CN101201780A - Method for testing parameter data - Google Patents

Method for testing parameter data Download PDF

Info

Publication number
CN101201780A
CN101201780A CNA2006101694231A CN200610169423A CN101201780A CN 101201780 A CN101201780 A CN 101201780A CN A2006101694231 A CNA2006101694231 A CN A2006101694231A CN 200610169423 A CN200610169423 A CN 200610169423A CN 101201780 A CN101201780 A CN 101201780A
Authority
CN
China
Prior art keywords
supplemental characteristic
parameter data
storage element
buffer unit
testing parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CNA2006101694231A
Other languages
Chinese (zh)
Other versions
CN100517253C (en
Inventor
林大华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
State Grid Shanghai Electric Power Co Ltd
Original Assignee
Inventec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inventec Corp filed Critical Inventec Corp
Priority to CNB2006101694231A priority Critical patent/CN100517253C/en
Publication of CN101201780A publication Critical patent/CN101201780A/en
Application granted granted Critical
Publication of CN100517253C publication Critical patent/CN100517253C/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

A testing method for parameter data is applied to a computer device that is provided with a base board management controller, a parameter data storage unit and a cache unit. The base board management controller reads the parameter data stored in the parameter data storage unit; the data is transmitted to the cache unit to be stored and the parameter data in parameter data storage unit is cleared away; then the parameter data in the cache unit is read and rewritten into parameter data storage unit to compare whether the parameter data in the parameter data storage unit and the that in the cache unit are the same, thus achieving the goal of testing whether parameter data access is correct.

