CN101419268A - Amplifier tube screening instrument - Google Patents
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- CN101419268A CN101419268A CN 200710059980 CN200710059980A CN101419268A CN 101419268 A CN101419268 A CN 101419268A CN 200710059980 CN200710059980 CN 200710059980 CN 200710059980 A CN200710059980 A CN 200710059980A CN 101419268 A CN101419268 A CN 101419268A
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Abstract
The invention discloses a kind of amplifier tube screening instrument, comprise: power supply, function keyboard, display panel, single-chip microcomputer 13, single-chip microcomputer 15 and master control borad, master control borad comprises the withstand voltage test circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the withstand voltage test circuit, the c utmost point of triode Q21 is succeeded an end of electric apparatus coil respectively, the other end ground connection of coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K4, K5, K6 respectively; Voltage comparator U5A outputs signal to single-chip microcomputer 13, and amplifier U3B amplifies V
Br_Make field effect transistor Q1 conducting behind the prt signal; By relay drive circuit adhesive K19, the high-voltage power supply output voltage gives capacitor C 15 chargings by resistance R 50; Voltage follower U3A outputs signal to single-chip microcomputer 15.Amplifier tube screening instrument testing efficiency height of the present invention, the degree of accuracy height, good stability, antijamming capability is strong, is adapted at workshop and uses.
Description
Technical field
The present invention relates to a kind of checkout equipment of electronic applications, relate in particular to a kind of screening instrument that is used for detection power pipe performance parameters.
Background technology
Power MOS pipe has been widely used in electric ballast, the electricity-saving lamp and in the various circuit at present with its excellent performance, and still, the test of power MOS pipe, screening, marriage problem are difficult points always; And also need to carry out the detection of each performance parameters from the power MOS pipe that circuit board disassembles, if cut-in voltage, withstand voltage, mutual conductance, channel resistance, input capacitance are all in specialized range, just can reuse, thereby saved cost, each performance parameters that adopt digital multimeter to measure power MOS pipe in the prior art more, the parameter that digital multimeter is measured is inaccurate, and efficient is low, can't reuse power MOS pipe, just improve the cost of product so virtually; Owing to lack corresponding measuring means, a lot of enterprises can not carry out quality monitoring effectively, so that have had a strong impact on consistency of product and reliability.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, a kind of amplifier tube screening instrument is provided.
The present invention solves its technical matters and takes following technical scheme to realize: a kind of amplifier tube screening instrument of the present invention, comprise: power supply, function keyboard, display panel, single-chip microcomputer 13, single-chip microcomputer 15 and master control borad, described power supply is powered to the entire circuit module, single-chip microcomputer 13 outputs signal to described master control borad, described master control borad feed signals is given single-chip microcomputer 15, single-chip microcomputer 15 gives display panel for signal feedback single-chip microcomputer 13 back feed signals, function keyboard transmits signal and gives single-chip microcomputer 13, and the power tube interface is connected with master control borad; Described master control borad comprises the withstand voltage test circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described withstand voltage test circuit, the c utmost point of triode Q21 in the driving circuit is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K4, K5, K6 respectively, the end of the other end connecting resistance R64 of relay K 4, the end of the other end connecting resistance R53 of resistance R 64, the other end ground connection of resistance R 53; The end of the other end connecting resistance R53 of relay K 6, the other end ground connection of resistance R 53; Voltage comparator U5A outputs signal to single-chip microcomputer 13, and amplifier U3B amplifies V
Br_Make field effect transistor Q1 conducting behind the prt signal, the end of the G utmost point connecting resistance R65 of field effect transistor Q1, the output terminal of another termination amplifier U3B, the S utmost point ground connection of field effect transistor Q1, the D utmost point connecting resistance R74 of field effect transistor Q1, the end after resistance R 75 parallel connections; By relay drive circuit adhesive K19, the high-voltage power supply output voltage gives capacitor C 15 chargings by resistance R 50; Voltage follower U3A outputs signal to single-chip microcomputer 15.
