CN101165501A - 异步芯片同测方法 - Google Patents
异步芯片同测方法 Download PDFInfo
- Publication number
- CN101165501A CN101165501A CNA2006101172481A CN200610117248A CN101165501A CN 101165501 A CN101165501 A CN 101165501A CN A2006101172481 A CNA2006101172481 A CN A2006101172481A CN 200610117248 A CN200610117248 A CN 200610117248A CN 101165501 A CN101165501 A CN 101165501A
- Authority
- CN
- China
- Prior art keywords
- asynchronous
- chip
- test
- test method
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200610117248A CN100575975C (zh) | 2006-10-18 | 2006-10-18 | 异步芯片同测方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200610117248A CN100575975C (zh) | 2006-10-18 | 2006-10-18 | 异步芯片同测方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101165501A true CN101165501A (zh) | 2008-04-23 |
CN100575975C CN100575975C (zh) | 2009-12-30 |
Family
ID=39334271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200610117248A Active CN100575975C (zh) | 2006-10-18 | 2006-10-18 | 异步芯片同测方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN100575975C (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106872874A (zh) * | 2015-12-11 | 2017-06-20 | 华大半导体有限公司 | 一种用于rfid标签芯片集中cp测试方法 |
CN110907803A (zh) * | 2019-11-21 | 2020-03-24 | 北京中电华大电子设计有限责任公司 | 一种在ate上可实现7816接口通讯同步测试的方法 |
-
2006
- 2006-10-18 CN CN200610117248A patent/CN100575975C/zh active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106872874A (zh) * | 2015-12-11 | 2017-06-20 | 华大半导体有限公司 | 一种用于rfid标签芯片集中cp测试方法 |
CN110907803A (zh) * | 2019-11-21 | 2020-03-24 | 北京中电华大电子设计有限责任公司 | 一种在ate上可实现7816接口通讯同步测试的方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100575975C (zh) | 2009-12-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100442069C (zh) | 同步通讯芯片进行多芯片并行测试的方法 | |
US10209305B2 (en) | Wafer tap domain die channel circuitry with separate die clocks | |
US8384408B2 (en) | Test module with blocks of universal and specific resources | |
US7752359B2 (en) | Wireless-interface module and electronic apparatus | |
CN102549443B (zh) | 可编程协议发生器 | |
CN101201389B (zh) | 利用模拟信号进行装置中扫描链测试的系统与方法 | |
US9110134B2 (en) | Input/output delay testing for devices utilizing on-chip delay generation | |
CN104808134A (zh) | 多通道芯片测试系统 | |
CN109307833A (zh) | 芯片测试装置及芯片测试方法 | |
CN101364529B (zh) | 一种自动下载集成电路序列号码的方法 | |
CN100442070C (zh) | 同步通讯芯片并行测试的方法 | |
CN110892483B (zh) | 采用有限数量的测试引脚测试存储器件的方法以及利用该方法的存储器件 | |
CN101706553B (zh) | 一种片上通路时延测量电路及方法 | |
CN102446557B (zh) | 一种芯片和一种芯片并行测试的方法 | |
CN100575975C (zh) | 异步芯片同测方法 | |
US7940588B2 (en) | Chip testing circuit | |
CN103915416A (zh) | 具有薄膜覆晶封装的电子装置 | |
CN112147482B (zh) | 一种并行测试系统及其测试方法 | |
CN108335720B (zh) | 使用存储器测试机编写个性化数据的方法 | |
CN113868065B (zh) | 一种测试和烧录叠封芯片的方法、叠封芯片 | |
CN100381833C (zh) | 测试桥接电路的方法与装置 | |
CN101452010B (zh) | 用于芯片测试的探针卡的测试方法 | |
US7433252B2 (en) | Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device | |
CN102305909B (zh) | 分布式测试节点链及其多链系统 | |
US8169228B2 (en) | Chip testing circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140108 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
|
TR01 | Transfer of patent right |
Effective date of registration: 20140108 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |