CN101261302B - Open circuit detection system and its method - Google Patents
Open circuit detection system and its method Download PDFInfo
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- CN101261302B CN101261302B CN2007100855480A CN200710085548A CN101261302B CN 101261302 B CN101261302 B CN 101261302B CN 2007100855480 A CN2007100855480 A CN 2007100855480A CN 200710085548 A CN200710085548 A CN 200710085548A CN 101261302 B CN101261302 B CN 101261302B
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Abstract
The invention discloses a detecting system and a method used for judging whether a pin of an electronic component is properly coupled to a circuit device, the detecting system comprises a measured signal source, a signal induction unit, a signal processor and an analyzing unit, wherein, the signal processor is provided with induction signals which are filtered and sensed by sampling and the induction signals are corresponding to the measured signals which are input by the electronic component. Besides, the analyzing unit controls the change of frequency and amplitude of the measured signals according to the fact that whether the induction signals are wrong signals.
Description
Invention field
The present invention relates to a kind of detection system and method thereof, and relate in particular to a kind of pin of detected electrons element and detection system and the method thereof whether the circuit erecting shop has the empty weldering of generation.
Technical background
At populated circuit board (Print Circuit Board Assembly, PCBA) in the test, when the production line head end test, a considerable step is each the integrated circuit (IntegratedCircuits that checks on the printed circuit board (PCB) (Print Circuit Boards), ICs) or connector electronic components such as (Connectors), whether firmly also correctly be connected on the printed circuit board (PCB), it is bad that such test is taken place in the time of can reducing back-end function test (Functional Test), and effectively detect the processing procedure defective (Manufacture Defects) of front end.Test machine (In-Circuit Tester on the general line, ICT) adopt so-called processing procedure defect analyzer (Manufacture Defect Analyzer, MDA) with automatically and find out process errors such as the empty weldering of element damage, element short circuit, element that the electronic component that is distributed on the printed circuit board (PCB) causes because of the front end processing procedure, element mistake part apace, but this processing procedure defect analyzer only takes advantage at the test mode of analogy element, test for digital circuit, the ASIC that oneself orders as client etc., then need complicated test archives, just can reach more complete detection.
For the test that is connected between integrated circuit or connector and printed circuit board (PCB), capacitive coupling detection method (Capacitive Coupling Test) then is the method for testing of quite convenient, reliable, scalar (Vector-less) pattern and non-destructive contact.This detection method is utilized the connection lead (Lead frame) of integrated circuit and is added formed equivalent inductance capacitance between induced electricity pole piece (Sensor Plate), make the connection lead of integrated circuit and add to have faint annexation between the induced electricity pole piece, the size of coupling back signal is then judged the connection state of this electronic component for us.Apply the test pin of ac small signal to integrated circuit, if being connected between integrated circuit or connector and printed circuit board (PCB) is normal, then this ac small signal can be coupled to the induced electricity pole piece through the inductance capacitance of interface generation thus, and obtain reference potential A, otherwise if being connected between integrated circuit and printed circuit board (PCB) is unusual, then the inductance capacitance value of this interface reduces, and signal is difficult for being coupled to the induced electricity pole piece, and also can get reference potential B this moment.Can judge by the amount size variation of this ac small signal whether integrated circuit normally is connected to printed circuit board (PCB), and this technology proposed patent (patent No. US5254953) by US business's Agilent (Agilent Technologies) in 1993, and was widely used in the production line of foundries.But progress along with semiconductor and integrated circuit manufacture process, the encapsulation of integrated circuit is towards the trend evolution of high density, small size, such result causes the connection lead of integrated circuit significantly to dwindle, this phenomenon especially tin ball lock array package (Ball Grid Array, BGA) or obvious especially in the encapsulation of some advanced process.The connector aspect, the lead of connectors such as novel connector such as PCI-E, DDR2/3, CPU Socket contracts in all many, and the geometric configuration of lead changes or dwindles and will cause the induced electricity pole piece significantly to dwindle with the inductance capacitance that is connected between lead, signal is difficult for being coupled on the induced electricity pole piece, so that rear signal is handled and is difficult for, and then cause signal noise ratio (the Signal to Noise Ratio of detection signal, S/NRatio) fall suddenly, what raising False Rate and reduction integrated circuit or connector were connected with printed circuit board (PCB) estimates.
