CN101201386A - Method for locating parameter type fault of analogue integrated circuit - Google Patents

Abstract

The invention discloses a location method of the parameter type fault of the analog integrated circuit. The invention carries out the polyphase filter bank for the measured analog integrated circuit, then calculates the cohere function sequence which corresponds to the faultless sub band sequence for the fault polyphase filter bank sequence in the sub band of the highest fault resolution, and obtains the autocorrelation function sequence of the cohere function sequence, and takes the definite integral answers of the autocorrelation function sequence of the cohere function as the digital characteristic of the fault to realize the fault location. By comparing to the exist technology, the invention can realize the location of the parameter type fault of the analog integrated circuit, reach high accuracy of fault diagnosis, high fault resolution and high fault coverage, realize the multi-parameter type fault location, and easily realize the automation of the fault diagnosis by the digitized fault characteristic with the obvious difference.

Description

A kind of localization method of parameter type fault of analogue integrated circuit

Technical field

The invention belongs to the integrated circuit fault diagnosis field, particularly a kind of localization method of parameter type fault of analogue integrated circuit.

Background technology

Analogous Integrated Electronic Circuits can depart from (drift) its nominal value owing to a variety of causes causes component parameters, parameter drift-out can cause that circuit performance descends, if parameter drift-out exceeds range of tolerable variance, just become the parameter type fault of Analogous Integrated Electronic Circuits, though at this moment the topological structure of circuit does not change, can cause serious decline of circuit performance even inefficacy.

At present, the correlative study aspect the parameter type fault of analogue integrated circuit diagnosis is very active both at home and abroad.Typical method for diagnosing faults has the parameter type fault detection method based on the circuit transmission function coefficients, based on the method for testing of sub-band filter.The former is the tolerance standard from the mathematical description of normal circuit and circuit component, pre-determine out " tolerance box (the tolerance box) " of circuit transmission function coefficients, utilize circuit input, the output information of actual measurement subsequently, debate the transition function of the method extraction circuit-under-test of knowledge by system, if the one or more coefficients in the transition function that extracts are fallen outside its " tolerance box ", just can declare to exist in the circuit fault; But this method can only detect whether there is parameter type fault in the circuit, and can not realize localization of fault, also is difficult for realizing test automation.The latter inserts the fault effect of circuit in the specific subband to observe, and can significantly improve the resolution of fault, and is more effective to detected parameters type failure ratio; But detecting after circuit has fault, if need further distinguish fault by which component parameters is caused, just there is limitation in this method.

Other parameter type fault of analogue integrated circuit diagnostic method mainly contains: based on the test node preferable methods, K method for diagnosing faults based on the multifrequency sensitivity analysis, the y-parameter method, least square small echo support vector machine method, method based on cluster pre-service and support vector machine, method based on the kemel feature extractor, new fault dictionary method, based on the method for calculating maximum Lyapunov exponent, module level soft fault feature extracting method improves the failure classes method of superposition, fuzzy soft fault dictionary method, based on joint time frequency analysis method, based on the method for feature space mapping, based on the method for statistical theory accelerated test, based on the supply current method of wavelet analysis, based on the global sensitivity Calculation Method, or the like.These methods are for the localization of fault of Analogous Integrated Electronic Circuits, and particularly the efficient for multiparameter type localization of fault is not high, and have the defective that is difficult for realizing the diagnosis robotization.

Summary of the invention

Purpose of the present invention is exactly at the deficiencies in the prior art, provide a kind of and can realize the parameter type fault of analogue integrated circuit location, satisfy high fault diagnosis precision, high fault resolution and high fault coverage, can realize the parameter type fault of analogue integrated circuit localization method of fault diagnosis robotization again.

For achieving the above object, technical scheme of the present invention is as follows:

A kind of localization method of parameter type fault of analogue integrated circuit, its step is as follows:

(1) driving source acts on tested trouble-free Analogous Integrated Electronic Circuits, for tested non-fault Analogous Integrated Electronic Circuits provides the test and excitation signal; The response of tested non-fault Analogous Integrated Electronic Circuits becomes the non-fault digital signal through analog to digital conversion; Described non-fault digital signal is carried out sub-band filter, obtain non-fault subband sequence.

