CN101159822A - Anti-flare light area array CCD image sensor - Google Patents
Anti-flare light area array CCD image sensor Download PDFInfo
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- CN101159822A CN101159822A CNA2007100182442A CN200710018244A CN101159822A CN 101159822 A CN101159822 A CN 101159822A CN A2007100182442 A CNA2007100182442 A CN A2007100182442A CN 200710018244 A CN200710018244 A CN 200710018244A CN 101159822 A CN101159822 A CN 101159822A
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Abstract
The invention is an anti-halation area array CCD image sensor which is realized by adding image-sensitive unit addressing circuit and a light integral time pulse generation circuit on the existing sensor; breaking off gate connecting wires for connecting a phase-sensitive zone with CRVA2 and CRVA3 terminals of each image-sensitive unit, and connecting gate of each image-sensitive unit to correspondent output terminal of data selector in the image-sensitive unit addressing circuit; and dividing signals of the CRVA2 and CRVA3 terminals into two paths one of which is connected to input terminal of a sequence pulse signal generation circuit and the other one is used as light integral time pulse control signal output. By independently setting light integral time of each image-sensitive unit, strong light and halation which are difficult to eliminate are prevented to make display image clear. The existing area array CCD image sensor can normally work under halation-free condition. The anti-halation CCD camera prepared in the invention has simple circuit, can be realized easily, and has good application prospects in the fields requiring mechanical observing device such as military affairs, traffic, public security and fire fighting.
Description
Technical field
The present invention relates to ccd image sensor, relate generally to the Array CCD transducer, specifically is exactly a kind of novel anti flare light area array CCD image sensor.
Background technology
During cars meeting at night, because driver's eyes can be subjected to the stimulation of opposite car light high light, this moment, the driver can't see the traffic route of oneself clearly at all, can only drive with sensation and experience, this halation phenomenon that produced this moment may cause serious traffic accident, thereby causes the serious consequence of car crash.
At large-scale workshop, still need to adopt arc welder manually to weld, the strong arc light that arc welder produces when welding can cause great injury to welding operating personnel's eyes, simultaneously because the halation phenomenon that arc light produces, also influence operating personnel's visual effect, thus also indirect influence the welding quality of product.
In addition, in numerous applications such as military affairs, traffic, public security, fire-fightings, also press for the halation problem that solves the common CCD imageing sensor.So the anti-halation technology of research ccd image sensor has very important social meaning and economic worth.
Scenery during the automobile driving at night, it is very special that its intensity of illumination distributes.Fig. 2 be before the car light on the plane vertical, 10cm place with optical axis horizontal displacement and illumination concern actual measurement data, Fig. 1 is horizontal displacement and illumination graph of relation.People are seeking automobile driving at night halation way to solve the problem always.
For eliminating the halation phenomenon, the various countries scholar is all seeking best solution.The method of eliminating the halation phenomenon at present has two kinds:
Passive night vision infrared imagery technique be to utilize thermal infrared imager only to infrared ray responsive, and to the insensitive characteristic of visible light, the infrared radiation that relies on target itself to send is realized image collecting function.Fig. 3 (a) and Fig. 3 (b) are the automobile driving at night picture that adopts thermal infrared imager to take.Car headlight light dazzling among the figure has disappeared, and also can not differentiate the travel direction of car simultaneously.So adopting its advantage of infrared imagery technique is effectively to have eliminated the halation phenomenon, but shortcoming is the cost height, poor image quality.
Another kind is to adopt the Array CCD transducer technology of drainning off floodwaters to eliminate halation.
The common CCD imageing sensor is owing to be subjected to the restriction of dynamic range, and the phenomenon of blooming can appear in the high brightness rest image, and comet phenomenon can appear dragging in live image.Novel FIT formula CCD is provided with " drainning off floodwaters " field effect transistor on the charge storage elements next door, suitably adjusts the grid potential of field effect transistor, the unnecessary electric charge of high brightness point can be discharged the storage potential well, so that eliminate " halation " phenomenon.
DL32 is an example with plain edition Array CCD transducer, and as shown in Figure 4, its structure is N type surface channel, three layers of polysilicon electrode of three-phase, frame transfer profile battle array device.Mainly by constituting as four parts such as quick district, memory block, horizontal shifting register and output circuits, its structure is to be connected successively as quick district, memory block, horizontal shift memory, what be connected with the horizontal shift memory is output circuit, and output circuit is made of output grid, signalling channel amplifier and compensated amplifier again.DL32 profile array CCD image sensor adopts interlaced scan mode, and promptly a two field picture is made up of strange, two of idols.Odd field is CR
VA2Electrode is a high level, CR
VA1And CR
VA3Be low level, with CR
VA2256 * 320 of connecting of electrode are in-optical-integral-time as quick unit; Even field is CR
VA3Electrode is a high level, CR
VA2With CR
VA1Be low level, with CR
VA3Electrode connect 256 * 320 is in same optical-integral-time as quick unit.So this structure of DL32 profile array CCD image sensor has just determined to realize that each is as the independent setting of the time of integration of quick unit light.