The capacitive coupling that known technology proposed detects critical value (1fF=10 about about 20fF of its test of patent
-15Farad), the inductance capacitance value that is lower than this value then can't detect judgement, and the pin of the tin ball lock array package nearly 30～40% of a common standard is lower than this test value.The signal processing mode that this known technology of old friend is proposed has been not enough to contain the situations of producing a large amount of use tin ball lock array package in the line, especially in the integrated circuit of high density pin, the situation that the inductance capacitance value descends is more obvious, so be necessary to propose new signal processing mode, solve test coverage rate problem on the low side takes place in detection.
For another U.S. Patent number US5486753, when US539199 proposes and multichannel detection mode, also be to use capacity coupled mode, but the framework complexity, be difficult to be implemented in and have test machine on the low-cost line that requires.In addition in the electric field detector that Taiwan patent No. TW540709 proposes, its framework complexity, and the probe that detects usefulness do not conform to tool and main flow market, and cost improves relatively.
Therefore, having needs to improve the shortcoming that above-mentioned known technology had, in the hope of and also reducing cost when improving verification and measurement ratio.
Summary of the invention
The invention provides a kind of detection system and detection method thereof, whether the pin of electronic component is connected in the circuit assembling definitely for example effectively to detect.
Detection system of the present invention comprises signal source, induction of signal unit, signal processing unit and analytic unit.Wherein this signal source output test signal is to the pilot to be measured of this electronic component, and this induction of signal unit detects induced signal that should test signal.Signal processing unit is provided with anaiog signal amplifier and wave filter, to handle induced signal and filtering noise wherein.Signal processing unit also is provided with excessive sampler, in order to digitizing that induced signal is excessively taken a sample, so that the subsequent analysis of analytic unit is handled.For guaranteeing that induced signal is non-rub-out signal, this analytic unit will be analyzed this digitizing induced signal, judge whether it meets reference value or reference range.Low and/or signal is undercoupling because of signal noise ratio makes the mistake during signal as induced signal, and analytic unit will be heightened the frequency and the amplitude of test signal through controller, so that induced signal is adjusted to correct signal.Correct induced signal transfers frequency spectrum data to after digitizing, so that analytic unit carries out analyzing and processing, and then judge whether pin is electrically connected correct.
Pick-up unit of the present invention and detection method can be by the frequency or the amplitudes that improve test, cooperate the particular filter of induced signal to handle and excessive sampling rate and increase signal noise ratio again, and it is more accurate that the electrical connection of electronic component is judged, reduces the erroneous judgement situation and take place.
Description of drawings
Fig. 1 shows the synoptic diagram of detection system according to an embodiment of the invention.
Fig. 2 shows the process flow diagram of detection method according to an embodiment of the invention.
Fig. 3 a and Fig. 3 b show the synoptic diagram that carries out the spectrum analysis comparison according to one embodiment of the invention.
Embodiment
The embodiment of detection system of the present invention and method below will be described.Need be appreciated that the described embodiment of this case is not in order to limiting the scope of the invention, that is the present invention can use further feature, element, method, and embodiment and being implemented.Whether detection system of the present invention and detection method can be utilized but be not limited to the situation whether capacity coupled mode detection. electronics has open circuit, correct to judge its electrical connection.
Fig. 1 shows the synoptic diagram of detection system according to an embodiment of the invention.Element number 100 is meant detection system, and it is suitable for detecting the electronic installation that is constituted with printed circuit board (PCB) 126 and integrated circuit 129.Detection system 100 comprises testing source 110, channel selection device 120, induction of signal unit 130, signal processing unit 140, computer 160, reaches controller 170.
Testing source 110 comprises signal source controller 112, formula frequency adjuster 114 able to programme, formula amplitude adjuster 116 able to programme and lump device 118.Signal source controller 112 utilizes lump device 118 to make the test signal Si tool adjustable frequency and the amplitude of testing source 110 outputs via controlled frequency adjuster 114 and amplitude adjuster 116 again.Channel selection device 120 is acceptance test signal Si for example for can drive matrix switch, 124 test points that are connected on the printed circuit board (PCB) 126 of its output terminal, and it is the pin 128 of corresponding integrated circuit 129.Channel selection device 120 is in order to selected pin 128 to be tested, and all the other pins except that pin to be measured in the integrated circuit 129 are connected to system earth 122.
