CN101446724B - Liquid crystal display device, array substrate and method for repairing defects thereof - Google Patents
Liquid crystal display device, array substrate and method for repairing defects thereof Download PDFInfo
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- CN101446724B CN101446724B CN2008101866608A CN200810186660A CN101446724B CN 101446724 B CN101446724 B CN 101446724B CN 2008101866608 A CN2008101866608 A CN 2008101866608A CN 200810186660 A CN200810186660 A CN 200810186660A CN 101446724 B CN101446724 B CN 101446724B
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Abstract
The invention discloses an array substrate of a liquid crystal display device, which comprises scanning wires, data wires, pixel cells as well as pixel electrodes and transistors which are arranged in the pixel cells, wherein every two lines of pixel cells in the array substrate can configure one scanning wire, and every one row of pixel cells configures two data wires; the array substrate also comprises first repairing wires and second repairing wires, which are arranged in different layers, and the first repairing wires are arranged between every two adjacent rows of pixel cells, are extended along the direction of the data wires and are broken on each of the crossed parts of the first repairing wires and the scanning wires; the second repairing wires are arranged on the broken parts of the first repairing wires, stripe over the scanning wires corresponding to the broken parts and extend along the direction of the data wires. The invention also discloses the liquid crystal display device applying the array substrate as well as a repairing method used for the array substrate. The liquid crystal display device, the array substrate and the defect repairing method thereof can solve the problem of lower yield caused by the defects of the data wires.
Description
Technical field
The present invention relates to technical field of manufacturing semiconductors, particularly a kind of liquid crystal indicator, array base palte and defect mending method thereof with repairing circuit.
Background technology
Advantages such as liquid crystal indicator (LCD, Liquid Crystal Display) has gently, approaches, low power consumption are widely used in modernized information equipments such as computing machine, mobile phone and personal digital assistant.
Fig. 1 is a kind of array base palte synoptic diagram of existing liquid crystal indicator, and as shown in Figure 1, this array base palte comprises sweep trace 110; Data line 120 with described sweep trace cross arrangement; Be arranged at pixel electrode 103 and thin film transistor (TFT) 104 (Thin Film Transistor is called for short TFT) in the pixel cell 100 that described sweep trace 110 and described data line 120 intersect to form mutually.Wherein, thin film transistor (TFT) 104 grids and sweep trace 110 are electrical connected, source electrode and data line 120 are electrical connected, drain electrode is electrical connected with pixel electrode 103, and each bar sweep trace all links to each other with the grid of each thin film transistor (TFT) 104 of corresponding row, and each bar data line all links to each other with the source electrode of each thin film transistor (TFT) 104 of respective column.
During this liquid crystal indicator work, utilize sweep trace 110 to send sweep signal each thin film transistor (TFT) 104 to corresponding row respectively, control TFT 104 is opened line by line or is closed; And when thin film transistor (TFT) 104 was in opening, the data-signal on the data line 120 can add to via the source electrode of thin film transistor (TFT) 104 on the pixel electrode 103 of this pixel cell 100, realized liquid crystal display.
Usually, the driving frequency of LCD is 60Hz, promptly shows 60 frame pictures p.s..Because in each frame image time, need to have scanned all sweep traces successively, to finish the driving to all pixel cells, be quite limited the sweep time of distributing to every sweep trace.For example, be the high-definition liquid crystal display of 1920*1080 for resolution, because each display pixel is made up of three sub-pixels of red, green, blue respectively, it need have 1920 * 3=5760 bar data line, and 1080 sweep traces.When the frequency of using 60Hz drives it, must in 1/60 second time, finish the scanning of a frame picture, or say and must in 1/60 second time, scan 1080 sweep traces successively, only be 15.43 microseconds the sweep time of every sweep trace.In the time of this 15.43 microsecond, need also to finish that (this memory capacitance is not shown to the charging of the memory capacitance in the pixel cell via data line, one end and pixel electrode 103 are electrical connected, one end and public electrode are electrical connected, when thin film transistor (TFT) cut out, memory capacitance can keep the voltage on the pixel electrode).
Yet when the frequency of utilizing 60Hz drove, dynamically ghost problem appearred significantly in LCD regular meeting.In order to address this problem, proposed to utilize the frequency of 120Hz that LCD is driven in the prior art.When utilizing the 120Hz frequency that the LCD with array base palte is as shown in Figure 1 driven, reduced half the sweep time of distributing to every sweep trace again, that is, the duration of charging of memory capacitance has shortened half.This moment is easily insufficient because of the memory capacitance charging, and the voltage on the pixel electrode can't reach predetermined value, causes LCD normally to show.
