CN101419261A - High resolution multimedia interface test system - Google Patents

High resolution multimedia interface test system Download PDF

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Publication number
CN101419261A
CN101419261A CNA2007102021892A CN200710202189A CN101419261A CN 101419261 A CN101419261 A CN 101419261A CN A2007102021892 A CNA2007102021892 A CN A2007102021892A CN 200710202189 A CN200710202189 A CN 200710202189A CN 101419261 A CN101419261 A CN 101419261A
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China
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oscillograph
power supply
unit
high resolution
supply unit
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CNA2007102021892A
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CN101419261B (en
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陈爱民
郭国富
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Priority to CN2007102021892A priority Critical patent/CN101419261B/en
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Abstract

The invention provides an HDMI test system, which comprises an object to be tested, a test fixture, an oscillograph probe rod and an oscillograph, wherein the object to be tested comprises at least one HDMI interface, the oscillograph probe rod is connected with the HDMI interface through the test fixture and is further connected with the oscillograph; and the oscillograph probe rod is used for acquiring output signals of the HDMI interface through the test fixture and transmits the output signals to the oscillograph to carry out signal analysis. The inside of the oscillograph comprises a power supply device which is used for providing a power supply for an internal circuit of the oscillograph; and the inside of the oscillogrpah also comprises a power supply leading out unit which is used for leading out the power supply provided by the power supply unit to the outside of the oscillogrpah and outputting to the test fixture through the oscillograph probe rob and is used as a pull-up power supply of the output signals of the HDMI interface. The HDMI test system has the advantages that the HDMI test system can reduce the HDMI test cost and reduce the signal interference in the HDMI test process.

