CN101410710B - 消除对稀有气体中的杂质测量的干扰的系统和方法 - Google Patents
消除对稀有气体中的杂质测量的干扰的系统和方法 Download PDFInfo
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- CN101410710B CN101410710B CN2007800071414A CN200780007141A CN101410710B CN 101410710 B CN101410710 B CN 101410710B CN 2007800071414 A CN2007800071414 A CN 2007800071414A CN 200780007141 A CN200780007141 A CN 200780007141A CN 101410710 B CN101410710 B CN 101410710B
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- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
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- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
物种 | 波长(nm) | 杂质 | 干扰类型 | 对N2读数的影响 |
N2 | 337.13 | 无 | 无 | |
357.69 | ||||
375.54 | ||||
380.49 | ||||
NH | 336.01 | CH4或H2 | 物理/化学光谱 | 更高读数 |
337.0 | ||||
CN | 388.34 | CH4 | 物理/化学 | |
387.14 | ||||
386.19 | ||||
CH | 431.42 | CH4 | 物理/化学光谱 | |
OH | 302.12 | H2O | 物理/化学 | 更低读数 |
306.36 | ||||
306.72 | ||||
307 | ||||
308.9 | ||||
NO | 200-300 | O2 | 物理/化学 | 更低读数 |
Claims (36)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US77692106P | 2006-02-28 | 2006-02-28 | |
US60/776,921 | 2006-02-28 | ||
PCT/CA2007/000314 WO2007098586A1 (en) | 2006-02-28 | 2007-02-28 | System and method of eliminating interference for impurities measurement in noble gases |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101410710A CN101410710A (zh) | 2009-04-15 |
CN101410710B true CN101410710B (zh) | 2011-01-05 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007800071414A Active CN101410710B (zh) | 2006-02-28 | 2007-02-28 | 消除对稀有气体中的杂质测量的干扰的系统和方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8239171B2 (zh) |
EP (1) | EP1989533B1 (zh) |
CN (1) | CN101410710B (zh) |
CA (1) | CA2643094C (zh) |
WO (1) | WO2007098586A1 (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007045068A1 (en) * | 2005-10-19 | 2007-04-26 | Panalytique Inc. | Chromatographic systems and methods for eliminating interference from interfering agents |
WO2007098586A1 (en) | 2006-02-28 | 2007-09-07 | Panalytique Inc. | System and method of eliminating interference for impurities measurement in noble gases |
DE102009057130A1 (de) | 2009-12-08 | 2011-06-09 | Heinrich-Heine-Universität Düsseldorf | Verfahren zur Analyse der Zusammensetzung von Gasgemischen |
US9310308B2 (en) | 2012-12-07 | 2016-04-12 | Ldetek Inc. | Micro-plasma emission detector unit and method |
WO2016051357A1 (en) * | 2014-10-01 | 2016-04-07 | Ldetek Inc. | Detection of gas impurities with a gas chromatograph |
EP3968007B1 (en) | 2015-03-06 | 2023-11-01 | Mécanique Analytique Inc. | Plasma-based optical emission method for detecting impurities in a gas |
JP2018521316A (ja) | 2015-07-15 | 2018-08-02 | メカニック・アナリティック・インコーポレーテッド | キャピラリーガスクロマトグラフィーのための発光ベース検出器 |
US10126278B2 (en) | 2016-03-04 | 2018-11-13 | Ldetek Inc. | Thermal stress resistant micro-plasma emission detector unit |
JP6754326B2 (ja) * | 2017-07-05 | 2020-09-09 | アークレイ株式会社 | プラズマ分光分析方法 |
JP6823555B2 (ja) * | 2017-07-05 | 2021-02-03 | アークレイ株式会社 | プラズマ分光分析方法 |
CN107643352A (zh) * | 2017-11-14 | 2018-01-30 | 杭州春来科技有限公司 | 非甲烷总烃检测装置及方法 |
WO2019144228A1 (en) | 2018-01-23 | 2019-08-01 | Ldetek Inc. | Valve assembly for a gas chromatograph |
GB2583897A (en) | 2019-04-05 | 2020-11-18 | Servomex Group Ltd | Glow plasma stabilisation |
GB2594050A (en) * | 2020-04-06 | 2021-10-20 | Servomex Group Ltd | Glow plasma gas measurement signal processing |
CN110411973B (zh) * | 2019-08-30 | 2021-12-17 | 中国科学院大学 | 一种检测气体中非甲烷总烃浓度的方法 |
CN115598266A (zh) * | 2022-12-12 | 2023-01-13 | 山东非金属材料研究所(Cn) | 一种惰性气体分析方法 |
Citations (4)
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EP1989533B1 (en) | 2014-10-22 |
US20090132206A1 (en) | 2009-05-21 |
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CA2643094C (en) | 2013-12-03 |
US8239171B2 (en) | 2012-08-07 |
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