In order to address the above problem, a kind of array base palte of the liquid crystal indicator that has improved has been proposed again in the prior art, Fig. 2 is the array base palte synoptic diagram of another kind of existing liquid crystal indicator, as shown in Figure 2, different with the array base palte among Fig. 1 is that 210 whiles of every sweep trace of the array base palte among Fig. 2 and each thin film transistor (TFT) 204 grid in the adjacent two capable pixel cells 200 are electrical connected.Therefore every sweep trace 210 can be controlled two row pixel cells 200 simultaneously.And each row pixel cell 200 all disposes two data lines 220, in the same row, pairing thin film transistor (TFT) 204 source electrodes of pixel cell of adjacent lines are electrical connected with different data line 220 respectively.
As shown in Figure 2, the quantity of the required sweep trace of this array base palte can reduce half.Therefore,, also still can reach 15.43 delicate the sweep time of distributing to each bar sweep trace, guarantee to have time enough that memory capacitance is charged even use the frequency of 120Hz that it is driven.Simultaneously, because pixel cell 200 pairing thin film transistor (TFT) 204 source electrodes of adjacent lines have been connected to different data lines respectively, even this array base palte is to control two row pixel cells 200 simultaneously by a sweep trace, still can guarantee between this two row pixel cell independently of one another.
But for the array base palte shown in Fig. 2, because same row pixel cell 200 need be driven by two data lines 220, it is compared with existing generic array substrate, and required data line amount has increased by one times.For procedure for producing, defectives such as line broken circuit or short circuit can take place in more frequently, cause the yield rate of production lower.
Summary of the invention
The invention provides a kind of liquid crystal indicator, array base palte and defect mending method thereof, can solve in the existing array base palte and increase the lower problem of the rate that manufactures a finished product that causes because of data line quantity.
For achieving the above object, a kind of LCD device array substrates provided by the invention comprises:
Sweep trace, with data line, the pixel cell of described sweep trace cross arrangement, be arranged at pixel electrode and transistor in the described pixel cell;
Described sweep trace of per two row pixel cell configurations in the described array base palte, every sweep trace is electrical connected with the two transistorized grids of going pixel cells that are positioned at its both sides;
Two data lines of each row pixel cell configuration, the transistorized source electrode in the same row pixel cell is electrical connected with described two data lines respectively in alternate mode;
Wherein, described array base palte also comprises first patch cord and second patch cord that is positioned at different layers, and described first patch cord and described data line different layers, described second patch cord and described sweep trace different layers;
Described first patch cord is arranged between the two adjacent row pixel cells, extend along described data line direction, interrupting with each intersection of described sweep trace, and each described first patch cord has also extended to form and the overlapping a plurality of extensions of projection section of two data lines between described adjacent two row pixel cells;
Described second patch cord is arranged at each interruptions of described first patch cord, stride across the described sweep trace corresponding with described interruptions, it is overlapping with described first repair line part that is positioned at described interruptions both sides respectively that two ends extend to its projection along described data line direction.
Preferably, described first patch cord and described sweep trace are positioned at same one deck, and described second patch cord and described data line bit are in same one deck.
Preferably, the extension of described first patch cord is extended to form along scan-line direction by each interrupt endpoint of described first patch cord.
Alternatively, described first patch cord also has coupled logical connecting portion, in the interval of described connecting portion between the adjacent described pixel cell of two row that described sweep trace is not set, and parallel, alternate setting with described sweep trace.
The present invention also provides a kind of liquid crystal indicator that comprises above-mentioned array base palte, and the transistorized source electrode in this display device in any two adjacent unit pixel is electrically connected to opposite polarity data line.
The present invention also provides a kind of defect mending method that can be used for above-mentioned array base palte, comprises step:
Detect the data line defective on the described array base palte;
When the defective locations of described data line is not crossed over sweep trace, to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected;
When the defective locations of described data line is crossed over sweep trace, to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected, to described second patch cord of the sweep trace both sides that are positioned at leap with and its partly overlapping described first patch cord be electrical connected;
Near the described position that is electrical connected, described first patch cord is carried out disconnection process.
Compared with prior art, the present invention has the following advantages:
Liquid crystal indicator of the present invention and array base palte thereof, in the different layers of array base palte, be provided with repairing circuit respectively with first patch cord and second patch cord, in case because of the data line defective has appearred in the reason of procedure for producing, can be by with first patch cord and data line or the method that is electrical connected with second patch cord, the bypass of data transmission is provided for this data line that defective occurs, the consequence of having avoided the chunk array substrate to scrap has improved the yield rate of producing.
Liquid crystal indicator of the present invention is electrically connected to opposite polarity data line with the transistor source in any two adjacent unit pixel in the above-mentioned array base palte, therefore can realize an inversion driving, has improved the expressive ability of image quality.
