CN101592623A - A kind of based on the multi-angle Compton scattering imaging device of screening the class survey device - Google Patents
A kind of based on the multi-angle Compton scattering imaging device of screening the class survey device Download PDFInfo
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- CN101592623A CN101592623A CN 200910069588 CN200910069588A CN101592623A CN 101592623 A CN101592623 A CN 101592623A CN 200910069588 CN200910069588 CN 200910069588 CN 200910069588 A CN200910069588 A CN 200910069588A CN 101592623 A CN101592623 A CN 101592623A
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Abstract
The present invention relates to a kind of based on the multi-angle Compton scattering imaging device of screening the class survey device.The invention belongs to technical field of nondestructive testing.A kind of based on the multi-angle Compton scattering imaging device of screening the class survey device, comprise radiographic source and receiver, be characterized in: radiographic source is provided with the multi-angle collimating apparatus relatively, and the multi-angle collimating apparatus is provided with detector array relatively, and radiographic source is X-ray pipe, linac or isotope radioactive source; The ray process collimating apparatus of radiographic source emission forms a beam line through collimating apparatus, and a pen bundle ray shoots is being detected on the object, by the multi-angle collimating apparatus, is mapped to the examination level semiconductor detector array of reception after the scattering of ray process multi-angle.That the present invention has is simple in structure, stable performance, be suitable for normal temperature work, detection efficiency advantages of higher.The NDT of composite that can be widely used in the original position Non-Destructive Testing, particularly aircraft of measurand.
Description
Technical field
The invention belongs to technical field of nondestructive testing, particularly relate to a kind of based on the multi-angle Compton scattering imaging device of screening the class survey device.
Background technology
At present, compound substance is big owing to having specific strength, specific stiffness is big, antivibration, antifatigue, fail-safety, characteristics such as thermotolerance and moulding process are good, it is used widely in the present generation aircraft structure, in the present generation aircraft structure, picture carbon fibre and glass fiber reinforced composite materials are used increasingly extensive, requiring of reliabilities such as empennage that this class compound substance is made and wing flap is high, detect this material as ultrasound wave or eddy current method and just be not well suited for if use, infrared thermal wave Non-Destructive Testing compound substance has noncontact, in real time, efficiently, characteristics intuitively, but, the cost height, and the time can not be too of a specified duration after requiring aircraft landing, requires in time to detect.
The X ray nondestructive examination is the common method that detects damage of composite materials.Commonly used is the film camera method at present, and it is an excellent process of checking compound substance mesoporosity and snotter equal-volume type defective, and the reinforcing agent skewness is also had certain ability that detects; But it is very difficult that this method detects lamination defect, and crackle generally has only when its plane and beam almost parallel and can detect; So this method can only detect the crackle vertical with specimen surface usually.
Computerized chromatographic photograph (CT) is applied to existing more than the 10 year history of compound substance research.CT is mainly used in and detects non-microdefect (crackle, snotter, pore and layering etc.); Density measurement distributes (material homogeneity, the little air vent content of compound substance), and because the restriction of volume, the less measurand of only suitable detection volume realizes that in situ detection is very difficult.
Summary of the invention
The present invention provides a kind of based on the multi-angle Compton scattering imaging device of screening the class survey device for solving problems of the prior art.
The purpose of this invention is to provide a kind of in-situ investigation aviation damage of composite materials situation under the normal temperature that is suitable for, improve the radiation ray utilization factor, reduce radiation requirement and reduction influence to environmental radiation, simplify the sniffer structure, reduce the lossless detection device volume, improve the multi-angle Compton scattering imaging device based on examination class survey device of characteristics such as detection efficiency.
The present invention is based on and screens level (energy resolution 2% to 5%FWHM) semiconductor detector array, utilize its power spectrum to differentiate in conjunction with the collimating apparatus that designs, make full use of scattered information, finish multi-angle, linear array and accept scattered information simultaneously, improve the stability of detection efficiency and detecting structure.