(2) driving source acts on the Analogous Integrated Electronic Circuits of known fault, for the Analogous Integrated Electronic Circuits of known fault provides the test and excitation signal; The response of the Analogous Integrated Electronic Circuits of known fault becomes the fault digital signal through analog to digital conversion; Described fault digital signal is carried out sub-band filter, obtain fault subband sequence.

(3) the non-fault subband sequence that obtains in the fault subband sequence that obtains in the step (2) and the step (1) is carried out correlation analysis, calculate the fault subband sequence in each subband and the related coefficient of non-fault subband sequence, the subband of choosing the related coefficient minimum carries out fault diagnosis subsequently, and promptly fault resolution is the highest in this subband; Also can choose other subbands and carry out fault diagnosis, as little subband of related coefficient the 2nd etc. with high fault resolution.

(4) calculate in the subband of the related coefficient minimum of determining by step (3) non-fault subband sequence and the coherence function sequence of fault subband sequence in frequency domain.

(5) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (4) is carried out correlation analysis, obtain the autocorrelation function sequence of coherence function sequence.

(6) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (5), as the numerical characteristic of the known fault of the Analogous Integrated Electronic Circuits in the step (2).

(7) driving source acts on the tested Analogous Integrated Electronic Circuits of unknown failure, for tested Analogous Integrated Electronic Circuits provides the test and excitation signal.

(8) actual measurement of described tested Analogous Integrated Electronic Circuits response becomes digital signal through analog to digital conversion.

(9) described digital signal is carried out sub-band filter, obtain the sub-band filter sequence, the subband of choosing the related coefficient minimum of being determined by step (3) carries out fault diagnosis and calculates.

(10) in the described subband that carries out fault diagnosis, the related coefficient of the corresponding non-fault subband sequence that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1).

(11) in the described subband that carries out fault diagnosis, the coherence function sequence of corresponding non-fault subband sequence in frequency domain that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1).

(12) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (11) is carried out correlation analysis, obtain the autocorrelation function sequence of coherence function sequence.

(13) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (12), as the numerical characteristic of the unknown failure of tested Analogous Integrated Electronic Circuits.

(14) with the numerical characteristic of the unknown failure that obtains in the step (13), compare with the numerical characteristic of the known fault that obtains in the step (6), finish localization of fault.

(15) during localization of fault, the related coefficient that obtains in can refer step (10) is accurately to be located.

Wherein, the non-fault subband sequence that obtains in the step (1) obtains by Theoretical Calculation or actual measurement.The fault subband sequence that obtains in the step (2) obtains by Theoretical Calculation or actual measurement.Described test and excitation signal is a sine wave signal.In order to improve fault resolution, the present invention is undertaken by sub-band filter the observation of test response under a certain fault, can utilize the wavelet filter group to carry out sub-band filter.The Haar wavelet filter group that described wavelet filter group can be a pyramid structure by 2 path filter group cascades, realizes 8 sub-band filters.

The present invention is based on the modern digital signal processing technology, correlation analysis method in the time domain is applied to coherence function sequence in the frequency domain, by obtaining the autocorrelation function sequence of frequency domain coherence function sequence, not only can extract the numerical characteristic of parameter type fault of analogue integrated circuit, and can realize the location, and then improve the coverage rate of parameter type fault to multiparameter type fault.Coherence function sequence in the described frequency domain can replace with the cross correlation function sequence of non-fault signal spectrum in the frequency domain and fault-signal frequency spectrum, with the constant volume score value of the autocorrelation function sequence of cross correlation function sequence, realize location to parameter type fault of analogue integrated circuit.Coherence function sequence in the described frequency domain also can replace with the cross correlation function sequence of non-fault power spectrum signal in the frequency domain and fault-signal power spectrum, with the constant volume score value of the autocorrelation function sequence of cross correlation function sequence, realize location to parameter type fault of analogue integrated circuit.

