CN101639515A - Testing device - Google Patents
Testing device Download PDFInfo
- Publication number
- CN101639515A CN101639515A CN200810131232A CN200810131232A CN101639515A CN 101639515 A CN101639515 A CN 101639515A CN 200810131232 A CN200810131232 A CN 200810131232A CN 200810131232 A CN200810131232 A CN 200810131232A CN 101639515 A CN101639515 A CN 101639515A
- Authority
- CN
- China
- Prior art keywords
- programmable
- proving installation
- test
- under test
- board under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention relates to testing device, which is suitable for testing at least one board under test and comprises a remote connecting unit, at least one programmable testing board and a main controlcomputer. The programmable testing board is connected to the remote connecting unit and the main control computer is also connected to the remote connecting unit. The board under test is suitably connected to the programmable testing board and the programmable testing board is provided with a system on programmable chip. A plurality of testing processes are preset in the main control computer. Themain control computer is suitable for selecting a testing process of a corresponding board under test according to the type of the board under test and controls the programmable testing board to testthe board under test. The testing device can reduce testing cost and shorten testing time.
Description
Technical field
The present invention relates to a kind of proving installation, particularly relate to and a kind ofly can test a plurality of boards under test (Unit Under Test, proving installation UUT) simultaneously.It is to utilize, and becomes a kind of new design that quite has practicality and progressive, is suitable for the industrial community wide popularization and application.
Background technology
Fig. 1 is the block scheme of existing known a kind of proving installation.Please refer to Fig. 1, existing known proving installation 100 comprises a host computer (Host PC) 110, one test board 120 and on-the-spot real time information system (Shop Floor Information System, SFIS) 130.Host computer 110 is to be electrically connected to test board 120 and on-the-spot real time information system 130, and test board 120 is in order to be electrically connected to a board under test 50.
The testing procedure of prior art is to start testing process by host computer 110, and tests by 120 pairs of boards under test 50 of test board.After test was finished, host computer 110 can be sent to test result on-the-spot real time information system 130, and on-the-spot real time information system 130 can stores test results.
In the prior art, each test board 120 is in order to testing specific board under test 50, so need change test board 120 when the different board under test 50 of test.In addition, because each board under test 50 comprises a plurality of parts to be measured, so when upgrading being arranged, need the new Extender Card of research and development usually, on test board 120, increase element newly or redesign test board 120, with each part to be measured of complete test board under test 50 as if board under test 50.Particularly, if having active member, board under test 50 (during as local networking (Local AreaNetwork, LAN) chip), often needs to change another test board or newly-increased element.
Because prior art need be researched and developed many test boards 120, so expend cost.In addition, when the different board under test 50 of test, need to change test board 120, so comparatively time-consuming.In addition, in the prior art, host computer 110 can't be tested a plurality of boards under test 50 simultaneously, causes the test duration long.
Based on foregoing, prior art has testing cost height and long shortcoming of test duration.
This shows that above-mentioned existing proving installation obviously still has inconvenience and defective, and demands urgently further being improved in structure and use.In order to solve the problem that proving installation exists, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and common product does not have appropriate structure to address the above problem, this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of proving installation that has that volume is little, cost is low concurrently and can have the new structure of comprehensive adjustment function when using, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Because the defective that above-mentioned existing proving installation exists, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, and the utilization of cooperation scientific principle, actively studied innovation, in the hope of founding a kind of proving installation of new structure, can improve general existing proving installation, make it have more practicality.Through constantly research, design, and after studying sample and improvement repeatedly, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective that existing proving installation exists, be to make it and a kind of proving installation of new structure, technical matters to be solved are provided, thereby be suitable for practicality more with reduction testing cost and test duration.
The object of the invention to solve the technical problems realizes by the following technical solutions.According to a kind of proving installation that the present invention proposes, it is suitable for testing at least one board under test.This proving installation comprises a far-end linkage unit, at least one programmable test plate (Programmable Testing Board) and a master control computer (Master Control PC).The programmable test plate is to be connected to the far-end linkage unit, and the master control computer is to be connected to the far-end linkage unit.Board under test is suitable for being connected to the programmable test plate, and the programmable test plate has a programmable chip system (System On Programmable Chip, i.e. SOPC).The master control computer memory has default a plurality of testing processs, and the master control computer is suitable for choosing according to the kind of board under test the testing process of corresponding board under test, and control programmable test plate is tested board under test.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid proving installation, it more comprises an on-the-spot real time information system, is connected to the master control computer.