Scattering is different with general Transmission X ray detection, it is specially adapted to detect the defective of large-sized object, the three dimensions volume element of detected object can directly be determined in their intersection region, do not need complex image to rebuild the 3-D view that to set up detected object, judge the crackle damage and the corrosion condition that occur in the detected object intuitively, and adopt the reconstruction compton backscattering scan image of certain method, reconstruction speed is fast, the image resolution ratio height, data correction is simple.In addition, because the Compton scattering method detects the highly sensitive of materials of low density, detection light material preferably, therefore when damage that detects most of aircraft by light metal alloy, fibre reinforced composites, sandwich structure and reinforcing rib structure type object and defective, detect the effect principle and be better than conventional X ray Non-Destructive Testing.Simultaneously, light material is little to weak scattered ray decay, is beneficial to and improves the signal to noise ratio (S/N ratio) that scattered ray detects.
To the Non-Destructive Testing of the light material and the low density material, particularly multilayer materials of this class low atomic number, Compton scattering is best detection method.Adopt the cannot-harm-detection device of Compton scattering technology, can be detected the restriction of thing size, very convenient realization in situ detection.
The present invention is based on the technical scheme that the multi-angle Compton scattering imaging device of screening the class survey device taked is:
A kind of based on the multi-angle Compton scattering imaging device of screening the class survey device, comprise radiographic source and receiver, be characterized in: radiographic source is provided with the multi-angle collimating apparatus relatively, and the multi-angle collimating apparatus is provided with detector array relatively, and radiographic source is X-ray pipe, linac or isotope radioactive source; The ray process collimating apparatus of radiographic source emission forms a beam line through collimating apparatus, and a pen bundle ray shoots is being detected on the object, by the multi-angle collimating apparatus, is mapped to the examination level semiconductor detector array of reception after the scattering of ray process multi-angle.
The present invention is based on the multi-angle Compton scattering imaging device of screening the class survey device and can also adopt following technical measures:
Described based on the multi-angle Compton scattering imaging device of screening the class survey device, be characterized in: detector array is classified the examination level semiconductor room temperature detector of energy resolution between 2%-5% as, and the detector array analyzer is a multichannel analyzer.
Described based on the multi-angle Compton scattering imaging device of screening the class survey device, be characterized in: the ray of radiographic source emission is through after the collimating apparatus, and the ray incident angle of irradiation measured object is the 20-40 degree, and the scattering angle of scattered ray is the 60-140 degree.
Described based on the multi-angle Compton scattering imaging device of screening the class survey device, be characterized in: multi-angle Compton scattering imaging device is provided with the control gear of main body level, vertical and front and back spatial movement step-length and moving direction.
Advantage that the present invention has and good effect:
Based on the multi-angle Compton scattering imaging device of screening the class survey device,, therefore had following characteristics owing to adopted brand-new technology scheme of the present invention:
The present invention can receive the multi-angle scattered information at measurand difference place simultaneously, thereby can make full use of scattered information owing to adopted based on screening the multi-angle collimating apparatus that class survey device power spectrum is differentiated, and improves image taking speed and resolution greatly.Simultaneously, because the detector that adopts is to screen the level semiconductor detector under the room temperature, according to its energy resolution, the distribution that each detector receives scattering angle is bigger at interval, and the collimating aperture diameter can be bigger, the processing of collimation device is easier to, and be suitable for room temperature and survey, overcome the requirement of the needed low temperature environment of high purity germanium detector, also not too high to the requirement of multiple tracks energy spectrum analysis device, the total system good cost performance is easy to realize.In addition, because a beam collimator and multi-angle collimating apparatus space distribution relative fixed, thereby improved the stability of imaging device.
That the present invention has is reasonable in design, simple in structure, handling ease realization, stable mechanical performance, be suitable for normal temperature work, detection efficiency advantages of higher.Can be widely used in the Non-Destructive Testing of compound substance of the original position Non-Destructive Testing, particularly aircraft of measurand.
Description of drawings
Fig. 1 is a structural representation of the present invention.
Among the figure, the 1-radiographic source, 2-is detected object, 3-incident ray, 4-scattered ray, 5-semiconductor detector array, 6-multi-angle collimating apparatus.
