CN101382575A - Auto testing system for electronic transformer - Google Patents
Auto testing system for electronic transformer Download PDFInfo
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- CN101382575A CN101382575A CNA2008100683099A CN200810068309A CN101382575A CN 101382575 A CN101382575 A CN 101382575A CN A2008100683099 A CNA2008100683099 A CN A2008100683099A CN 200810068309 A CN200810068309 A CN 200810068309A CN 101382575 A CN101382575 A CN 101382575A
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Abstract
The invention disclose an automatic test system of an electronic transformer, which comprises a machine cabinet, a high-low voltage switching box, a programmable high-voltage tester, a computer, a displayer, a programmable alternating current power supply, a keyboard, an indicator light, a loading plate and a relay that are sequentially connected from down to up and arranged in the machine cabinet, the high-low voltage switching box is installed with a position sensor; the automatic test system of the electronic transformer obtains test data by using the computer for controlling a dada acquisition card, calculates the test data by using the computer, and then obtains the result for judging the good and bad of the tested product; the computer has DAQ and DIO serial ports. The software design of the computer adopts an NI LabVIEW software development platform, and adopts NI data acquisition card for acquiring data. The method acquires the test data by using the computer for controlling the data acquisition card and then calculates the test data by the computer so as to obtain the result for judging the good and the bad of the tested product, controls a data acquisition channel by the I/O card and a drive circuit and automatically switches product load, thus being capable of testing a plurality of products simultaneously and greatly improving test efficiency.
Description
Technical field
The present invention relates to a kind of test macro of electronic product, this test macro is to obtain test data by computer control data capture card, calculate test data by computer again, obtain a result and judge the quality of test product, specifically be meant auto testing system for electronic transformer.
Background technology
Transformer almost all will be used in all electronic products, because its effect is extremely important: it can provide various voltage stratum to guarantee system's normal running; Provide in the system and partly be able to electrical isolation with the different potentials operation; Provide high impedance to alternating current, but then provide low impedance direct current; Under different current potentials, keep or modify waveform and frequency response.Impedance also is key concept wherein, that is one of electronics property, and it is a kind of equipment, promptly when circuit unit impedance system when a stratum changes to other stratum, also need to use transformer.Ballast resistor is a kind of of electronic transformer, so its effect is the same with transformer extensive and important.Transformer also is one of visual plant in the electric system, along with more and more putting into operation of UHV (ultra-high voltage) long distance power transmission system, high-power transformer is increasing, therefore to the requirement of the various unfailing performances of transformer also in continuous raising, as voltage, electric current, power, frequency, the test of withstand voltage leakage current, and between the two, do not having clear and definite separatrix at power transformer and electronic transformer, just there is the difference of size in volume.So, no matter be electronics or electric power circle, the unfailing performance of transformer is required all unusual height.
And the test of traditional transformer in its production run, or during the performance test when waiting it to be finished product, its every performance is mostly finished by manual instrument and meter test operation, and every performance is because of the separately test of different needs of testing tool, instrument, its step is many, divides the work carefullyyer, and not only speed is slow, efficient is low, and also can there be bigger error in test result simultaneously.In addition, during the present production and processing of transformer or ballast resistor, general also all is the operating type that adopts streamline, it is when carrying out the transformer performance test, also to be equipped with different staff and carry out corresponding performance test, so the demand aspect manpower is also bigger, also just increased cost in the middle of invisible.In a word, in the present transformer or the performance test of this armstrong's patent of ballast resistor, exist many weak points, not only work efficiency is low for it, and test result exists error.Therefore, the applicant strives present this not good transformer, ballast resistor performance test situation is improved, and develops a kind of novel Auto-Test System.
Summary of the invention
One of purpose of the present invention is: provide a kind of test speed faster, test result is auto testing system for electronic transformer more accurately.
Two of purpose of the present invention is: a kind of raising testing efficiency is provided, and test data can be stored respectively by the sequence number of each product simultaneously, has the auto testing system for electronic transformer of trackability.
Another object of the present invention is to provide a kind of auto testing system for electronic transformer of simple in structure, attractive in appearance and easy-operating hommization.