Aforesaid proving installation, it more comprises at least one expansion unit, wherein the programmable test plate is to be connected to board under test by expansion unit.
Aforesaid proving installation, wherein said programmable chip system be a field programmable gate array (Field Programmable Gate Array, FPGA).
Aforesaid proving installation, wherein said far-end linkage unit be a hub (Hub) or an access point (Access Point, AP).
Aforesaid proving installation, wherein said master control computer is to be connected to the connection interface by a wireless transmission method.
Aforesaid proving installation, wherein said wireless transmission method comprise a Wi-Fi, a bluetooth (Bluetooth), an infrared ray or a radio universal serial bus (Wireless UniversalSerial Bus, Wireless USB).
Aforesaid proving installation, wherein said programmable test plate has a plurality of connection interfaces.
Aforesaid proving installation, it more comprises at least one input block, connects the programmable test plate.
Aforesaid proving installation, wherein said input block comprise a keyboard and/or a barcode scanner (Barcode Scanner).
Aforesaid proving installation, wherein said master control computer comprise a host computer (Host PC) or a server (Server).
The present invention compared with prior art has tangible advantage and beneficial effect.By technique scheme, proving installation of the present invention can reach suitable technical progress and practicality, and has the extensive value on the industry, and it has following advantage at least:
In the proving installation of the present invention, at least one programmable test plate of master control computer may command is to test a plurality of boards under test simultaneously, so can save the test duration.In addition, because the programmable test plate has programmable chip system,, so can save the cost of research and development test board so can make the programmable test plate can test multiple board under test by the mode of software programming.Therefore, proving installation of the present invention can reduce testing cost and test duration.
In sum, the proving installation of novelty of the present invention, have above-mentioned plurality of advantages and practical value, no matter it all has bigger improvement on device, structure or function, obvious improvement is arranged technically, and produced handy and practical effect, and more existing proving installation has the outstanding multinomial effect of enhancement, thereby being suitable for practicality more, and having the extensive value of industry, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the block scheme of existing known a kind of proving installation.
Fig. 2 is the synoptic diagram of the proving installation of one embodiment of the invention.
Fig. 3 is the synoptic diagram of the proving installation of another embodiment of the present invention.
50,60a, 60b, 60c, 60d, 60e, 60f: board under test
62: bar code 100,200,200 ': proving installation
110: host computer 120: test board
130,250: on-the-spot real time information system 210: far-end linkage unit
220a, 220b, 220c: programmable test plate
222: programmable chip system 224: connect interface
230: master control computer 240: input block
250: on-the-spot real time information system
260a, 260b, 260c: expansion unit
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, to its embodiment of proving installation, structure, feature and the effect thereof that foundation the present invention proposes, describe in detail as after.
Relevant aforementioned and other technology contents, characteristics and effect of the present invention can be known to present in the following detailed description that cooperates with reference to graphic preferred embodiment.By the explanation of embodiment, when can being to reach technological means that predetermined purpose takes and effect to get one more deeply and concrete understanding to the present invention, yet appended graphic only provide with reference to the usefulness of explanation, be not to be used for the present invention is limited.
Relevant aforementioned and other technology contents, characteristics and effect of the present invention can clearly present in the following detailed description that cooperates with reference to graphic preferred embodiment.For convenience of description, in following embodiment, components identical is represented with identical numbering.
By the explanation of embodiment, when can being to reach technological means that predetermined purpose takes and effect to get one more deeply and concrete understanding to the present invention, yet appended graphic only provide with reference to the usefulness of explanation, be not to be used for the present invention is limited.
Fig. 2 is the synoptic diagram of the proving installation of one embodiment of the invention.Please refer to Fig. 2, the proving installation 200 of present embodiment is suitable for testing a plurality of boards under test (as 60a, 60b, 60c).This proving installation 200 comprises a far-end linkage unit 210, a plurality of programmable test plate (as 220a, 220b, 220c) and a master control computer 230. Programmable test plate 220a, 220b, 220c are connected to far-end linkage unit 210 respectively, and master control computer 230 is to be connected to far-end linkage unit 210.Each programmable test plate 220a, 220b, 220c have a programmable chip system 222.Each board under test 60a, 60b, 60c be suitable for being connected to programmable test plate 220a, 220b, 220c one of them.In more detail, board under test 60a is connected to programmable test plate 220a, and board under test 60b is connected to programmable test plate 220b, and board under test 60c is connected to programmable test plate 220c.
In addition, there are default a plurality of testing processs in the master control computer 230, and master control computer 230 is suitable for choosing according to the kind of board under test 60a, 60b, 60c the testing process of corresponding board under test 60a, 60b, 60c, and control programmable test plate 220a, 220b, 220c test board under test 60a, 60b, 60c.In other words, master control computer 230 optional taking in the testing process of test board under test 60a, and control programmable test plate 220a are to test board under test 60a.Similarly, master control computer 230 optional taking in the testing process of test board under test 60b, and control programmable test plate 220b are to test board under test 60b.Master control computer 230 optional taking in the testing process of test board under test 60c, and control programmable test plate 220c are to test board under test 60c.
In the above-mentioned proving installation 200, each programmable chip system 222 for example is a field programmable gate array chip.Master control computer 230 can be a host computer or a server.In addition, master control computer 230 and programmable test plate 220a, 220b, 220c can be connected with far-end linkage unit 210 by transmission line, and wherein transmission line can be network circuit.That is far-end linkage unit 210 can be a hub or an access point.In addition, transmission line is not limited to network circuit, for instance, transmission line can also be universal serial bus (Universal Serial Bus, USB).
Hold above-mentionedly, master control computer 230 also can be connected to far-end linkage unit 210 by a wireless transmission method, and wherein wireless transmission method can be a Wi-Fi, a bluetooth, an infrared ray or a radio universal serial bus.In addition, each programmable test plate 220a, 220b, 220c have a plurality of connection interfaces 224.These connect interface 224 and comprise the universal serial bus port, universal I/O port (General Purpose I/O Port), joint test working group port (Joint Test ActionGroup Port, JTAG Port), Ethernet port (Ethernet Port), the Wi-Fi interface, the audio port, Low Voltage Differential Signal (Low-Voltage Differential Signaling, LVDS) interface, the terminal of prining port (Line Print Terminal Port, LPT Port), serial port (COM Port), PS/2 port and video graphics array port (Video Graphics Array Port, VGA Port) at least one of them.In addition, the user can do programming with the action that writes to programmable chip system 222 by joint test working group port.
In the present embodiment, proving installation 200 can more comprise a plurality of input blocks 240, and these input blocks 240 are to connect programmable test plate 220a, 220b, 220c respectively.In addition, each input block 240 can comprise a keyboard and/or a barcode scanner.
To be the method for testing that example illustrates the proving installation 200 of present embodiment below with test board under test 60a.In addition, identical about the method for testing of board under test 60b, 60c with the method for testing of board under test 60a, so will not describe in detail hereinafter.
The method of testing of the proving installation 200 of present embodiment is as follows: at first, to programmable test plate 220a, and programmable test plate 220a can be sent to the information of board under test 60a master control computer 230 by the kind of the input block 240 input board under test 60a of tester by being connected to programmable test plate 220a.In more detail, the tester can import the kind (as the sequence number of input board under test 60a) of board under test 60a with keyboard.In addition, if board under test 60a has bar code 62, then the tester can be scanned the bar code 62 of board under test 60a by barcode scanner, with the kind of input board under test 60a.
Then, master control computer 230 can be chosen the testing process that is used to test board under test 60a according to the kind of board under test 60a, and this testing process is sent to programmable test plate 220a, master control computer 230 can control programmable test plate 220a afterwards, so that board under test 60a is tested.In test process, programmable test plate 220a is reported to master control computer 230 with test mode, makes the tester to understand test mode by master control computer 230.
After test was finished, programmable test plate 220a can be sent to test result master control computer 230.If board under test 60a is by test, the direct stores test results of master control computer 230 then.If by test, then the tester can not determine whether will test again to board under test 60a, and if the tester selects not test again, then master control computer 230 can stores test results.
In the present embodiment, proving installation 200 can more comprise an on-the-spot real time information system 250.This on-the-spot real time information system 250 is to be connected to master control computer 230, and master control computer 230 can determine whether test result to be sent to on-the-spot real time information system 250 on demand.