Its technical scheme can also comprise: described master control borad also comprises the channel resistance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described channel resistance testing circuit, the c utmost point of the c utmost point of triode Q23, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K10, relay K 11, relay K 12 respectively, and voltage follower U2B makes the complete conducting of measured power pipe, by single-chip microcomputer 13 output signal V
Rm_P, control field effect transistor Q14 after amplifier U2A amplifies, the corresponding DS of power tube interface two ends add the DS bias voltage, and amplifier U4B amplifies the voltage on the resistance R 91 after voltage regulator circuit forms I
Srm_AD; Amplifier U9A and amplifier U9B amplify V respectively
dAnd V
SAfter voltage regulator circuit is delivered to single-chip microcomputer 15 with signal.
Its technical scheme can also comprise: described master control borad also comprises the cut-in voltage testing circuit, its connected mode is: described single-chip microcomputer 13 is given relay drive circuit in the described cut-in voltage testing circuit signal, one termination single-chip microcomputer 13 of resistance R 2, the b utmost point of resistance R 2 other ends, capacitor C 45 1 termination triode Q2; The e utmost point of the e utmost point of triode Q2, capacitor C 45 other ends, triode Q3 is ground connection respectively; The end of the c utmost point difference connecting resistance R16 of triode Q2, an end of resistance R 90, the b utmost point of another termination triode Q3 of resistance R 90, an end of an end of the other end of resistance R 16, resistance R 17, an end of resistance R 140, capacitor C 16 connects respectively+20V voltage; The other end of the c utmost point difference connecting resistance R17 of triode Q3, an end of resistance R 18, the b utmost point of another termination triode Q20 of resistance R 18, the other end of the c utmost point connecting resistance R140 of triode Q20, the c utmost point of triode Q20 is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K1, K2, K3 respectively, and single-chip microcomputer 13 offers amplifier U1A signal V
Th_DA, amplifier U1A is V
Th_The DA value is added in the corresponding G utmost point of power tube interface after amplifying, and the output terminal of voltage follower U1B connects single-chip microcomputer 15.
Its technical scheme can also comprise: described master control borad also comprises the mutual conductance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described mutual conductance testing circuit, the c utmost point of the c utmost point of triode Q22, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K7, relay K 8, relay K 12 respectively, and single-chip microcomputer 13 is signal V
Gm_DA gives amplifier U4A, the end of connecting resistance R92 drives the grid of measured power pipe after amplifier U4A amplifies, the corresponding DS of power tube interface two ends add the DS bias voltage, and the voltage on the amplifier U4B amplification resistance R 91 is after voltage regulator circuit inputs to single-chip microcomputer 15 signal I
Sgm_AD.
Its technical scheme can also comprise: described master control borad also comprises the input capacitance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given described input capacitance testing circuit relay drive circuit, the c utmost point of triode Q27 in the relay drive circuit, the c utmost point of triode Q24 are succeeded an end of electric apparatus coil, relay coil other end ground connection respectively; The pairing G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K16, relay K 17 respectively; The single-chip microcomputer feed signals is given amplifier U11A, makes the complete conducting of field effect transistor Q16 after amplifier U11A amplifies, and voltage follower U11B outputs signal to single-chip microcomputer 15.
Its technical scheme can also comprise: described function keyboard includes the function button of relevant detection circuit.
Its technical scheme can also comprise: described function keyboard also comprises automatic measuring ability button, can detect each parameter in the relevant detection circuit successively behind the described automatic measuring ability pushbutton enable.
Its technical scheme can also comprise: described display panel is made of simulating signal display screen or digital signal display screen.
