CN101344433A - Novel infrared temperature measurement scanner - Google Patents
Novel infrared temperature measurement scanner Download PDFInfo
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- CN101344433A CN101344433A CNA2008101957289A CN200810195728A CN101344433A CN 101344433 A CN101344433 A CN 101344433A CN A2008101957289 A CNA2008101957289 A CN A2008101957289A CN 200810195728 A CN200810195728 A CN 200810195728A CN 101344433 A CN101344433 A CN 101344433A
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- infrared ray
- ray incident
- incident mirror
- lens
- temperature measurement
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Abstract
The invention belongs to the technical field of temperature monitoring and videography, in particular to a novel infrared temperature measuring scanner. An infrared incident lens is arranged in the scanner, a camera scene is arranged at one side of the infrared incident lens, infrared rays are transmitted into an inner processing system of the scanner after passing through the infrared incident lens, visible lights are transmitted into the inner processing system of the scanner after passing through the camera scene, and the object temperature field that is measured by the scanning of the infrared incident lens is corresponding to the object image that is taken by the camera scene. The novel infrared temperature measuring scanner greatly improves the analyzing effect of infrared temperature monitoring of the objects.
Description
Technical field
The invention belongs to temperature monitoring and video camera technical field, be specifically related to a kind of novel infrared temperature measurement scanner.
Background technology
In the modern industry production run, for the stable operation that ensures process equipment and guarantee that the quality of product is in higher horizontality, often need carry out contactless infrared temperature monitoring to process equipment body and product, this monitoring generally adopts the mode of high speed infrared scanning to carry out temperature analysis, but can not carry out with monitored material object usually in the time of the infrared temperature analysis effective corresponding, thereby make the effect of infrared temperature analysis have a greatly reduced quality.
Summary of the invention
The purpose of this invention is to provide a kind of novel infrared temperature measurement scanner, its infrared temperature analysis that can make object is with monitored in kind corresponding, thereby improved the analytical effect of object infrared temperature monitoring greatly.
For achieving the above object, the present invention has adopted following technical scheme: a kind of novel infrared temperature measurement scanner, be provided with infrared ray incident mirror in the described scanner, the side of infrared ray incident mirror is provided with pick-up lens, infrared ray is passed to the disposal system of scanner inside through infrared ray incident mirror, visible light is passed to the disposal system of scanner inside through pick-up lens, and the temperature field of the object that described infrared ray incident mirror scanning records is corresponding with the image of the object that pick-up lens is taken the photograph.
As shown from the above technical solution, the present invention in infrared temperature measurement scanner except that being provided with infrared scan mechanism, also be provided with pick-up lens towards object, when infrared temperature measurement scanner carries out the infrared scan thermometric to object, also object is made a video recording, after being incident to the infrared ray and the treated system handles of visible light of scanner inside, obtain the temperature field and the image of testee respectively, the image of the object that the temperature field that just makes the object that infrared scan records thus and pick-up lens are taken the photograph can carry out good corresponding between the two, thereby has improved the analytical effect of object infrared temperature monitoring greatly.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the vertical view of Fig. 1;
Fig. 3 is the structural representation of infrared ray incident mirror;
Fig. 4 is visible light and ultrared incident wiring diagram.
Embodiment
As shown in Figure 1, 2, a kind of novel infrared temperature measurement scanner, be provided with infrared ray incident mirror 10 in the described scanner, the side of infrared ray incident mirror 10 is provided with pick-up lens 20, infrared ray is passed to the disposal system of scanner inside through infrared ray incident mirror 10, visible light is passed to the disposal system of scanner inside through pick-up lens 20, and the temperature field of the object that described infrared ray incident mirror 10 scannings record is corresponding with the image of the object that pick-up lens 20 is taken the photograph.
Infrared ray incident mirror 10 is delivered to scanner inside with the infrared ray of incident, and generate the temperature field of scanned object by the disposal system of scanner inside, pick-up lens 20 then is delivered to the transmission of visible light of incident the disposal system at its rear portion, generate the image of scanned object again by disposal system, thereby make that the temperature field of scanned object and image can be corresponding, and greatly improved the analytical effect of object infrared temperature monitoring.
The minute surface of described infrared ray incident mirror 10 need be done gyration usually for being rotated scanning, this gyration has constituted the surface of revolution that comprises certain space, pick-up lens 20 is arranged on the side of infrared ray incident mirror 10, also be the side that pick-up lens 20 is arranged on the surface of revolution that the gyration of infrared ray incident mirror 10 constitutes, can not interfere thereby make between the range of movement of the position of pick-up lens 20 and infrared ray incident mirror 10.