In the proving installation 200 of present embodiment, owing to master control computer 230 may command programmable test plate 220a, 220b, 220c, to test board under test 60a, 60b, 60c simultaneously, so can save the test duration.In addition, programmable test plate 220a, 220b, 220c can have multiple connection interface 224, to be connected with multiple board under test.And, because each programmable test plate 220a, 220b, 220c have programmable chip system 222, so can write test procedure in programmable chip system 222 by master control computer 230, make each programmable test plate 220a, 220b, 220c can test multiple board under test, so can save the cost of research and development test board.In addition, if board under test has change or upgrading, the testing process and the test procedures newly-increased by master control computer 230 or that revise programmable chip system 222 that only need to upgrade in the master control computer 230 just can be supported relevant test.So compared to prior art, the proving installation 200 of present embodiment need not made multiple test board, so can save the cost of test board and the time of changing test board.In other words, the proving installation 200 of present embodiment can reduce testing cost and test duration.
Be noted that though be to be example with three programmable test plate 220a, 220b, 220c, in the present invention, the quantity of programmable test plate can be one or more in Fig. 2.
Though programmable test plate 220a, 220b, 220c have a plurality of connection interfaces 224 respectively, if these connect interfaces 224 and board under test be connected interface not simultaneously, can connect board under test by expansion unit.In addition, if programmable test plate 220a, 220b, 220c be can't be directly with the board under test transmission signals time, also can be and the board under test transmission signals by expansion unit.Below will cooperate graphic explanation to have the embodiment of the proving installation of expansion unit.
Fig. 3 is the synoptic diagram of the proving installation of another embodiment of the present invention.Please refer to Fig. 3, compared to proving installation 200, proving installation 200 ' more comprises a plurality of expansion unit 260a, 260b, 260c.Expansion unit 260a is connected between programmable test plate 220a and the board under test 60d, and expansion unit 260b is connected between programmable test plate 220b and the board under test 60e, and expansion unit 260c is connected between programmable test plate 220c and the board under test 60f.In other words, programmable test plate 220a is connected and transmission signals with board under test 60d by expansion unit 260a, programmable test plate 220b is connected and transmission signals with board under test 60e by expansion unit 260b, and programmable test plate 220c is connected and transmission signals with board under test 60f by expansion unit 260c.
The technological innovation of the proving installation of the present invention that above-mentioned structure like this constitutes all has many saving graces for technician of the same trade now, and the progressive that possesses skills really.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (11)
1. a proving installation is suitable for testing at least one board under test, it is characterized in that it comprises:
One far-end linkage unit;
At least one programmable test plate is connected to this far-end linkage unit, and this board under test is suitable for being connected to this programmable test plate, and this programmable test plate has a programmable chip system; And
One master control computer, be connected to this far-end linkage unit, this master control computer memory has default a plurality of testing processs, and this master control computer is suitable for choosing this testing process that should board under test according to the kind of this board under test, and controls this programmable test plate this board under test is tested.
2. proving installation according to claim 1 is characterized in that it more comprises an on-the-spot real time information system, is connected to this master control computer.
3. proving installation according to claim 1 is characterized in that it more comprises at least one expansion unit, and wherein this programmable test plate is to be connected to this board under test by this expansion unit.
4. proving installation according to claim 1 is characterized in that wherein said programmable chip system is a field programmable gate array.
5. proving installation according to claim 1 is characterized in that wherein said far-end linkage unit is a hub or an access point.
6. proving installation according to claim 1 is characterized in that wherein said master control computer is to be connected to one by a wireless transmission method to connect interface.
7. proving installation according to claim 6 is characterized in that wherein said wireless transmission method comprises a Wi-Fi, a bluetooth, an infrared ray or a radio universal serial bus.
8. proving installation according to claim 1 is characterized in that wherein said programmable test plate has a plurality of connection interfaces.
9. proving installation according to claim 1 is characterized in that it more comprises at least one input block, connects those programmable test plates.
10. proving installation according to claim 9 is characterized in that wherein said input block comprises a keyboard and/or a barcode scanner.
