment
CN204832267U (en) Chip test platform
CN102013246B (en) Establishing method for gamma comparison table of display apparatus
CN102708814B (en) Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module
US20140159762A1 (en) Test apparatus for liquid crystal module
CN105911512A (en) Intelligent electric energy meter constant test system and test method thereof
CN103928006A (en) Gamma voltage debugging device and gamma voltage debugging method
CN105575352A (en) Grid driving method, grid driving circuit and display device
CN106384580A (en) Gamma automatic correction device and method for LCD logic board
CN101685113B (en) Method and device for measuring phase shift
CN106124866A (en) A kind of periodic signal waves test device
CN107589568B (en) Automatic learning and detecting device and method for LED lamp string
CN103500560A (en) Method and system for processing luminance data of display module and display device
CN105810172A (en) Display driving circuit and display device
CN103487964B (en) A kind of real-time dynamic power consumption display device
CN106297614A (en) A kind of method of testing of LCD product
CN104575426B (en) Driving method, drive system, display panel and display device
KR20050015029A (en) Circuit of aging test driving for liquid crystal display device
CN203069666U (en) Intelligent high-precision digital voltmeter
CN103019171A (en) Centralized control method of environmental simulation test device
CN100510649C (en) Device and method for automatically releasing measuring peak value keep and freely setting keep time
CN205451751U (en) Gamma voltage regulation device and have its gamma voltage regulation system
CN202758151U (en) Testing system for attribute of liquid crystal display screen
KR102033885B1 (en) Display device and driving method thereof
KR100674239B1 (en) Detector for LCD module

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150429

Termination date: 20200729

CF01 Termination of patent right due to non-payment of annual fee