Description

High resolution multimedia interface test system
Technical field
The present invention relates to a kind of interface test system, especially a kind of high resolution multimedia interface (High-DefinitionMultimedia Interface, HDMI) test macro.
Background technology
In personal computer and all kinds of consumer electronics field, therefore the equipment of band HDMI interface, more and more be subjected to users' favor owing to can support audio transmission can support video transmission again.
In the past, to the common test macro that adopts as shown in Figure 1 of the test of HDMI interface.Consult shown in Figure 1ly, this test macro comprises: determinand 1, measurement jig 2, DC power supply 3, oscillograph probe 4 and oscillograph 5.Described determinand 1 comprises HDMI 10.
In above-mentioned test macro, described oscillograph probe 4 is by TMDS (the Transition Minimized Differential Signaling of measurement jig 2 with 10 outputs of HDMI interface, transition minimized differential signaling) digital signal and TMDS clock signal are drawn, and by DC power supply 3 output+the 3.3V direct supply as on draw voltage, catch described TMDS digital signal and TMDS clock signal, the TMDS digital signal of catching and TMDS clock signal are sent to carry out signal analysis in the oscillograph 5.
According to above-mentioned test macro HDMI 10 is carried out signal testing and following problem can occur:
One, testing apparatus is many, the testing cost height.Except the tested determinand that has HDMI 10 1, also need measurement jig 2, oscillograph 5, oscillograph probe 4 and external DC power supply 3, and the price of a DC power supply 3 wherein is with regard to needs several ten thousand even hundreds of thousands.
Two, the overshoot of test signal/owe towards undesirable.Owing to use external DC power supply 3 to provide+the 3.3V power supply, cause the signal mutual interference and produce noise mutually between DC power supply 3 and the oscillograph 5 easily.In order to eliminate above-mentioned noise, need further to be equipped with the respond well equipment of shielding noise, therefore, more increased testing cost.
Summary of the invention
In view of above content, be necessary to propose a kind of HDMI interface test system, it can reduce the testing cost of HDMI, and reduces the signal in the HDMI test process is disturbed.
A kind of high resolution multimedia interface test system, this system comprises measurement jig, oscillograph probe and oscillograph.Described measurement jig links to each other with a determinand, and described high resolution multimedia interface is installed on this determinand.Described oscillograph probe links to each other with described oscillograph and is connected described high resolution multimedia interface by measurement jig.This oscillograph probe is used for catching by measurement jig the output signal of described high resolution multimedia interface, and the output signal of catching is sent in the oscillograph to carry out signal analysis.Comprise in the described oscillograph that supply unit and power supply draw the unit.Described supply unit is used to provide power supply to oscillographic internal circuit.Described power supply is drawn the unit and is comprised two circuitry lines, be connected to respectively between the both positive and negative polarity and oscillograph probe of supply unit, be used for the power supply that supply unit provides is drawn out to outside the oscillograph, and export on the measurement jig by the oscillograph probe, as drawing power supply on the output signal of high resolution multimedia interface.
HDMI interface test system provided by the present invention is with the direct supply output of oscillograph inside, do not need to buy and be used to provide the external dc power that draws voltage supply, provide cost savings, and also eliminated owing to use the external dc power supply effectively and the signal that produces between oscillograph interference.
Description of drawings
Fig. 1 is traditional system architecture diagram that the HDMI interface is tested.
Fig. 2 is the system architecture diagram of HDMI interface test system of the present invention preferred embodiment.
Fig. 3 is second kind of realization circuit diagram that power supply in the oscillograph is drawn the unit in the HDMI interface test system of the present invention.
Embodiment
Consulting shown in Figure 2ly, is the system architecture diagram of HDMI interface test system of the present invention preferred embodiment.This HDMI interface test system comprises: determinand 1, measurement jig 2, oscillograph probe 4 and oscillograph 5.
Wherein, described determinand 1 can be desktop computer, notebook computer, reach electronic products such as CATV set-top-box, it provides at least one HDMI interface 10, is used to export output signal to be tested, and described output signal comprises TMDS digital signal and TMDS clock signal.
Described measurement jig 2 comprises a HDMI socket, is used to connect described HDMI interface 10, and TMDS digital signal and TMDS clock signal that HDMI interface 10 is exported are incorporated on the wiring board of measurement jig 2.Measurement jig 2 also comprises a SMA (SubMiniature version A, the A version is mini) coaxial socket, be used to connect oscillograph probe 4, TMDS digital signal and the TMDS clock signal that is incorporated on the wiring board of measurement jig 2 is drawn out on the oscillograph probe 4.
Described oscillograph probe 4 comprises a SMA coaxial interface, and the coaxial socket of its SMA with above-mentioned measurement jig 2 is connected, to catch described TMDS digital signal and TMDS clock signal.Described oscillograph probe 4 also comprises the oscillograph interface of a standard, is used to connect oscillograph 5, and above-mentioned TMDS digital signal of catching and TMDS clock signal are coupled on the oscillograph 5.
Described oscillograph 5 is used for above-mentioned TMDS digital signal and TMDS clock signal are carried out analytical test.Comprise in this oscillograph 5 that a supply unit 6 and a power supply draw unit 7.