11. proving installation according to claim 1 is characterized in that wherein said master control computer comprises a host computer or a server.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810131232A CN101639515A (en) | 2008-08-01 | 2008-08-01 | Testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810131232A CN101639515A (en) | 2008-08-01 | 2008-08-01 | Testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101639515A true CN101639515A (en) | 2010-02-03 |
Family
ID=41614600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810131232A Pending CN101639515A (en) | 2008-08-01 | 2008-08-01 | Testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101639515A (en) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101916593A (en) * | 2010-07-15 | 2010-12-15 | 凌阳科技股份有限公司 | Memory test system |
| CN101980036A (en) * | 2010-10-22 | 2011-02-23 | 福建鑫诺通讯技术有限公司 | FPGA-based JTAG test method |
| CN102200939A (en) * | 2010-03-22 | 2011-09-28 | 鸿富锦精密工业（深圳）有限公司 | Control panel test system |
| CN102955439A (en) * | 2011-08-22 | 2013-03-06 | 鸿富锦精密工业（深圳）有限公司 | Device for sharing scanner for multiple work stations |
| CN103226506A (en) * | 2013-04-28 | 2013-07-31 | 杭州士兰微电子股份有限公司 | Chip-embedded USB to JTAG debugging device and debugging method |
| CN105517676A (en) * | 2015-07-31 | 2016-04-20 | 深圳市元征科技股份有限公司 | Whole-machine testing method and device of smart bracelets, and mobile terminal |
| CN106484573A (en) * | 2015-09-02 | 2017-03-08 | 仁宝电脑工业股份有限公司 | High-definition multi-media interface test system and its method of testing |
| CN107283423A (en) * | 2016-04-11 | 2017-10-24 | 凌华科技股份有限公司 | Intelligent tester device people's system |
| CN107390394A (en) * | 2017-08-07 | 2017-11-24 | 武汉精测电子技术股份有限公司 | A kind of liquid crystal module test system based on SOPC |
| CN109752641A (en) * | 2018-12-21 | 2019-05-14 | 深圳市科陆电子科技股份有限公司 | A kind of method, apparatus, equipment and the storage medium of batch testing Devices to test |
| CN109856580A (en) * | 2018-12-19 | 2019-06-07 | 珠海派诺科技股份有限公司 | Power monitoring instrumentation produces test macro and method in batches |
| CN109959858A (en) * | 2017-12-26 | 2019-07-02 | 新智数字科技有限公司 | A kind of method, apparatus of bluetooth card power consumption test |
| CN112382328A (en) * | 2020-11-06 | 2021-02-19 | 润昇系统测试(深圳)有限公司 | Memory test device and test voltage adjusting method |
-
2008
- 2008-08-01 CN CN200810131232A patent/CN101639515A/en active Pending
Cited By (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102200939A (en) * | 2010-03-22 | 2011-09-28 | 鸿富锦精密工业（深圳）有限公司 | Control panel test system |
| CN101916593A (en) * | 2010-07-15 | 2010-12-15 | 凌阳科技股份有限公司 | Memory test system |
| CN101916593B (en) * | 2010-07-15 | 2012-11-21 | 凌阳科技股份有限公司 | Memory test system |
| CN101980036A (en) * | 2010-10-22 | 2011-02-23 | 福建鑫诺通讯技术有限公司 | FPGA-based JTAG test method |
| CN101980036B (en) * | 2010-10-22 | 2012-08-29 | 福建鑫诺通讯技术有限公司 | FPGA-based JTAG test method |
| CN102955439A (en) * | 2011-08-22 | 2013-03-06 | 鸿富锦精密工业（深圳）有限公司 | Device for sharing scanner for multiple work stations |
| CN103226506A (en) * | 2013-04-28 | 2013-07-31 | 杭州士兰微电子股份有限公司 | Chip-embedded USB to JTAG debugging device and debugging method |
| CN105517676A (en) * | 2015-07-31 | 2016-04-20 | 深圳市元征科技股份有限公司 | Whole-machine testing method and device of smart bracelets, and mobile terminal |
| CN106484573A (en) * | 2015-09-02 | 2017-03-08 | 仁宝电脑工业股份有限公司 | High-definition multi-media interface test system and its method of testing |
| CN107283423A (en) * | 2016-04-11 | 2017-10-24 | 凌华科技股份有限公司 | Intelligent tester device people's system |
| CN107390394A (en) * | 2017-08-07 | 2017-11-24 | 武汉精测电子技术股份有限公司 | A kind of liquid crystal module test system based on SOPC |
| CN107390394B (en) * | 2017-08-07 | 2020-04-28 | 武汉精测电子集团股份有限公司 | Liquid crystal module testing system based on SOPC |
