CN101452212B - 投影式光刻机 - Google Patents
投影式光刻机 Download PDFInfo
- Publication number
- CN101452212B CN101452212B CN2007100943903A CN200710094390A CN101452212B CN 101452212 B CN101452212 B CN 101452212B CN 2007100943903 A CN2007100943903 A CN 2007100943903A CN 200710094390 A CN200710094390 A CN 200710094390A CN 101452212 B CN101452212 B CN 101452212B
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- reflecting mirror
- completely reflecting
- holophote
- mask
- completely
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- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
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Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2007100943903A CN101452212B (zh) | 2007-12-06 | 2007-12-06 | 投影式光刻机 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2007100943903A CN101452212B (zh) | 2007-12-06 | 2007-12-06 | 投影式光刻机 |
Publications (2)
Publication Number | Publication Date |
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CN101452212A CN101452212A (zh) | 2009-06-10 |
CN101452212B true CN101452212B (zh) | 2010-09-08 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN2007100943903A Active CN101452212B (zh) | 2007-12-06 | 2007-12-06 | 投影式光刻机 |
Country Status (1)
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CN (1) | CN101452212B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10036963B2 (en) * | 2016-09-12 | 2018-07-31 | Cymer, Llc | Estimating a gain relationship of an optical source |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1201154A (zh) * | 1997-05-29 | 1998-12-09 | 中国科学院上海光学精密机械研究所 | 超精细结构的光学测量系统 |
US5894056A (en) * | 1995-12-19 | 1999-04-13 | Nikon Corporation | Mask substrate, projection exposure apparatus equipped with the mask substrate, and a pattern formation method utilizing the projection exposure apparatus |
CN1647249A (zh) * | 2002-04-26 | 2005-07-27 | 佳能株式会社 | 曝光设备以及使用该曝光设备的器件制造方法 |
-
2007
- 2007-12-06 CN CN2007100943903A patent/CN101452212B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5894056A (en) * | 1995-12-19 | 1999-04-13 | Nikon Corporation | Mask substrate, projection exposure apparatus equipped with the mask substrate, and a pattern formation method utilizing the projection exposure apparatus |
CN1201154A (zh) * | 1997-05-29 | 1998-12-09 | 中国科学院上海光学精密机械研究所 | 超精细结构的光学测量系统 |
CN1647249A (zh) * | 2002-04-26 | 2005-07-27 | 佳能株式会社 | 曝光设备以及使用该曝光设备的器件制造方法 |
Non-Patent Citations (1)
Title |
---|
葛威,李毅杰.584A投影曝光机的光学系统.电子工业专用设备.1997,26(4),27-34,60. * |
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Publication number | Publication date |
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CN101452212A (zh) | 2009-06-10 |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20131216 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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TR01 | Transfer of patent right |
Effective date of registration: 20131216 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |