CN101476975B - Method and apparatus for measuring polarization mode dispersion vector - Google Patents
Method and apparatus for measuring polarization mode dispersion vector Download PDFInfo
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Abstract
The invention discloses a method for measuring chromatic dispersion vector of a polarization mode. The method comprises the following steps: light with appointed wavelength passes through a device to be tested according to three input polarization states respectively; three input polarization states meet linear independence; three output polarization states formed after the light passes through the device to be tested are measured respectively; the three input polarization states and the three output polarization states are recorded into a set of calculating data; the step is repeated; a plurality of calculating data with different appointed wavelength is recorded; according to each set of the calculating data, each Mueller matrix with appointed wavelength is calculated; and according to the Mueller matrix, the chromatic dispersion vector of the polarization mode of the device to be tested is calculated. The invention also discloses a measuring device adopting the method. The method can reduce errors introduced by the adjustment of wavelength and input polarization states in the measuring process and improve the measuring precision of the chromatic dispersion vector of the polarization mode.
Description
[technical field]
The present invention relates to the test of polarization mode dispersion (PMD) vector of optical fibre device or system, clear and definite says, relates to a kind of method and apparatus that is used to measure polarization mode dispersion vector.
[background technology]
Apart from development of Photonic Network, Fiber Optical Communication System becomes and becomes increasingly complex and used a large amount of devices and equipment along with long.Therefore, the characteristic of measuring optical fiber device and equipment (DUT) becomes more and more important quickly and accurately.
This system mainly contains two big class features: the relevant and polarization irrelevant characteristic of polarization.Polarization dependent behavior comprises Polarization Dependent Loss or gain (PDL/G), birefringence and go inclined to one side effect.The polarization irrelevant characteristic comprises chromatic dispersion, scattering, loss etc.Along with Fiber Optical Communication System towards at a high speed, the fast development of wide bandwidth direction, increasing by the polarization mode dispersion (PMD) that birefringence causes to the influence of system.Especially to moving towards now the system of the 40Gbit/s on foreground gradually, this influence is mainly reflected in pulse strenching, thus signal skew and system signal noise ratio is produced influence at random cause system tolerance to descend.Therefore, the PMD and the compensation of the PMD in the Fiber Optical Communication System of accurately measuring fast control device and instrument when producing of PMD all have important meaning.
The research of PMD starts from the relevant wide communication system seventies in last century the locking to output polarization attitude (SOP).In 1986, C.D.Poole and R.E.Wagner have proposed principal state of polarization (psp) (PSP) thereby model is described the model that PMD has been drawn in the evolution of polarization state in optical fiber.They so proposed to measure the method for polarization mode dispersion vector with main attitude in 1988, but this method only is applicable to the system that does not have Polarization Dependent Loss.In addition, poincare sphere (Poincar é sphere) method, (Mueller Matrix Method MMM) also only is suitable for and treats that examining system does not have the situation of Polarization Dependent Loss the mueller matrix method.
When treating that examining system contains Polarization Dependent Loss or when gain, the PMD vector more complicated that becomes mainly contains two class methods and measures: based on the method for difference with based on the method for transmission matrix.First kind method comprises complex plane method (Complex Plane Method) and expansion poincare sphere method (GeneralizedPoincar é Sphere Method).This class methods measurement result signal to noise ratio (S/N ratio) is poor.Second class comprise the Jones matrix eigenvalue Method (Jones Matrix Eigenanalysis, JME), expansion mueller matrix method (Generalized Mueller Matrix Method, GMMM) etc.JME has higher signal to noise ratio (S/N ratio), become the reference test method that PMD measures, but its measurement result only is the size of PMD vector, promptly Differential Group Delay (Differential Group Delay, DGD).Expansion mueller matrix method is expanded the measurement of traditional mueller matrix method PMD vector, makes it be applicable to the situation that has Polarization Dependent Loss.The signal to noise ratio (S/N ratio) of this class methods measurement result is higher.