| CN109959858A (en) * | 2017-12-26 | 2019-07-02 | 新智数字科技有限公司 | A kind of method, apparatus of bluetooth card power consumption test |
| CN109959858B (en) * | 2017-12-26 | 2022-03-15 | 新智数字科技有限公司 | Bluetooth card power consumption testing method and device |
| CN109856580A (en) * | 2018-12-19 | 2019-06-07 | 珠海派诺科技股份有限公司 | Power monitoring instrumentation produces test macro and method in batches |
| CN109856580B (en) * | 2018-12-19 | 2021-04-13 | 珠海派诺科技股份有限公司 | Batch production test system and method for power monitoring instruments |
| CN109752641A (en) * | 2018-12-21 | 2019-05-14 | 深圳市科陆电子科技股份有限公司 | A kind of method, apparatus, equipment and the storage medium of batch testing Devices to test |
| CN112382328A (en) * | 2020-11-06 | 2021-02-19 | 润昇系统测试(深圳)有限公司 | Memory test device and test voltage adjusting method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101639515A (en) | Testing device | |
| CN101576603B (en) | Testing device | |
| CN101848042A (en) | Method and system for testing radio frequency of mobile phones | |
| CN105426298A (en) | ADB (Android debug bridge)-based software test method and system | |
| CN102968377A (en) | Virtual machine technique based airborne software system testing general platform | |
| CN104516798A (en) | Wireless one-to-many test system | |
| US20100164522A1 (en) | Signal testing apparatus | |
| CN103248527A (en) | Testing tool device, testing system and testing method for Ethernet consistency | |
| CN108683556A (en) | Detect the method, apparatus and computer storage media of network interface card functional status | |
| CN101452413B (en) | Automatic detection system for note type computer keyboard interface and method thereof | |
| CN201145731Y (en) | Apparatus for testing vehicle mounted acoustics system mainboard | |
| CN103064011B (en) | Examining system and method in a kind of rfid interrogator chip | |
| CN105261278A (en) | Camera module group demonstration tool system, and communication and detection method thereof | |
| KR20070029695A (en) | Test method and test device for testing an integrated circuit | |
| US20090187684A1 (en) | Automatic inspection system and method for notebook computer keyboard interface | |
| CN204989875U (en) | Restructural test instrument based on FPGA | |
| CN1797357A (en) | Circuit board for testing function of main board | |
| CN101211297A (en) | Method for automatically allocating test machine station each IP address and the machine station | |
| CN109143111A (en) | A kind of power supply changes test method, device and equipment | |
| CN107490755A (en) | DUT test boards and its application method | |
| CN110544505A (en) | test system and method for screening poor Die in Wafer | |
| CN103905814A (en) | Method and device for detecting interface displaying | |
| CN101839932B (en) | Measuring equipment | |
| CN102135582A (en) | Mainboard tester | |
| CN211669544U (en) | Test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: HUANXU ELECTRONICS CO., LTD. Free format text: FORMER OWNER: HUANLONG ELECTRIC CO LTD Effective date: 20110201 Owner name: UNIVERSAL GLOBAL SCIENTIFIC INDUSTRIES CO., LTD. |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: NANTOU COUNTY, TAIWAN, CHINA TO: 201203 NO.1558, ZHANGDONG ROAD, INTEGRATEDCIRCUIT INDUSTRIAL AREA, ZHANGJIANG HIGH TECHNOLOGY PARK, SHANGHAI, CHINA |
|
| TA01 | Transfer of patent application right |
Effective date of registration: 20110201 Address after: 201203, Zhangjiang hi tech park, Shanghai, China integrated circuit Industrial Zone, No. 1558 East Cheung Road Applicant after: Huanxu Electronics Co., Ltd. Co-applicant after: Universal Global Scientific Industries Co., Ltd. Address before: Taiwan Nantou County Chinese Applicant before: Huanlong Electric Co., Ltd. |
|
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20100203 |