The array base palte method for repairing and mending of liquid crystal indicator of the present invention, be electrical connected with near first patch cord the fault location and data line or with second patch cord, the bypass of data transmission is provided for the data line that defective occurs, the consequence of having avoided the chunk array substrate to scrap has improved the yield rate of producing.
Description of drawings
Fig. 1 is a kind of array base palte synoptic diagram of existing liquid crystal indicator;
Fig. 2 is the array base palte synoptic diagram of another kind of existing liquid crystal indicator;
Fig. 3 is for adding the array base palte synoptic diagram of repairing circuit of the present invention liquid crystal indicator before;
Fig. 4 is the array base palte synoptic diagram of the liquid crystal indicator in the first embodiment of the invention;
Fig. 5 is the array base palte synoptic diagram of the liquid crystal indicator in the second embodiment of the invention;
Fig. 6 is the array base palte synoptic diagram of the another kind of liquid crystal indicator in the second embodiment of the invention;
Fig. 7 is the defect mending method process flow diagram of array base palte in the third embodiment of the invention;
Fig. 8 is the array base palte synoptic diagram of the liquid crystal indicator after utilizing method for repairing and mending in the third embodiment of the invention to repair.
Embodiment
For above-mentioned purpose of the present invention, feature and advantage can be become apparent more, the specific embodiment of the present invention is described in detail below in conjunction with accompanying drawing.Certainly the present invention is not limited to this specific embodiment, and the known general replacement of one of ordinary skilled in the art is encompassed in protection scope of the present invention far and away.
Secondly, the present invention utilizes synoptic diagram to describe in detail, when the embodiment of the invention is described in detail in detail, for convenience of explanation, the synoptic diagram of expression structure can be disobeyed general ratio and be done local the amplification, should be with this as limitation of the invention, in addition, in the making of reality, should comprise the three dimensions size of length, width and the degree of depth.
In order clearly to describe structure of the present invention, omitted the part known configurations in each synoptic diagram of the application, as and structure such as not shown colored filter substrate.
" OK " of the pixel cell that defines among the application, " row " are for the relation of each pixel cell and sweep trace, data line, with the actual arrangement orientation independent of each pixel cell.As, among the application each pixel cell is defined as each row pixel cell respectively along each scan-line direction, each pixel cell is defined as each row pixel cell respectively along each data line direction.
In the prior art, the array base palte of traditional liquid crystal indicator is improved, with every sweep trace simultaneously and the transistor in the adjacent two row pixel cells link to each other, make the quantity of required sweep trace reduce half; Simultaneously, each row pixel cell is linked to each other with two data lines, the pairing transistor of the pixel cell of adjacent lines is connected to different data lines respectively, has guaranteed still to keep independent each other between the adjacent two row pixel cells.But this kind array base palte is compared with common array base palte, and required data line amount has increased by one times, can take place more frequently also that data line opens circuit or defective such as short circuit, causes the yield rate of production lower.For this reason, the present invention is further improved such array base palte, has increased the repairing circuit part.
Fig. 3 is for adding the array base palte synoptic diagram of repairing circuit of the present invention liquid crystal indicator before, as shown in Figure 3, this array base palte comprise sweep trace 310, with data line 320, the pixel cell 300 of described sweep trace 310 cross arrangements, be arranged at pixel electrode 303 and transistor 304 in the described pixel cell 300.
Wherein, described sweep trace 310 of per two row pixel cells, 300 configurations in the described array base palte, every sweep trace 310 is electrical connected with two transistor 304 grids of going pixel cells 300 that are positioned at its both sides; The grid of the transistor 304 in capable and m+1 is capable each pixel cell 300 is electrical connected with m respectively as the G in the sweep trace among Fig. 3 310 (m), and the grid of the transistor 304 in each pixel cell 300 that the G in the sweep trace 310 (m+2) is capable with m+2 respectively and m+3 is capable is electrical connected.At this moment, do not need to be provided with sweep trace 310 between pixel cell 300 that m+1 is capable and m+2 is capable, the quantity of sweep trace can reduce half.
Two data lines 320 of each row pixel cell 300 configuration in the described array base palte, transistor 304 source electrodes in the same row pixel cell 300 are electrical connected with described two data lines 320 respectively in alternate mode.As, the and arranged on left and right sides of the pixel cell 300 of the n row in the data line 320 among Fig. 3 disposes the data line D (n) and the D (n+1) of these row pixel cell 300 special uses respectively, wherein data line D (n) can be respectively links to each other with transistor 304 source electrodes in the pixel cell 300 of odd-numbered line in this row pixel cell 300, and data line D (n+1) can be respectively links to each other with interior transistor 304 source electrodes of the pixel cell 300 of even number line in this row pixel cell 300.Other data line D (n+2) among the figure, D (n+3) ... wait with the connected mode of pixel cell 300 also can the rest may be inferred.