For achieving the above object, technical solution of the present invention is:
A kind of auto testing system for electronic transformer, include: rack, high-low pressure boxcar, high voltage testing device able to programme, computer, display, AC power able to programme, keyboard, pilot lamp, load board, relay, they from bottom to top, link successively and be located in the rack, the described high-low pressure boxcar inductor that is in place;
It is to obtain test data by computer control data capture card for an auto testing system for electronic transformer, calculates test data by computer again, obtains a result and judges the quality of test product;
Described computer contains DAQ, DIO serial ports.
The The software NI LabVIEW Software Development Platform of described computer adopts NI data collecting card image data.
The performance project that it can test the electronic transformer product has: the AC/DC voltage tester; the AC/DC testing current; waveform testing; the amplitude test in arbitrary cycle of waveform; frequency test; power test; the power factor (PF) test; the overload protection test; the short-circuit protection test; the rise time test; test fall time; withstand voltage leakage current test; bar code reads, and the amplitude test in described arbitrary cycle of waveform includes: the frequency test in arbitrary cycle of waveform; the phase test in arbitrary cycle of waveform; the rise time test in arbitrary cycle of waveform; test fall time in arbitrary cycle of waveform; product starts the delay test of instantaneous trigger waveform testing and different interchannel waveforms.
It supports bar code reader.
Its data storage adopts storage of local computing EXCEL form and network data library storage dual mode.
Its test data is exported with report form according to the customer requirement form.
It can test a plurality of products simultaneously.
The local computing method of calling is adopted in accessing of test procedure and test event.
The employing network call mode that accesses of test procedure and test event.
After adopting such scheme, because the present invention adopts by computer control data capture card and obtains test data again by computer calculating test data, obtain a result and judge the quality of test product, by I/O card and driving circuit control data acquisition channel and the load of automatic switchover product, can test a plurality of products simultaneously, improve testing efficiency greatly, test data is stored respectively by the sequence number of each product simultaneously, has trackability.It is compared with traditional manual instrument and meter test, and test speed is faster, and test result is more accurate, can avoid artificial erroneous judgement fully, in addition, electronic transformer test macro of the present invention adopts the outer machine structure of cabinet-type and the hommization operation interface of computer, its simple in structure, attractive in appearance and easy behaviour.
The utility model is described in further detail below in conjunction with drawings and embodiments:
Description of drawings
Fig. 1 is a structure outside drawing of the present invention;
Fig. 2-Fig. 4 is a structure side view of the present invention;
Fig. 5-6 is a test philosophy of the present invention;
Concrete operations step synoptic diagram when Fig. 7-15 works for the present invention;
Figure 16-24 is a programming process synoptic diagram of the present invention;
Figure 25, Figure 26 are provided with the interface synoptic diagram fast for the present invention;
Figure 27 shows synoptic diagram for testing current value of the present invention.
The figure number explanation:
1, rack 2, high-low pressure boxcar 3, high voltage testing device able to programme 4, computer 5, display 6, AC power able to programme 7, keyboard 8, pilot lamp 9, load board 10, relay 91, load 11, through signal condition
Embodiment
A kind of auto testing system for electronic transformer, include: rack 1, high-low pressure boxcar 2, high voltage testing device able to programme 3, computer 4, display 5, AC power able to programme 6, keyboard 7, pilot lamp 8, load board 9, relay 10, they from bottom to top, link successively and be located in the rack 1, shown in Fig. 1-4.
Wherein, the software of computer 4 adopts NI LabVIEW as Software Development Platform; LabVIEW (Laboratory Virtual instrument Engineering) is a kind of patterned programming language; it is preset parameter and editor; and cipher protection function is arranged, and the user passes in and out system all can have record.LabVIEW is a kind of programming development environment, be similar to C and BASIC development environment, the characteristics of LabVIEW are: other computereses all are to adopt the text based language to produce code, are graphical author language G codings and LabVIEW uses, and the program of generation is the form of block diagram.The same with C and BASIC, LabVIEW also is general programing system, and a huge function library of finishing any programmed tasks is arranged.The function library of LabVIEW comprises data acquisition, GPIB, serial ports control, data analysis, data presentation and data storage, or the like.LabVIEW also has traditional program debugging tool; as breakpoint is set, carries out or the like with the result of animation mode video data and subroutine (sub-VI) thereof, single step; be convenient to the debugging beautiful interface practicality of program; easy to operate; the user can directly preset parameter and editor by the interface; and cipher protection function is arranged, and the user passes in and out system log (SYSLOG).
