CN101196821A - Motherboard test program initialization system and method thereof - Google Patents
Motherboard test program initialization system and method thereof Download PDFInfo
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- CN101196821A CN101196821A CNA2006101633914A CN200610163391A CN101196821A CN 101196821 A CN101196821 A CN 101196821A CN A2006101633914 A CNA2006101633914 A CN A2006101633914A CN 200610163391 A CN200610163391 A CN 200610163391A CN 101196821 A CN101196821 A CN 101196821A
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Abstract
A mainboard testing program setting system and method are provided. Selecting a testing mode value required by the next testing point through a setting module and storing the testing mode value into a second storage module to form a set testing mode value, when the system starts up again, during the starting-up stage, a reading module can read the set testing mode value from the second storage module; then loading a BIOD program corresponding to the testing mode value into the system by a loading module, working personnel of the testing point can carry through corresponding testing works aiming at required BIOS program. Thus, the invention can further realize improvement of testing efficiency of testing program on mainboard with multiple testing points according to different testing modes set at different testing points.
Description
Technical field
The present invention relates to a kind of host board testing program setting technology, in more detail, relate to a kind of host board testing program setting system and method that is applied to have the host board testing program of a plurality of test points.
Background technology
Along with the integrated level of circuit board and electronic component significantly promotes, computer motherboard the function that can provide also increase thereupon.Motherboard is the main skeleton of computer apparatus, be used on it connect and put central processing unit, bus, storer, connecting interface and connect assemblies such as the storage of putting and data output/input unit by this connecting interface, those assemblies are instigated the execution data processing work by the integration of motherboard with foundation.
As previously mentioned, put above-mentioned those assemblies for guaranteeing that motherboard can successfully connect, and make the normal operation on motherboard of those assemblies.Thereby those assemblies connect place on this motherboard after, manufacturer must be through the test point in many stages, the test point of different phase may be tested at the specific function of this motherboard.For example, some test point be used to test connect the random access memory of putting on this motherboard whether can normal operation, whether the external device connecting interface that some test point is used to test this motherboard can normal operation; Whether some test point then is used to test built-in display driver can normal operation.
Yet the host board testing of the required execution of manufacturer may be with the start content measurement difference of the required execution of terminal user.For example, manufacturer does not need whole memory block of random access memory are tested in a large amount of host board testing programs, may be as long as test beginning or part block wherein so could increase the speed of testing.In addition, some test pattern is that terminal user needs and manufacturer does not need to carry out the tester, and these test patterns are skipped or hidden at manufacturer's test procedure and do not carry out, and also can increase the efficient of manufacturer's test.In brief, the host board testing pattern can have different contents because of different user's purposes.
As previously mentioned, existing host board testing system all is incorporated in the ROM-BIOS (BIOS), and those test procedures are normally carried out by BIOS in the process of start.For satisfying the requirement of manufacturer to test pattern, can be provided with a wire jumper (Jumper) on the motherboard, if with this wire jumper conducting, this BIOS will carry out the needed host board testing of manufacturer after then should starting shooting.
Aforesaid test mode no doubt can be got rid of the unwanted test pattern of manufacturer, and then more efficient execution host board testing.Yet different test patterns more comprises many test options usually, in the host board testing program of manufacturer, is responsible for different test options by different test points usually.So be the required person of manufacturer with the host board testing mode initialization only by wire jumper, still have weak point, and, just need two groups of above wire jumpers if the test point that surpasses more than two is arranged, more increase cost on the hardware, the position of the motherboard that also accounts for simultaneously.Because, the different test point of manufacturer can not only be tested according to the required main test option in this station, should belong to other test points but not to belong to other of this test point inessential or need not complete test items, still must repeat, cause each test point because of need repeat the unnecessary test event of this test point, make host board testing efficient to promote.
In sum, how can provide a kind of and can set different test patterns and test option thereof according to the different host board testing point of manufacturer, and then shorten test duration of each test point, to increase the efficient of host board testing, real problem for needing to be resolved hurrily at present.
Summary of the invention
For solving the disadvantages of aforementioned prior art, the invention provides a kind of host board testing program setting system and method, can set different test patterns and test option thereof according to different test points, and then reach the testing efficiency that promotes host board testing program with a plurality of test points.