In actual measurement, above-mentioned two class methods require to carry out length scanning and obtain the pairing output of several specific input SOP SOP under each wavelength.When measuring, can adopt dual mode:
First kind is that the input SOP that sets an appointment earlier carries out length scanning again, and then specifies another required SOP and carry out length scanning.Repeat similar measurement up to the length scanning of finishing under all SOP.This metering system can obtain SOP under different wave length consistance but the repeatability of tunable light source wavelength regulation is proposed very high requirement.Thereby the wavelength regulation error of light source can cause the rotation of output SOP and cause the measurement result mistake, particularly under the bigger situation of PMD.The optical source wavelength regulating error comprises absolute wavelength sum of errors wavelength repeatability error.The absolute wavelength error is meant the maximum differential between light source setting wavelength and the actual output wavelength.This can cause that thereby the error of wavelength regulation step-length influences the PMD measurement result.By in measurement, addressing this problem with wavemeter surveying work wavelength.Wavelength repeatability is meant the uncertain at random error of introducing in different wave length setting and the adjusting.Because randomness, the error of being introduced is difficult to overcome.In addition, because optical source wavelength governing speed slow usually (the hundreds of millisecond is to several second-times), so the easier environmental impact that is subjected to of this mode.Because aforesaid first kind measuring method need be to the calculus of differences of wavelength, this just needs wavelength regulation very accurate, thereby this mode is very big to the influence of the precision of first kind measuring method.
The second way is to set wavelength earlier, adjusts SOP then.Because only need the single pass wavelength, thereby can avoid the wavelength repeatability error.But measurement requirement has one group of identical input SOP under different wavelength, and this measures the detection adjustment process up to being adjusted to required SOP with regard to needing to use Polarization Controller (PC) to regulate input SOP and be used in the linear polarization analyser.Because it is inconsistent under different wave length that the measuring error of SOP can cause importing SOP, finally also can increase the error that PMD measures.Certainly, use the polarization state generator on the market to replace PC and polarization analysis instrument.Though measuring speed can improve, the inconsistent of SOP still can not avoid.
Other some PMD measuring methods such as fixed analysis process (FA), conventional interference method (TINTY) and expansion interferometric method (GINTY) be because of can not providing the PMD vector, thereby be difficult to the requirement that is applicable to that PMD compensates.
[summary of the invention]
Technical matters to be solved by this invention is at above-mentioned the deficiencies in the prior art, provide a kind of new being used to measure the method and apparatus of the polarization mode dispersion vector of device under test or system, can make the error of introducing by the adjusting of wavelength and input polarization in the measuring process be reduced to floor level and improve measuring accuracy.
For achieving the above object, the invention provides a kind of method that is used to measure polarization mode dispersion vector, may further comprise the steps:
A, make specified wavelength light respectively according to three kinds of input polarizations by device under test, described three kinds of input polarization linear independences;
B, measure the three kind output polarization attitudes of described light after respectively, described three kinds of input polarizations and three kinds of output polarization attitudes are recorded as the batch total certificate that counts by described device under test;
Repeat above-mentioned steps A, B, write down many batch totals under a plurality of different specified wavelengths certificate that counts; With
C, counting according to each batch total it is calculated that mueller matrix under each specified wavelength, and calculates the polarization mode dispersion vector of described device under test according to described mueller matrix.
Preferably, also comprise after the described step C:
D, calculate birefringence under the corresponding specified wavelength and/or Polarization Dependent Loss or the gain under the corresponding specified wavelength according to described mueller matrix.
Preferably, the vector of described three kinds of input polarizations in the Stokes space in twos angle be 120 the degree three Stokes vector.
Preferably, in the described steps A, produce three kinds of input polarizations according to the Polarization Controller setting state Polarization Controller that writes down in advance.
Preferably, in the described steps A, make described light by before the described device under test, acquisition in the Stokes space in twos angle be 120 the degree three Stokes calibration vectors and write down corresponding Polarization Controller state, carry out Polarization Control and measure the result of Polarization Control in real time, and regulate Polarization Control to obtain and the corresponding input polarization of described Polarization Controller state by feedback.
A kind of device that is used to measure polarization mode dispersion vector is characterized in that, comprising:
Light source is used to produce the light of different specified wavelengths;
The input polarization acquisition module is used for obtaining respectively three kinds of input polarizations of the light of each specified wavelength, described three kinds of input polarization linear independences;
Output polarization attitude detection module, the light that is used to detect each specified wavelength respectively under described three kinds of input polarizations by device under test after corresponding three kinds of output polarization attitudes that obtain; And
Processing module, comprise first processing unit, be used for according to the mueller matrix under described three kinds of output polarization attitudes calculating specified wavelength of described three kinds of input polarizations and correspondence, and calculate the polarization mode dispersion vector of described device under test according to the described mueller matrix under each specified wavelength.