Array base palte shown in Fig. 3 can utilize upper frequency that it is driven, effectively anti-dynamic ghost problem, simultaneously, its sweep time of distributing to each bar sweep trace under high frequency also can be longer, has time enough that memory capacitance is charged, and guaranteed the normal demonstration of display.
For improving the lower phenomenon of yield rate that array base palte causes because of data line quantity increases among Fig. 3, specific embodiments of the invention have been set up repairing circuit thereon.
First embodiment:
Fig. 4 is the array base palte synoptic diagram of the liquid crystal indicator in the first embodiment of the invention, as shown in Figure 4, this array base palte comprise sweep trace 410, with data line 420, the pixel cell 400 of described sweep trace 410 cross arrangements, be arranged at pixel electrode 403 and transistor 404 in the described pixel cell 400.
Wherein, its sweep trace 410 (comprising G shown in Fig. 4 (m) and G (m+2)) and data line 420 (comprise the D shown in Fig. 4 (n), D (n+1) ... etc.) identical with shown in the connected mode of each pixel cell 400 and Fig. 3, do not repeat them here.
As shown in Figure 4, this array base palte also comprises first patch cord 451 and second patch cord 452 that is positioned at different layers, and described first patch cord 451 also with described data line 420 different layers, described second patch cord 452 also with described sweep trace 410 different layers.In the present embodiment, for easy to make, respectively first patch cord 451 is arranged at in one deck with sweep trace 410, second patch cord 452 is arranged at in one deck with data line 420.
Use the liquid crystal indicator of the array base palte among this first embodiment among the present invention, the pixel cell of any two adjacent (comprising neighbouring adjacent with the left and right sides) all can be connected the data line of opposite polarity, the polarity of promptly any two adjacent pixel unit is opposite.Realize the some inversion driving, further improved the expressive ability of image quality.
Use in other liquid crystal indicator of the array base palte among this first embodiment in the present invention, also can unfavorablely use above-mentioned connected mode, and adopt other connected mode to realize row counter-rotating or row counter-rotating.For those of ordinary skills, under the inspiration of the above embodiment of the present invention, can release the concrete connected mode that realizes row counter-rotating or row counter-rotating, do not repeat them here.
Array base palte in the present embodiment and use the liquid crystal indicator of this array base palte, in the different layers of array base palte, be parallel to data line and be provided with repairing circuit respectively with first patch cord and second patch cord, in case occurred that data line opens circuit or defective such as short circuit, can utilize introduce later with first patch cord and data line or the method that is electrical connected with second patch cord, the bypass of data transmission is provided for this data line that defective occurs, the consequence of having avoided the chunk array substrate to scrap has improved the yield rate of product.
In addition,, can also do further expansion, the array base palte of the liquid crystal indicator after introducing in detail wherein a kind of repairing circuit is expanded below by second embodiment of the invention to repairing circuit in order to reduce resistance.
Second embodiment:
Fig. 5 is the array base palte synoptic diagram of the liquid crystal indicator in the second embodiment of the invention, as shown in Figure 5, this array base palte comprise sweep trace 510, with data line 520, the pixel cell 500 of described sweep trace 510 cross arrangements, be arranged at pixel electrode 503 and transistor 504 in the described pixel cell 500.
Wherein, its sweep trace 510 (comprising G shown in Fig. 5 (m) and G (m+2)) and data line 520 (comprise the D shown in Fig. 5 (n), D (n+1) ... etc.) identical with shown in the connected mode of each pixel cell 500 and Fig. 5, do not repeat them here.
As shown in Figure 5, this array base palte also comprises first patch cord 551 and second patch cord 552 that is positioned at different layers, preferably, first patch cord 551 can be arranged at in one deck with sweep trace 510, second patch cord 552 is arranged at in one deck with data line 520.
First patch cord 551 is arranged between the two adjacent row pixel cells 500, extend along data line 520 directions, interrupting with each intersection of sweep trace 510, promptly between two adjacent row pixel cells 500, the both sides of each sweep trace can have two interrupt endpoint of first patch cord 551 respectively.This first patch cord 551 has extended to form a plurality of extensions, described extension extends to both sides along sweep trace 510 directions, arrive respectively below two data lines 520 between the identical two row pixel cells 500, overlapping with described data line 520 in the projection section of these first patch cord, 551 place layers.Particularly, the described first patch cord extension in the present embodiment is extended to form along scan-line direction by each interrupt endpoint of described first patch cord.
