CN101413980B - Automatic test method and automatic test device thereof - Google Patents
Automatic test method and automatic test device thereof Download PDFInfo
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- CN101413980B CN101413980B CN2007101640772A CN200710164077A CN101413980B CN 101413980 B CN101413980 B CN 101413980B CN 2007101640772 A CN2007101640772 A CN 2007101640772A CN 200710164077 A CN200710164077 A CN 200710164077A CN 101413980 B CN101413980 B CN 101413980B
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- impact damper
- button
- impact
- electronic installation
- dampers
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Abstract
The invention relates to an automatic test method for an automatic test device for testing a plurality of keys of an electronic device. The method comprises the following steps: a control signal is transmitted to conduct a first buffer and a second buffer; a first test signal is transmitted to the electronic device by the first buffer; a second test signal is transmitted to the electronic device by the second buffer; a normal signal is output by the electronic device to represent the normal action of a plurality of keys; and the circuit breaking is carried out on the first buffer and the second buffer.
Description
Technical field
The present invention relates to a kind of automatic testing equipment and method, particularly relate to a kind of proving installation and method of utilizing the key arrangement mode to test.
Background technology
Along with the progress of science and technology, the demand of the production of electronic installation and use also increases day by day now.Because the function of electronic installation is numerous and diverse gradually, makes that number of keys is also various day by day on electronic installation.Generally speaking, all want on the production line earlier the button of half-finished electronic installation to be tested with definite each button can both operate normally.But whether in the middle of prior art, if the button of wanting testing electronic devices in testing process whether can both normal running, normally utilize artificial or the mode of machine, go one by one to test button, then going to observe it again has normal signal generation.Thus, average button of an about aptitude test in second.If this electronic installation has 16 buttons, the time of test just approximately will be spent about 16 seconds.For the testing process on general production line, very labor intensive and time.
Therefore need a kind of new proving installation of invention and method to solve the problem that prior art was produced.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of automatic testing equipment, with the effect of the button that reaches quick testing electronic devices.
Another fundamental purpose of the present invention is to provide a kind of automatic test approach of a plurality of buttons of automatic testing equipment testing electronic devices.
For reaching above-mentioned purpose, automatic testing equipment of the present invention comprises microcontroller chip and button connecting circuit.The microcontroller chip has the function of coding, can edit different testing processs.The button connecting circuit comprises a plurality of impact dampers.Microcontroller chip and button connecting circuit electrically connect, and are used for controlling a plurality of impact dampers in the button connecting circuit.A plurality of impact dampers again with electronic installation in a plurality of buttons electrically connect.
Automatic test approach of the present invention is: transmit a control signal with the conducting first vertical impact damper and first horizontal buffer; Transmit one first test signal to this electronic installation by first vertical impact damper; Transmit one second test signal to this electronic installation by this second impact damper; Export a normal signal with these a plurality of button effects of representative normal (functionally normal) by this electronic installation; And this first impact damper and this second impact damper are opened circuit.
Description of drawings
Fig. 1 is the connection diagram of an automatic testing equipment of the present invention and an electronic installation.
Fig. 2 is the process flow diagram of automatic test approach of the present invention.
The primary clustering symbol description:
Second vertical impact damper 31b the 3rd vertical impact damper 31c
The 4th vertical impact damper 31d first horizontal buffer 32a
The second horizontal buffer 32b the 3rd horizontal buffer 32c
The 4th horizontal buffer 32d electronic installation 90
The capable lead C1～C4 of a plurality of button B1～B16
Column wire R1～R4
Embodiment
For above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, cited below particularlyly go out specific embodiments of the invention, and cooperate appended accompanying drawing, be described in detail below.
Please refer to Fig. 1, Fig. 1 is the connection diagram of an automatic testing equipment of the present invention and an electronic installation.
As shown in Figure 1, automatic testing equipment of the present invention 10 electrically connects with electronic installation 90, and this automatic testing equipment 10 is provided with a microcontroller chip 20 and a button connecting circuit 30, and whether be used in the testing electronic devices 90 a plurality of button effects normal.And electronic installation 90 to be measured has a plurality of buttons, intelligent mobile phone for example, but the present invention is not as limit.