The present invention compared with prior art has significant advantage and beneficial effect, is embodied in the following aspects:
1. amplifier tube screening instrument testing efficiency height of the present invention, the degree of accuracy height, because the numerical value of the seven segment digital tubes demonstration parameter of surveying is arranged, and therefore simple and clear, be easy to detect;
2. this platform of function keyboard has been arranged, and flicking is keyboard button once, according to the information that single-chip microcomputer inside institute written program, keyboard button are given, survey numerical value is presented on the charactron, so the present invention is simple to operation;
3. amplifier tube screening instrument good stability of the present invention is not subjected to external environment influence, and antijamming capability is strong, is adapted at workshop and uses;
Since in the circuit among the present invention components and parts few and mostly be straight cutting spare, in case problems such as rosin joint appear in circuit board element, be convenient to maintenance, reduce maintenance cost.
Description of drawings
Fig. 1 is a process flow diagram of the present invention;
Fig. 2 is interface microcontroller figure of the present invention;
Fig. 3 is withstand voltage test circuit figure of the present invention;
Fig. 4 is channel resistance testing circuit figure of the present invention;
Fig. 5 is cut-in voltage testing circuit figure of the present invention;
Fig. 6 is mutual conductance testing circuit figure of the present invention;
Fig. 7 is input capacitance testing circuit figure of the present invention.
Embodiment
Narrate below in conjunction with physical circuit figure given in the accompanying drawing technical scheme of the present invention is described in detail.
Referring to Fig. 1,2,3
Single-chip microcomputer 13 models are ADUC824, are produced by U.S. AD company, as central processing unit of the present invention; Single-chip microcomputer 18 models are TLC5540, by 8 A/D converters of high speed of TIX's release; Single-chip microcomputer 15 models are MC14051B, and production firm is ON SEMICONDUCTOR, can be replaced by CD4051, HC4051, as analogue relay.
Supply voltage required for the present invention is respectively+5V ,+15V, and+20V ,+100V is by linear voltage stabilizing chip conversion.
Relay drive circuit in the described circuit, during normality, single-chip microcomputer 13 output V
Th_S is a high level, makes the Q2 saturation conduction, makes Q3 end, and also for ending, relay is in normally open to Q20.When detecting V
ThThe time, single-chip microcomputer 13 is put V
Th_S is low, makes the Q3 saturation conduction, and Q20 is and then conducting also, make+20V acts on the relay coil relay adhesive.
A kind of amplifier tube screening instrument of the present invention, comprise: power supply, function keyboard, display panel, single-chip microcomputer and master control borad, described power supply is powered to the entire circuit module, single-chip microcomputer 13 outputs signal to described master control borad, described master control borad feed signals is given single-chip microcomputer 15, single-chip microcomputer 15 gives display panel for signal feedback single-chip microcomputer 13 back feed signals, and function keyboard transmits signal and gives single-chip microcomputer 13, and the power tube interface is connected with master control borad; Its technical scheme comprises: described master control borad comprises the withstand voltage test circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described withstand voltage test circuit, the c utmost point of triode Q21 in the driving circuit is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K4, K5, K6 respectively, the end of the other end connecting resistance R64 of relay K 4, the end of the other end connecting resistance R53 of resistance R 64, the other end ground connection of resistance R 53; The end of the other end connecting resistance R53 of relay K 6, the other end ground connection of resistance R 53; Voltage comparator U5A outputs signal to single-chip microcomputer 13, and amplifier U3B amplifies V
Br_Make field effect transistor Q1 conducting behind the prt signal, the end of the G utmost point connecting resistance R65 of field effect transistor Q1, the output terminal of another termination amplifier U3B, the S utmost point ground connection of field effect transistor Q1, the D utmost point connecting resistance R74 of field effect transistor Q1, the end after resistance R 75 parallel connections; By relay drive circuit adhesive K19 ,+100V voltage gives capacitor C 15 chargings by resistance R 50; Voltage follower U3A outputs signal to single-chip microcomputer 15.