LabVIEW is integrated and the repertoire that satisfies GPIB, VXI, RS-232 and RS-485 protocol with hardware and data collecting card communication.It is also built-in is convenient to use the built-in function of software standards such as TCP/IP, ActiveX.This is a powerful and software flexibly, utilizes LabVIEW, can produce the executable file of independent operating, and it is 32 real compilers.As many important software, LabVIEW provides the multiple version of Windows, UNIX, Linux, Macintosh.
Therefore the The software N of computer 4 in the auto testing system for electronic transformer of the present invention] the LabVIEW development platform, so its data acquisition is to adopt NI data collecting card image data, computer 4 contains DAQ, DIO, serial ports.Test procedure is open, the technician who has editing authority can be voluntarily to testing procedure, and specification is made amendment, and the program that can have now generates new test procedure fast for the basis, program portability is strong, and need not the professional software developer can safeguard and edit.Be provided with the multinomial performance test procedure of electronic transformer in the computer 4: the AC/DC voltage tester; the AC/DC testing current; waveform testing; the amplitude test in arbitrary cycle of waveform; frequency test; power test; the power factor (PF) test; the overload protection test; the short-circuit protection test; the rise time test; test fall time; withstand voltage leakage current test; bar code reads or the like, and the amplitude test in described arbitrary cycle of waveform includes: the frequency test in arbitrary cycle of waveform; the phase test in arbitrary cycle of waveform; the rise time test in arbitrary cycle of waveform; test fall time in arbitrary cycle of waveform; product starts the delay test of instantaneous trigger waveform testing and different interchannel waveforms.The graphical interfaces of computer 4 of the present invention can adopt Windows 98/NT/2000/XP environment, and computer 4 is supported various industrial instrumentation interfaces, as: GPIB, USB, RS232/485, CAN BUS etc.
Program in the computer 4 is provided with automatic judgement test result: qualified-PASS or defective-FAIL, can stop the people fully and be misjudgment.Auto testing system for electronic transformer of the present invention is supported bar code reader (Bar Code Reader), and after the bar code typing, Automatic Program begins test, need not again by other switches.All test datas corresponding product sequence number are one by one stored, and the database network enabled is shared.Test data can be exported with report form according to the customer requirement form.When program interrupt and test finish, system cuts off the electricity supply automatically, its handling safety.
High-low pressure boxcar 2 inductor that is in place by procedure judges, prevents that the high-low pressure intercommunication from damaging product and testing apparatus; High voltage testing device 3 able to programme, high pressure and functional test can be incorporated into a test position, the condition of Hi-pot test requires by Automatic Program high voltage testing device 3 able to programme to be set according to different product, avoid artificially being provided with mistake, and can accurately test withstand voltage leakage current value and be stored to database by the serial ports test data of reading back.
Test philosophy of the present invention is: shown in Fig. 5-6, auto testing system for electronic transformer, take to simulate the functional test of finished product complete machine, by the 41 control switch load 91 of the DAQ card DIO passage in the computer 4, AC power 6 able to programme is adjusted input voltage and frequency, with output signal through signal condition 11 circuit be adjusted into the acceptable signal of DAQ41 (10-+10V), output to the DAQ41 card again and handle by software analysis and collect signal and whether waveform correct.DAQ41 can catch the waveform in a plurality of cycles simultaneously, again by software to analyzing amplitude, frequency, rise time, the fall time in arbitrary cycle.By I/O card and driving circuit control data acquisition channel and the load of automatic switchover product, can test 4 products simultaneously, and when surveying four products simultaneously, can on a test fixture, put eight products, four is one group, switch between two groups by relay 10, can save the taking and placing product time.Wherein, the performance project that the present invention can test the electronic transformer product has: the AC/DC voltage tester; the AC/DC testing current; waveform testing; the amplitude test in arbitrary cycle of waveform; frequency test; power test; the power factor (PF) test; the overload protection test; the short-circuit protection test; the rise time test; test fall time; withstand voltage leakage current test; bar code reads or the like, and the amplitude test in described arbitrary cycle of waveform includes: the frequency test in arbitrary cycle of waveform; the phase test in arbitrary cycle of waveform; the rise time test in arbitrary cycle of waveform; test fall time in arbitrary cycle of waveform; product starts the delay test of instantaneous trigger waveform testing and different interchannel waveforms.