Description

Method for testing parameter data
Technical field
The present invention relates to a kind of supplemental characteristic measuring technology, know clearly it, relate to a kind of baseboard management controller of learning storage element read-write correctness that is used for the storage parameter data and the method for testing parameter data that reads stability.
Background technology
Be applied to baseboard management controller (the Baseboard ManagementController of server at present; BMC) supplemental characteristic is stored in various replaceable nextport hardware component NextPorts unit (Field Replaceable Unit respectively, FRU) and SDR (Sensor Data Record) formula internal storage location, and this supplemental characteristic has suitable importance concerning baseboard management controller, when server under the state of dormancy or shutdown, can assist baseboard management controller to proceed work by this supplemental characteristic, for example teleinformatic reception, the server internal signal transmits or the like, allow server under dormancy or off-mode, can also carry out partially-working, do not enter dormancy or off-mode leaves unused because of server.
Because present server manufacturer is at the various replaceable nextport hardware component NextPort unit of baseboard management controller (Field Replaceable Unit; FRU) and SDR (Sensor Data Record) formula internal storage location in the exploitation of various platforms; might be absolutely fully errorless write supplemental characteristic maybe with stable the reading of this supplemental characteristic; if supplemental characteristic can't be correctly at various replaceable nextport hardware component NextPorts unit (Field Replaceable Unit; FRU) and SDR (Sensor DataRecord) formula internal storage location carry out stable read-write; then can make this baseboard management controller when work, read wrong supplemental characteristic; and to read wrong supplemental characteristic when carrying out work; also might make the unstable or shutdown of server running; and then produce the visitor and tell problem, so quite big for the commodity image and the word-of-mouth influence of server manufacturer.
Therefore, how to provide a kind of supplemental characteristic read-write whether correctly to reach stable method of testing, real is the industry problem demanding prompt solution.
Summary of the invention
In view of the shortcoming of above-mentioned prior art, fundamental purpose of the present invention is to provide a kind of readwrite tests to supplemental characteristic whether correctly to reach stable method for testing parameter data.
In order to achieve the above object, the invention provides a kind of method for testing parameter data, be applied to have baseboard management controller, the computer installation of supplemental characteristic storage element and buffer unit, this method for testing parameter data may further comprise the steps: the supplemental characteristic that (1) makes this baseboard management controller will be stored in this supplemental characteristic storage element is read, and this supplemental characteristic is sent to this buffer unit storage; (2) make this baseboard management controller remove the interior supplemental characteristic of this supplemental characteristic storage element; (3) make this baseboard management controller read this supplemental characteristic, and this supplemental characteristic is write this supplemental characteristic storage element again from this buffer unit; And whether the supplemental characteristic that (4) make this baseboard management controller contrast in this supplemental characteristic storage element and this buffer unit conforms to.
In addition this method for testing parameter data also comprises the input cycling numerical value, does not reach this cycling numerical value if this computer installation is carried out this step (1) to the number of times of step (4), and then escheat is carried out this step (1) to step (4); If carrying out this step (1) to the number of times of step (4) has reached this cycling numerical value and has then finished this method for testing parameter data.
In above-mentioned steps (1), the storage area that this buffer unit provided equals to be used to store the size of this supplemental characteristic at least, and perhaps the storage area that this buffer unit provided can be equal to or greater than the storage area that this supplemental characteristic storage element is provided.
In the above-mentioned steps (2), this reset mode be with electrically erase or fill out 00h, the FFh mode is removed the supplemental characteristic in this supplemental characteristic storage element.
Whether in the above-mentioned steps (4), it is consistent with the length scale and the content of the supplemental characteristic of this buffer unit to contrast this supplemental characteristic storage element, and record of the data message after will contrasting and output, for inquiry.
Among another embodiment of method for testing parameter data of the present invention, when carrying out the number of times of this step (1) and reached this cycling numerical value to step (4), output contrast back data message then, and this data message is meant that this supplemental characteristic storage element contrasts consistent with supplemental characteristic in this buffer unit and contrasts inconsistent ratio.
In sum; method for testing parameter data of the present invention; it is stable to be used to judge whether supplemental characteristic storage element read-write supplemental characteristic correctly reaches, with correctness and the stability of guaranteeing that baseboard management controller is read and write supplemental characteristic at this supplemental characteristic storage element.
Description of drawings
Fig. 1 is the system architecture block schematic diagram of running method for testing parameter data of the present invention; And
Fig. 2 is the schematic flow sheet of method for testing parameter data of the present invention.
[primary clustering symbol description]
1 computer installation
11 baseboard management controllers
12 supplemental characteristic storage elements
13 buffer units
S1~S8 step
Embodiment
Below by specific instantiation explanation embodiments of the present invention, those skilled in the art can understand other advantage of the present invention and effect easily by the content that this instructions disclosed.
See also Fig. 1, it is the system architecture block schematic diagram of running method for testing parameter data of the present invention, as shown in the figure, this method of testing is applied to computer installation 1, this computer installation 1 includes baseboard management controller (Baseboard Management Controller, BMC) 11, supplemental characteristic storage element 12 and buffer unit 13, wherein, this supplemental characteristic storage element 12 is by various replaceable nextport hardware component NextPorts unit (Field Replaceable Unit, FRU) 121 and SDR (Sensor Data Record) formula internal storage location 122 form, and this buffer unit 13 is to can be electrically erase formula programmble read only memory PROM (EEPROM) or flash memory internal memories such as (Flash RAM).