In addition, as shown in Figure 5, also in same one deck of described first patch cord 551, be provided with coupled logical connecting portion in the present embodiment.In the intervals of this connecting portion between the described pixel cells of adjacent two row that sweep trace is not set, parallel, alternate setting with described sweep trace couples together each first patch cord 551 along scan-line direction.
The connecting portion of setting up in the present embodiment can have following effect:
A, can reduce the problem that the resistance value of using this first patch cord 551 to bring as the bypass that transmits data increases.Owing to set up connecting portion, the area of first patch cord 551 has obtained bigger expansion, and the resistance when it transmits data can obviously descend.
B, can be used as public electrode and use.As shown in Figure 5, this connecting portion can arrive each pixel cell, after loading common electric voltage thereon, can form memory capacitance between itself and the pixel electrode, is used for when thin film transistor (TFT) cuts out, and keeps the voltage on the pixel electrode.
C, can be used to repair sweep trace.Because this connecting portion is parallel to sweep trace setting, when defective appears in sweep trace, the sweep trace that defective this can be occurred electrically connects with second patch cord 552 that strides across it, first patch cord 551 and second patch cord 552 with correspondence electrically connects again, utilize this second patch cord 552, first patch cord 551 and connecting portion thereof to form the bypass that transmits sweep signal and carry out the transmission of sweep signal, realize repairing the sweep trace that defective occurs.
Second patch cord 552 in the present embodiment is arranged at each interruptions of described first patch cord 551, stride across the described sweep trace 510 corresponding with described interruptions, extend along described data line 520 directions, second patch cord 552 is overlapped with described first patch cord 551 that is positioned at described interruptions both sides respectively in the projection of first patch cord, 551 place layers.
The connecting portion that is connected with first patch cord in the present embodiment is arranged within the interval of the adjacent two row pixel cells that sweep trace is not set, in other embodiments of the invention, this connecting portion can also have other distortion, as the connecting portion that is connected with first patch cord of other shape can also be set in other position, as long as it can be expanded first patch cord, the resistance when reducing its transmission data gets final product.Under the enlightenment of the embodiment of the invention, the extension of this application is easy to understand and realization for those of ordinary skills, does not repeat them here.
Use the liquid crystal indicator of the array base palte among this second embodiment among the present invention, can reverse by the polarity setting of the data line that transistor connected in each pixel cell being realized row counter-rotating, row equally, or the some counter-rotating.Wherein, the transistorized source electrodes in the pixel cell 500 of any two adjacent (comprising neighbouring adjacent with the left and right sides) all are connected the some inversion driving mode of the data line 520 of opposite polarity, can further improve the expressive ability of image quality.
The polarity of the data line 520 of liquid crystal indicator is to be to change in the cycle with the wall scroll among Fig. 5.At this moment, the transistorized source electrode in described any two adjacent unit pixel is electrically connected to opposite polarity data line and specifically comprises:
In delegation, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected;
And in the same row, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected.
Even should be noted that it is to realize the some inversion driving equally, the array base palte of liquid crystal indicator also can have different connected modes.Fig. 6 is the array base palte synoptic diagram of the another kind of liquid crystal indicator in the second embodiment of the invention, it comprises sweep trace 610 equally, with data line 620, the pixel cell 600 of described sweep trace 610 cross arrangements, be arranged at pixel electrode 603 and transistor 604 in the described pixel cell 600.The repairing circuit of setting up in this array base palte (comprising first patch cord 651 and second patch cord 652) can be set to Fig. 5 in similarly have the structure of connecting portion, also can be set to Fig. 4 in similar simple structure, be the former shown in Fig. 6.
The data line polarity of the pairing liquid crystal indicator of array base palte is to be to change in the cycle with two among Fig. 6, and two data line polarity that link to each other with same row pixel cell are opposite.At this moment, realize a counter-rotating, need make the transistorized source electrode in any two adjacent unit pixel be electrically connected to opposite polarity data line, specifically comprise:
In delegation, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of same side be electrical connected;
And in the same row, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected.
The 3rd embodiment:
Present embodiment is described in detail the concrete method for repairing and mending with array base palte of repairing circuit of the present invention.
Fig. 7 is the defect mending method process flow diagram of array base palte in the third embodiment of the invention, Fig. 8 is the array base palte synoptic diagram of the liquid crystal indicator after utilizing method for repairing and mending in the third embodiment of the invention to repair, and below in conjunction with Fig. 7 and Fig. 8 the method for repairing and mending of present embodiment is specifically introduced.