Data storage of the present invention adopts storage of EXCEL form and network data library storage dual mode in the local computing 4.Accessing of test procedure and test event also can be adopted local computing and network call dual mode, to greatly make things convenient for engineering technical personnel to safeguard, can effectively avoid simultaneously identical product to use the phenomenon of different test procedures to take place in different system, can guarantee the consistance of all system detection methods and specification, and can test a plurality of layouts (PCI-6254 can provide 32 tunnel analog inputs at most, 48 tunnel Digital I) simultaneously.
Concrete operations step when the present invention works is as follows: cooperates shown in Fig. 7-15,
A, affirmation system connect correct (comprising the connection of test fixture), all power supplys of open system;
B, double-click computer desktop shortcut icon " EAGLERISE ATE.EXE " enter test macro (as Fig. 7):
C, input operation person's name are with click program interface OK key or directly knock keyboard ENTER key (as Fig. 8);
D, input user cipher are with click program interface OK key or directly knock keyboard ENTER key (as Fig. 9);
E, earlier select the test file (D: EAGLERISE TEST SPEC) of product correspondence to be measured, double-click test file name (as Figure 10) with click " OK " or with mouse;
F, this moment, program can automatically be downloaded testing procedure (annotate: the testing procedure System Time control that finishes can show current system time), waited (as Figure 11) to be tested;
G, product to be measured is put into test fixture according to correct direction, lid is the loam cake of test fixture down, presses on the test fixture green " START " switch 0.5 second, begin test (as Figure 12);
If all testing procedure results of h are setting within the specification limit, the result shows " PASS ", opens the loam cake of test fixture, takes out product, end of test (EOT) (as Figure 13);
If the arbitrary testing procedure result of the some products of i exceeds specification limit, program can stop the test of this product immediately, and other products continue test, up to end of test (EOT), open the loam cake of test fixture, takes out product (as Figure 14);
J, in test process, if unusual circumstance needs to end in advance test, can test interface STOP key or pin " STOP " switch red on the test fixture with click, up to end of test, the result shows " FAIL ", open the loam cake of test fixture, take out product, end of test (EOT);
K, end of test (EOT), test data can deposit database " ATE.mdb " in automatically according to sequence number, " ATEBASE.mdb " and with the date on the same day be filename the testing journal sheet D: DATA ATE SET7OLS 2008-05-08 2008-03-07SET70LSATE-1.XLS), annotate: " SET70LS " by at that time the model of survey product;
M, slow for avoiding data query, database " ATE.mdb " only preserve and go up bimestrial test data, but database " ATE BASE.mdb " will be preserved all historical records;
N, repeating step g carry out the test of next product.
Programming process of the present invention: shown in Figure 16-24
A, affirmation system connect correct (comprising the connection of test fixture), all power supplys of open system;
B, double-click computer desktop shortcut icon " ATE.EXE ", enter test macro (as Figure 16);
C, input operation person's name are with click program interface Modify key (as Figure 17);
D, input user cipher are with click program interface OK key or directly knock keyboard ENTER key (as Figure 18);
E, earlier select the test file (D: ATE TEST SPEC) of product correspondence to be measured, double-click test file name (as Figure 19) with click " OK " or with mouse;
Testing procedure (as Figure 20) is downloaded in f, program meeting this moment automatically;
G, selective system hardware configuration and address (as Figure 21);
H, the bar code information (as Figure 22) of product type correspondence is set;
I, Model: product type to be measured;
J, Customer P/N: client's product type identification code (the several successive character that corresponding this Model must contain in the bar code);
K, Bar Code Length: the number of character in the bar code;
M, needs save as new document with current test file, and with mouse-click " Save As " key, import file name (* .TXT), hit OK is preserved (as Figure 23);
Row (as Figure 24) is selected to insert by right mouse button in n, the position that needs to insert delegation's program in test file;
P, modification finish, and use mouse-click " Save " the key preservation.