Embodiment
For further understanding summary of the invention of the present invention, characteristics and effect, exemplify following examples now, and be described in detail as follows:
Embodiment
A kind of based on the multi-angle Compton scattering imaging device of screening the class survey device, comprise radiographic source and receiver.Its radiographic source is provided with the multi-angle collimating apparatus relatively, and the multi-angle collimating apparatus is provided with detector array relatively, and radiographic source is X-ray pipe, linac or isotope radioactive source; The ray of radiographic source emission forms a beam line through collimating apparatus through collimating apparatus, and pen bundle ray shoots is being detected on the object.The ray of radiographic source emission is through after the collimating apparatus, and the ray incident angle of irradiation measured object is 30 degree, and the scattering angle of scattered ray is the 60-140 degree.By the multi-angle collimating apparatus, be mapped to the examination level semiconductor detector array of reception after the scattering of ray process multi-angle.Detector array is classified the examination level semiconductor room temperature detector of energy resolution between 2%-5%FWHM as, and the detector array analyzer is a multichannel analyzer.Multi-angle Compton scattering imaging device is provided with the control gear of main body level, vertical and front and back spatial movement step-length and moving direction.
Concrete implementation process is described in detail as follows:
The multi-angle scattering imaging device comprises radiographic source 1, multi-angle collimating apparatus 6 and examination level semiconductor detector array 5 etc., and radiographic source 1 can be X-ray pipe, linac, isotope radioactive source or other light sources.The ray of described radiographic source 1 emission forms pen bundle incident ray 3 through collimating apparatus, and pen bundle ray shoots is being detected on the object 2, and ray receives by screening level semiconductor detector array 5 by designed multi-angle collimating apparatus 6 through multi-angle scattered ray 4 backs.Wherein radiographic source 1 locus is determined by the incident x-ray angle in the multi-angle Compton scattering imaging device, after the radiographic source locus is determined, locus relative fixed between it and multi-angle collimating apparatus 6 and the detector array 5, three parts and related peripheral shield facility constitute the main body of multi-angle Compton scattering imaging device thus.For making full use of scattered information, the incident ray adopts low-angle incident (incident ray and plane of incidence angle are about 30 degree), and the scattering angle of scattered ray is distributed in 60 degree between 140 degree.Simultaneously, because the detector that adopts is to screen the level semiconductor detector under the room temperature, according to its energy resolution, the distribution that each detector receives scattering angle is bigger at interval, and the collimating aperture diameter can be bigger, the processing of collimation device is easier to, and be suitable for room temperature and survey, overcome the requirement of the needed low temperature environment of high purity germanium detector, also not too high to the requirement of multiple tracks energy spectrum analysis device, the total system good cost performance is easy to realize.
Requirement according to the testee spatial resolution, set the moving step length and the moving direction of multi-angle Compton scattering imaging device main body, can move horizontally by the relative testee of a fixed step size earlier, the spatial resolution according to two other direction of testee space requires vertically to determine to vertically move step-length and corresponding mobile number of times then.
The present invention is applicable to all ray imaging devices that adopt ray to detect, and comprises used all kinds of container check systems, aviation goods radiological survey X system and other ray non-destructive detecting device of original position Non-Destructive Testing, customs of aircraft compound substance.
Claims (4)
1. one kind based on the multi-angle Compton scattering imaging device of screening the class survey device, comprise radiographic source and receiver, it is characterized in that: radiographic source is provided with the multi-angle collimating apparatus relatively, the multi-angle collimating apparatus is provided with detector array relatively, and radiographic source is X-ray pipe, linac or isotope radioactive source; The ray process collimating apparatus of radiographic source emission forms a beam line through collimating apparatus, and a pen bundle ray shoots is being detected on the object, by the multi-angle collimating apparatus, is mapped to the examination level semiconductor detector array of reception after the scattering of ray process multi-angle.