Wherein, coherence function sequence in the frequency domain and the correlation analysis method in the time domain are expressed as follows respectively:

By Wei Na-Xin Qin formula, to the autocorrelation function sequence r of stationary signal x (n) _x(m) apply following computing, just become power spectrum P _x(f),

$P_x\left(f\right)=P_x\left(e^{\mathrm{j\ω}}\right)=\underset{-\∞}{\overset{+\∞}{\mathrm{\Σ}}}{r}_x\left(m\right)e^{-\mathrm{j\ωm}}$

Cross correlation function sequence r to two stationary sequence x (n), y (n) _Xy(m) apply following computing, can obtain cross-power spectrum P _Xy(f),

$P_{\mathrm{xy}}\left(f\right)=P_{\mathrm{xy}}\left(e^{\mathrm{j\ω}}\right)=\underset{-\∞}{\overset{+\∞}{\mathrm{\Σ}}}{r}_{\mathrm{xy}}\left(m\right)e^{-\mathrm{j\ωm}}$

Calculate in the frequency domain the coherence function sequence promptly:

$C_{\mathrm{xy}}\left(f\right)=\frac{{\left|P_{\mathrm{xy}}\left(f\right)\right|}^2}{P_x\left(f\right)P_y\left(f\right)}$

The coherence function sequence C _Xy(f) value is between 0-1, and it has reflected relation relevant between the two sequence power spectrum.

To cause and effect energy sequence x[n] and y[n], x[n] autocorrelation function sequence r _Xx[l], x[n] and y[n] cross correlation function sequence r _Xy[l], x[n] and y[n] related coefficient ρ _XYBe respectively:

$r_{\mathrm{xx}}\left[l\right]=\underset{n=-\∞}{\overset{\∞}{\mathrm{\Σ}}}x\left[n\right]x[n-l],l=\mathrm{0,}\±\mathrm{1,}\±2,...$

$r_{\mathrm{xy}}\left[l\right]=\underset{n=-\∞}{\overset{\∞}{\mathrm{\Σ}}}x\left[n\right]y[n-l],l=\mathrm{0,}\±\mathrm{1,}\±2,...$

${\mathrm{\ρ}}_{\mathrm{xy}}=\frac{\underset{n=0}{\overset{\∞}{\mathrm{\Σ}}}x\left[n\right]y\left[n\right]}{{\left(\underset{n=0}{\overset{\∞}{\mathrm{\Σ}}}{x}^2\right[n\left]\underset{n=0}{\overset{\∞}{\mathrm{\Σ}}}{y}^2\right[n\left]\right)}^{1/2}}$

Related coefficient ρ _XYCharacterized the correlation degree between two sequences, its absolute value is between 0 and 1.Work as ρ _XY=0 o'clock, sequence x[n] and y[n] uncorrelated; ρ _XY=1 o'clock, sequence x[n] and y[n] identical.Remove in addition ρ _XYValue illustrates sequence x[n more near 1] and y[n] relevance strong more; ρ _XYValue illustrates sequence x[n more near 0] and y[n] correlativity weak more.The present invention comes output under a certain fault of quantitative description and the difference between normal output with related coefficient.

Compared with prior art, the invention has the beneficial effects as follows: by the modern digital signal processing theory, can realize the parameter type fault of analogue integrated circuit location, satisfy high fault diagnosis precision, high fault resolution and high fault coverage, can realize multiparameter type localization of fault, and the digitalized fault feature by obvious difference is easy to realize the fault diagnosis robotization.

Description of drawings

Fig. 1 is the workflow diagram of parameter type fault of analogue integrated circuit localization method.

Fig. 2 is the pyramid wavelet decomposition structural drawing of 8 passages.

Fig. 3 is the circuit diagram of state variable filter.

Fig. 4 be among the embodiment 1 the 8th subband non-fault subband sequence respectively with R fault subband sequence, the coherence function sequence chart of C fault subband sequence in frequency domain.

Fig. 5 is the autocorrelation function sequence chart of coherence function sequence among Fig. 4.

Fig. 6 is the integrated curve figure of the autocorrelation function sequence of R fault coherence function sequence among Fig. 5.

Fig. 7 is the integrated curve figure of the autocorrelation function sequence of C fault coherence function sequence among Fig. 5.

Fig. 8 is the circuit diagram of leapfrog wave filter.

Wherein:

Among Fig. 3, R ₁～R ₇Represent 7 resistance respectively; C ₁～C ₂Represent 2 electric capacity respectively.

