CN101467306A - 光谱椭偏仪 - Google Patents
光谱椭偏仪 Download PDFInfo
- Publication number
- CN101467306A CN101467306A CN200780022259.4A CN200780022259A CN101467306A CN 101467306 A CN101467306 A CN 101467306A CN 200780022259 A CN200780022259 A CN 200780022259A CN 101467306 A CN101467306 A CN 101467306A
- Authority
- CN
- China
- Prior art keywords
- polarization
- angle
- analyzer
- light beam
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims abstract description 24
- 230000010287 polarization Effects 0.000 claims description 49
- 230000003287 optical effect Effects 0.000 abstract description 14
- 238000005259 measurement Methods 0.000 abstract description 4
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 238000007689 inspection Methods 0.000 abstract 2
- 239000000523 sample Substances 0.000 description 13
- 238000001514 detection method Methods 0.000 description 5
- 229920000535 Tan II Polymers 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000002310 reflectometry Methods 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000572 ellipsometry Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000007620 mathematical function Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
- G01N2021/213—Spectrometric ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US79392606P | 2006-04-24 | 2006-04-24 | |
US60/793,926 | 2006-04-24 | ||
US11/735,979 | 2007-04-16 | ||
US11/735,979 US20070242267A1 (en) | 2006-04-14 | 2007-04-16 | Optical Focusing Devices |
US11/739,679 US7999949B2 (en) | 2006-04-24 | 2007-04-24 | Spectroscopic ellipsometers |
PCT/US2007/067345 WO2007127760A2 (en) | 2006-04-24 | 2007-04-24 | Spectroscopic ellipsometers |
US11/739,679 | 2007-04-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101467306A true CN101467306A (zh) | 2009-06-24 |
CN101467306B CN101467306B (zh) | 2012-12-26 |
Family
ID=40806686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200780022259.4A Active CN101467306B (zh) | 2006-04-24 | 2007-04-24 | 光谱椭偏仪 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN101467306B (zh) |
WO (1) | WO2007127760A2 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103134591A (zh) * | 2011-12-02 | 2013-06-05 | 北京智朗芯光科技有限公司 | 近垂直入射宽带偏振光谱仪和光学测量系统 |
CN106248615A (zh) * | 2015-06-05 | 2016-12-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 一种太赫兹波检偏器 |
CN107918184A (zh) * | 2016-10-09 | 2018-04-17 | 睿励科学仪器(上海)有限公司 | 非垂直自动聚焦系统以及相应的光学仪器 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101666626B (zh) * | 2008-09-03 | 2012-02-29 | 睿励科学仪器(上海)有限公司 | 一种椭偏测量的方法及其装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2264427B1 (en) * | 1997-01-31 | 2017-05-03 | Xy, Llc | Optical apparatus with focussing reflector for converging radiation onto a flow of particles, and related method of analysis |
US6278519B1 (en) * | 1998-01-29 | 2001-08-21 | Therma-Wave, Inc. | Apparatus for analyzing multi-layer thin film stacks on semiconductors |
-
2007
- 2007-04-24 CN CN200780022259.4A patent/CN101467306B/zh active Active
- 2007-04-24 WO PCT/US2007/067345 patent/WO2007127760A2/en active Application Filing
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103134591A (zh) * | 2011-12-02 | 2013-06-05 | 北京智朗芯光科技有限公司 | 近垂直入射宽带偏振光谱仪和光学测量系统 |
CN103134591B (zh) * | 2011-12-02 | 2016-05-04 | 北京智朗芯光科技有限公司 | 近垂直入射宽带偏振光谱仪和光学测量系统 |
CN106248615A (zh) * | 2015-06-05 | 2016-12-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 一种太赫兹波检偏器 |
CN106248615B (zh) * | 2015-06-05 | 2019-04-23 | 中国科学院苏州纳米技术与纳米仿生研究所 | 一种太赫兹波检偏器 |
CN107918184A (zh) * | 2016-10-09 | 2018-04-17 | 睿励科学仪器(上海)有限公司 | 非垂直自动聚焦系统以及相应的光学仪器 |
Also Published As
Publication number | Publication date |
---|---|
CN101467306B (zh) | 2012-12-26 |
WO2007127760A2 (en) | 2007-11-08 |
WO2007127760A3 (en) | 2008-04-10 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180628 Address after: 201203 6 Hua Tuo road Pioneer Park, 68 Pudong New Area Road, Pudong New Area, Shanghai. Co-patentee after: Rui Li microelectronic equipment (Shanghai) Co.,Ltd. Patentee after: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. Address before: 201200 Hua Tuo Road 68, Shanghai Pudong New Area Pioneer Park 6, 6 Patentee before: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Light intensity smoothing device and method of xenon lamp light sources in spectrum ellipsometer Effective date of registration: 20190121 Granted publication date: 20121226 Pledgee: Shanghai Xingcheng Investment Management Co.,Ltd. Pledgor: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. Registration number: 2019310000002 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20191029 Granted publication date: 20121226 Pledgee: Shanghai Xingcheng Investment Management Co.,Ltd. Pledgor: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. Registration number: 2019310000002 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20230414 Address after: 201203 6 Hua Tuo road Pioneer Park, 68 Pudong New Area Road, Pudong New Area, Shanghai. Patentee after: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. Address before: 201203 6 Hua Tuo road Pioneer Park, 68 Pudong New Area Road, Pudong New Area, Shanghai. Patentee before: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) Corp. Patentee before: Rui Li microelectronic equipment (Shanghai) Co.,Ltd. |
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TR01 | Transfer of patent right |