Wherein a plurality of button of electronic installation 90 is the circuit form of keyboard matrix (Keyboard Matrix).Keyboard matrix is to be staggered and to be formed by be expert at lead and column wire of button setting, each row lead and the column wire corresponding button of part that interlocks.For example in the present embodiment, electronic installation 90 is for having the electronic installation of 16 button B1～B16, and just capable lead C1～C4 and the column wire R1～R4 by keyboard matrix is staggered to a plurality of button B1～B16.Be noted that 10 electronic installations 90 that can test of automatic testing equipment of the present invention do not exceed with above-mentioned number of keys and arrangement mode.
This microcontroller chip 20 electrically connects with this button connecting circuit 30.Microcontroller chip 20 can be one 8051 chips, but the present invention is not as limit.Microcontroller chip 20 has the function of coding, can carry out different process encodings according to different testing processs, and can be optimized processing, allows testing process that the shortest execution time is arranged.Button connecting circuit 30 has comprised a plurality of impact dampers, and in the present embodiment, button connecting circuit 30 can comprise first vertical impact damper 31a to the four vertical impact damper 31d and the first horizontal buffer 32a to the, the four horizontal buffer 32d.A plurality of vertical impact dampers and a plurality of horizontal buffer electrically connect mutually each other.The quantity of impact damper can change according to the quantity and the arrangement mode of button.Microcontroller chip 20 electrically connects with button connecting circuit 30, is used for controlling a plurality of impact dampers in the button connecting circuit 30.A plurality of impact dampers again with electronic installation 90 in a plurality of buttons electrically connect.
Each vertical impact damper all is connected with column wire with the row lead respectively with horizontal buffer.For example in the present embodiment, first vertical impact damper 31a is connected with B13, B9, B5 and the B1 of the capable lead C1 of keyboard matrix, and the first horizontal buffer 32a is connected with B1, B2, B3 and the B4 of the column wire R1 of keyboard matrix.
Moreover B14, B10, B6 and B2 on second vertical impact damper 31b and the row lead C2 connect; B5, B6, B7 and B8 on the second horizontal buffer 32b and the column wire R2 connect; Moreover B15, B11, B7 and B3 on the 3rd vertical impact damper 31C and the row lead C3 connect; B9, B10, B11 and B12 on the 3rd horizontal buffer 32C and the column wire R3 connect; Again, B16, B12, B8 and the B4 on the 4th vertical impact damper 31d and the row lead C4 connects; And B13, B14, B15 and B16 on the 4th horizontal buffer 32d and the column wire R4 connect.
Moreover whether microcontroller chip 20 just can normal to test a plurality of button effects by a plurality of impact dampers of control.
Next please refer to Fig. 2, about the process flow diagram of automatic test approach of the present invention.Be noted that, below for convenience of explanation, be to be that example illustrates automatic test approach of the present invention with electronic installation 90, but the present invention is not as limit with automatic testing equipment shown in Figure 1 10.
The present invention at first carry out step 201: the microcontroller chip is encoded to carry out follow-up testing process.
At first, earlier microcontroller chip 20 to be encoded.The user writes testing process at the electronic installation 90 that will test earlier.And, also need to cooperate the quantity of button and the arrangement mode of its keyboard matrix to come testing process is optimized processing for the shortest processing time will be arranged.After testing process is determined, just begin to carry out this testing process, promptly carry out step 202.
Step 202: transmit control signal with vertical impact damper of conducting and horizontal buffer by the microcontroller chip.
In step 202, the present invention can transmit a control signal to button connecting circuit 30 earlier by microcontroller chip 20, this control signal makes this vertical impact damper and this horizontal buffer be transmitted signal in order to allow one of them vertical impact damper and a horizontal buffer conducting.Be to be that example describes in the present embodiment with first test button B1 and the capable lead C1 and the column wire R1 that are staggered into button B1.Microcontroller chip 20 makes the first vertical impact damper 31a and the first horizontal buffer 32a conducting earlier.
Be noted that the present invention is not exceeded in above-mentioned mode.In step 202, also can allow first vertical impact damper 31a and the 3rd horizontal buffer 32c conducting with test button B9 and be staggered into capable lead C1 and the column wire R3 of button B9.
Then carry out step 203: transmit one first test signal to electronic installation by this vertical impact damper.
When the first vertical impact damper 31a conducting, microcontroller chip 20 can transmit the capable lead C1 that one first test signal arrives electronic installation 90 via first vertical impact damper 31a.
And carry out step 204 simultaneously: transmit one second test signal to electronic installation by this horizontal buffer.