Among Fig. 8, R ₁～R ₁₃Represent 13 resistance respectively, C ₁～C ₄Represent 4 electric capacity respectively.

Embodiment

Below in conjunction with accompanying drawing, the preferred embodiments of the present invention are further described.

Embodiment 1

As Fig. 1, Fig. 2, Fig. 3, Fig. 4, Fig. 5, Fig. 6, shown in Figure 7.Choose state variable filter in the international standard circuit and test the localization method of parameter type fault of analogue integrated circuit of the present invention.The device parameters of state variable filter: R ₁=R ₃=R ₄=R ₅=R ₆=R ₇=10K Ω, R ₂=1K Ω, C ₁=C ₂=20nF.Two parameter type faults are: R fault, resistance R ₁Drift 5%; The C fault, capacitor C ₁Drift 6%.

(1) driving source acts on tested unfaulty conditions variable wave filter, and for tested unfaulty conditions variable wave filter provides the test and excitation signal, described test and excitation signal is the sine wave signal of frequency 1.0KHz, amplitude 5.0V; The response of described tested unfaulty conditions variable wave filter becomes the non-fault digital signal through analog to digital conversion; Utilize the Haar wavelet filter group of pyramid structure that described non-fault digital signal is carried out sub-band filter,, realize 8 sub-band filters, obtain non-fault subband sequence by 2 path filter group cascades.This step is undertaken by actual measurement.

(2) driving source acts on the state variable filter with R fault and C fault, and for it provides the test and excitation signal, described test and excitation signal is the sine wave signal of frequency 1.0KHz, amplitude 5.0V; The response of the state variable filter of described known fault becomes the fault digital signal through analog to digital conversion; Utilize the Haar wavelet filter group of pyramid structure that described fault digital signal is carried out sub-band filter,, realize 8 sub-band filters, obtain R fault subband sequence and C fault subband sequence by 2 path filter group cascades.This step is undertaken by actual measurement.

(3) the non-fault subband sequence that obtains in the R fault subband sequence, C fault subband sequence and the step (1) that obtain in the step (2) is carried out correlation analysis, calculate R fault subband sequence in each subband, C fault subband sequence respectively with the related coefficient of non-fault subband sequence, the 8th subband of choosing the related coefficient minimum carries out fault diagnosis subsequently.

(4) calculate in the 8th subband, non-fault subband sequence respectively with R fault subband sequence, the C fault subband sequence coherence function sequence (seeing shown in Figure 4) in frequency domain; By the coherence function sequence chart, as seen the degree of coherence obvious difference of visible R fault, C fault and non-fault output utilizes coherence function can distinguish R fault and C fault from mathematics, but does not so far also form the digitalized fault characteristic quantity.

(5) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (4) is carried out correlation analysis, obtain the autocorrelation function sequence (seeing shown in Figure 5) of coherence function sequence; As can be seen, the envelope of the autocorrelation function sequence of R fault coherence function sequence is triangular form, and the envelope of the related function sequence of C fault coherence function sequence is and changes bell slowly, and both distinguish obviously on profile.

(6) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (5), as the numerical characteristic of the known fault of the Analogous Integrated Electronic Circuits in the step (2); The autocorrelation function sequence of coherence function sequence that can draw R fault and C fault is to the constant volume score value (as Fig. 6, shown in Figure 7) of the different delayed time sequence number of coordinate transverse axis; The constant volume score value of R fault is 491.7, and the constant volume score value of C fault under identical integrating range is 279.6, and both relative difference number percents are (491.7-279.6)/279.6=75.9%, and this is a difference clearly.In view of the above, can distinguish R fault, C fault.

(7) driving source acts on the tested Analogous Integrated Electronic Circuits of unknown failure, for tested Analogous Integrated Electronic Circuits provides the test and excitation signal; Described test and excitation signal is the sine wave signal of frequency 1.0KHz, amplitude 5.0V.

(8) actual measurement of described tested Analogous Integrated Electronic Circuits response becomes digital signal through analog to digital conversion.

(9) utilize the Haar wavelet filter group of pyramid structure that described digital signal is carried out sub-band filter,, realize 8 sub-band filters, obtain the sub-band filter sequence, choose the 8th subband and carry out fault diagnosis calculating by 2 path filter group cascades.