Step 701: detect the data line defective of determining on the described array base palte. Open defect 841 and 842 have appearred respectively in as shown in Figure 8 data line D (n+3), D (n+5).If this array base palte does not have the repairing circuit among the present invention, then this two row pixel cell can't show normally that all its array base palte can only do to scrap processing.But the array base palte among the present invention has repairing circuit, can repair above-mentioned defective.
Step 702: near the operation that defective locations, is electrical connected, to form the data bypass that surrogate data method line defect place transmits data.
Particularly, when the defective locations of described data line is not crossed over sweep trace, as the defective among Fig. 8 841, can be only to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected (841b shown in Fig. 8), form the data bypass 841a that surrogate data method line D (n+3) fault location shown in the figure transmits data.Wherein, this is electrical connected and can realizes by first patch cord and the puncture of the insulation course between the data line that utilizes laser to put.
When the defective locations of described data line is crossed over sweep trace, as the defective among Fig. 8 842, can by to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected (842b shown in Fig. 8), to described second patch cord of the sweep trace both sides that are positioned at leap with and its partly overlapping described first patch cord be electrical connected (842d shown in Fig. 8), form the data bypass 842a that surrogate data method line D (n+5) fault location shown in Fig. 8 transmits data.
Near step 703: the described position that is electrical connected, described first patch cord is carried out disconnection process.
Operation is electrical connected near defective, after forming above-mentioned data bypass 841a and 842a, for preventing that harassing from appearring in the signal that transmits between each data bypass, need near the position that is electrical connected, carry out disconnection process (841c as shown in Figure 8 and 842c) to described first patch cord.In the present embodiment, this disconnection process is to utilize laser that first patch cord of correspondence position is cut off and realize.This disconnection process has guaranteed that the shows signal of the respective column pixel cell that each data bypass transmits can not have influence on the normal demonstration of other row pixel cell.
In addition, because the resistance value of the data bypass that laser forms after getting through is higher,, can also replenish the operation that is electrical connected in the position that defective do not occur for reducing its resistance.
Such replenish the operation that is electrical connected can be included near the described position that is electrical connected to described data line with and its partly overlapping described first patch cord replenish be electrical connected (843b shown in Fig. 8), and/or to described second patch cord of the sweep trace both sides that are positioned at leap with replenish be electrical connected (843d shown in Fig. 8) with its partly overlapping described first patch cord.Can see, add above-mentioned replenish the operation that is electrical connected after, conjointly formed new complementarity bypass 843a (as shown in phantom in Figure 8) again with bypass 842a, it can reduce the resistance of data bypass 842a.
It should be noted that, for the data bypass that has increased above-mentioned complementarity bypass, its disconnection process need be carried out in conjunction with its complementarity bypass, as the data bypass 842a among Fig. 8, if do not increase the complementarity bypass, can directly carry out disconnection process at the first patch cord place of its both sides.But after having increased coupled complementarity bypass 843a, its disconnection just need be considered coupled complementarity bypass 843a simultaneously.At this moment, near the position that is electrical connected in the preceding step 703, refer to be exactly the position that is electrical connected with replenish position after the position merging that is electrical connected near, as shown in Figure 8, disconnection process 842a wherein is exactly the disconnection process of carrying out together in data bypass 842a and complementarity bypass 843a both sides.
Method for repairing and mending in the present embodiment is that example describes with the data line open defect, in other embodiments of the invention, also can utilize this method that other defectives such as data line short circuit are repaired.As for the data line circuit defect, only need short circuit part two ends are disconnected, by above-mentioned the open circuit method of repairing of data line is repaired and got final product again.Its concrete implementation step is all similar with present embodiment to thinking, and under the enlightenment of the embodiment of the invention, the extension of this application is easy to understand and realization for those of ordinary skills, does not repeat them here.
Method for repairing and mending in the present embodiment is that example describes with the data line defective, and in other embodiments of the invention, this repairing circuit with connecting portion also can be used for repairing sweep trace.It can electrically connect the sweep trace that defective occurs equally with second patch cord 552 that strides across it, first patch cord 551 and second patch cord 552 with correspondence electrically connects again, utilize this second patch cord 552, first patch cord 551 and connecting portion thereof to form the bypass that transmits sweep signal and carry out the transmission of sweep signal, realize repairing the sweep trace that defective occurs.When sweep trace is repaired, may also need to carry out corresponding disconnection process equally, to prevent harassing of sweep signal.
In addition, if connecting portion has been carried out disconnection process, and this connecting portion is used to transmit the words of common electric voltage simultaneously, for guaranteeing that this common electric voltage normal transmission is to each pixel cell, also need relevant first patch cord 551 and second patch cord 552 near the open position are electrically connected, with the common electric voltage that will transmit it on be connected to simultaneously because of carried out disconnection process can't the connecting portion of normal transmission common electric voltage on.Its concrete implementation step is all similar with present embodiment to thinking, and under the enlightenment of the embodiment of the invention, the extension of this application is easy to understand and realization for those of ordinary skills, does not repeat them here.
