CN101171691B - 光探测器及其光设备 - Google Patents

光探测器及其光设备 Download PDF

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Publication number
CN101171691B
CN101171691B CN2006800156314A CN200680015631A CN101171691B CN 101171691 B CN101171691 B CN 101171691B CN 2006800156314 A CN2006800156314 A CN 2006800156314A CN 200680015631 A CN200680015631 A CN 200680015631A CN 101171691 B CN101171691 B CN 101171691B
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CN
China
Prior art keywords
photo
detector
detection segments
optoelectronic device
detectors
Prior art date
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Active
Application number
CN2006800156314A
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English (en)
Chinese (zh)
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CN101171691A (zh
Inventor
托斯腾·威匹耶斯基
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hong Kong Applied Science and Technology Research Institute ASTRI
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Hong Kong Applied Science and Technology Research Institute ASTRI
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Publication of CN101171691A publication Critical patent/CN101171691A/zh
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/108—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type
    • H01L31/1085—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type the devices being of the Metal-Semiconductor-Metal [MSM] Schottky barrier type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64—Devices characterised by the determination of the time taken to traverse a fixed distance
    • G01P3/68—Devices characterised by the determination of the time taken to traverse a fixed distance using optical means, i.e. using infrared, visible, or ultraviolet light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN2006800156314A 2005-09-26 2006-09-25 光探测器及其光设备 Active CN101171691B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
HK05108486 2005-09-26
HK05108486.9 2005-09-26
PCT/CN2006/002509 WO2007033610A1 (fr) 2005-09-26 2006-09-25 Photodetecteurs et dispositifs optiques les comprenant

Publications (2)

Publication Number Publication Date
CN101171691A CN101171691A (zh) 2008-04-30
CN101171691B true CN101171691B (zh) 2010-11-17

Family

ID=37888562

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006800156314A Active CN101171691B (zh) 2005-09-26 2006-09-25 光探测器及其光设备

Country Status (2)

Country Link
CN (1) CN101171691B (fr)
WO (1) WO2007033610A1 (fr)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1042013A (zh) * 1988-09-28 1990-05-09 赫彻斯特股份公司 光探测器
US6376826B1 (en) * 2000-03-24 2002-04-23 Agilent Technologies, Inc. Polarity-independent optical receiver and method for fabricating same
US6552325B1 (en) * 1999-05-11 2003-04-22 Yokogawa Electric Corporation Photo diode array

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0624251B2 (ja) * 1986-01-08 1994-03-30 富士通株式会社 光半導体装置
US4772931A (en) * 1986-07-08 1988-09-20 Ibm Corporation Interdigitated Schottky barrier photodetector
JPS63278380A (ja) * 1987-05-11 1988-11-16 Fujitsu Ltd 半導体受光装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1042013A (zh) * 1988-09-28 1990-05-09 赫彻斯特股份公司 光探测器
US6552325B1 (en) * 1999-05-11 2003-04-22 Yokogawa Electric Corporation Photo diode array
US6376826B1 (en) * 2000-03-24 2002-04-23 Agilent Technologies, Inc. Polarity-independent optical receiver and method for fabricating same

Also Published As

Publication number Publication date
WO2007033610A1 (fr) 2007-03-29
CN101171691A (zh) 2008-04-30

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