When the first horizontal buffer 32a conducting, microcontroller chip 20 also can transmit the column wire R1 of one second test signal to electronic installation 90 simultaneously via the first horizontal buffer 32a.
Under the normal situation of this button B1 effect, when the capable lead C1 of electronic installation 90 is transfused to first test signal in step 203, and column wire R1 just is equivalent to the B1 that pushes button when being transfused to second test signal in step 204.Go again to judge then whether button B1 has output one normal signal on a screen or other display device (figure does not show).
If electronic installation 90 has the described normal signal of output, the effect of just representing the circuit of the relative keyboard matrix of button B1 all is normal.In other words, by first vertical impact damper 31a row lead C1 is imported first test signal, and column wire R1 is imported the mode of second test signal by the first horizontal buffer 32a, just can determine whether row lead C1 is normal with the button B1 that column wire R1 interlocks.And determine further whether row lead C1 normally all is connected with column wire R1 in keyboard matrix.If button B1 has the normal signal of output, just carry out step 205.
If electronic installation 90 do not export a normal signal, promptly represent button B1 or be staggered into the capable lead C1 of button B1 and column wire R1 in have circuit contacts undesired.May be short circuit is arranged, to open circuit or the situation of loose contact produces, the lead C1 that for example goes be shorted to another row lead C2 or be shorted to ground.Automatic testing equipment 10 just can directly stop testing process thus, checks that further which or a plurality of button effect are arranged in the electronic installation 90 is undesired.
If button B1 has the normal signal of output, just carry out step 205 again: this vertical impact damper and this horizontal buffer are opened circuit.
The microcontroller chip just sends control signal so that the first vertical impact damper 31a and the first horizontal buffer 32a open circuit 20 this moments, just reverts to initial not conducting state.
Then carry out step 206: judge whether testing process finishes.
Microcontroller chip 20 can judge whether its testing process finishes, and judges whether promptly that all a plurality of buttons are tested all to finish.If testing process also is not finished, just returns step 202 and remove to control other vertical impact damper and horizontal buffer, to test other button.If testing process is finished, just finish this testing process.
Thus, promptly can not need all buttons in the electronic installation 90 all just can be tested all buttons by crossing one by one by automatic testing equipment 10 of the present invention and automatic test approach.With regard to present embodiment, automatic testing equipment 10 is just tested button B1, button B6, button B11 and button B16 as long as carry out four tests, just can test capable lead C1～C4 and column wire R1～R4 to finish this testing process.And whether the button of learning electronic installation 90 immediately is normal, and institute's spended time is in 4 seconds.Compared in the prior art, if electronic installation 90 has 16 buttons just must will spend about 16 seconds.Therefore can be learnt by above-mentioned explanation utilizes apparatus and method of the present invention to save many manpowers and time in the test time.
To sum up institute is old, and no matter the present invention everywhere all shows it totally different in the feature of known technology with regard to purpose, means and effect, earnestly asks your juror to perceive, and grants quasi patent early, makes Jiahui society, and the true feeling moral just.Only it should be noted that above-mentioned many embodiment give an example for convenience of explanation, the present invention's interest field required for protection should be as the criterion so that claims scope is described naturally, but not only limits to the foregoing description.
Claims (8)
1. automatic testing equipment, in order to test a plurality of buttons of an electronic installation, described a plurality of buttons are the circuit form of a keyboard matrix, described automatic testing equipment comprises:
One microcontroller chip; And
One button connecting circuit, described button connecting circuit and described microcontroller chip and described electronic installation electrically connect, and described button connecting circuit comprises:
A plurality of first impact dampers, described a plurality of first impact dampers electrically connect with the capable lead of described keyboard matrix respectively; And
A plurality of second impact dampers, described a plurality of second impact dampers electrically connect with the column wire of described keyboard matrix respectively, and described microcontroller chip is in order to control described button connecting circuit to reach following mechanism:
Transmit a control signal with one first impact damper in corresponding a plurality of first impact dampers of a button in difference conducting and the described a plurality of button and one second impact damper in a plurality of second impact damper;
Transmit one first test signal to described electronic installation by one first impact damper in described a plurality of first impact dampers;
Transmit one second test signal to described electronic installation by one second impact damper in described a plurality of second impact dampers;
Export a normal signal to represent the described button effect in described a plurality of button normal by described electronic installation; And
One first impact damper in described a plurality of first impact damper and one second impact damper in described a plurality of second impact damper are opened circuit.
