CN101611291B - 测量物体的方法和系统 - Google Patents

测量物体的方法和系统 Download PDF

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Publication number
CN101611291B
CN101611291B CN2007800515862A CN200780051586A CN101611291B CN 101611291 B CN101611291 B CN 101611291B CN 2007800515862 A CN2007800515862 A CN 2007800515862A CN 200780051586 A CN200780051586 A CN 200780051586A CN 101611291 B CN101611291 B CN 101611291B
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China
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stand
range sensor
cutting tool
periscope
optical sensor
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Chinese (zh)
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CN101611291A (zh
Inventor
史蒂文·R·海亚希
李忠国
凯文·G·哈丁
郑建明
霍华德·P·韦弗
杜晓明
陈�田
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CN2007800515862A 2006-12-20 2007-11-30 测量物体的方法和系统 Expired - Fee Related CN101611291B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/642,076 US7768655B2 (en) 2006-12-20 2006-12-20 Methods and system for measuring an object
US11/642,076 2006-12-20
PCT/US2007/085994 WO2008076608A1 (en) 2006-12-20 2007-11-30 Method and system for measuring an object

Publications (2)

Publication Number Publication Date
CN101611291A CN101611291A (zh) 2009-12-23
CN101611291B true CN101611291B (zh) 2012-04-18

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CN2007800515862A Expired - Fee Related CN101611291B (zh) 2006-12-20 2007-11-30 测量物体的方法和系统

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US (1) US7768655B2 (enExample)
EP (1) EP2095066A1 (enExample)
JP (1) JP2010513927A (enExample)
CN (1) CN101611291B (enExample)
AU (1) AU2007334217A1 (enExample)
CA (1) CA2672475A1 (enExample)
MX (1) MX2009006226A (enExample)
WO (1) WO2008076608A1 (enExample)

Cited By (2)

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US11185697B2 (en) 2016-08-08 2021-11-30 Deep Brain Stimulation Technologies Pty. Ltd. Systems and methods for monitoring neural activity
US11298070B2 (en) 2017-05-22 2022-04-12 Deep Brain Stimulation Technologies Pty Ltd Systems and methods for monitoring neural activity

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US7876454B2 (en) * 2006-12-20 2011-01-25 General Electric Company Method and system for measurement of a cutting tool
CN101358825B (zh) * 2007-08-01 2010-09-29 鸿富锦精密工业（深圳）有限公司 端面跳动测量仪
WO2009113068A1 (en) * 2008-03-12 2009-09-17 Optimet, Optical Metrology Ltd. Intraoral imaging system and method based on conoscopic holography
US7924439B2 (en) * 2008-09-29 2011-04-12 General Electric Company Method and system for parameter extraction of a cutting tool
US10274263B2 (en) 2009-04-09 2019-04-30 General Electric Company Method and apparatus for improved cooling of a heat sink using a synthetic jet
US9615482B2 (en) * 2009-12-11 2017-04-04 General Electric Company Shaped heat sinks to optimize flow
US9478479B2 (en) 2010-10-26 2016-10-25 General Electric Company Thermal management system and method
US8112172B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method and system for gash parameter extraction of a cutting tool
CN103649680B (zh) * 2011-06-07 2016-11-09 形创有限公司 用于3d扫描的传感器定位
CN102322818A (zh) * 2011-08-11 2012-01-18 武汉材料保护研究所 一种用光学三维形貌仪测量机械加工车刀片vb值的方法
CN103017677B (zh) * 2011-09-23 2015-07-15 通用电气公司 测量刀具的刀刃轮廓的方法
CA2875820C (en) 2012-07-04 2018-08-21 Creaform Inc. 3-d scanning and positioning system
EP2875314B1 (en) 2012-07-18 2017-08-16 Creaform Inc. System and method for 3d scanning of the surface geometry of an object
KR101448510B1 (ko) * 2014-04-10 2014-10-14 순환엔지니어링 주식회사 스테이지의 직각도 측정 시스템 및 이를 이용한 스테이지의 홈 포지셔닝 방법
DE102014111240A1 (de) * 2014-08-07 2016-02-11 Walter Maschinenbau Gmbh Verfahren und Vorrichtung zur Bestimmung wenigstens eines Modellparameters eines virtuellen Werkzeugmodells eines Werkzeugs
DE102015105999B4 (de) * 2015-04-20 2016-11-10 Walter Maschinenbau Gmbh Verfahren und Vorrichtung zur materialabtragenden Bearbeitung eines Werkzeuges
JP6691837B2 (ja) * 2016-06-27 2020-05-13 株式会社キーエンス 測定装置
DE102017106741B4 (de) * 2017-03-29 2019-11-14 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät
DE102018103420A1 (de) 2018-02-15 2019-08-22 Jenoptik Industrial Metrology Germany Gmbh Messgerät zur Oberflächen- oder Konturmessung
CN109444937B (zh) * 2018-08-08 2021-04-02 北京木业邦科技有限公司 树木建模及抚育方法、装置、电子设备及存储介质
DE102020108182A1 (de) 2019-05-07 2020-11-12 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät
US20230306413A1 (en) * 2022-03-28 2023-09-28 Royal Ark, Inc. Tokenization of real-world objects and monetization thereof