The required supplemental characteristic of these baseboard management controller 11 work is stored in this supplemental characteristic storage element 12, therefore, stablize in order to ensure entirely true the reaching of supplemental characteristic that this baseboard management controller 11 is read and write out by this supplemental characteristic storage element 12, so utilize test procedure whether this baseboard management controller 11 to the required supplemental characteristic of these supplemental characteristic storage element 12 read-writes is correctly reached stable the test, and use buffer unit 13 to cooperate test, the supplemental characteristic of reading is stored in this buffer unit 13, can produce mistake from these supplemental characteristic storage element 12 read-writes to guarantee this supplemental characteristic.
This buffer unit 13 storages are read and be sent to the supplemental characteristic that this test procedure makes this baseboard management controller 11 will be stored in this supplemental characteristic storage element 12, the storage area that this buffer unit 13 is provided need equal to can be used for storing the size of this supplemental characteristic at least, perhaps the storage area that provided of this buffer unit 13 can be equal to or greater than the storage area that this supplemental characteristic storage element 12 is provided, for storing this supplemental characteristic content, 11 of this baseboard management controllers are electrically to erase or to fill out 00h, the FFh mode is removed the supplemental characteristic that originally is stored in this supplemental characteristic storage element 12, read the supplemental characteristic of storage from this buffer unit 13 again, and write this supplemental characteristic storage element 12 again, and make this baseboard management controller 11 these supplemental characteristic storage elements 12 of contrast and this buffer unit 13 interior supplemental characteristic length scale and content whether identical, errorless to confirm this supplemental characteristic.
See also Fig. 2 and cooperation with reference to figure 1, Fig. 2 is the schematic flow sheet of method for testing parameter data of the present invention, as shown in the figure, this method for testing parameter data is applied to computer installation 1, this computer installation 1 has baseboard management controller 11, supplemental characteristic storage element 12 and buffer unit 13, and this computer installation 1 is carried out method for testing parameter data of the present invention and comprised the following steps:
At first in this step S1, import cycling numerical value n, for example importing cycling numerical value n is 6, and this cycling numerical value n is used to increase test accuracy, can increase and decrease this cycling numerical value n according to the degree of accuracy demand, then proceeds to step S2.
In this step S2, judge whether this cycling numerical value n equals zero, if then proceed to step S8; If not, then proceed to step S3.
In this step S3, the supplemental characteristic that makes this baseboard management controller 11 will be stored in this supplemental characteristic storage element 12 is read, and the supplemental characteristic that this read is stored to this buffer unit 13, then proceeds to step S4.
In this step S4, make this baseboard management controller 11 electrically to erase or to fill out 00h, FFh mode and remove supplemental characteristic in this supplemental characteristic storage element 12, then proceed to step S5.
In this step S5, make this baseboard management controller 11 read this supplemental characteristic, and this supplemental characteristic is write this supplemental characteristic storage element 12 again from this buffer unit 13, then proceed to step S6.
In this step S6, make this baseboard management controller 11 these supplemental characteristic storage elements 12 of contrast and this buffer unit 13 interior supplemental characteristic length scale and content whether consistent, and the result of record contrast, also be, if comparing result is consistent, represent that then this supplemental characteristic storage element 12 is correct for the read-write of supplemental characteristic, and write down this comparing result for correct; Otherwise, if comparing result is inconsistent, then represent the read-write mistake of this supplemental characteristic storage element 12, and to write down this comparing result be mistake for supplemental characteristic, then proceed to step S7.
In this step S7, this cycling numerical value n that successively decreases also promptly sets cycling numerical value n=(cycling numerical value n-1), if this cycling numerical value n 6 o'clock for example after carrying out this step S7, promptly becomes 5, and returns step S2, till this cycling numerical value n equals zero.
In this step S8, the result after the contrast is shown, and finished test procedure.In the present embodiment, shown comparing result is for example correct and wrong ratio, thus can be with reference to the correct and wrong ratio size of this output, as the judgement of this supplemental characteristic storage element 12 for the read-write correctness of supplemental characteristic for the tester.
In the present embodiment, the cycling numerical value n that is imported is 6, test procedure judges whether this cycling numerical value 6 equals zero, if not, this test procedure repeated execution of steps S2 to S7 then, whenever circulation executes once, this cycling numerical value n then can successively decrease 1, the condition that meets step S2 up to this cycling numerical value n, the ratio of the correct and error result after then execution in step S8 will contrast is exported to the tester and is known and finish test procedure, and this cycling numerical value is then decided on the testing time that the tester desires to think, to guarantee that this supplemental characteristic storage element 12 is correct equally for the read-write through repeatedly of supplemental characteristic, and then can not have influence on the running of baseboard management controller, in addition, the cycle criterion pattern of this cycling numerical value n then has different embodiments according to tester's demand, for example, but modify steps S1, step S2 and step S7 (not shown) at this, particularly, the newly-increased parameter value m that sets in this step S1, and setting this parameter value m is zero, behind the execution in step S3 to S6, step S7 changed into increase progressively this parameter value m, also promptly set this parameter value m=(parameter value m+1), and this step S2 changed into judge whether this parameter value m equates with cycling numerical value n, if equate then to proceed to step S8, if unequally then continue to carry out step S3 to S7, up to this parameter value m with till cycling numerical value n equates, also be, look closely the cycle criterion demand and different designs is arranged, so no longer be described in detail at this.
Therefore, method for testing parameter data of the present invention is to utilize test procedure that baseboard management controller (BMC) supplemental characteristic is read and write to the correctness and the stability of supplemental characteristic storage element to test, end of test (EOT) produces test report, to learn that according to this test report this baseboard management controller (BMC) is to the read-write correctness of this supplemental characteristic storage element 12 and read stability.
The above embodiments only are illustrative characteristics of the present invention and effect thereof, but not are used to limit the scope of essence technology contents of the present invention.Any those skilled in the art all can be under spirit of the present invention and category, and the foregoing description is modified and changed.Therefore, the scope of the present invention, the claim scope is listed as described later.