(10) in the 8th subband, the related coefficient of the corresponding non-fault subband sequence that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1);

(11) in the 8th subband, the coherence function sequence of corresponding non-fault subband sequence in frequency domain that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1);

(12) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (11) is carried out correlation analysis, obtain the autocorrelation function sequence of coherence function sequence;

(13) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (12), as the numerical characteristic of the unknown failure of tested Analogous Integrated Electronic Circuits;

(14) with the numerical characteristic of the unknown failure that obtains in the step (13), compare with the numerical characteristic of the known fault that obtains in the step (6), finish localization of fault;

(15) during localization of fault, the related coefficient that obtains in can refer step (10) is accurately to be located.

Embodiment 2

As Fig. 1, Fig. 2, shown in Figure 8.The place identical with embodiment 1 be repeated description no longer, and difference is: the localization method of choosing the leapfrog filters to test parameter type fault of analogue integrated circuit of the present invention in the international standard circuit.The device parameters of leapfrog wave filter: all resistance R ₁To R ₁₃Resistance is all 10K Ω, capacitor C ₁=C ₄=0.01 μ F, C ₂=C ₃=0.02 μ F.10 kinds of multiparameter type fault combinations are experimentized, and the result is as shown in the table.

Fault sequence number #	Parameter type fault	Wavelet sub-band #	Related coefficient	The autocorrelation function sequence constant volume score value of coherence function sequence
					1	(C 1&C 2)+5％	7	-0.0013	389.6140
2	(C 1&C 3)+5％	8	-0.0721	583.7254
					3	(C 2&C 3)+5％	6	0.0107	535.5262
4	(C 1&C 2&C 3)+5％	7	-0.0441	431.3105
					5	(R 7&R 8)+5％	8	-0.0079	485.9794
6	(R 8&R 9)+5％	8	0.0444	365.2369
					7	(R 7&R 9)+5％	4	-0.0139	660.6529
8	(R 7&R 8&R 9)+5％	7	-0.0249	339.4309
					9	(R 11&R 10&C 1&C 2)+5％	6	-0.0378	264.5886
10	(R 12&R 13&C 3&C 4)+5％	4	0.0768	713.9460

In the last table, the 1st classifies the fault sequence number as, has tested 10 kinds of parameter type fault combinations altogether.The 2nd classifies fault as, and each element in its expression bracket is all just drifting about 5%; #1 fault " (C ₁﹠amp; C ₂)+5% " the expression capacitor C ₁And C ₂Each two capacitance parameter type fault of 5% of just drifting about; #4 fault " (C ₁﹠amp; C ₂﹠amp; C ₃)+5% " the expression capacitor C ₁, C ₂And C ₃Each three capacitance parameter type fault of 5% of just drifting about; #5 to #7 is two resistance parameter type faults; #8 is three Resistance Fault; #9 and #10 represent the quaternary part parameter drift type fault of two resistance and two electric capacity respectively.The 3rd classifies the highest wavelet sub-band of fault resolution that carries out fault diagnosis that uses as, has 8 wavelet sub-bands.The 4th classifies the related coefficient of fault subband sequence and non-fault subband sequence in the corresponding subband as, in order to improve the precision of localization of fault, has selected the related coefficient minimum here, promptly selects the subband of output and normal output differences maximum under the fault.The 5th classifies the constant volume score value of the autocorrelation function sequence of coherence function sequence as.

In the last table, all facies relationship numerical value all are lower than 0.1000, the obvious difference between this expression fault subband sequence and non-fault subband sequence, the resolution height of detection failure in corresponding subband.

The constant volume score value total difference of the autocorrelation function sequence of the coherence function sequence of 10 faults is more obvious, can realize localization of fault according to this constant volume score value.Under indivedual situations, different little as the definite integral value difference of #1 and #4 fault, location difficulty as if, but if, still can realize localization of fault accurately with reference to facies relationship numerical value (related coefficient of #1 fault only be #4 fault related coefficient 1/34).To add by two resistance two electric capacity totally four elements take place than complicated parameter type fault, as #9 and #10 fault, the definite integral value difference that obtains according to the present invention is different big all the better, can obtain more significantly fault distinguish.