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DD218672A1 (de) * 1982-07-07 1985-02-13 Ilmenau Tech Hochschule Optisch-beruehrungslose mehrkordinaten-antasteinrichtung
DE9110287U1 (de) * 1991-08-20 1991-10-02 Siemens AG, 8000 München Einrichtung zur berührungslosen Messung der Kerndicke, des Durchmessers und des Rundlaufs von Microbohrern der Leiterplattentechnik
US5568260A (en) * 1995-03-31 1996-10-22 General Electric Company Precision non-contact measurement system for curved workpieces
EP1580521A2 (de) * 2004-03-23 2005-09-28 IBTL - Ing. Büro Lang & Armlich GmbH Koordinatenmessgerät mit Wechseloptik

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US4736247A (en) 1987-05-04 1988-04-05 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Range and range rate system
US5369286A (en) 1989-05-26 1994-11-29 Ann F. Koo Method and apparatus for measuring stress in a film applied to surface of a workpiece
JPH05164525A (ja) * 1991-12-16 1993-06-29 Tokyo Boeki Kk レーザ式座標測定装置の測定ヘッド
JP2503919B2 (ja) * 1993-10-29 1996-06-05 日本電気株式会社 異物検査装置
US5477371A (en) 1993-12-13 1995-12-19 Shafir Production Systems Ltd. Three-dimensional, non-contact scanning apparatus and method
JP3378401B2 (ja) * 1994-08-30 2003-02-17 株式会社日立メディコ Ｘ線装置
US5846081A (en) 1995-08-23 1998-12-08 Bushway; Geoffrey C. Computerized instrument platform positioning system
JPH09178441A (ja) * 1995-12-27 1997-07-11 Technol Res Assoc Of Medical & Welfare Apparatus ３次元形状測定装置
US6788807B1 (en) 1998-02-13 2004-09-07 Minolta Co., Ltd. Three dimensional information measurement method and apparatus
US6185030B1 (en) * 1998-03-20 2001-02-06 James W. Overbeck Wide field of view and high speed scanning microscopy
JP2000329531A (ja) * 1999-03-17 2000-11-30 Minolta Co Ltd 三次元形状計測装置および同方法
JP2003262510A (ja) * 2002-03-08 2003-09-19 Center For Advanced Science & Technology Incubation Ltd 三次元形状測定方法及び三次元スキャナ
DE10211070A1 (de) 2002-03-13 2003-09-25 Gurny Broesch Andrea Vorrichtung zum Vermessen eines Messobjekts
US6862099B2 (en) * 2002-04-05 2005-03-01 Varco I/P Tubular ovality testing
JP4029178B2 (ja) * 2003-01-22 2008-01-09 日本鋳鉄管株式会社 渦流探傷方法およびその装置
US20040263863A1 (en) 2003-01-27 2004-12-30 Rogers William E System and method for design and manufacture of custom face masks

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3710128A (en) * 1970-04-02 1973-01-09 Exatest Messtechnik Gmbh Method and device for photoelectrically scanning an object by means of an optical beam
DD218672A1 (de) * 1982-07-07 1985-02-13 Ilmenau Tech Hochschule Optisch-beruehrungslose mehrkordinaten-antasteinrichtung
DE9110287U1 (de) * 1991-08-20 1991-10-02 Siemens AG, 8000 München Einrichtung zur berührungslosen Messung der Kerndicke, des Durchmessers und des Rundlaufs von Microbohrern der Leiterplattentechnik
US5568260A (en) * 1995-03-31 1996-10-22 General Electric Company Precision non-contact measurement system for curved workpieces
EP1580521A2 (de) * 2004-03-23 2005-09-28 IBTL - Ing. Büro Lang & Armlich GmbH Koordinatenmessgerät mit Wechseloptik

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11185697B2 (en) 2016-08-08 2021-11-30 Deep Brain Stimulation Technologies Pty. Ltd. Systems and methods for monitoring neural activity
US11278726B2 (en) 2016-08-08 2022-03-22 Deep Brain Stimulation Technologies Pty Ltd Systems and methods for monitoring neural activity
US11890478B2 (en) 2016-08-08 2024-02-06 Deep Brain Stimulation Technologies Pty Ltd Systems and methods for monitoring neural activity
US11298070B2 (en) 2017-05-22 2022-04-12 Deep Brain Stimulation Technologies Pty Ltd Systems and methods for monitoring neural activity

Also Published As

Publication number Publication date
CA2672475A1 (en) 2008-06-26
AU2007334217A1 (en) 2008-06-26
WO2008076608A1 (en) 2008-06-26
JP2010513927A (ja) 2010-04-30
CN101611291A (zh) 2009-12-23
EP2095066A1 (en) 2009-09-02
MX2009006226A (es) 2009-06-22
US20080148590A1 (en) 2008-06-26
US7768655B2 (en) 2010-08-03

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