Described withstand voltage test circuit principle: at first by relay drive circuit attracting electric relay K4, K5, K6.Attracting electric relay K19 again ,+100V voltage gives capacitor C 15 chargings by resistance R 50.While voltage V
DSAlso will be along with voltage on the capacitor C 15 rise together, can produce I this moment
DSWork as I
DSDuring=250uA, produce low level signal V by voltage comparator U5A
Br_Stp is input to single-chip microcomputer 13.Single-chip microcomputer 13 detects V
Br_When stp is low level, at first gather the V after resistance R 9 and resistance R 77 dividing potential drops
Br_The AD value, the back disconnects relay K 19, puts V again
Br_Prt is high, amplifies by the ratio of amplifier U3B, makes field effect transistor Q1 conducting, finishes the discharge process of electric energy on the capacitor C 15.Disconnect relay K 4, K5, K6 by relay drive circuit at last.(R9+R77)/R77V
Br_The AD value is the withstand voltage of tested metal-oxide-semiconductor.Single-chip microcomputer 13 is presented at charactron to this withstand voltage through calculating the back.
Referring to Fig. 4
Described channel resistance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described channel resistance testing circuit, the c utmost point of the c utmost point of triode Q23, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K10, relay K 11, relay K 12 respectively, and voltage follower U2B makes the complete conducting of measured power pipe, by single-chip microcomputer 13 output signal V
Rm_P, control field effect transistor Q14 after amplifier U2A amplifies, the corresponding DS of power tube interface two ends add+20V voltage, and amplifier U4B amplifies the voltage on the resistance R 91 after voltage regulator circuit forms I
Srm_AD; Amplifier U9A and amplifier U9B amplify V respectively
dAnd V
SAfter voltage regulator circuit is delivered to single-chip microcomputer 15 with signal.
Described channel resistance testing circuit principle: at first by relay drive circuit attracting electric relay K10, K11, K12, U2B constitutes voltage follower, makes the complete conducting of measured tube, then by single-chip microcomputer 13 output V
Rm_P controls field effect transistor Q14 after the ratio of amplifier U2A is amplified, make the I of field effect transistor Q14
DSFor about 10A, the data that detect this moment have three: V
D_AD, V
Sr_AD, V
Srm_AD.After by amplifier U4B the voltage scale on the constantan wire resistance R 91 being amplified, form I through voltage regulator circuit
Srm_AD, by ultra high speed A chip U18 sampling, single-chip microcomputer 13 is worth the corresponding current value I of calculating thus
DSV
dAnd V
SBe the voltage on the tested metal-oxide-semiconductor drain-source utmost point pin root, after amplifier U9A and amplifier U9B amplify in proportion, behind voltage regulator circuit, form V
D_AD and V
Sr_AD by ultra high speed A chip U18 sampling, is transferred to single-chip microcomputer 13.Disconnect relay K 10, K11, K12 by relay drive circuit at last.[V
Sr_AD/ (1+R133/R132)-V
D_AD/ (1+R87/R85)]/I
DSBe the values of channel resistance of tested metal-oxide-semiconductor.Single-chip microcomputer 13 is presented at charactron after calculating.
Referring to Fig. 5
Described cut-in voltage testing circuit, its connected mode is: described single-chip microcomputer 13 is given relay drive circuit in the described cut-in voltage testing circuit, a termination single-chip microcomputer 13 of resistance R 2, the b utmost point of resistance R 2 other ends, capacitor C 45 1 termination triode Q2 signal; The e utmost point of the e utmost point of triode Q2, capacitor C 45 other ends, triode Q3 is ground connection respectively; The end of the c utmost point difference connecting resistance R16 of triode Q2, an end of resistance R 90, the b utmost point of another termination triode Q3 of resistance R 90, an end of an end of the other end of resistance R 16, resistance R 17, an end of resistance R 140, capacitor C 16 connects respectively+20V voltage; The other end of the c utmost point difference connecting resistance R17 of triode Q3, an end of resistance R 18, the b utmost point of another termination triode Q20 of resistance R 18, the other end of the c utmost point connecting resistance R140 of triode Q20, the c utmost point of triode Q20 is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The G utmost point of measured power pipe, the D utmost point, the S utmost point are succeeded the end of electrical equipment K1, K2, K3 respectively, and single-chip microcomputer 13 offers amplifier U1A signal V
Th_DA, amplifier U1A is V
Th_Be added in the G utmost point of measured power pipe after the DA value is amplified, the output terminal of voltage follower U1B connects single-chip microcomputer 15.