Embodiment 3

The place identical with embodiment 1 be repeated description no longer, and difference is: the non-fault subband sequence that obtains in the step (1) obtains by Theoretical Calculation.The fault subband sequence that obtains in the step (2) obtains by Theoretical Calculation.

Claims (6)

1. the localization method of a parameter type fault of analogue integrated circuit, it is characterized in that: the localization method step of described parameter type fault of analogue integrated circuit is as follows:

(1) driving source acts on tested trouble-free Analogous Integrated Electronic Circuits, for tested non-fault Analogous Integrated Electronic Circuits provides the test and excitation signal; The response of tested non-fault Analogous Integrated Electronic Circuits becomes the non-fault digital signal through analog to digital conversion; Described non-fault digital signal is carried out sub-band filter, obtain non-fault subband sequence;

(2) driving source acts on the Analogous Integrated Electronic Circuits of known fault, for the Analogous Integrated Electronic Circuits of known fault provides the test and excitation signal; The response of the Analogous Integrated Electronic Circuits of known fault becomes the fault digital signal through analog to digital conversion; Described fault digital signal is carried out sub-band filter, obtain fault subband sequence;

(3) the non-fault subband sequence that obtains in the fault subband sequence that obtains in the step (2) and the step (1) is carried out correlation analysis, calculate the fault subband sequence in each subband and the related coefficient of non-fault subband sequence, the subband of choosing the related coefficient minimum carries out fault diagnosis subsequently;

(4) calculate in the subband of the related coefficient minimum of determining by step (3) non-fault subband sequence and the coherence function sequence of fault subband sequence in frequency domain;

(5) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (4) is carried out correlation analysis, obtain the autocorrelation function sequence of coherence function sequence;

(6) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (5), as the numerical characteristic of the known fault of the Analogous Integrated Electronic Circuits in the step (2);

(7) driving source acts on the tested Analogous Integrated Electronic Circuits of unknown failure, for tested Analogous Integrated Electronic Circuits provides the test and excitation signal;

(8) actual measurement of described tested Analogous Integrated Electronic Circuits response becomes digital signal through analog to digital conversion;

(9) described digital signal is carried out sub-band filter, obtain the sub-band filter sequence, the subband of choosing the related coefficient minimum of being determined by step (3) carries out fault diagnosis and calculates;

(10) in the described subband that carries out fault diagnosis, the related coefficient of the corresponding non-fault subband sequence that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1);

(11) in the described subband that carries out fault diagnosis, the coherence function sequence of corresponding non-fault subband sequence in frequency domain that obtains in sub-band filter sequence that obtains in the calculation procedure (9) and the step (1);

(12) correlation analysis method in the time domain is introduced frequency domain, the coherence function sequence that calculates in the step (11) is carried out correlation analysis, obtain the autocorrelation function sequence of coherence function sequence;

(13) with the constant volume score value of the autocorrelation function sequence of the coherence function sequence that obtains in the step (12), as the numerical characteristic of the unknown failure of tested Analogous Integrated Electronic Circuits;

(14) with the numerical characteristic of the unknown failure that obtains in the step (13), compare with the numerical characteristic of the known fault that obtains in the step (6), finish localization of fault;

(15) during localization of fault, the related coefficient that obtains in can refer step (10) is accurately to be located.

2. the localization method of parameter type fault of analogue integrated circuit according to claim 1, it is characterized in that: the non-fault subband sequence that obtains in the step (1) obtains by Theoretical Calculation or actual measurement.

3. the localization method of parameter type fault of analogue integrated circuit according to claim 1, it is characterized in that: the fault subband sequence that obtains in the step (2) obtains by Theoretical Calculation or actual measurement.

4. according to the localization method of the arbitrary described parameter type fault of analogue integrated circuit of claim 1 to 3, it is characterized in that: described test and excitation signal is a sine wave signal.

5. according to the localization method of the arbitrary described parameter type fault of analogue integrated circuit of claim 1 to 3, it is characterized in that: utilize the wavelet filter group to carry out sub-band filter.

6. the localization method of parameter type fault of analogue integrated circuit according to claim 5 is characterized in that: the Haar wavelet filter group that described wavelet filter group is a pyramid structure, by 2 path filter group cascades, realize 8 sub-band filters.

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