Preferably, described processing module also comprises second processing unit, is used for calculating birefringence under the corresponding specified wavelength and/or Polarization Dependent Loss or the gain under the corresponding specified wavelength according to described mueller matrix.
Preferably, described input polarization acquisition module comprises Polarization Controller and online polarization analysis instrument, described Polarization Controller is used to regulate the input polarization of described light, described online polarization analysis instrument is used to detect the result of described light through described Polarization Controller effect, and feeds back the polarization state that records is adjusted to described light with acquisition the input polarization that satisfies condition to described Polarization Controller Polarization Controller state of a control.
Preferably, the vector of described three kinds of input polarizations in the Stokes space in twos angle be 120 the degree three Stokes vector.
Preferably, described input polarization acquisition module comprises Polarization Controller and online polarization analysis instrument, described Polarization Controller is used to regulate the input polarization of described light, described online polarization analysis instrument is used to detect the result of described light through described Polarization Controller effect, described Polarization Controller and online polarization analysis instrument are again alignment units simultaneously, described alignment unit be used for providing produce one group in the Stokes space Polarization Controller state when angle is three calibration vectors of 120 degree in twos, described Polarization Controller is adjusted to described light the described input polarization that satisfies condition according to align mode.
The invention has the beneficial effects as follows:
Among the present invention, make the light of specified wavelength pass through device under test according to three kinds of input polarizations respectively, three kinds of input polarizations satisfy the condition of linear independence, measure three kinds of corresponding output polarization attitudes, three kinds of inputs, output polarization attitudes are recorded as the batch total certificate that counts, measure respectively with write down a plurality of different specified wavelengths under many batch totals certificate that counts, utilize each batch total to count to it is calculated that the mueller matrix under each specified wavelength then, can calculate the polarization mode dispersion vector of device under test according to each mueller matrix.On the one hand, the present invention has only carried out the primary reflection long scan, thereby avoided the wavelength repeatability error, on the other hand, with respect to the measuring method that adopted the primary reflection long scan in the past, the present invention comes the calculating system mueller matrix according to any three linear independence input polarizations and three corresponding output polarization attitudes thereof, does not require the consistance of the input polarization under different wave length, thereby has avoided the inconsistent measuring error of bringing of input polarization.Because the present invention has avoided the scheme shortcoming separately measured in the past, therefore the error of being introduced by the adjusting of wavelength and input polarization in the measuring process can be reduced to minimumly, effectively restrain and measure noise, significantly improve measuring accuracy.
In addition, the present invention all can use under the situation that has or not Polarization Dependent Loss or gain.
Because the present invention measured the system transmissions mueller matrix the different wave length under, system under respective wavelength birefringence and Polarization Dependent Loss or gain and also can measure simultaneously.
[description of drawings]
Fig. 1 measures the basic procedure of the method for polarization mode dispersion vector for the present invention;
Fig. 2 is the process flow diagram of a kind of embodiment of method of measurement polarization mode dispersion vector;
Fig. 3 is the vector correlation synoptic diagram between three kinds of input polarizations of same specified wavelength;
Fig. 4 measures the theory diagram of the device of polarization mode dispersion vector for the present invention;
Fig. 5 is the structured flowchart of a kind of embodiment of device of measurement polarization mode dispersion vector;
[embodiment]
Feature of the present invention and advantage will be elaborated in conjunction with the accompanying drawings by embodiment.
People such as Jopson are in the verified system that is containing Polarization Dependent Loss or gain (PDL/G) in 1999, and the PMD vector representation is
Comprise two real vectors and by matrix M
Δ=M (ω+Δ ω) M
-1(ω) statement
[1]Wherein M (ω+Δ ω) and M (ω) treat the mueller matrix of examining system under frequencies omega and ω+Δ ω.Carry out the method that system's mueller matrix is measured in conjunction with any three groups of linear independence input polarizations of utilization and corresponding output polarization attitude thereof that people such as Dong Hui proposed in 2007
[2], the M of description PMD vector
ΔMatrix just can calculate.
Please refer to Fig. 1, it is as follows that the present invention is used to measure the basic procedure of method of polarization mode dispersion vector:
Steps A, make specified wavelength light respectively according to three kinds of input polarizations by device under test, three kinds of input polarizations satisfy linear independence;
Step B, respectively measuring light is by three kinds of output polarization attitudes behind the device under test, and three kinds of input polarizations and three kinds of output polarization attitudes are recorded as the batch total certificate that counts;
Repeat above-mentioned steps A, B, write down many batch totals under a plurality of different specified wavelengths certificate that counts; With
Step C, counting according to each batch total it is calculated that mueller matrix under each specified wavelength, and according to the polarization mode dispersion vector of each mueller matrix meter device under test.