Described cut-in voltage testing circuit principle: at first by relay drive circuit attracting electric relay K1, K2, K3, single-chip microcomputer 13 offers operational amplifier U1A, and being begun with 0.1V by 0V is the continually varying V of amplification
Th_The DA value.Amplifier U1A is this V
Th_The DA value is amplified necessarily extraordinarily at tested metal-oxide-semiconductor grid.Until single-chip microcomputer 13 detected V
Th_The AD value reach nominal on the tested metal-oxide-semiconductor specifications reach cut-in voltage the time the drain-source current magnitude of voltage V during with sampling resistor (R76) value on duty
Th_AD.Disconnect relay K 1, K2, K3 by relay drive circuit then.This moment, single-chip microcomputer 13 was presented at charactron to this cut-in voltage value by calculating.
Referring to Fig. 6
Comprise the mutual conductance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described mutual conductance testing circuit, the c utmost point of the c utmost point of triode Q22, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The G utmost point of measured power pipe, the D utmost point, the S utmost point are succeeded electrical equipment K7, relay K 8, relay K 12 respectively, and single-chip microcomputer 13 is signal V
Gm_DA gives amplifier U4A, and the end of connecting resistance R92 drives the grid of measured power pipe after amplifier U4A amplifies, and measured power pipe DS two ends add+20V voltage, and the voltage on the amplifier U4B amplification resistance R 91 is after voltage regulator circuit inputs to single-chip microcomputer 15 signal I
Sgm_AD.
Described mutual conductance testing circuit principle: at first by relay drive circuit attracting electric relay K7, K8, K12.The interim pulse signal V that increases progressively gradually by single-chip microcomputer 13
Gm_DA, U4A is V
Gm_DA amplifies the grid of rear drive measured tube in proportion.Because of 20V has been added in the DS two ends, the drain-source two ends have corresponding pulse high current when on the grid driving voltage being arranged.8 Da Rong value electrochemical capacitors can guarantee pulse high current at this moment in the power module.This electric current forms voltage on constantan wire R91, amplifier U4B amplifies in proportion after the superpotential regulating circuit, by ultra high speed A chip U18 this I that samples
Sgm_AD is transferred to single-chip microcomputer 13, and single-chip microcomputer 13 draws I after calculating
DSV
SBe the voltage on the tested metal-oxide-semiconductor source electrode pin root.Disconnect relay K 7, K8, K12 by relay drive circuit at last.Δ I
DS/ Δ [(1+R56/R85) V
Gm_DA-V
S] be the transconductance value of tested metal-oxide-semiconductor.Single-chip microcomputer 13 is presented at charactron to this transconductance value through calculating the back.
Described input capacitance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given described input capacitance testing circuit relay drive circuit, the c utmost point of triode Q27 in the relay drive circuit, the c utmost point of triode Q24 are succeeded an end of electric apparatus coil, relay coil other end ground connection respectively; The G utmost point of measured power pipe, the D utmost point, the S utmost point are succeeded electrical equipment K16, relay K 17 respectively; The single-chip microcomputer feed signals is given amplifier U11A, makes the complete conducting of field effect transistor Q16 after amplifier U11A amplifies, and voltage follower U11B outputs signal to single-chip microcomputer 15.
Described input capacitance testing circuit principle: at first by relay drive circuit attracting electric relay K16, K17, K12.This moment V
GsBe 5V, it is high putting PNC_ctrl by single-chip microcomputer 13, makes the complete conducting of field effect transistor Q16 after amplifier U11A amplifies in proportion, and the electric charge on the input capacitance is discharged by resistance R 14, and single-chip microcomputer 13 picks up counting this moment.U11B constitutes voltage follower output PNC_AD.Disconnect relay K 16, K17, K12 by relay drive circuit at last.-t/R80ln (PNC_AD/5) value is the input capacitance value.Single-chip microcomputer 13 is presented at charactron through after calculating.