Claims (9)

1. method for testing parameter data is applied to have baseboard management controller, the computer installation of supplemental characteristic storage element and buffer unit, and this data parameters method of testing may further comprise the steps:
(1) supplemental characteristic that makes this baseboard management controller will be stored in this supplemental characteristic storage element is read, and this supplemental characteristic is sent to this buffer unit storage;
(2) make this baseboard management controller remove the interior supplemental characteristic of this supplemental characteristic storage element;
(3) make this baseboard management controller read this supplemental characteristic, and this supplemental characteristic is write this supplemental characteristic storage element again from this buffer unit; And
Whether (4) make this baseboard management controller contrast this supplemental characteristic storage element consistent with the supplemental characteristic in this buffer unit.
2. method for testing parameter data according to claim 1, this method also comprises the input cycling numerical value, does not reach this cycling numerical value if this computer installation is carried out this step (1) to the number of times of step (4), then escheat is carried out this step (1) to step (4); If carrying out this step (1) to the number of times of step (4) has reached this cycling numerical value and has then finished this method for testing parameter data.
3. method for testing parameter data according to claim 1, wherein, the storage area that this buffer unit provided equals to can be used for storing the size of this supplemental characteristic at least.
4. method for testing parameter data according to claim 1, wherein, the storage area that this buffer unit provided equals the storage area that this supplemental characteristic storage element is provided.
5. method for testing parameter data according to claim 1, wherein, the storage area that the storage area that this buffer unit provided is provided greater than this supplemental characteristic storage element.
6. method for testing parameter data according to claim 1, wherein, in this step (2), this reset mode be with electrically erase or fill out 00h, the FFh mode is removed the supplemental characteristic in this supplemental characteristic storage element.
7. method for testing parameter data according to claim 1, wherein, whether in this step (4), it is consistent with the length scale and the content of the supplemental characteristic of this buffer unit to contrast this supplemental characteristic storage element.
8. method for testing parameter data according to claim 1, this method also comprise record of the data message after the contrast and output.
9. method for testing parameter data according to claim 2, wherein, when carrying out the number of times of this step (1) and reached this cycling numerical value to step (4), output contrast back data message, and this data message is meant that this supplemental characteristic storage element is consistent with the supplemental characteristic contrast in this buffer unit and contrasts inconsistent ratio.
CNB2006101694231A 2006-12-14 2006-12-14 Method for testing parameter data Active CN100517253C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2006101694231A CN100517253C (en) 2006-12-14 2006-12-14 Method for testing parameter data

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2006101694231A CN100517253C (en) 2006-12-14 2006-12-14 Method for testing parameter data

Publications (2)

Publication Number Publication Date
CN101201780A true CN101201780A (en) 2008-06-18
CN100517253C CN100517253C (en) 2009-07-22

