CN101498921B - Method for automatically monitoring fragmentation rate in solar cell processing course - Google Patents
Method for automatically monitoring fragmentation rate in solar cell processing course Download PDFInfo
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- CN101498921B CN101498921B CN2009100374263A CN200910037426A CN101498921B CN 101498921 B CN101498921 B CN 101498921B CN 2009100374263 A CN2009100374263 A CN 2009100374263A CN 200910037426 A CN200910037426 A CN 200910037426A CN 101498921 B CN101498921 B CN 101498921B
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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Abstract
The invention disclose a method for automatically monitoring fragmentation rate in a solar cell processing process, wherein, silicon wafer sensors are arranged on the different positions of a chain solar cell processing equipment, the silicon wafer sensor counts the number of the silicon wafers passing by, under a condition when the equipment operates normally, the two sensors has a normal silicon wafer difference, the difference can be a number range, after the sensor feeds the recorded number to a terminal, the terminal calculates the actual difference of the two sensors and compares the difference with the normal difference (after fragments are produced in the solar cell processing process, the actual difference is larger than the normal difference), if the difference exceeds the range of the normal difference, then alarming automatically, timely alarming prevents the fragments being further produced and can timely inform related personnel to solve the abnormity of the equipment, thus greatly reducing the fragmentation rate of the solar cell processing and the manufacture cost of the solar cell.
Description
Technical field
The present invention relates to the method for fragment rate in a kind of automatic monitoring solar cell processing course, specifically a kind of method that reduces fragment rate through fragment rate in the automatic monitoring solar cell processing course.
Background technology
The application of solar cell gets into departments such as industry, commerce, agricultural, communication, household electrical appliance and public utility from military field, space industry; Especially can be dispersedly in the backcountry, high mountain, desert, island and rural area use, to save the very expensive transmission line of electricity of cost.But at this stage, its cost is also very high, and sending the 1kW electricity needs up to ten thousand dollars of investment, and therefore extensive use still receives restriction economically.
But; In the long run; Invention along with the improvement of solar cell manufacturing technology and new light-electrical switching device; Various countries are to the protection of environment with to the great demand of regeneration clean energy resource, and solar cell will be to utilize the more practicable method of solar radiant energy, can be to utilize sun power to open vast vistas on a large scale human future.
Because the fragment rate in the monitoring solar cell processing course plays an important role to reducing the solar cell cost automatically, so fragment rate is significant in the automatic monitoring solar cell processing course.Whether the present invention at first requires to utilize the silicon chip sensor to carry out information acquisition, requires information feedback to give the terminal simultaneously, and the terminal carries out logical operation, require the terminal determining apparatus normal at last, and determine whether to carry out equipment alarm according to operation result.
Summary of the invention
The method that the purpose of this invention is to provide fragment rate in a kind of automatic monitoring solar cell processing course; The fragment that adopts this method effectively to cause unit exception is reported to the police; And have the prospect that reduces the solar cell cost of manufacture, make fragment rate in the solar cell processing course far below existing level.
The object of the invention is achieved through taking following technical scheme:
The method of fragment rate in a kind of automatic monitoring solar cell processing course; It is characterized in that; Diverse location at chain type solar cell process equipment is installed the silicon chip sensor; Utilize the silicon chip sensor to write down the quantity of silicon chip charging and discharging automatically and feed back to the terminal, whether the terminal, and determines whether and will report to the police according to operation result in normal operation through the logical operation judgment device.
As of the present invention further perfect, in processing silicon chip process, the silicon chip sensor of diverse location writes down the quantity of silicon chip process automatically and feeds back to the terminal.
As of the present invention further perfect, the difference judgment device of calculating silicon chip charging and discharging is passed through in normal operation in the terminal whether, and determines whether and will report to the police based on operation result.
Whole automatic monitored control system of the present invention comprises the feedback of collection, the information of information, to the logic determines of information and the unusual warning that logic determines is judged.
The main means of fragment rate are at chain type solar cell process equipment diverse location the silicon chip sensor to be installed in the automatic monitoring solar cell processing course that the present invention proposes, and the silicon chip sensor can be counted the silicon chip of process, under the equipment normal condition; A normal silicon chip difference is arranged between two sensors; Difference can be a numerical range, and after sensor fed back to the terminal with numerical values recorded, the terminal was calculated the actual difference between two sensors and done contrast (behind the generation fragment with normal difference; Actual difference can be bigger than normal difference); Exceed regime values scope equipment and report to the police automatically, in time prevent the further generation of fragment thereby report to the police automatically, and can in time notify the related personnel to solve unit exception; Thereby reduced fragment rate, reduced the manufacturing cost of solar cell.