Described supply unit 6 is used to provide the internal circuit of power supply to oscillograph 5.Described power supply is drawn unit 7 and is comprised two circuitry lines, be connected to respectively between the both positive and negative polarity and oscillograph probe of supply unit, be used for the power supply that supply unit 6 provides is drawn out to outside the oscillograph 5, export measurement jig 2 to as drawing power supply on described TMDS digital signal and the TMDS clock signal, so that oscillograph probe 4 is caught this TMDS digital signal and TMDS clock signal by oscillograph probe 4.
For eliminate supply unit 6 that provide, be drawn out to the noise signal in the power supply outside the oscillograph 5; and for the purpose of protecting oscillograph 5; described power supply is drawn unit 7 can comprise a fuse 71; its series connection is on the positive pole of supply unit 6, and the minus earth of described supply unit 6 also is connected on the oscillograph probe 4.Described fuse 71 is used to prevent wait the power supply of other external units to flow into the internal circuit of oscillograph 5 owing to maloperation makes determinand 1, thereby causes that power supply short circuit damages oscillograph 5.Described power supply is drawn unit 7 can also comprise a gauge tap 70, it is connected in series between fuse 71 and the oscillograph probe 4, be used in the time the power supply that supply unit 6 provides need being drawn out to outside the oscillograph 5, this gauge tap 70 is in closure state, and when not needing to be drawn out to the power supply that supply unit 6 provides outside the oscillograph 5, this gauge tap 70 is in off-state.
In addition, described power supply is drawn unit 7 and can also be comprised positive pole and electrochemical capacitor C1 between the negative pole and the ceramic disc capacitor C2 that is connected in parallel in supply unit 6.The positive pole of electrochemical capacitor C1 wherein links to each other with the positive pole of power supply unit 6, and the negative pole of electrochemical capacitor C1 links to each other with the negative pole of power supply unit 6, is used to filter the low frequency clutter that the circuit of supply unit 6 causes; And described ceramic disc capacitor C2 is used to filter because the high frequency clutter that circuit-line is long or oscillograph 5 interior other channel radiations are come.
Further, described power supply is drawn unit 7 and also can be utilized second kind shown in Figure 3 to implement circuit diagram and realize.As shown in Figure 3, this power supply is drawn unit 7 and comprised: an inductor 72 is connected in series between the positive pole and fuse 71 of supply unit 6, is used to filter the low frequency clutter that the circuit of supply unit 6 causes; And ceramic disc capacitor C2, be connected in parallel between the positive pole and negative pole of supply unit 6, be used to filter high frequency clutter long owing to circuit-line or that oscillograph 5 interior other channel radiations are come, and gauge tap 70, be connected in series between fuse 71 and the oscillograph probe 4.
Further, in order to prevent to wait the power supply of other external units to flow into the internal circuit of oscillograph 5 owing to maloperation makes determinand 1, cause that thereby power supply short circuit damages oscillograph 5, fuse 71 among described Fig. 2 and Fig. 3 also can replace with a diode with unidirectional conducting function, wherein, the positive pole of diode is connected with the positive pole of supply unit 6, and the negative pole of diode directly links to each other with oscillograph probe 4, and perhaps the negative pole of diode passes through gauge tap 70 link to each other with oscillograph probe 4 (not shown).
Here need to prove, no matter draw gauge tap 70 included in the enforcement circuit diagram of unit 7 at power supply shown in Figure 2, fuse 71, electrochemical capacitor C1 and ceramic disc capacitor C2, still draw second kind of unit 7 at power supply shown in Figure 3 and realize included gauge tap 70 in the circuit diagram, fuse 71, inductor 72 and ceramic disc capacitor C2, perhaps above-mentioned replaces to diode with the fuse among Fig. 2 and Fig. 3 71, all said elements all not necessarily are included in power supply and draw in the enforcement circuit of unit 7, be that power supply shown in Figure 2 is drawn in the enforcement circuit diagram of unit 7 and must do not comprised gauge tap 70, fuse 71, four elements of electrochemical capacitor C1 and ceramic disc capacitor C2, it can include only certain or certain several elements wherein according to user's demand, in like manner, power supply shown in Figure 3 is drawn second kind of unit 7 and is realized also must not comprising gauge tap 70 in the circuit diagram, fuse 71, four elements of inductor 72 and ceramic disc capacitor C2, it can include only certain or certain several elements wherein according to user's demand.
HDMI interface test system provided by the present invention can be with the direct supply output of oscillograph inside, do not need extra the purchase to be used to provide the external dc power that draws voltage supply, provide cost savings, and also eliminated owing to use the external dc power supply effectively and the signal that produces between oscillograph interference.Further, the present invention is totally independent of traditional hardware circuit in the oscillograph to oscillographic improvement, can not produce any influence to the original performance of oscillograph, and need not to change the existing software application environment of oscillograph, just can control the output of oscillographic direct supply, design is got up simple and convenient.
It should be noted last that, more than consult preferred embodiment and characteristic thereof and be shown specifically and described the present invention.Yet, those skilled in the art should be understood that, under the condition of the spirit and scope of the present invention that do not break away from the claims proposition, can make various changes and modification in form and details, wherein, except offering some clarification on, more than be not to be meant " one or unique one " with the element of singular reference, and can be " one or more ".Any variation according to spirit of the present invention is done all should be included within the protection domain of the presently claimed invention.