Attention: above-mentioned test procedure classify set form as, can not insert new row or deletion.
Be that division name of the present invention is made an explanation below:
“BEGIN”
| Test Description | Skip | ID | Label | Address | Command | Lower | Value | Upper | U | Offset | |
| 1 | BEGIN |
Illustrate: ID: from then on " BEGIN " this order expression test procedure begins.
Attention: instruction character form therewith is in full accord, and space etc. all can not be added.
“RELAY CONTROL”
Form:
| Test Description | ID | Label | Addre ss | Command | Lowcr | Valuc | Uppcr | U | Offset | |
| 1 | RELAYCONTROL | 0F00000A02 |
Illustrate: ID: " RELAY CONTROL " is provided with gauge tap.
Common: " 0F00000A02 " is hexadecimal character, and the cursor of mouse is moved
To Command row and a mouse click left button of this row, program can eject interface (as shown in figure 25) is set fast, and this passage is connected when pressing switch representative test with left mouse button, and the tunnel name of each switch representative can be with reference to shown in Figure 28 A-28H.
“AC SOURCE SETUP”
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | | U | Offsct | ||
| 1 | AC SOURCE SETUP | VOLT 240 | V |
Illustrate: ID: " AC SOURCE SETUP " this order is provided with the output of AC SOURCE.Command: " VOLT 240 " are provided with AC SOURCE and are output as 240VAC;
The output frequency that " FREQ 50 " are provided with AC SOURCE is 50HZ;
" OUTP ON " is provided with the output ON of AC SOURCE;
" OUTP OFF " is provided with the output OFF of AC SOURCE.
“DELAY”
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | Upper | U | Offset | |
| 1 | DELAY | 500 | mS |
Illustrate: ID: " DELAY " is provided with the test wait time." 500 " are decimal numbers, the unit milli
Second, for example: " 500 " are to be provided with to wait for 0.5 second.
Title: " MEASURE OUTPUT "
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | Upper | U | Offset | |
| 1 | MEASURE OUTPUT |
Illustrate: ID: " MEASURE OUTPUT ", the data collecting card analog channel is gathered product output signal.When the cursor of mouse moves to Command row and a mouse click left button of this row, program can eject interface (Figure 26) is set fast.
The analog channel name of " Physical channel " expression data collecting card.
The data that the analog channel of " Scale " expression data collecting card is gathered and the proportionate relationship of actual value, this is relevant with hardware circuit, but reference schematic.
The sample frequency of " Sample Rate " expression data collecting card.“
Samples per channel " expression data collecting card hits.
The input mode of " input terminal " expression data collecting card.DIFF represents the difference input.
The number of times of " Loop " expression data collecting card circle collection.
Title: " OUTPUT CURRENT "
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | Upper | U | Offset | ||
| 1 | | XXX | 5 | 6 | A |
Illustrate: ID: " OUTPUT CURRENT ", expression test output current.
Label: " XXX " is illustrated in the title that is listed as in the data storage form.
Lower: " 5 ", the lower limit of expression output.
Upper: " 6 ", the upper limit of expression output.
Offset: the expression modified value, as shown in figure 27.
Title: " OUTPUT VOLTAGE "
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | Uppcr | U | Offset | |
| 1 | OUTPUT VOLTAGE | XXX | U | 12 | V |
Illustrate: ID: " OUTPUT VOLTAGE ", expression test output voltage.
Label: " XXX " is illustrated in the title that is listed as in the data storage form.
Lower: " 11 ", the lower limit of expression output.
Upper: " 12 ", the upper limit of expression output.
Offset: expression modified value.