Host board testing program setting of the present invention system, in the applied host machine board test program, it mainly comprises: first storage module stores the indivedual needed a plurality of bios programs of corresponding a plurality of test point; Second storage module stores corresponding respectively a plurality of test pattern values of this bios program; Setting module is used to set the needed test pattern values of these a plurality of test points of this host board testing program, and deposits the test pattern values of setting in second storage module; Read module is used for reading the test pattern values of having set from second storage module; Insmod, the test pattern values of having set according to read module reads in first storage module, is written into corresponding bios program.
On the step, by setting module the needed test pattern values of next test point is selected and deposited second storage module in earlier and become the test pattern values of having set, when system starts shooting again, in start-up phase, read module can read the test pattern values of having set from second storage module, again by insmoding to bios program loading system that should test pattern values, the staff of test point, can carry out corresponding test job at needed bios program.
Than existing information indicating technology, host board testing program setting system of the present invention and method, by aforementioned first storage module, second storage module, setting module, insmod and the phase interworking of read module, can set different test pattern and bios program thereof according to different test points, and then reach the testing efficiency that promotes integral body.
Description of drawings
Fig. 1 is the application architecture synoptic diagram of host board testing program setting of the present invention system; And
The process flow diagram of Fig. 2 when to be host board testing program setting method of the present invention by host board testing program setting of the present invention system carry out.
The main element symbol description
11 first storage modules
12 second storage modules
13 setting modules
14 read modules
15 insmod
21～24 bios programs
31～34 first～the 4th test points
4 motherboards
S201～S205 step
Embodiment
Below by particular specific embodiment explanation embodiments of the present invention, those skilled in the art can understand other advantages of the present invention and effect easily by this instructions institute disclosure.The present invention also can be implemented or be used by other different specific embodiments, and the every details in this instructions also can be based on different viewpoints and application, carries out various modifications and change under the spirit of the present invention not deviating from.
See also Fig. 1, this is the application architecture synoptic diagram of host board testing program setting of the present invention system.As shown in Figure 1, host board testing program setting system applies of the present invention is in the host board testing program, and this host board testing program comprises at least one test point.In the present embodiment, host board testing program setting of the present invention system 1 comprises: first storage module 11, second storage module 12, setting module 13, read module 14 and insmod 15.
In the present embodiment, these bios program 21～24 test patterns can be for example but are not limited at the performed test pattern of different assemblies, and this assembly can be for example but is not defined as central processing unit, bus, storer, connecting interface and connects assemblies such as the storage of putting and data output/input unit by this connecting interface.The preferably, those test patterns further comprise at least one test option, this test option is the thin portion test event that test module had of corresponding different assemblies, it for example but be not defined as the processing speed of central processing unit, the rotating speed of central processing unit radiator fan, whether the whole or local storage block of storer is complete normal, and whether connecting interface can normally connect the message transmission rate of external device, connecting interface etc.
Second storage module stores a plurality of test pattern values that should each bios program 21～24, and this second storage module 12 is arranged at the nonvolatile memory of this motherboard 4, its can be for example but be not defined as EPROM, EEPROM or flash memory one of them.
This setting module 13 is used to set these first to fourth test point, 31～34 needed test patterns of this host board testing program, and will deposit second storage module 12 in to the pairing test pattern values of the test pattern that should set.In the present embodiment, this setting module 13 is chosen corresponding first test point, 31 needed bios program 21 pairing test pattern values and deposited in second storage module 12.Read module 14, be used for reading the test pattern values of having set, insmod 15, then the test pattern values of having set that reads according to read module 14 from second storage module 12, in first storage module 11, be written into corresponding bios program 21 and come to use for first test point 31.
On concrete the enforcement, this setting module 13, read module 14 and/or insmod and 15 build and place this motherboard 4, further, this setting module 13, read module 14 and/or insmod and 15 can be integrated in the motherboard 4 one and can carry out in the control chip of access to second storage module 12, thereby finish storage, read the test pattern values of having set stored in second storage module 12 by this control chip, in the present embodiment, this control chip can for example be baseboard management controller (Baseboard Management Controller, BMC).
See also Fig. 2, this is the process flow diagram when carrying out host board testing program setting method of the present invention by aforementioned host board testing program setting of the present invention system.As shown in Figure 2, in step S201, the needed test pattern values of next test point is selected and deposit second storage module in and become the test pattern values of having set by setting module.Then proceed to step S202.
In step S202, this motherboard 4 enter first test point 31 and with this first test point 31 finish carry out the necessary mechanism of test and/or electrically connect after, carry out boot programs by this first test point 31 at this motherboard 4.Then proceed to step S203.