Method for repairing and mending in the present embodiment is to be that example describes with the repairing circuit with connecting portion, in other embodiments of the invention, also can utilize said method that the array base palte with simple structure repairing circuit is repaired, or the array base palte of repairing circuit with other similar connecting portion structure repaired, its concrete implementation step is all similar with present embodiment to thinking, under the enlightenment of the embodiment of the invention, the extension of this application is easy to understand and realization for those of ordinary skills, does not repeat them here.
In the above embodiment of the present invention, described extension is extended to form along scan-line direction by each interrupt endpoint of described first patch cord, and each pixel cell that is positioned at each bar first patch cord both sides all has an extension corresponding with it.In other embodiments of the invention, the extension of first patch cord also can be extended to form to both sides by certain position at its trunk position, perhaps can not that each pixel cell all has corresponding extension, and can be the corresponding extension of plurality of pixel cells.
But it should be noted that for the latter, when the data line of defective appears in repairing, because of being subjected to the extension restricted number, the data that plurality of pixel cells can occur are all from repairing the situation that the data bypass that forms transmits, and being electrical connected between required first patch cord that carries out and second patch cord operated and also can be increased.All similar with present embodiment to thinking to the concrete implementation step that above-mentioned array base palte is repaired, under the enlightenment of the embodiment of the invention, the extension of this application is easy to understand and realization for those of ordinary skills, does not repeat them here.
Though the present invention is with preferred embodiment openly as above, the schematic and nonrestrictive expression that it is just made for principle of the present invention is described.Any those skilled in the art without departing from the spirit and scope of the present invention, can make possible change and modification, can also utilize the conductive layer that is specifically designed to formation first patch cord or second patch cord to form respectively as first patch cord and second patch cord, the shape of first patch cord and second patch cord or data line projection lap can be for circular arcization, or all the other position areas increase etc. to some extent relatively.Therefore protection scope of the present invention should be as the criterion with the scope that claim of the present invention was defined.
Claims (11)
1. LCD device array substrates comprises:
Sweep trace, with data line, the pixel cell of described sweep trace cross arrangement, be arranged at pixel electrode and transistor in the described pixel cell;
Described sweep trace of per two row pixel cell configurations in the described array base palte, every sweep trace is electrical connected with two transistor gates of going pixel cells that are positioned at its both sides;
Two data lines of each row pixel cell configuration, the transistor source in the same row pixel cell is electrical connected with described two data lines respectively in alternate mode;
It is characterized in that:
Described array base palte also comprises first patch cord and second patch cord that is positioned at different layers, and described first patch cord and data line different layers, described second patch cord and sweep trace different layers;
Described first patch cord is arranged between each two adjacent row pixel cell, extend along the data line direction, interrupting with each intersection of sweep trace, and described first patch cord has also extended to form and the overlapping a plurality of extensions of projection section of two data lines between described adjacent two row pixel cells;
Described second patch cord is arranged at each interruptions of described first patch cord, strides across the described sweep trace corresponding with described interruptions, extends along the data line direction, and its projection is overlapping with described first repair line part that is positioned at described interruptions both sides respectively.
2. array base palte as claimed in claim 1 is characterized in that: described first patch cord and described sweep trace are positioned at same one deck.
3. array base palte as claimed in claim 1 is characterized in that: described second patch cord and described data line bit are in same one deck.
4. array base palte as claimed in claim 1 is characterized in that: the extension of described first patch cord is extended to form along scan-line direction by each interrupt endpoint of described first patch cord.
5. array base palte as claimed in claim 1, it is characterized in that: described first patch cord also has coupled logical connecting portion, in the interval of described connecting portion between the adjacent described pixel cell of two row that described sweep trace is not set, parallel, alternate setting with described sweep trace.
6. array base palte as claimed in claim 5 is characterized in that: described connecting portion also is used to load common electric voltage.
7. liquid crystal indicator that comprises as any described array base palte among the claim 1-6 is characterized in that: the transistorized source electrode in any two adjacent unit pixel is electrically connected to opposite polarity data line.
8. liquid crystal indicator as claimed in claim 7 is characterized in that, when the polarity of described data line is when changing in the cycle with single, the transistorized source electrode in described any two adjacent unit pixel is electrically connected to opposite polarity data line and specifically comprises:
In delegation, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected;
And in the same row, the transistorized source electrode in the adjacent pixel region respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected.