Claims (7)

  1. [claim 1] a kind of high resolution multimedia interface test system, this system comprises measurement jig, oscillograph probe and oscillograph, described measurement jig links to each other with a determinand, described high resolution multimedia interface is installed on this determinand, described oscillograph probe links to each other with described oscillograph and is connected described high resolution multimedia interface by measurement jig, this oscillograph probe is used for catching by measurement jig the output signal of described high resolution multimedia interface, and the output signal of catching is sent in the oscillograph to carry out signal analysis, comprise supply unit in the described oscillograph, this supply unit is used to provide power supply to oscillographic internal circuit, it is characterized in that, also comprise in the described oscillograph:
    Power supply is drawn the unit, it comprises two circuitry lines, be connected to respectively between the both positive and negative polarity and oscillograph probe of supply unit, be used for the power supply that supply unit provides is drawn out to outside the oscillograph, and export on the measurement jig by the oscillograph probe, as drawing power supply on the output signal of high resolution multimedia interface.
  2. [claim 2] high resolution multimedia interface test system as claimed in claim 1 is characterized in that, described power supply is drawn the unit and also comprised:
    Fuse and/or gauge tap, described fuse and/or gauge tap are connected in series between the anodal and described oscillograph probe of supply unit.
  3. [claim 3] high resolution multimedia interface test system as claimed in claim 1 or 2 is characterized in that, described power supply is drawn the unit and also comprised:
    Electrochemical capacitor C1 and ceramic disc capacitor C2, described electrochemical capacitor C1 and ceramic disc capacitor C2 are connected in parallel between the positive pole and negative pole of supply unit, and wherein the positive pole of electrochemical capacitor C1 is connected with the positive pole of supply unit, and its negative pole is connected with the negative pole of supply unit.
  4. [claim 4] high resolution multimedia interface test system as claimed in claim 2 is characterized in that, described power supply is drawn the unit and also comprised:
    Inductor and ceramic disc capacitor C2, described ceramic disc capacitor C2 are connected between the positive pole and negative pole of supply unit, and described inductor is connected in series in the supply unit positive pole and connects described oscillograph probe by fuse and/or gauge tap.
  5. [claim 5] high resolution multimedia interface test system as claimed in claim 1 is characterized in that, described power supply is drawn the unit and also comprised:
    Inductor and ceramic disc capacitor C2, described ceramic disc capacitor C2 are connected between the positive pole and negative pole of supply unit, and described inductor is connected in series between supply unit positive pole and the oscillograph probe.
  6. [claim 6] high resolution multimedia interface test system as claimed in claim 5 is characterized in that, described power supply is drawn the unit and also comprised:
    Diode, the positive pole of described diode is connected with the positive pole of supply unit by inductor, and the negative pole of diode links to each other with the oscillograph probe.
  7. [claim 7] high resolution multimedia interface test system as claimed in claim 6 is characterized in that, described power supply is drawn the unit and also comprised:
    Gauge tap is connected with described diode, is connected between described diode and the oscillograph probe.
CN2007102021892A 2007-10-22 2007-10-22 High resolution multimedia interface test system Expired - Fee Related CN101419261B (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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CN101419261A true CN101419261A (en) 2009-04-29
CN101419261B CN101419261B (en) 2011-08-24

