CN101286050A - 测试仪表控制系统及方法、仪表控制装置 - Google Patents
测试仪表控制系统及方法、仪表控制装置 Download PDFInfo
- Publication number
- CN101286050A CN101286050A CNA2008100946925A CN200810094692A CN101286050A CN 101286050 A CN101286050 A CN 101286050A CN A2008100946925 A CNA2008100946925 A CN A2008100946925A CN 200810094692 A CN200810094692 A CN 200810094692A CN 101286050 A CN101286050 A CN 101286050A
- Authority
- CN
- China
- Prior art keywords
- instrument
- test
- control module
- module
- main control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 283
- 238000000034 method Methods 0.000 title claims abstract description 76
- 238000012545 processing Methods 0.000 claims abstract description 8
- 230000003993 interaction Effects 0.000 claims abstract description 5
- 230000008569 process Effects 0.000 claims description 57
- 230000004913 activation Effects 0.000 claims description 14
- 230000006870 function Effects 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 description 6
- 238000010998 test method Methods 0.000 description 4
- 238000013500 data storage Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 210000000352 storage cell Anatomy 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 201000004569 Blindness Diseases 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000006854 communication Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Images
Landscapes
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
Description
仪表 | 型号 | 功能 |
矢量分析仪 | A1 | 信号幅度、相位 |
矢量分析仪 | A2 | 信号幅度、相位 |
信号源 | B1 | 任意波形发生器 |
信号源 | B2 | 函数发生器 |
信号源 | B3 | RF信号源 |
信号源 | B4 | 模拟输出 |
频率计数器 | C1 | 测量高频、周期 |
频率计数器 | C2 | 测量低频、周期 |
通道开关 | D1 | 控制数据流向 |
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008100946925A CN101286050B (zh) | 2008-05-07 | 2008-05-07 | 测试仪表控制系统及方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008100946925A CN101286050B (zh) | 2008-05-07 | 2008-05-07 | 测试仪表控制系统及方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101286050A true CN101286050A (zh) | 2008-10-15 |
CN101286050B CN101286050B (zh) | 2010-12-29 |
Family
ID=40058282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008100946925A Expired - Fee Related CN101286050B (zh) | 2008-05-07 | 2008-05-07 | 测试仪表控制系统及方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101286050B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012167640A1 (zh) * | 2011-06-07 | 2012-12-13 | 中兴通讯股份有限公司 | 单板光指标自动化测试方法、系统和控制服务器 |
CN103592533A (zh) * | 2013-10-23 | 2014-02-19 | 航天东方红卫星有限公司 | 一种基于小卫星信息系统的数传天线整星测试方法 |
CN104950724A (zh) * | 2015-06-18 | 2015-09-30 | 李朝阳 | 一种自动化仪表及控制设备的维护系统及方法 |
CN105955232A (zh) * | 2016-04-22 | 2016-09-21 | 北京广利核系统工程有限公司 | 一种电站dcs中i/o模块通道自动化测试方法及系统 |
CN114817018A (zh) * | 2022-04-18 | 2022-07-29 | 润芯微科技(江苏)有限公司 | 一种仪表域人机交互标准化平台的开发测试系统 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102142895A (zh) * | 2011-03-16 | 2011-08-03 | 武汉电信器件有限公司 | 一种复用光通信仪表的方法及装置 |
-
2008
- 2008-05-07 CN CN2008100946925A patent/CN101286050B/zh not_active Expired - Fee Related