Induction of signal unit 130 comprises that sensing chip 134 and multiplex (MUX) block 132.Sensing chip 134 is assembled on each corresponding integrated circuit 129, and is connected to the multiplex (MUX) and blocks 132 input.With test signal Si when channel selection device 120 inputs to test point, the test pin 128 of integrated circuit 129 will produce the matching test alternating current impression signal (St1, St1 ') that small capacitance is coupled out with sensing chip 134, and it blocks 132 through the multiplex (MUX) and inputs to signal processing unit 140.The pin to be measured of integrated circuit 129 is to send by controller 170 to select signal Sc2 to select to channel selection device 120, and by the controller 170 output enable signal Se corresponding with control signal Sc2 work card 132 at the most, and select to test corresponding induced signal of pin (St1, St1 ') to signal processing unit 140 with this.
Signal processing unit 140 is in order to handle induced signal (St1, St1 ') to obtain frequency spectrum St7 to be measured and to remove the noise for the treatment of that measured frequency is outer.Embodiment as shown in Figure 1, signal processing unit 140 comprise high-frequency signal amplifier 142a/ low-frequency signal amplifier 142b, high-frequency signal wave filter 144a/ low frequency signal wave filter 144b, excessive sampler 146, reach spectrum analyzer 149.Block the switching state of the induced signals of 132 outputs by the multiplex (MUX), select one so that induced signal is handled paths through high-frequency signal amplifier 142a and high-frequency signal wave filter 144a or low-frequency signal amplifier 142b and low frequency signal wave filter 144b two according to its frequency height determine switch SW1, SW2.For example, when being higher than about 100kHz and being high-frequency signal St1, be to transfer amplifying signal St2 to through high-frequency signal amplifier 142a as the induced signal frequency, be present in noise among the signal St2 through high-frequency signal wave filter 144a filtering again.When the induced signal frequency is low frequency signal St1 ' less than about 100kHz, then transfer amplifying signal St2 ' to, be present in noise among the signal St2 ' through low frequency signal wave filter 144b filtering again through low-frequency signal amplifier 142b.
The signal St3 that is provided by high-frequency signal wave filter 144a/ low frequency signal wave filter 144b will input to excessive sampler 146, and it can comprise antialiasing (anti-alias) wave filter 146a, cross sampler 146b and adjustable digital filter 146c.Antialiasing filter 146a trap signal St3 and produce signal St4 wherein, and cross sampler 146b and signal St4 is excessively taken a sample and produce digitized signal St5, and adjustable digital filter 146c will carry out digital filtering to signal St5 and handle so that noise filtering is produced digital signal St6.In exemplary embodiments of the present invention, adjustable digital filter 146c can be 256 rank finite impulse response filters (finite impulseresponse filter), and when test signal for example was 100kHz, excessively sampling rate (over-sampling ratio) can reach 25 times.
Spectrum analyzer 149 and computer 160 component analysis unit, whether it is correct induced signal earlier signal St6 to be carried out analysis and judgement, is applicable to whether the pin to be tested of judging integrated circuit 129 is coupled on the printed circuit board (PCB) definitely.With regard to the analysis of this signal St6, computer 160 stores the corresponding reference value or the reference range of test feature, the standard coupling capacitance that it for example should detect under different condition for integrated circuit.Based on the reference data that computer prestored, native system will be extrapolated it with signal St6 and whether meet corresponding reference value or reference range.Meet its corresponding reference value as signal St6, spectrum analyzer 149 will carry out for example spectrum analysis of fast fourier transform (FastFourier Transform) to signal St6, whether after making signal St6 be converted to the frequency spectrum St7 that forms with the complex conversion value by time-domain function, conversion value is analysed and compared is coupled on the printed circuit board (PCB) with the pin to be tested of judging integrated circuit 129 more definitely.Though present embodiment uses fourier transform to obtain frequency spectrum, so other algorithm or processing mode also are suitable for.
Do not meet its corresponding reference value as signal St6, represent that then the signal coupling is improper, the induced signal that causes acquisition is a rub-out signal.Because the influence of the miniaturization of integrated circuit 129 makes signal be difficult for coupling and reduction signal noise ratio, therefore may cause induced signal incorrect, can not use the foundation into judging that pin is electrically connected.For solving rub-out signal problems such as signal coupling and signal noise ratio reduction, the capacitive reactance of inductance capacitance can be expressed as:
X
c=1/j ω C, wherein ω=2 π f are angular frequency, C is a capacitance.