In step S203, start-up phase makes read module read the test pattern values of having set in second storage module, in the present embodiment, this test pattern values system corresponds to these first test point, 31 needed bios programs 21 and the secondary program of corresponding first test point, 31 needed BIOS.Then proceed to step S204.
In step S204, making insmods reads the test pattern values set to bios program 21 and the secondary program loading systems of corresponding first test point, 31 needed BIOS that should test pattern values with this read module in second storage module.Then proceed to step S205.
In step S205, system is carried out by this insmod bios program 21 that is loaded into this system and the corresponding secondary program of BIOS, thereby carry out corresponding test job.
In sum, host board testing program setting system of the present invention and method, by the phase interworking between aforementioned storage module, setting module and adjusting module, can set different test patterns and test option thereof according to different test points, and then reach the testing efficiency that promotes host board testing program with a plurality of test points.
The foregoing description only is illustrative principle of the present invention and effect thereof, but not is used to limit the present invention.Any those skilled in the art all can be under spirit of the present invention and category, and the foregoing description is modified and changed.Therefore, the scope of the present invention should be listed as claim.
Claims (6)
1. host board testing program setting system is applied to comprise that in the host board testing program of a plurality of test points, this host board testing program setting system comprises:
First storage module stores should a plurality of test points indivedual needed a plurality of bios programs;
Second storage module stores corresponding respectively a plurality of test pattern values of this bios program;
Setting module is used to set the needed test pattern of these a plurality of test points of this host board testing program, and the test pattern values of this test pattern that correspondence is set deposits this second storage module in;
Read module is used for reading the test pattern values of having set from this second storage module; And
Insmod,, be written into corresponding bios program certainly in this first storage module according to the test pattern values of having set that this read module reads.
2. host board testing program setting according to claim 1 system, wherein, this first storage module and this second storage module are the nonvolatile memories that is arranged at this motherboard.
3. host board testing program setting according to claim 2 system, wherein, this nonvolatile memory is EPROM, EEPROM or flash memory.
4. host board testing program setting according to claim 1 system, wherein, this bios program comprises BIOS master routine and the secondary program of the needed different BIOS of corresponding respectively this test point, wherein, this BIOS master routine is that this a plurality of test point does not need the person jointly, and the secondary program correspondence of this BIOS respectively different demands of this test point is adjusted to some extent.
5. host board testing program setting according to claim 1 system, wherein, this setting module, read module and/or insmod and be integrated in and can carry out in the control chip of access to second storage module.
6. a host board testing program setting method is applied in the described host board testing program setting of claim 1 system, and this host board testing program setting method comprises:
By setting module that the needed test pattern values of next test point is selected and deposit second storage module in and become the test pattern values of having set;
Make system carry out boot program;
Make read module from this second storage module, read the test pattern values of having set in start-up phase;
Making insmods reads the test pattern values of having set with this read module and is written into this system from this second storage module; And
Make this system carry out by this insmod be loaded into this system to indivedual needed bios programs of each test point that should test pattern values, thereby carry out corresponding test job.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101633914A CN101196821A (en) | 2006-12-04 | 2006-12-04 | Motherboard test program initialization system and method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101633914A CN101196821A (en) | 2006-12-04 | 2006-12-04 | Motherboard test program initialization system and method thereof |
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| CN101196821A true CN101196821A (en) | 2008-06-11 |
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| CNA2006101633914A Pending CN101196821A (en) | 2006-12-04 | 2006-12-04 | Motherboard test program initialization system and method thereof |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576076A (en) * | 2012-07-27 | 2014-02-12 | 飞思卡尔半导体公司 | System and method for executing scan test |
| CN106326054A (en) * | 2016-08-25 | 2017-01-11 | 天津市英贝特航天科技有限公司 | Automatic test system and method of mainboard PCI external device |
| CN114218124A (en) * | 2022-02-22 | 2022-03-22 | 深圳市吉方工控有限公司 | Method, device, equipment and storage medium for rapidly deploying BIOS setting environment |
-
2006
- 2006-12-04 CN CNA2006101633914A patent/CN101196821A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576076A (en) * | 2012-07-27 | 2014-02-12 | 飞思卡尔半导体公司 | System and method for executing scan test |
| CN106326054A (en) * | 2016-08-25 | 2017-01-11 | 天津市英贝特航天科技有限公司 | Automatic test system and method of mainboard PCI external device |
| CN114218124A (en) * | 2022-02-22 | 2022-03-22 | 深圳市吉方工控有限公司 | Method, device, equipment and storage medium for rapidly deploying BIOS setting environment |
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