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102169154A (en) * 2011-01-13 2011-08-31 深圳创维-Rgb电子有限公司 A method and a device for testing an HDMI
CN102685542A (en) * 2011-03-09 2012-09-19 鸿富锦精密工业(深圳)有限公司 High definition multimedia interface testing system and method
CN103024435A (en) * 2012-12-21 2013-04-03 深圳Tcl新技术有限公司 HDMI (high-definition multimedia interface) interface detection device and method and HDMI interface system
CN105891559A (en) * 2016-06-24 2016-08-24 福建联迪商用设备有限公司 HDMI (high definition multimedia interface) high-speed signal testing clamp and testing method
CN106249004A (en) * 2016-08-29 2016-12-21 福建联迪商用设备有限公司 HDMI active termination test fixture and method of testing
CN106484573A (en) * 2015-09-02 2017-03-08 仁宝电脑工业股份有限公司 High-definition multi-media interface test system and its method of testing
CN108008285A (en) * 2017-12-04 2018-05-08 丰顺县培英电声有限公司 A kind of vehicle multimedia system test device and its method
CN108353162A (en) * 2016-02-15 2018-07-31 斯坦伦电子(国际)有限责任公司 High-definition multimedia interface tests system
CN112433074A (en) * 2020-11-20 2021-03-02 苏州浪潮智能科技有限公司 Multifunctional connecting device of oscilloscope and connecting method thereof
CN113358957A (en) * 2021-06-03 2021-09-07 深圳市海创嘉科技有限公司 HDMI active terminal test equipment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100490154B1 (en) * 2002-04-13 2005-05-16 엘지전자 주식회사 DTV Test Stream Generator
JP2006332094A (en) * 2005-05-23 2006-12-07 Seiko Epson Corp Process for producing electronic substrate, process for manufacturing semiconductor device and process for manufacturing electronic apparatus
CN2914103Y (en) * 2006-07-11 2007-06-20 杭州华为三康技术有限公司 Portable testing apparatus

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102169154B (en) * 2011-01-13 2013-02-06 深圳创维-Rgb电子有限公司 A method and a device for testing an HDMI
CN102169154A (en) * 2011-01-13 2011-08-31 深圳创维-Rgb电子有限公司 A method and a device for testing an HDMI
CN102685542A (en) * 2011-03-09 2012-09-19 鸿富锦精密工业(深圳)有限公司 High definition multimedia interface testing system and method
CN102685542B (en) * 2011-03-09 2015-06-24 鸿富锦精密工业(深圳)有限公司 High definition multimedia interface testing system and method
TWI510789B (en) * 2011-03-09 2015-12-01 Hon Hai Prec Ind Co Ltd System and method for testing a high-definition multimedia interface
CN103024435A (en) * 2012-12-21 2013-04-03 深圳Tcl新技术有限公司 HDMI (high-definition multimedia interface) interface detection device and method and HDMI interface system
CN103024435B (en) * 2012-12-21 2015-09-30 深圳Tcl新技术有限公司 HDMI checkout gear, detection method and HDMI system
CN106484573A (en) * 2015-09-02 2017-03-08 仁宝电脑工业股份有限公司 High-definition multi-media interface test system and its method of testing
CN108353162A (en) * 2016-02-15 2018-07-31 斯坦伦电子(国际)有限责任公司 High-definition multimedia interface tests system
CN105891559A (en) * 2016-06-24 2016-08-24 福建联迪商用设备有限公司 HDMI (high definition multimedia interface) high-speed signal testing clamp and testing method
CN105891559B (en) * 2016-06-24 2019-04-30 福建联迪商用设备有限公司 HDMI high speed signal test fixture and test method
CN106249004A (en) * 2016-08-29 2016-12-21 福建联迪商用设备有限公司 HDMI active termination test fixture and method of testing
CN106249004B (en) * 2016-08-29 2018-10-23 福建联迪商用设备有限公司 The active termination test fixtures of HDMI and test method
CN108008285A (en) * 2017-12-04 2018-05-08 丰顺县培英电声有限公司 A kind of vehicle multimedia system test device and its method
CN112433074A (en) * 2020-11-20 2021-03-02 苏州浪潮智能科技有限公司 Multifunctional connecting device of oscilloscope and connecting method thereof
CN112433074B (en) * 2020-11-20 2022-11-29 苏州浪潮智能科技有限公司 Multifunctional connecting device of oscilloscope and connecting method thereof
CN113358957A (en) * 2021-06-03 2021-09-07 深圳市海创嘉科技有限公司 HDMI active terminal test equipment

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