So when the frequency f of the test signal Si that passes through inductance capacitance improves, the capacitive reactance of inductance capacitance will reduce, the signal coupling is easier to.Therefore, according to an embodiment, test signal Si is preferable can to heighten frequency to more than the 100kHz via formula frequency adjusted signal able to programme source 114, for example 100kHz～500kHz, significantly promoting the amount that test signal Si is coupled to sensing chip 134, thereby effectively increase signal noise ratio.In addition, collocation uses formula amplitude adjustment signal able to programme source 116 to adjust the size of amplitude, and the semaphore of coupling is promoted again.So, computer 160 sees through controller 170 will send control signal Sc1 to signal source 110, with the frequency of heightening test signal Si and the size of amplitude, and change-over switch SW1 and SW2, make induced signal transfer high-frequency induction signal St1 to and carry out suitable follow-up signal again and handle.
Because described system adopts the mode of back coupling control to adjust frequency and the amplitude of test signal Si, the test critical value of induction of signal unit 130 can be lower than known capacitive coupling detection significantly and be about 20fF (1fF=10
-15Farad) test critical value, thus can measure less inductance capacitance, thereby improve the test coverage rate.
Please refer to Fig. 3 a and Fig. 3 b, it analyses and compares whether be coupled to the chart of printed circuit board (PCB) definitely with the pin to be tested of judging integrated circuit 129 for 160 pairs of conversion values of explanation computer.Computer 160 analysis spectrum to be to isolate target data and with after its normalization, judge that again its conversion value is whether in preset standard scope [v1, v2].Be positioned in the scope [v1, v2] as target data, the pin to be tested that can infer integrated circuit 129 is for being coupled to definitely on the printed circuit board (PCB), shown in Fig. 3 a.Less than scope [v1, v2], represent that pin to be tested is unusual with being connected of printed circuit board (PCB), as target data shown in Fig. 3 b.
Fig. 2 shows the process flow diagram according to the detection method of one embodiment of the invention.Please refer to Fig. 2 and Fig. 1, further specify the detection method of the embodiment of the invention again.In step 202,, whether correctly be electrically connected with the pin 128 of testing integrated circuits 129 via testing source 110 output test signal Si.
In step 204, than induced signal, it for example is the low frequency induction signal St1 ' of corresponding lower frequency test signal Si via induction of signal unit 130 detection type.Subsequently, the induced signal St1 ' that detects is carried out the anaiog signal place, after amplifying induced signal St1 ' (step 206), again via wave filter 144b filtering noise (step 208) through amplifier 142b.Then, the signal of filtering noise after excessively sampling transfers digital signal (step 210) to, the noise (step 212) in digital filter 146c filtering digital signal again.Then, by being compared, digital signal and corresponding reference value judge whether induced signal is rub-out signal (step 213).If induced signal is wrong induced signal, controller 170 will be controlled frequency and the amplitude (step 218) of testing source 110 to heighten test signal Si, carry out signal testing and processing via step 202～212 again.
As induced signal is correct induced signal, by step 214 digital signal is converted to the frequency spectrum of forming with conversion value through spectrum analyzer 149.Subsequently, computer 160 will carry out step 220, extract the conversion value of the target data of corresponding test signal Si from frequency spectrum out and also judge according to its size whether pin is electrically connected correct.Shown in Fig. 3 a, to represent that pin is electrically connected during greater than the minimum value of preset standard scope correct when conversion value; Otherwise pin electrically connects as unusually, shown in Fig. 3 b.
By above-mentioned description as can be known, the present invention is by feedbacking control and can automatically adjust frequency and the amplitude that signal source is used according to different inductance capacitance values so that the test coverage rate increases, thereby improve electronic component can the survey rate, draw high signal noise ratio simultaneously.
Compared to known detection method, the present invention can improve the frequency or the amplitude of test by the mode of back coupling control, cooperate the particular filter of induced signal to handle and excessive sampling rate again, and then the increase signal noise ratio is the about signal noise ratio more than 20 times of known technology, make the electrical connection judgement of electronic component more accurate, reduce the test False Rate effectively.Detection system of the present invention fully adopts existing tool and probe, need not newly-increased tool cost, so provide cost savings significantly.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; any those skilled in the art; without departing from the spirit and scope of the present invention; when can doing a little change and retouching, so protection scope of the present invention is when being as the criterion with the protection domain that accompanying claim was defined.
Claims (13)
1. whether detection method between the contact in order to the pin of judging electronic component and circuit assembling empty weldering takes place, and it is characterized in that comprising:
The output test signal also makes its pin through electronic component;
The induced signal that detection produces with capacitive coupling, the parameter that it is electrically connected for this pin of reflection;
Make this induced signal carry out the program of a signal Processing, it comprises:
Excessive this induced signal of sampling is to obtain the digitizing induced signal; And
Extrapolate this digitizing induced signal and whether meet a preset reference value, use and judge whether this induced signal is correct induced signal;
When this digitizing induced signal does not meet this preset reference value, heighten the frequency and/or the amplitude of this test signal;
When this digitizing induced signal meets this preset reference value, this digitizing induced signal is handled, make this digitizing induced signal be converted to frequency spectrum data; And
Based on this frequency spectrum data, judge whether the electrical connection of this pin is correct.