9. liquid crystal indicator as claimed in claim 7, it is characterized in that, when the polarity of described data line is to change in the cycle with two, and when the two data lines polarity that link to each other with same row pixel cell are opposite, transistorized source electrode in described any two adjacent unit pixel is electrically connected to opposite polarity data line, specifically comprises:
In delegation, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of same side be electrical connected;
And in the same row, the transistorized source electrode in the adjacent unit pixel respectively with the data line that forms its place pixel cell in the data line of opposition side be electrical connected.
10. a defect mending method that is used for any described array base palte of claim 1-6 is characterized in that, comprises step:
Detect the data line defective on the described array base palte;
When the defective locations of described data line is not crossed over sweep trace, to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected;
When the defective locations of described data line is crossed over sweep trace, to the described data line that is positioned at described defective locations both sides with and its partly overlapping described first patch cord be electrical connected, to described second patch cord of the sweep trace both sides that are positioned at leap with and its partly overlapping described first patch cord be electrical connected;
Near the described position that is electrical connected, described first patch cord is carried out disconnection process.
11. method for repairing and mending as claimed in claim 10 is characterized in that, after described being electrical connected, described carrying out also comprises step before the disconnection process:
Near the described position that is electrical connected to described data line with and its partly overlapping described first patch cord replenish and be electrical connected; And/or
To described second patch cord of the sweep trace both sides that are positioned at leap with and its partly overlapping described first patch cord replenish and be electrical connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008101866608A CN101446724B (en) | 2008-12-16 | 2008-12-16 | Liquid crystal display device, array substrate and method for repairing defects thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2008101866608A CN101446724B (en) | 2008-12-16 | 2008-12-16 | Liquid crystal display device, array substrate and method for repairing defects thereof |
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| Publication Number | Publication Date |
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| CN101446724A CN101446724A (en) | 2009-06-03 |
| CN101446724B true CN101446724B (en) | 2010-07-07 |
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Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8264631B2 (en) | 2009-11-11 | 2012-09-11 | Au Optronics Corporation | Common repair structures for close bus in a liquid crystal display |
| CN101762914B (en) * | 2010-01-05 | 2011-04-13 | 友达光电股份有限公司 | Polymer stabilization orientation liquid crystal display panel and liquid crystal display panel |
| CN101852956A (en) * | 2010-04-27 | 2010-10-06 | 瀚宇彩晶股份有限公司 | Pixel driving circuit structure with repair line |
| CN103163697B (en) * | 2011-12-08 | 2015-12-09 | 上海天马微电子有限公司 | Picture element array structure |
| CN103472605A (en) | 2013-09-13 | 2013-12-25 | 合肥京东方光电科技有限公司 | Array substrate, driving method thereof and display device |
| CN103745970B (en) | 2013-12-31 | 2017-02-01 | 合肥京东方光电科技有限公司 | Array base plate, manufacturing method of array base plate, restoring method of array base plate and display device |
| CN104851404B (en) * | 2015-06-04 | 2018-09-04 | 合肥鑫晟光电科技有限公司 | Array substrate and its restorative procedure, test method, production method, display device |
| CN105866989A (en) * | 2016-06-16 | 2016-08-17 | 深圳市华星光电技术有限公司 | Array substrate and liquid crystal display panel |
| CN106873276B (en) * | 2017-03-21 | 2019-11-19 | 昆山龙腾光电有限公司 | Display device and its driving method |
| CN106842751B (en) * | 2017-04-11 | 2020-06-23 | 京东方科技集团股份有限公司 | Array substrate, repairing method thereof and display device |
| CN108153077A (en) * | 2018-01-26 | 2018-06-12 | 深圳市华星光电半导体显示技术有限公司 | A kind of display panel and liquid crystal display |
| CN208521584U (en) | 2018-07-24 | 2019-02-19 | 京东方科技集团股份有限公司 | A kind of dot structure, display panel and display device |
| CN109377882B (en) * | 2018-11-29 | 2020-04-10 | 武汉华星光电技术有限公司 | Flexible display panel |
| CN111446262A (en) * | 2020-04-08 | 2020-07-24 | 深圳市华星光电半导体显示技术有限公司 | Array substrate, manufacturing method thereof and display panel |
| CN215183964U (en) * | 2020-08-03 | 2021-12-14 | 友达光电股份有限公司 | Pixel array substrate |
| CN118076917A (en) * | 2022-08-19 | 2024-05-24 | 京东方科技集团股份有限公司 | Display panel, maintenance method thereof and display device |
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Address after: 215300 No. 1, Longteng Road, Kunshan, Jiangsu Patentee after: Kunshan Longteng Au Optronics Co Address before: 215300 No. 1, Longteng Road, Kunshan, Jiangsu Patentee before: Kunshan Longteng Optronics Co., Ltd. |