Utilize technical solutions according to the invention, or those skilled in the art designing the similar techniques scheme under the inspiration of technical solution of the present invention, and reach above-mentioned technique effect, all is to fall into protection scope of the present invention.
Claims (8)
1. amplifier tube screening instrument, comprise: power supply, function keyboard, display panel, single-chip microcomputer 13, single-chip microcomputer 15 and master control borad, described power supply is powered to the entire circuit module, single-chip microcomputer 13 outputs signal to described master control borad, described master control borad feed signals is given single-chip microcomputer 15, single-chip microcomputer 15 gives display panel for signal feedback single-chip microcomputer 13 back feed signals, and function keyboard transmits signal and gives single-chip microcomputer 13, and the power tube interface is connected with master control borad; It is characterized in that: described master control borad comprises the withstand voltage test circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described withstand voltage test circuit, the c utmost point of triode Q21 in the driving circuit is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K4, K5, K6 respectively, the end of the other end connecting resistance R64 of relay K 4, the end of the other end connecting resistance R53 of resistance R 64, the other end ground connection of resistance R 53; The end of the other end connecting resistance R53 of relay K 6, the other end ground connection of resistance R 53; Voltage comparator U5A outputs signal to single-chip microcomputer 13, and amplifier U3B amplifies V
Br_Make field effect transistor Q1 conducting behind the prt signal, the end of the G utmost point connecting resistance R65 of field effect transistor Q1, the output terminal of another termination amplifier U3B, the S utmost point ground connection of field effect transistor Q1, the D utmost point connecting resistance R74 of field effect transistor Q1, the end after resistance R 75 parallel connections; By relay drive circuit adhesive K19, the high-voltage power supply output voltage gives capacitor C 15 chargings by resistance R 50; Voltage follower U3A outputs signal to single-chip microcomputer 15.
2. amplifier tube screening instrument as claimed in claim 1, it is characterized in that: described master control borad also comprises the channel resistance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described channel resistance testing circuit, the c utmost point of the c utmost point of triode Q23, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K10, relay K 11, relay K 12 respectively, and voltage follower U2B makes the complete conducting of measured power pipe, by single-chip microcomputer 13 output signal V
Rm_P, control field effect transistor Q14 after amplifier U2A amplifies, the corresponding DS of power tube interface two ends add the DS bias voltage, and amplifier U4B amplifies the voltage on the resistance R 91 after voltage regulator circuit forms I
Srm_AD; Amplifier U9A and amplifier U9B amplify V respectively
dAnd V
SAfter voltage regulator circuit is delivered to single-chip microcomputer 15 with signal.
3. amplifier tube screening instrument as claimed in claim 2, it is characterized in that: described master control borad also comprises the cut-in voltage testing circuit, its connected mode is: described single-chip microcomputer 13 is given relay drive circuit in the described cut-in voltage testing circuit signal, one termination single-chip microcomputer 13 of resistance R 2, the b utmost point of resistance R 2 other ends, capacitor C 45 1 termination triode Q2; The e utmost point of the e utmost point of triode Q2, capacitor C 45 other ends, triode Q3 is ground connection respectively; The end of the c utmost point difference connecting resistance R16 of triode Q2, an end of resistance R 90, the b utmost point of another termination triode Q3 of resistance R 90, an end of an end of the other end of resistance R 16, resistance R 17, an end of resistance R 140, capacitor C 16 connects respectively+20V voltage; The other end of the c utmost point difference connecting resistance R17 of triode Q3, an end of resistance R 18, the b utmost point of another termination triode Q20 of resistance R 18, the other end of the c utmost point connecting resistance R140 of triode Q20, the c utmost point of triode Q20 is succeeded an end of electric apparatus coil respectively, the other end ground connection of relay coil; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded the end of electrical equipment K1, K2, K3 respectively, and single-chip microcomputer 13 offers amplifier U1A signal V
Th_DA, amplifier U1A is V
Th_The DA value is added in the corresponding G utmost point of power tube interface after amplifying, and the output terminal of voltage follower U1B connects single-chip microcomputer 15.
