CN101666624A - Micro locating test device - Google Patents
Micro locating test device Download PDFInfo
- Publication number
- CN101666624A CN101666624A CN200910307547A CN200910307547A CN101666624A CN 101666624 A CN101666624 A CN 101666624A CN 200910307547 A CN200910307547 A CN 200910307547A CN 200910307547 A CN200910307547 A CN 200910307547A CN 101666624 A CN101666624 A CN 101666624A
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- Prior art keywords
- sliding seat
- slide
- locating
- hole
- ccd
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Abstract
The invention relates to a device for detecting LED wafers, in particular to a device which relates to a locating test structure, adopts an integrated compact structure and can finish microchip test locating, probe adjustment, photoelectric detection and other jobs. The device comprises a base 1, above which a translation component is arranged; the translation component comprises a power source 20, a fixed base 21, a first sliding seat 22, a second sliding seat 23 and a roller sliding rail 24, and is connected with the base 1 through the first sliding seat 22; the power source 20 is fixed through the fixed base 21 and arranged on the top surface of the first sliding seat 22; the second sliding seat 23 is arranged on the top surface of the first sliding seat 22; the roller sliding rail 24 is arranged between the first sliding seat 22 and the second sliding seat 23; the end part of the second sliding seat 23 is provided with a through hole 231 which is provided with a notch 232; and thethrough hole 231 is internally provided with a CCD camera which comprises a CCD, a camera lens 31 and a light source 32. The device has the advantages of compact structure, convenient operation and good human-computer interaction, and the locating monitoring function can be finished only by one CCD camera. The device is arranged on a detecting machine and used for detecting LED wafers.
Description
Technical field
The present invention relates to LED wafer detection device.Particularly relevant with the assignment test structure, adopt integrated cramped construction, be a kind of device of finishing work such as microwafer test position fix, probe adjustment, Photoelectric Detection.
Background technology
Chinese patent literature discloses the patent of invention that a kind of name is called " the instant assignment test structure of cinephotomicrography " on May 31st, 1996, the patent No. is 200420088008.x, this patented technology is the instant assignment test structure of a kind of cinephotomicrography, it comprises a light characteristic analysis module, an analysis module holder is established in its below, and adjacent is established CCD (image perception original paper) video camera, it is to contain a microlens, lens fixing base, CCD focal length fine setting seat, CCD fixed angle part, its below then is provided with CCDx y fine setting seat, an and CCD fixed pedestal, and a CCD camera light source is established in another corresponding section, and contains first of light holder far away, second and the 3rd, by this, be assembled into whole group system structure, and be located on the machines body, can be for test LED, the use of LCD and other wafers.This method of the instant assignment test of described device cinephotomicrography mechanism causes the motion stroke big, and structure is not compact, and location and probe location are accurately adjusted difficulty, and operation can't reach quick requirement, has its further improved necessity.
Summary of the invention
Fundamental purpose of the present invention according to above-mentioned the deficiencies in the prior art part, proposes a kind of micro locating test device, reaches swift to operate, and man-machine interaction is good, the purpose of increasing work efficiency.
The object of the invention realizes being finished by following technical scheme:
The present invention includes: pedestal 1, a translation assembly is placed in the top, the translation assembly comprises power source 20, holder 21, first slide 22, second slide 23, the roller slide rail constitutes 24, wherein power source is a cylinder, carry out rectilinear motion, the translation assembly links to each other with pedestal 1 by first slide 22, power source 20 is fixing by holder 21, and being positioned over the end face of first slide 22, second slide 23 places first slide, 22 end faces, and first slide 22, between second slide 23 roller slide rail 24 is set, second slide, 23 ends are provided with through hole 231, jagged 232 in the through hole, place ccd video cameras in the through hole 231, ccd video camera is by CCD, camera lens 31, light source 32.
The invention has the advantages that compact conformation, easy to operate, man-machine interaction is good, and a CCD camera is promptly finished the positioning monitoring function.The present invention is positioned on the machines, detects for test LED wafer and uses.
Description of drawings
Fig. 1 is the present invention's a perspective exploded view;
Fig. 2 is the present invention's a combination schematic perspective view;
Fig. 3 is the present invention's the second slide synoptic diagram.
Embodiment
Show that as accompanying drawing 1,2,3 number in the figure is expressed as follows respectively:
1-pedestal, 20--power source, 21--holder, 22--first slide, 23--second slide, 231--through hole, 232--breach, 24--roller slide rail, 30--CCD, 31--camera lens, 32--light source.
Consult Fig. 1, Fig. 2, a kind of micro locating test structure of the present invention, system comprises a pedestal 1, continuous first slide 22 in its top, power source 20 is fixing by holder 21, and together be positioned over first slide, 22 end faces, second slide 23 places first slide, 22 end faces, and 23 of first slides 22, second slide are placed roller slide rail 24, the second slide end through holes, and through hole 231 place's gaps 232, ccontaining in the through hole 231 by CCD30, camera lens 31, the assembly that light source 32 is formed, by this, be assembled into whole system.A kind of micro locating test structure of the present invention mainly is located on the machines, is used for monitoring when machines is surveyed the identification of crystal grain location and point, increases work efficiency simplied system structure.
Though below design and embodiment according to the object of the invention have been done to elaborate with reference to accompanying drawing; but those of ordinary skills can recognize; under the precondition that does not break away from the claim limited range; still can make various improvement and conversion to the present invention, and this improvement and conversion still should belong to protection scope of the present invention.
Claims (1)
1. micro locating test device, it is characterized in that: it comprises a pedestal (1), a translation assembly is placed in the top, the translation assembly comprises power source (20), holder (21), first slide (22), second slide (23), the roller slide rail constitutes (24), the translation assembly links to each other with pedestal (1) by first slide (22), power source (20) is fixing by holder (21), and be positioned over the end face of first slide (22), second slide (23) places first slide (22) end face, and first slide (22), roller slide rail (24) is set between second slide (23), second slide (23) end is provided with through hole (231), jagged in the through hole (232), place ccd video camera in the through hole (231), ccd video camera is by CCD, camera lens (31), light source (32).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910307547A CN101666624A (en) | 2009-09-23 | 2009-09-23 | Micro locating test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910307547A CN101666624A (en) | 2009-09-23 | 2009-09-23 | Micro locating test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101666624A true CN101666624A (en) | 2010-03-10 |
Family
ID=41803349
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200910307547A Pending CN101666624A (en) | 2009-09-23 | 2009-09-23 | Micro locating test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101666624A (en) |
-
2009
- 2009-09-23 CN CN200910307547A patent/CN101666624A/en active Pending
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20100310 |