2. automatic testing equipment as claimed in claim 1, wherein said a plurality of first impact dampers are vertical impact damper.
3. automatic testing equipment as claimed in claim 2, wherein said a plurality of second impact dampers are horizontal buffer.
4. automatic testing equipment as claimed in claim 1, wherein said a plurality of first impact dampers and described a plurality of second impact damper are electrically connected to each other.
5. automatic testing equipment as claimed in claim 1, wherein said microcontroller chip can be carried out an encoding function, in order to optimally to control described button connecting circuit.
6. automatic test method, be used for an automatic testing equipment to test a plurality of buttons of an electronic installation, described a plurality of button is the circuit form of a keyboard matrix, described automatic testing equipment comprises a microcontroller chip and a button connecting circuit, described button connecting circuit comprises a plurality of first impact dampers and a plurality of second impact damper, described a plurality of first impact damper electrically connects with the capable lead of described keyboard matrix respectively, described a plurality of second impact damper electrically connects with the column wire of described keyboard matrix respectively, and described automatic test method comprises:
Transmit a control signal with one first impact damper in corresponding a plurality of first impact dampers of a button in difference conducting and the described a plurality of button and one second impact damper in a plurality of second impact damper;
Transmit one first test signal to described electronic installation by one first impact damper in described a plurality of first impact dampers;
Transmit one second test signal to described electronic installation by one second impact damper in described a plurality of second impact dampers;
Export a normal signal to represent the described button effect in described a plurality of button normal by described electronic installation; And
One first impact damper in described a plurality of first impact damper and one second impact damper in described a plurality of second impact damper are opened circuit.
7. automatic test method as claimed in claim 6 also comprises the step that described microcontroller chip is encoded.
8. automatic test method as claimed in claim 7, wherein the step that described microcontroller chip is encoded is in order to optimally to control described button connecting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101640772A CN101413980B (en) | 2007-10-18 | 2007-10-18 | Automatic test method and automatic test device thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101640772A CN101413980B (en) | 2007-10-18 | 2007-10-18 | Automatic test method and automatic test device thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101413980A CN101413980A (en) | 2009-04-22 |
| CN101413980B true CN101413980B (en) | 2011-04-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101640772A Expired - Fee Related CN101413980B (en) | 2007-10-18 | 2007-10-18 | Automatic test method and automatic test device thereof |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102387231B (en) * | 2010-08-27 | 2016-08-17 | 苏州安可信通信技术有限公司 | Cell phone keyboard ATE and method of testing |
| CN102520301B (en) * | 2011-11-25 | 2014-03-05 | 福建联迪商用设备有限公司 | Test method of key matrix keyboard |
| CN106199256B (en) * | 2016-07-01 | 2019-06-18 | 廊坊中电熊猫晶体科技有限公司 | The design method of TCXO test circuit |
| TWI748300B (en) * | 2019-12-09 | 2021-12-01 | 新唐科技股份有限公司 | Testing system and method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5790054A (en) * | 1996-07-26 | 1998-08-04 | United Microelectronics Corp. | Apparatus and method for scanning a key matrix |
| CN1567145A (en) * | 2003-07-10 | 2005-01-19 | 精拓科技股份有限公司 | Apparatus and method for hardware scan keyboard array |
| US20060100841A1 (en) * | 2004-09-02 | 2006-05-11 | Tung-Ho Wu | Automatic system and method for testing mobile phone |
| CN2888534Y (en) * | 2006-04-19 | 2007-04-11 | 深圳安博电子有限公司 | A keyboard tester |
-
2007
- 2007-10-18 CN CN2007101640772A patent/CN101413980B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5790054A (en) * | 1996-07-26 | 1998-08-04 | United Microelectronics Corp. | Apparatus and method for scanning a key matrix |
| CN1567145A (en) * | 2003-07-10 | 2005-01-19 | 精拓科技股份有限公司 | Apparatus and method for hardware scan keyboard array |
| US20060100841A1 (en) * | 2004-09-02 | 2006-05-11 | Tung-Ho Wu | Automatic system and method for testing mobile phone |
| CN2888534Y (en) * | 2006-04-19 | 2007-04-11 | 深圳安博电子有限公司 | A keyboard tester |
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| CN101413980A (en) | 2009-04-22 |
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Granted publication date: 20110413 Termination date: 20161018 |