Please refer to Fig. 2, in the preferred embodiment, the measuring method of polarization mode dispersion vector comprises the steps:
The polarized light of step s1, adjusting narrow-band light source output specified wavelength;
Step s2, use Polarization Controller act on the polarized light of this specified wavelength, adjust it to first input polarization;
Step s3, the online polarization analysis instrument of use detect the adjustment result in real time;
Step s4, make first input polarization polarized light by device under test or system, for example optical fiber;
Step s5, use polarization analysis instrument are measured the first output polarization attitude of the first input polarization correspondence;
Repeating step s2 to s5 produces and writes down second input polarization and the 3rd input polarization and second and third corresponding output polarization attitude thereof;
Repeat the step of front, measure three groups of inputs, output polarization attitude under other specified wavelength, as the batch total certificate that counts;
Step s6, counting according to each batch total it is calculated that mueller matrix under the different specified wavelengths, and according to the mueller matrix compute matrix M under the different wave length
ΔWith the PMD vector.
Preferably further comprising the steps of:
Step s7, calculate the Polarization Dependent Loss or the gain (PDL/G) of system under the respective wavelength according to the mueller matrix under the different wave length;
Preferably further comprising the steps of:
Step s8, can calculate the birefringence of system under the respective wavelength according to the mueller matrix under the different wave length.
In the context, the polarization state when term " input polarization " refers to that light enters device under test, term " output polarization attitude " refers to the polarization state of light when device under test is exported.
The method according to this invention, 3 required input polarizations of same specified wavelength only need satisfy mutual linear independence, promptly 3 polarization states on poincare sphere any two all not parallel.Therefore can make light source produce 3 polarization states at random.If 3 polarization state differences are little, then the probability of measuring error increase can be bigger.In order to obtain optimum measurement result, can be pointed in the method for measuring mueller matrix according to people such as Dong Hui, adopt 3 polarization states in the Stokes space, being three Stokes vector of 120 degree angles in twos.As shown in Figure 3, Stokes vector
With
Starting point at the centre of sphere of poincare sphere, terminal point is on a circumference, 3 vectors are positioned at same plane.
In actual measurement, can specify one group of Stokes vector in advance, for example (100)
T,
With
Find 3 groups of corresponding Polarization Controller magnitudes of voltage, as the calibration of Polarization Controller.
Because it is very little to the Polarization Dependent Loss and the polarization mode dispersion of this section of polarization analysis instrument light path from light source, can think and have only birefringent influence, is identical for the anglec of rotation of different polarization states on poincare sphere with direction and only contain birefringent system, therefore, in measuring process, though can change because of environmental impact even enter 3 polarization states of Polarization Controller, what cause Polarization Controller output is not above-mentioned 3 polarization states, but 3 polarization states of output still keep 120 degree angle relations, so still can reach the effect that reduces measuring error.
After measurement is finished, can calculate the system transmissions mueller matrix under different wave length according to the method that people such as Dong Hui proposed in 2007, thus the PMD vector
Can be according to people's such as Jopson method matrix M
Δ=M (ω+Δ ω) M
-1(ω) calculate.And use formula
With
Can also be able to calculate except that Differential Group Delay (differential group delay, DGD) and the differential attenuation rate (differential attenuation slope, DAS).
On the one hand, the method that the present invention adopts has only been carried out the primary reflection long scan, thereby has avoided the wavelength repeatability error, and on the other hand, the present invention does not require the consistance of the input SOP under different wave length, thereby has avoided the inconsistent measuring error of bringing of SOP.Therefore, the present invention has avoided the shortcoming of different measuring mode in the measuring method in the past, thereby makes the measuring accuracy to be improved, and noise obtains restraining.
Because the present invention measured the system transmissions mueller matrix the different wave length under, system under respective wavelength birefringence and Polarization Dependent Loss or gain and also can measure simultaneously.