4. amplifier tube screening instrument as claimed in claim 3, it is characterized in that: described master control borad also comprises the mutual conductance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given the relay drive circuit in the described mutual conductance testing circuit, the c utmost point of the c utmost point of triode Q22, triode Q24 is succeeded an end of electric apparatus coil respectively in the relay drive circuit, relay coil other end ground connection; The corresponding G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K7, relay K 8, relay K 12 respectively, and single-chip microcomputer 13 is signal V
Gm_DA gives amplifier U4A, the end of connecting resistance R92 drives the grid of measured power pipe after amplifier U4A amplifies, the corresponding DS of power tube interface two ends add the DS bias voltage, and the voltage on the amplifier U4B amplification resistance R 91 is after voltage regulator circuit inputs to single-chip microcomputer 15 signal I
Sgm_AD.
5. amplifier tube screening instrument as claimed in claim 4, it is characterized in that: described master control borad also comprises the input capacitance testing circuit, its connected mode is: single-chip microcomputer 13 input signals are given described input capacitance testing circuit relay drive circuit, the c utmost point of triode Q27 in the relay drive circuit, the c utmost point of triode Q24 are succeeded an end of electric apparatus coil, relay coil other end ground connection respectively; The pairing G utmost point of power tube interface, the D utmost point, the S utmost point are succeeded electrical equipment K16, relay K 17 respectively; The single-chip microcomputer feed signals is given amplifier U11A, makes the complete conducting of field effect transistor Q16 after amplifier U11A amplifies, and voltage follower U11B outputs signal to single-chip microcomputer 15.
6. as claim 1 to 5 kind of any described amplifier tube screening instrument, it is characterized in that: described function keyboard includes the function button of relevant detection circuit.
7. amplifier tube screening instrument as claimed in claim 6 is characterized in that: described function keyboard also comprises automatic measuring ability button, can detect each parameter in the relevant detection circuit successively behind the described automatic measuring ability pushbutton enable.
8. amplifier tube screening instrument as claimed in claim 7 is characterized in that: described display panel is made of simulating signal display screen or digital signal display screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710059980 CN101419268A (en) | 2007-10-23 | 2007-10-23 | Amplifier tube screening instrument |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710059980 CN101419268A (en) | 2007-10-23 | 2007-10-23 | Amplifier tube screening instrument |
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| CN101419268A true CN101419268A (en) | 2009-04-29 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104280675A (en) * | 2013-07-12 | 2015-01-14 | 上海宏测半导体科技有限公司 | Multi-SITE parallel test method |
| CN108054792A (en) * | 2017-12-04 | 2018-05-18 | 广东美的制冷设备有限公司 | Power tube power supply circuit and power tube test device |
| CN111220890A (en) * | 2020-01-16 | 2020-06-02 | 河北工业大学 | Parameter characteristic detection device of power semiconductor device |
-
2007
- 2007-10-23 CN CN 200710059980 patent/CN101419268A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104280675A (en) * | 2013-07-12 | 2015-01-14 | 上海宏测半导体科技有限公司 | Multi-SITE parallel test method |
| CN104280675B (en) * | 2013-07-12 | 2017-02-08 | 上海宏测半导体科技有限公司 | Multi-SITE parallel test method |
| CN108054792A (en) * | 2017-12-04 | 2018-05-18 | 广东美的制冷设备有限公司 | Power tube power supply circuit and power tube test device |
| CN108054792B (en) * | 2017-12-04 | 2022-03-22 | 广东美的制冷设备有限公司 | Power tube power supply circuit and power tube testing device |
| CN111220890A (en) * | 2020-01-16 | 2020-06-02 | 河北工业大学 | Parameter characteristic detection device of power semiconductor device |
| CN111220890B (en) * | 2020-01-16 | 2022-05-27 | 河北工业大学 | Parameter characteristic detection device of power semiconductor device |
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