Family

ID=39516955

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2006101694231A Active CN100517253C (en) 2006-12-14 2006-12-14 Method for testing parameter data

Country Status (1)

Country Link
CN (1) CN100517253C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102045212B (en) * 2009-10-19 2012-11-21 英业达股份有限公司 Network connection testing method
CN102147757B (en) * 2010-02-08 2013-07-31 安凯(广州)微电子技术有限公司 Test device and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102045212B (en) * 2009-10-19 2012-11-21 英业达股份有限公司 Network connection testing method
CN102147757B (en) * 2010-02-08 2013-07-31 安凯(广州)微电子技术有限公司 Test device and method

Also Published As

Publication number Publication date
CN100517253C (en) 2009-07-22

Similar Documents

Publication Publication Date Title
CN112331253B (en) Chip testing method, terminal and storage medium
CN101558452B (en) Method and device for reconfiguration of reliability data in flash eeprom storage pages
US8201037B2 (en) Semiconductor integrated circuit and method for controlling semiconductor integrated circuit
CN103187102B (en) Semiconductor memory test method and semiconductor memory
US7562256B2 (en) Semiconductor memory device for build-in fault diagnosis
CN102737724A (en) System and method for testing nonvolatile random access memory (NVRAM)
CN102306127A (en) Novel method for identifying and initializing DDRIII (double-data-rate III) memory
CN109686392A (en) Non-volatile memory device and the Error Compensation method that it is verified
CN115116511A (en) Power consumption prediction method, device, equipment and storage medium
US20170103797A1 (en) Calibration method and device for dynamic random access memory
CN100517253C (en) Method for testing parameter data
CN111028881B (en) Open Block testing device, method and system
US8762926B2 (en) Method and apparatus for diagnosing a fault of a memory using interim time after execution of an application
US6708295B2 (en) Circuit and method, for storing data prior to and after determining failure
JPS603082A (en) Ic card
CN112463633B (en) Method, device, equipment and medium for checking address decoding of on-chip memory
KR100286186B1 (en) One Chip Clock Synchronous Memory Device
CN101364201A (en) Real-time watch device and method
US20170337104A1 (en) Counter in a flash memory
CN114281287B (en) Sub-view display method, device and storage medium
CN205139315U (en) Chip lectotype tester
CN117236277B (en) Method and device for checking register and electronic equipment
JP2008226020A (en) Register verifying device, method and program
US20020083040A1 (en) Data log acquisition circuit and data log acquisition method
JP2003099333A (en) Management system for flash memory

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Owner name: GUANGDONG HUABO ENTERPRISE MANAGEMENT CONSULTING C

Free format text: FORMER OWNER: YINGYEDA CO., LTD., TAIWAN

Effective date: 20141008

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: TAIWAN, CHINA TO: 510640 GUANGZHOU, GUANGDONG PROVINCE

TR01 Transfer of patent right

Effective date of registration: 20141008

Address after: 510640 Guangdong city of Guangzhou province Tianhe District gold Yinglu No. 1 was 1106 room two

Patentee after: Guangdong Huabo Enterprise Management Consulting Co., Ltd.

Address before: Taipei City, Taiwan, China

Patentee before: Inventec Corporation

ASS Succession or assignment of patent right

Owner name: STATE GRID SHANGHAI ELECTRIC POWER COMPANY

Free format text: FORMER OWNER: GUANGDONG HUABO ENTERPRISE MANAGEMENT CONSULTING CO., LTD.

Effective date: 20141121

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: 510640 GUANGZHOU, GUANGDONG PROVINCE TO: 200002 PUDONG NEW AREA, SHANGHAI

TR01 Transfer of patent right

Effective date of registration: 20141121

Address after: 200002 Shanghai City, Pudong New Area source deep road, No. 1122

Patentee after: State Grid Shanghai Municipal Electric Power Company

Address before: 510640 Guangdong city of Guangzhou province Tianhe District gold Yinglu No. 1 was 1106 room two

Patentee before: Guangdong Huabo Enterprise Management Consulting Co., Ltd.