Please refer to Fig. 4, the device that the present invention is used to measure polarization mode dispersion vector comprises: light source 1, input polarization acquisition module 2, output polarization attitude detection module 3 and processing module 4.Wherein, light source 1 is used to produce the light of different specified wavelengths, input polarization acquisition module 2 is used for obtaining respectively three kinds of input polarizations of the light of each specified wavelength, the light that output polarization attitude detection module 3 is used to detect each specified wavelength respectively under three kinds of input polarizations by device under test after corresponding three kinds of output polarization attitudes that obtain, processing module comprises first processing unit, first processing unit is used for according to the mueller matrix under three kinds of output polarization attitudes calculating specified wavelengths of three kinds of input polarizations and correspondence, and calculates the polarization mode dispersion vector of device under test according to the mueller matrix under each specified wavelength.Processing module preferably also comprises second processing unit, and second processing unit is used for calculating birefringence and/or Polarization Dependent Loss or gain under the corresponding specified wavelength according to mueller matrix.
Please refer to Fig. 5, in a preferred embodiment, light source 1 comprises wavelength-tunable narrow-band light source 11, and input polarization acquisition module 2 comprises Polarization Controller 12 and online polarization analysis instrument 13, output polarization attitude detection module 3 adopts polarization analysis instrument 15, and processing module 4 adopts computing machine 16.In the course of work, wavelength-tunable narrow-band light source 11 produces the narrowband line polarized light of specified wavelength, and polarized light is added to the input end of device under test or system 14 after Polarization Control.Polarization Controller 12 changes light source 11 outgoing polarization state of light, and it is adjusted to the suitable input polarization that satisfies aforementioned condition.Online polarization analysis instrument 13 detects the polarization state of polarized light after Polarization Controller 12 effects in measuring process; In calibration process, testing result is fed back to Polarization Controller 12, carry out suitable adjustment according to feedback by Polarization Controller 12.Output terminal in device under test or system 14, the output polarization attitude that polarization analysis instrument 15 is measured by the light of device under test or system 14.
Typically, Polarization Controller 12 adopts the automatically controlled Polarization Controller of being made by electro-optic crystal.This type of Polarization Controller is undertaken by applying voltage control signal the adjusting of polarization state.Under this situation, polarization state after the adjusting is relevant with the birefringence that is input to optical fiber pigtail Polarization Controller and Polarization Controller, voltage control signal and output polarization attitude do not have one-to-one relationship, therefore, by the polarization state of online polarization analysis instrument 13 measurement in real time after Polarization Controller 12 effects, through the voltage control signal of feedback adjusting Polarization Controller, thereby obtain the required input polarization state.
In the said process, computing machine 16 each devices of control are according to Measurement Algorithm collaborative work of the present invention.After 3 groups of input and output measuring polarization states under the specified wavelength are finished, make light source 11 adjust to next specified wavelength and repeat the measurement of 3 groups of input and output polarization states.After the data of all specified wavelengths were surveyed, computing machine 16 was according to the mueller matrix under each wavelength of data computation that record, and then calculated the polarization mode dispersion vector of device under test or system 14.
Relevant disclosure below with reference to document is incorporated this paper by reference into:
[1]R.M.Jopson，L.E.Nelson，and?H.Kogelnik，″Measurement?ofsecond-order?polarization-mode?dispersion?vectors?in?optical?fibers，″IEEEPhotonics?Technology?Letters，vol.11，pp.1153-1155，1999.
[2]H.Dong，P.Shum，M.Yan，J.Q.Zhou，G.X.Ning，Y.D.Gong，and?C.Q.Wu，″Measurement?of?Mueller?matrix?for?an?optical?fiber?system?withbirefringence?and?polarization-dependent?loss?or?gain，″Optics?Communications，vol.274，pp.116-123，2007.
Above content be in conjunction with concrete preferred implementation to further describing that the present invention did, can not assert that concrete enforcement of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to protection scope of the present invention.
Claims (10)
1. a method that is used to measure polarization mode dispersion vector is characterized in that, may further comprise the steps:
A, make specified wavelength light respectively according to three kinds of input polarizations by device under test, described three kinds of input polarizations satisfy linear independence;
B, measure the three kind output polarization attitudes of described light after respectively, described three kinds of input polarizations and three kinds of output polarization attitudes are recorded as the batch total certificate that counts by described device under test;
Repeat above-mentioned steps A, B, write down many batch totals under a plurality of different specified wavelengths certificate that counts; With
C, counting according to each batch total it is calculated that mueller matrix under each specified wavelength, and calculates the polarization mode dispersion vector of described device under test according to described mueller matrix.