2. detection method as claimed in claim 1 is characterized in that: the program that makes this induced signal carry out signal Processing comprises makes this induced signal through signal amplifier and wave filter.
3. detection method as claimed in claim 1 is characterized in that: the program that makes this induced signal carry out signal Processing comprises makes this induced signal behind antialiasing filter, excessively takes a sample again.
4. detection method as claimed in claim 1 is characterized in that: the program that makes this induced signal carry out signal Processing comprise this induced signal excessively taken a sample after, handled through digital filter in addition.
5. detection method as claimed in claim 1 is characterized in that: the step that makes this digitizing induced signal be converted to frequency spectrum data comprises carries out fast fourier transform.
6. detection method as claimed in claim 1 is characterized in that: this preset reference value is the capacity coupled reference value of expression.
7. detection method as claimed in claim 1 is characterized in that also comprising:
Test signal based on this tool frequency and/or amplitude are heightened detects another induced signal; And
Make this another induced signal carry out the program of this signal Processing.
8. whether detection system between the contact in order to the pin of judging electronic component and circuit assembling empty weldering takes place, and it is characterized in that comprising:
One signal source is suitable for exporting test signal and makes it through this pin;
One induction of signal unit is suitable for detecting the induced signal that produces with capacitive coupling, the parameter that it is electrically connected for this pin of reflection;
One signal processing unit is suitable for this induced signal of excessively taking a sample, to obtain the digitizing induced signal; And
One analytic unit is implemented a signal handler to this digitizing induced signal, and wherein this signal handler comprises:
Extrapolate this digitizing induced signal and whether meet a preset reference value, use and judge whether this induced signal is correct induced signal; And
When this digitizing induced signal meets this preset reference value, this digitizing induced signal is handled, make this digitizing induced signal be converted to frequency spectrum data, whether correct with the electrical connection of judging this pin based on this frequency spectrum data; And
One controller, when this digitizing induced signal did not meet this preset reference value, this controller can be heightened the frequency and/or the amplitude of this test signal.
9. detection system as claimed in claim 8 is characterized in that: this signal processing unit is with this induced signal process signal amplifier and wave filter.
10. detection system as claimed in claim 9 is characterized in that: this signal processing unit makes this induced signal through this signal amplifier and wave filter after going out the frequency height of this induced signal respectively again.
11. detection system as claimed in claim 8 is characterized in that: this signal processing unit is excessively taken a sample for making this induced signal behind antialiasing filter again.
12. detection system as claimed in claim 8 is characterized in that: this signal processing unit is handled through digital filter after this induced signal is excessively taken a sample again.
13. detection system as claimed in claim 8 is characterized in that: this preset reference value is the capacity coupled reference value of expression.
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8179143B2 (en) | 2008-10-15 | 2012-05-15 | Test Research, Inc. | Apparatus for testing printed circuit and method therefor |
| CN102478619B (en) * | 2010-11-30 | 2014-12-31 | 致茂电子股份有限公司 | Open circuit detecting method and test carrying table with open circuit detecting function |
| CN104569711B (en) * | 2013-10-22 | 2018-02-09 | 珠海格力电器股份有限公司 | Electronic component opens the method and test device of short circuit experiment |
| EP3312617B1 (en) * | 2016-10-18 | 2019-09-04 | ABB Schweiz AG | Method and device for testing a galvanic connection of a high-voltage condenser bushing assembly |
| CN106771831B (en) * | 2017-01-09 | 2023-09-01 | 昆山艾伯格机器人科技有限公司 | Automatic detection mechanism for connectors with multiple pin heights |
| CN109150211B (en) * | 2017-06-19 | 2020-09-25 | 大唐移动通信设备有限公司 | Broadband transmitting device |
| CN107782944A (en) * | 2017-09-26 | 2018-03-09 | 信利光电股份有限公司 | A kind of universal meter and the device and method of detection circuit open-circuit position |
| CN108760819B (en) * | 2018-05-22 | 2020-08-18 | 广州兴森快捷电路科技有限公司 | Welding quality detection device and detection method thereof |
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