As shown in Figure 2, the field of view angle β of the field of view angle α of described infrared ray incident mirror 10 and pick-up lens 20 matches.
Field of view angle α, β match, infrared ray incident mirror 10 and pick-up lens 20 camera watch region that can obtain matching then, thereby for having laid a good foundation with the corresponding of image in the temperature field of scanned object.
As preferred version of the present invention, the field of view angle α of described infrared ray incident mirror 10 is identical with the field of view angle β of pick-up lens 20.
If field of view angle α, β are identical, then infrared ray incident mirror 10 can obtain identical camera watch region with pick-up lens 20, thereby for laying a good foundation further with the corresponding of image in the temperature field of scanned object.
As the further preferred version of the present invention, described infrared ray incident mirror 10 is 90～120 ° with pick-up lens 20 field of view angle α, β separately.
In the time of in field of view angle β is in above-mentioned numerical range, can adapt to the thermometric situation of multiple object, such as the surveying work that can launch the rotary kiln of various different lengths, different-diameter, not only thermometric speed is fast, and measurement effect is good.
As the present invention's preferred version further, described infrared ray incident mirror 10 is 90 ° with pick-up lens 20 field of view angle α, β separately.
When the field of view angle β of the two was 90 °, the infrared temperature measurement scanner of this moment had higher scanning accuracy, and can guarantee the reliability of temperature measurement accuracy and thermometric, thereby helps the thermometric effect of object is analyzed.
Shown in Fig. 1,3, the below of described infrared ray incident mirror 10 is provided with rotating shaft, and electric rotating machine 30 drives infrared ray incident mirror 10 by rotating shaft and rotates.Infrared ray incident mirror 10 is finished the thermometric process to object in rotation process.
As preferred version of the present invention, as shown in Figure 3, the below of described infrared ray incident mirror 10 be provided with level to base 11, the output terminal of electric rotating machine 30 is connected by the base 11 of rotating shaft with infrared ray incident mirror 10, and the minute surface 12 and the angle between its base 11 of infrared ray incident mirror 10 are acute angle.
Because be provided with angle between the minute surface plane, 12 place of infrared ray incident mirror 10 and the plane, its base 11 place, rather than solid construction, therefore can significantly reduce material consumption, also greatly reduce the energy consumption of electric rotating machine 30 simultaneously.
As shown in Figure 4, described disposal system comprises photoelectric conversion unit 50 and signal processing unit 60, the minute surface 12 of infrared ray incident mirror 10 is with the infrared reflection of the incident catoptron 40 to its top, catoptron 40 is incident upon photoelectric conversion unit 50 with the infrared ray commentaries on classics, and described photoelectric conversion unit 50 is electrically connected with the input end of signal processing unit 60; Visible light enters the video camera 70 at camera lens rear through pick-up lens 20, and video camera 70 is electrically connected with the input end of signal processing unit 60, and the output terminal of described signal processing unit 60 is electrically connected with computing machine 80.
Visible light and infrared ray through after above-mentioned circuit transmission, conversion and handling, just can obtain the temperature field and the image of testee respectively, thereby can carry out corresponding effectively.
Described video camera 70 can be linear video camera, also can be area array camera, carry out at once at temperature field and image equally testee, also exist corresponding two kinds of situations of line temperature signal and the corresponding of line image and surface temperature signal and face image, as preferred version of the present invention, described video camera 70 is an area array camera, this moment, people corresponded to the corresponding of surface temperature signal and face image to what the temperature field of testee and image were done, meet the custom that people observe object, help analysis the object temperature monitoring effect.
As shown in Figure 4, be provided with condenser 90 between described catoptron 40 and the photoelectric conversion unit 50.The setting of condenser 90 can improve the temperature measurement accuracy of scanner, helps simultaneously the temperature monitoring effect Analysis.
Claims (10)
1, a kind of novel infrared temperature measurement scanner, it is characterized in that: be provided with infrared ray incident mirror (10) in the described scanner, the side of infrared ray incident mirror (10) is provided with pick-up lens (20), infrared ray is passed to the disposal system of scanner inside through infrared ray incident mirror (10), visible light is passed to the disposal system of scanner inside through pick-up lens (20), and the temperature field of the object that described infrared ray incident mirror (10) scanning records is corresponding with the image of the object that pick-up lens (20) is taken the photograph.