2. the method that is used to measure polarization mode dispersion vector as claimed in claim 1 is characterized in that, also comprises after the described step C:
D, calculate birefringence under the corresponding specified wavelength and/or Polarization Dependent Loss or the gain under the corresponding specified wavelength according to described mueller matrix.
3. the method that is used to measure polarization mode dispersion vector as claimed in claim 1 or 2 is characterized in that, the vector of described three kinds of input polarizations in the Stokes space in twos angle be 120 the degree three Stokes vector.
4. the method that is used to measure polarization mode dispersion vector as claimed in claim 3 is characterized in that, in the described steps A, produces three kinds of input polarizations according to the Polarization Controller setting state Polarization Controller that writes down in advance.
5. the method that is used to measure polarization mode dispersion vector as claimed in claim 4, it is characterized in that, in the described steps A, make described light by before the described device under test, acquisition in the Stokes space in twos angle be 120 the degree three Stokes calibration vectors and write down corresponding Polarization Controller state, carry out Polarization Control and measure the result of Polarization Control in real time, and regulate Polarization Control to obtain and the corresponding input polarization of described Polarization Controller state by feedback.
6. a device that is used to measure polarization mode dispersion vector is characterized in that, comprising:
Light source is used to produce the light of different specified wavelengths;
The input polarization acquisition module is used for obtaining respectively three kinds of input polarizations of the light of each specified wavelength, described three kinds of input polarization linear independences;
Output polarization attitude detection module, the light that is used to detect each specified wavelength respectively under described three kinds of input polarizations by device under test after corresponding three kinds of output polarization attitudes that obtain;
And processing module, comprise first processing unit, be used for according to the mueller matrix under described three kinds of output polarization attitudes calculating specified wavelength of described three kinds of input polarizations and correspondence, and calculate the polarization mode dispersion vector of described device under test according to the described mueller matrix under each specified wavelength.
7. the device that is used to measure polarization mode dispersion vector as claimed in claim 6, it is characterized in that, described processing module also comprises second processing unit, is used for calculating birefringence under the corresponding specified wavelength and/or Polarization Dependent Loss or the gain under the corresponding specified wavelength according to described mueller matrix.
8. as claim 6 or the 7 described devices that are used to measure polarization mode dispersion vector, it is characterized in that, described input polarization acquisition module comprises Polarization Controller and online polarization analysis instrument, described Polarization Controller is used to regulate the input polarization of described light, described online polarization analysis instrument is used to detect the result of described light through described Polarization Controller effect, and feeds back the polarization state that records is adjusted to described light with acquisition the input polarization that satisfies condition to described Polarization Controller Polarization Controller state of a control.
9. as claim 6 or the 7 described devices that are used to measure polarization mode dispersion vector, it is characterized in that, the vector of described three kinds of input polarizations in the Stokes space in twos angle be 120 the degree three Stokes vector.
10. the device that is used to measure polarization mode dispersion vector as claimed in claim 9, it is characterized in that, described input polarization acquisition module comprises Polarization Controller and online polarization analysis instrument, described Polarization Controller is used to regulate the input polarization of described light, described online polarization analysis instrument is used to detect the result of described light through described Polarization Controller effect, described Polarization Controller and online polarization analysis instrument are again alignment units simultaneously, described alignment unit be used for providing produce one group in the Stokes space Polarization Controller state when angle is three calibration vectors of 120 degree in twos, described Polarization Controller is adjusted to described light the described input polarization that satisfies condition according to align mode.
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Assignee: Shenzhen Weiyi Optical Communication Technology Co., Ltd. Assignor: Shenzhen Jpt Electronics Co., Ltd. Contract record no.: 2010440020159 Denomination of invention: Method and apparatus for measuring polarization mode dispersion vector License type: Exclusive License Open date: 20090708 Record date: 20100908 |
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Address after: 518000 Guangdong Province, Shenzhen city Longhua District Guanlan Street No. 5 Wu Lu Sheng Keng community view science and Technology Building No. 1 factory south and West Industrial Park Building 3 floor Patentee after: SHENZHEN JPT OPTO-ELECTRONICS CO., LTD. Address before: 5 floor, Zhenhua Industrial Park, Heping East Road, Longhua Town, Shenzhen, Guangdong, Baoan District 518109, China Patentee before: Shenzhen Jpt Electronics Co., Ltd. |