2. according to claim 1 based on the multi-angle Compton scattering imaging device of screening the class survey device, it is characterized in that: detector array is classified the examination level semiconductor room temperature detector of energy resolution between 2%-5% as, and the detector array analyzer is a multichannel analyzer.
3. according to claim 1 based on the multi-angle Compton scattering imaging device of screening the class survey device, it is characterized in that: the ray of radiographic source emission is through after the collimating apparatus, the ray incident angle of irradiation measured object is the 20-40 degree, and the scattering angle of scattered ray is the 60-140 degree.
4. according to claim 1,2 or 3 described based on the multi-angle Compton scattering imaging devices of screening the class survey device, it is characterized in that: multi-angle Compton scattering imaging device is provided with the control gear of main body level, vertical and front and back spatial movement step-length and moving direction.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105487099A (en) * | 2014-09-16 | 2016-04-13 | 深圳市贝斯达医疗股份有限公司 | Radioactive photoelectric detector and detection method thereof |
| CN108449988A (en) * | 2015-09-08 | 2018-08-24 | 美国科学及工程股份有限公司 | Backscattering for precision agriculture is imaged |
| CN110286138A (en) * | 2018-12-27 | 2019-09-27 | 合刃科技（深圳）有限公司 | Information detecting method, apparatus and system |
| WO2020134959A1 (en) * | 2018-12-28 | 2020-07-02 | 中国兵器工业第五九研究所 | Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece |
| CN113970567A (en) * | 2020-07-22 | 2022-01-25 | 同方威视技术股份有限公司 | Back scattering imaging device, control method and inspection system |
| CN113984815A (en) * | 2021-10-29 | 2022-01-28 | 北京师范大学 | Efficient Compton scattering imaging system based on inverse Compton scattering X-ray source |
| US11536672B2 (en) | 2015-09-08 | 2022-12-27 | American Science And Engineering, Inc. | Systems and methods for using backscatter imaging in precision agriculture |
-
2009
- 2009-07-06 CN CN 200910069588 patent/CN101592623A/en active Pending
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105487099A (en) * | 2014-09-16 | 2016-04-13 | 深圳市贝斯达医疗股份有限公司 | Radioactive photoelectric detector and detection method thereof |
| CN108449988A (en) * | 2015-09-08 | 2018-08-24 | 美国科学及工程股份有限公司 | Backscattering for precision agriculture is imaged |
| US10955367B2 (en) | 2015-09-08 | 2021-03-23 | American Science And Engineering, Inc. | Backscatter imaging for precision agriculture |
| CN108449988B (en) * | 2015-09-08 | 2021-08-20 | 美国科学及工程股份有限公司 | Backscatter imaging for precision agriculture |
| US11927551B2 (en) | 2015-09-08 | 2024-03-12 | American Science And Engineering, Inc. | Systems and methods for using backscatter imaging in precision agriculture |
| US11536672B2 (en) | 2015-09-08 | 2022-12-27 | American Science And Engineering, Inc. | Systems and methods for using backscatter imaging in precision agriculture |
| CN110286138A (en) * | 2018-12-27 | 2019-09-27 | 合刃科技（深圳）有限公司 | Information detecting method, apparatus and system |
| US11846595B2 (en) | 2018-12-28 | 2023-12-19 | The 59Th Institute Of China Ordnance Industry | Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece |
| WO2020134959A1 (en) * | 2018-12-28 | 2020-07-02 | 中国兵器工业第五九研究所 | Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece |
| CN113970567A (en) * | 2020-07-22 | 2022-01-25 | 同方威视技术股份有限公司 | Back scattering imaging device, control method and inspection system |
| CN113970567B (en) * | 2020-07-22 | 2023-01-31 | 同方威视技术股份有限公司 | Back scattering imaging device, control method and inspection system |
| CN113984815B (en) * | 2021-10-29 | 2023-09-05 | 北京师范大学 | High-efficiency Compton scattering imaging system based on inverse Compton scattering X-ray source |
| CN113984815A (en) * | 2021-10-29 | 2022-01-28 | 北京师范大学 | Efficient Compton scattering imaging system based on inverse Compton scattering X-ray source |
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