2, novel infrared temperature measurement scanner according to claim 1 is characterized in that: the field of view angle (α) of described infrared ray incident mirror (10) matches with the field of view angle (β) of pick-up lens (20).
3, novel infrared temperature measurement scanner according to claim 1, it is characterized in that: described disposal system comprises photoelectric conversion unit (50) and signal processing unit (60), the minute surface (12) of infrared ray incident mirror (10) is with the infrared reflection of the incident catoptron (40) to its top, catoptron (40) is incident upon photoelectric conversion unit (50) with the infrared ray commentaries on classics, and described photoelectric conversion unit (50) is electrically connected with the input end of signal processing unit (60); Visible light enters the video camera (70) at camera lens rear through pick-up lens (20), and video camera (70) is electrically connected with the input end of signal processing unit (60), and the output terminal of described signal processing unit (60) is electrically connected with computing machine (80).
4, novel infrared temperature measurement scanner according to claim 2 is characterized in that: the field of view angle (α) of described infrared ray incident mirror (10) is identical with the field of view angle (β) of pick-up lens (20).
5, novel infrared temperature measurement scanner according to claim 3 is characterized in that: described video camera (70) is an area array camera.
6, novel infrared temperature measurement scanner according to claim 3 is characterized in that: be provided with condenser (90) between described catoptron (40) and the photoelectric conversion unit (50).
7, novel infrared temperature measurement scanner according to claim 4 is characterized in that: described infrared ray incident mirror (10) is 90～120 ° with pick-up lens (20) field of view angle (α, β) separately.
8, novel infrared temperature measurement scanner according to claim 4 is characterized in that: described infrared ray incident mirror (10) is 90 ° with pick-up lens (20) field of view angle (α, β) separately.
9, according to claim 1 or 2 or 3 or 4 or 7 or 8 each described novel infrared temperature measurement scanners, it is characterized in that: the below of described infrared ray incident mirror (10) is provided with rotating shaft, and electric rotating machine (30) drives infrared ray incident mirror (10) by rotating shaft and rotates.
10, novel infrared temperature measurement scanner according to claim 9, it is characterized in that: the below of described infrared ray incident mirror (10) be provided with level to base (11), the output terminal of electric rotating machine (30) is connected with the base (11) of infrared ray incident mirror (10) by rotating shaft, and the minute surface (12) of infrared ray incident mirror (10) and the angle between its base (11) are acute angle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008101957289A CN101344433A (en) | 2008-08-26 | 2008-08-26 | Novel infrared temperature measurement scanner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008101957289A CN101344433A (en) | 2008-08-26 | 2008-08-26 | Novel infrared temperature measurement scanner |
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| Publication Number | Publication Date |
|---|---|
| CN101344433A true CN101344433A (en) | 2009-01-14 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNA2008101957289A Pending CN101344433A (en) | 2008-08-26 | 2008-08-26 | Novel infrared temperature measurement scanner |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106197686A (en) * | 2016-08-30 | 2016-12-07 | 常州宝仪机电设备有限公司 | Infrared thermometry thermocouple |
| CN106404177A (en) * | 2016-08-23 | 2017-02-15 | 合肥金星机电科技发展有限公司 | Infrared scanning measured temperature correcting method |
| CN110132144A (en) * | 2019-07-10 | 2019-08-16 | 常州伊博艾利斯自动化有限公司 | A kind of dimension of object measurement method and system |
| WO2021203859A1 (en) * | 2020-04-09 | 2021-10-14 | 杭州欧镭激光技术有限公司 | Infrared temperature measuring device |
-
2008
- 2008-08-26 CN CNA2008101957289A patent/CN101344433A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106404177A (en) * | 2016-08-23 | 2017-02-15 | 合肥金星机电科技发展有限公司 | Infrared scanning measured temperature correcting method |
| CN106404177B (en) * | 2016-08-23 | 2018-10-16 | 合肥金星机电科技发展有限公司 | Infrared scanning thermometric modification method |
| CN106197686A (en) * | 2016-08-30 | 2016-12-07 | 常州宝仪机电设备有限公司 | Infrared thermometry thermocouple |
| CN110132144A (en) * | 2019-07-10 | 2019-08-16 | 常州伊博艾利斯自动化有限公司 | A kind of dimension of object measurement method and system |
| WO2021203859A1 (en) * | 2020-04-09 | 2021-10-14 | 杭州欧镭激光技术有限公司 | Infrared temperature measuring device |
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Open date: 20090114 |