Compared with prior art, the beneficial effect that the present invention has is: through adopting the method for fragment rate in the automatic monitoring solar cell processing course, can find that fragment rate is unusual the very first time.
Description of drawings
Fig. 1 monitors the system schematic of fragment rate in the solar cell processing course automatically for the present invention; 1. chain type solar cell process equipments wherein, 2. roller, 3. the crossbeam of silicon chip top 4. is hung on the silicon chip sensor on the crossbeam, 5. silicon chip, 6. terminal, 7. warning system, 8. circuit.
Embodiment
As shown in Figure 1; It is at the diverse location of chain type solar cell process equipment 1 silicon chip sensor 4 to be installed that the present invention monitors the technological means of fragment rate in the solar cell processing course automatically; Silicon chip sensor 4 can be counted the silicon chip 5 of process; Under the equipment normal condition, the quantity of silicon chip 5 processes has a normal difference between two silicon chip sensors 4, and normal difference can be a numerical range; After silicon chip sensor 4 feeds back to terminal 6 with numerical values recorded; Terminal 6 is calculated the actual difference of 4 of two silicon chip sensors and is done contrast (after producing fragment, actual difference can be bigger than normal difference) with normal difference, exceeds regime values scope warning system 7 and reports to the police automatically.Automatic monitored control system of the present invention comprises the feedback of collection, the information of information, the unusual warning of judging to the logic determines of information, to logic determines.The present invention is through adopting the method for monitoring fragment rate in the solar cell processing course automatically; Can find that fragment rate is unusual the very first time; Thereby prevent the further generation of fragment; And can in time notify the related personnel to solve unit exception, thus reduce fragment rate, reduce the manufacturing cost of solar cell.
In a word, the present invention's above-mentioned preferred implementation of having given an example, but should explain that those skilled in the art can carry out various variations and remodeling.Therefore, only if such variation and remodeling have departed from scope of the present invention, otherwise all should be included in protection scope of the present invention.
Claims (3)
1. automatic method of fragment rate in the monitoring solar cell processing course; It is characterized in that; Diverse location at chain type solar cell process equipment is installed the silicon chip sensor; Utilize the silicon chip sensor to write down the quantity of silicon chip charging and discharging automatically and feed back to the terminal, whether the terminal, and determines whether and will report to the police according to operation result in normal operation through the logical operation judgment device.
2. the method for fragment rate is characterized in that in the automatic monitoring solar cell processing course according to claim 1, and the silicon chip sensor of diverse location writes down the quantity of silicon chip process automatically and feeds back to the terminal.
3. the method for fragment rate is characterized in that in the automatic monitoring solar cell processing course according to claim 2, and the difference judgment device of calculating silicon chip charging and discharging is passed through in normal operation in the terminal whether, and determines whether and will report to the police according to operation result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100374263A CN101498921B (en) | 2009-02-26 | 2009-02-26 | Method for automatically monitoring fragmentation rate in solar cell processing course |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100374263A CN101498921B (en) | 2009-02-26 | 2009-02-26 | Method for automatically monitoring fragmentation rate in solar cell processing course |
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| Publication Number | Publication Date |
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| CN101498921A CN101498921A (en) | 2009-08-05 |
| CN101498921B true CN101498921B (en) | 2012-05-30 |
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| CN2009100374263A Active CN101498921B (en) | 2009-02-26 | 2009-02-26 | Method for automatically monitoring fragmentation rate in solar cell processing course |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102800560B (en) * | 2011-05-26 | 2015-04-01 | 联景光电股份有限公司 | Method for automatically monitoring manufacturing procedure |
| CN102709206B (en) * | 2012-01-12 | 2015-06-17 | 上海华力微电子有限公司 | Automatic defect scanning and casual inspecting method and automatic defect scanning and casual inspecting device for controlling abnormality during silicon wafer production |
| TWI575343B (en) * | 2015-12-23 | 2017-03-21 | 迅得機械股份有限公司 | Manufacturing process monitoring method |
| CN106849871A (en) * | 2017-04-10 | 2017-06-13 | 常州亿晶光电科技有限公司 | Full automatic solar cell piece bending detection means |
| CN113919611A (en) * | 2020-07-07 | 2022-01-11 | 深南电路股份有限公司 | Sampling method, device and computer readable storage medium |
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2009
- 2009-02-26 CN CN2009100374263A patent/CN101498921B/en active Active
Non-Patent Citations (1)
| Title |
|---|
| 杨静等.《GZP-2全自动硅片装片机的研制 》.《电子工艺技术》.2008,第29卷(第6期),348－351. * |
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| CN101498921A (en) | 2009-08-05 |
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