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012167640A1 (zh) * | 2011-06-07 | 2012-12-13 | 中兴通讯股份有限公司 | 单板光指标自动化测试方法、系统和控制服务器 |
CN103592533A (zh) * | 2013-10-23 | 2014-02-19 | 航天东方红卫星有限公司 | 一种基于小卫星信息系统的数传天线整星测试方法 |
CN103592533B (zh) * | 2013-10-23 | 2016-02-10 | 航天东方红卫星有限公司 | 一种基于小卫星信息系统的数传天线整星测试方法 |
CN104950724A (zh) * | 2015-06-18 | 2015-09-30 | 李朝阳 | 一种自动化仪表及控制设备的维护系统及方法 |
CN105955232A (zh) * | 2016-04-22 | 2016-09-21 | 北京广利核系统工程有限公司 | 一种电站dcs中i/o模块通道自动化测试方法及系统 |
CN105955232B (zh) * | 2016-04-22 | 2018-10-19 | 北京广利核系统工程有限公司 | 一种电站dcs中i/o模块通道自动化测试方法及系统 |
CN114817018A (zh) * | 2022-04-18 | 2022-07-29 | 润芯微科技(江苏)有限公司 | 一种仪表域人机交互标准化平台的开发测试系统 |
CN114817018B (zh) * | 2022-04-18 | 2023-02-21 | 润芯微科技(江苏)有限公司 | 一种仪表域人机交互标准化平台的开发测试系统 |
Also Published As
Publication number | Publication date |
---|---|
CN101286050B (zh) | 2010-12-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101286050B (zh) | 测试仪表控制系统及方法 | |
US20120095718A1 (en) | Automatic testing system and method | |
CN104483959A (zh) | 故障模拟与测试系统 | |
WO2018184361A1 (zh) | 应用程序测试方法、服务器、终端和存储介质 | |
CN108983077B (zh) | 一种基于jtag链路的电路板测试系统及测试方法 | |
CN112014788B (zh) | 基于录波文件回放的负荷辨识模组检测方法 | |
TW201216048A (en) | Test system | |
CN114578790B (zh) | 一种无人机飞控自动测试方法、系统、设备和介质 | |
CN101604275A (zh) | Bios测试系统及其测试方法 | |
US20070118779A1 (en) | Intelligent Test System and Related Method for Testing an Electronic Product | |
CN111242445A (zh) | 基于配置生产线测试产品的方法、设备及可读存储介质 | |
CN109002397B (zh) | 一种控制器冒烟测试系统及测试方法 | |
TWI459002B (zh) | 自動測試系統及方法 | |
CN202404912U (zh) | 智能卡芯片存储器的神经网络测试模块及测试系统 | |
CN113160875B (zh) | 芯片测试系统和测试方法 | |
CN109684142A (zh) | 一种bmc时间准确性测试的方法、系统及设备 | |
TW201222240A (en) | Testing method for automatically rebooting a motherboard and recording related debug information and rebooting device thereof | |
CN213780287U (zh) | 数字集成电路测试装置和数字集成电路测试系统 | |
CN113341300B (zh) | 矩阵按键电路自动检测方法、装置、介质及设备 | |
CN114911656A (zh) | 一种ipmi指令的自动化测试方法、单片机及相关装置 | |
CN110554936A (zh) | 一种ssd测试方法及系统 | |
CN116953418B (zh) | 射频测试方法、系统、设备及计算机可读存储介质 | |
CN1979192A (zh) | 用来测试电子产品的智慧型测试系统及其相关方法 | |
CN109254925B (zh) | 测试数据帧生成方法及装置、软件测试方法及装置 | |
CN114090454B (zh) | 一种接口自动化测试方法、装置、设备及存储介质 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170912 Address after: 121200 Jinzhou City, Liaoning Province Linghai City Jianye Village Center Village No. 352 Patentee after: Tong Fang Address before: 518057 Nanshan District Guangdong high tech Industrial Park, South Road, science and technology, ZTE building, Ministry of Justice Patentee before: ZTE Corporation |
|
TR01 | Transfer of patent right | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Tong Fang Inventor before: Cui Wenhui |
|
CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: 541006 the Guangxi Zhuang Autonomous Region Qifeng Yanshan District of Guilin City Park Patentee after: Tong Fang Address before: 121200 Jinzhou City, Liaoning Province Linghai City Jianye Village Center Village No. 352 Patentee before: Tong Fang |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101229 Termination date: 20180507 |