Title: " OUTPUT POWER "
Form:
| Test Description | ID | Label | Addre ss | Command | Lower | Value | Upper | U | Offset | ||
| 1 | | XXX | 60 | 70 | W |
Illustrate: ID: " OUTPUT POWER ", expression test output power.
Label: " XXX ". be illustrated in the title that is listed as in the data storage form.
Lower: " 60 ", the lower limit of expression output.
Upper: " 70 ", the upper limit of expression output.
Offset: expression modified value.
Title: " OUTPUT FREQUENCE "
Form:
| Test Description | ID | Label | Addre ss | Command | Lowar | Value | Upper | U | Offset | ||
| 1 | | XXX | 26 | 50 | K hz |
Illustrate: ID: " OUTPUT FREQUENCE ", expression test output frequency.
Label: " XXX " is illustrated in the title that is listed as in the data storage form.
Lower: " 26 ", the lower limit of expression output.
Upper: " 50 ", the upper limit of expression output.
Offset: expression modified value.
The sample frequency of " Sample Rate " expression data collecting card.
The hits of " Samples per channel " expression data collecting card.
Offset:-5 represents, ignores preceding 5 samplings of waveform.
Title: " END "
| Test Description | Skip | ID | Label | Address | Command | Lower | Value | Upper | U | Offset | |
| 1 | END |
Illustrate: ID: " END " this order expression test procedure is to this Ji beginning.
To sum up, the present invention obtains test data by computer control data capture card, calculate test data by computer again, obtain a result and judge the quality of test product, by I/O card and driving circuit control data acquisition channel and the load of automatic switchover product, can test 4 products simultaneously, improve testing efficiency greatly, test data is stored respectively by the sequence number of each product simultaneously, has trackability.It is compared with traditional manual instrument and meter test, and test speed is faster, and test result is more accurate, can avoid artificial erroneous judgement fully.
Above embodiment is only for the usefulness that the present invention is described, but not limitation of the present invention, person skilled in the relevant technique under the situation that does not break away from the spirit and scope of the present invention, can also be made various conversion or variation.Therefore, all technical schemes that are equal to also should belong to category of the present invention, should limit by being equipped with claim.
Claims (9)
1, a kind of auto testing system for electronic transformer, it is characterized in that: include: rack, high-low pressure boxcar, high voltage testing device able to programme, computer, display, AC power able to programme, keyboard, pilot lamp, load board, relay, they from bottom to top, link successively and be located in the rack, the described high-low pressure boxcar inductor that is in place;
It is to obtain test data by computer control data capture card for an auto testing system for electronic transformer, calculates test data by computer again, obtains a result and judges the quality of test product;
Described computer contains DAQ, DIO serial ports.
2, auto testing system for electronic transformer as claimed in claim 1 is characterized in that: the The software NI LabVIEW Software Development Platform of described computer, adopt NI data collecting card image data.
3; auto testing system for electronic transformer as claimed in claim 1; it is characterized in that: the performance project that it can test the electronic transformer product has: the AC/DC voltage tester; the AC/DC testing current; waveform testing; the amplitude test in arbitrary cycle of waveform; frequency test; power test; the power factor (PF) test; the overload protection test; the short-circuit protection test; the rise time test; test fall time; withstand voltage leakage current test; bar code reads, and the amplitude test in described arbitrary cycle of waveform includes: the frequency test in arbitrary cycle of waveform; the phase test in arbitrary cycle of waveform; the rise time test in arbitrary cycle of waveform; test fall time in arbitrary cycle of waveform; product starts the delay test of instantaneous trigger waveform testing and different interchannel waveforms.
4, auto testing system for electronic transformer as claimed in claim 1 is characterized in that: it supports bar code reader.
5, auto testing system for electronic transformer as claimed in claim 1 is characterized in that: its data storage adopts storage of local computing EXCEL form and network data library storage dual mode.
6, auto testing system for electronic transformer as claimed in claim 3 is characterized in that: its test data is exported with report form according to the customer requirement form.
7, auto testing system for electronic transformer as claimed in claim 3 is characterized in that: it can test a plurality of products simultaneously.
8, auto testing system for electronic transformer as claimed in claim 1 is characterized in that: the local computing method of calling is adopted in accessing of test procedure and test event.
9, auto testing system for electronic transformer as claimed in claim 1 is characterized in that: the employing network call mode that accesses of test procedure and test event.
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|---|---|---|---|
| CNA2008100683099A CN101382575A (en) | 2008-07-04 | 2008-07-04 | Auto testing system for electronic transformer |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008100683099A CN101382575A (en) | 2008-07-04 | 2008-07-04 | Auto testing system for electronic transformer |
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| CN101382575A true CN101382575A (en) | 2009-03-11 |
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| CNA2008100683099A Pending CN101382575A (en) | 2008-07-04 | 2008-07-04 | Auto testing system for electronic transformer |
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| CN101776717A (en) * | 2009-12-25 | 2010-07-14 | 海洋王照明科技股份有限公司 | Network system and client for emergency power supply conversion testing, and emergency power system |
| CN102508087A (en) * | 2011-12-26 | 2012-06-20 | 石家庄供电公司 | Integrated test stand for transformers |
| CN102565562A (en) * | 2010-12-31 | 2012-07-11 | 上海市电力公司 | Comprehensive testing device for electrical test of transformer |
| CN103217293A (en) * | 2013-04-08 | 2013-07-24 | 浙江大学 | Casing tolerance test data acquisition trigger system based on vibration value |
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| CN104020368A (en) * | 2014-05-06 | 2014-09-03 | 徐州格利尔科技有限公司 | Multifunctional comprehensive testing device of transformer |
| CN105137254A (en) * | 2015-10-16 | 2015-12-09 | 哈尔滨理工大学 | Submersible transformer automatic detection system based on PLC and embedded system |
| CN109239495A (en) * | 2018-09-26 | 2019-01-18 | 合肥博微田村电气有限公司 | A kind of transformer performance automatic detection device |
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| CN101776717B (en) * | 2009-12-25 | 2013-12-04 | 海洋王照明科技股份有限公司 | Network system and client for emergency power supply conversion testing, and emergency power system |
| CN101776717A (en) * | 2009-12-25 | 2010-07-14 | 海洋王照明科技股份有限公司 | Network system and client for emergency power supply conversion testing, and emergency power system |
| CN102565562A (en) * | 2010-12-31 | 2012-07-11 | 上海市电力公司 | Comprehensive testing device for electrical test of transformer |
| CN102508087A (en) * | 2011-12-26 | 2012-06-20 | 石家庄供电公司 | Integrated test stand for transformers |
| CN102508087B (en) * | 2011-12-26 | 2014-01-22 | 国家电网公司 | Integrated test stand for transformers |
| CN103217293A (en) * | 2013-04-08 | 2013-07-24 | 浙江大学 | Casing tolerance test data acquisition trigger system based on vibration value |
| CN103217293B (en) * | 2013-04-08 | 2015-09-02 | 浙江大学 | Based on the casing containment test data acquisition triggering system of vibration values |
| CN103278715A (en) * | 2013-05-16 | 2013-09-04 | 广东电网公司 | Electrical equipment testing method |
| CN103278715B (en) * | 2013-05-16 | 2015-09-16 | 广东电网公司 | Power equipment test method |
| CN104020368A (en) * | 2014-05-06 | 2014-09-03 | 徐州格利尔科技有限公司 | Multifunctional comprehensive testing device of transformer |
| CN104020368B (en) * | 2014-05-06 | 2017-05-24 | 徐州格利尔科技有限公司 | Multifunctional comprehensive testing device of transformer |
| CN105137254A (en) * | 2015-10-16 | 2015-12-09 | 哈尔滨理工大学 | Submersible transformer automatic detection system based on PLC and embedded system |
| CN109239495A (en) * | 2018-09-26 | 2019-01-18 | 合肥博微田村电气有限公司 | A kind of transformer performance automatic detection device |
| CN110031706A (en) * | 2019-04-30 | 2019-07-19 | 上海世兆新能源科技有限公司绍兴分公司 | The limit test system of wisdom Electrical Safety management system |
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