Although ccd sensor is present most widely used imageing sensor, when light and shade part brightness in the scenery differs big, owing to be subjected to the restriction of its dynamic range, ccd image sensor can't obtain satisfied image.Cause is if shorten the ccd sensor optical-integral-time, and then scenery brightness will be lost than the image of dark-part in the image; If the ccd sensor optical-integral-time is prolonged, then the halation phenomenon will take place than the highlights branch in scenery in the image.Both of these case is the picture signal of output down, utilizes image processing software also can't reduce.
Therefore, the Array CCD transducer adopts the technology of drainning off floodwaters to eliminate halation, because " drainning off floodwaters " fet gate current potential that all CCD charge storage elements next doors are provided with is identical, scenery during for the automobile driving at night, in order to obtain in the scenery light than the image information of dark-part, the ccd image sensor optical-integral-time must be longer, will certainly make all corresponding on the ccd image sensor potential wells all produce saturated overflowing like this as quick unit with high light, what the method for drainning off floodwaters was drained just in time is that these are as the useful image information in quick unit, and the full potential well electric charge that stays in the potential well is nugatory owing to can't reflect the image information of car light halation place scenery.
Project team of the present invention finds report or the document closely related and the same with the present invention more as yet to domestic and international patent documentation and the journal article retrieval of publishing.
Summary of the invention
The objective of the invention is to overcome the shortcoming of above-mentioned technology or instrument existence, providing a kind of sets separately as quick unit light each the time of integration, can optical-integral-time reasonably be set according to its intensity of illumination, the Array CCD transducer can not overflow because of saturated the generation as the electric charge in the quick unit potential well like this, thoroughly eliminate halation, and the anti-flare light area array CCD image sensor of the clear display background of energy.
Below the present invention is described in detail
The present invention is a kind of anti-flare light area array CCD image sensor, it is implemented in this anti-flare light area array CCD image sensor device architecture mainly by constituting as quick district, memory block, horizontal shift memory and the output circuit that is connected with the horizontal shift memory of being connected successively, and the odd-numbered line of Array CCD transducer all is connected to CR as quick cell gate
VA2Terminal, the even number line of area array CCD all is connected to CR as quick cell gate
VA3Terminal, CR
VA2Terminal, CR
VA3Terminal and CR
VA1Terminal together as quick district all as the quick unit light pulse control signal time of integration, it is characterized in that: on existing ccd image sensor basis, set up and look like quick unit addressing circuit and optical-integral-time pulse-generating circuit.Mainly select circuit to constitute the time of integration as quick unit addressing circuit by address decoding circuitry, AND circuit with as quick unit light.Select circuit to form by data selector and data latches again the time of integration as quick unit light.Not dizzy optical control signal N-B with as quick element address decoded signal with after be connected respectively to the latch enable end that optical-integral-time is selected the data latches 9 of circuit 7 separately, disconnect strange row in phase sensitivity district and CR
VA2Continuous each of terminal goes between as quick cell gate, also disconnects phase sensitivity district idol row and CR
VA3Continuous each of terminal goes between as quick cell gate, each is connected respectively to each corresponding output of selecting data selector 8 in the circuit 7 as quick unit light the time of integration as quick cell gate, and data are selected input D0～D2 and are selected the input of the data latches 9 in the circuit 7 to be connected the time of integration as the quick unit light of picture in the quick unit addressing circuit 2.Optical-integral-time pulse-generating circuit 1 mainly is made of multichannel frequency divider 10 and time sequential pulse signal generating circuit 11, and the output signal of multichannel frequency divider 10 is connected respectively to time sequential pulse signal generating circuit 11 corresponding inputs, CR by different frequency
VA2The signal of terminal is divided into two-way, and one the road is connected to the input of time sequential pulse signal generating circuit 11, and directly export as one road optical-integral-time pulse control signal on another road.The output signal of time sequential pulse signal generating circuit 11 is connected respectively on the data selector 9 in the optical-integral-time selection circuit 7 in the quick unit addressing circuit 2 of picture.
As selecting the output signal of the data selector in the circuit to be connected respectively to each grid of area array CCD the time of integration as quick unit light in the quick unit addressing circuit as quick unit.Data input pin D0～D2 with select the input of the data latches in the circuit to be connected the time of integration as the quick unit light of picture in the quick unit addressing circuit.Therefore when not having halation, the present invention and the same work of existing Array CCD transducer, the present invention can control as quick unit each of area array CCD when meeting the halation phenomenon, realizes the purpose of elimination halation.
The present invention has set up quick unit addressing circuit of picture and optical-integral-time pulse-generating circuit on the basis of existing Array CCD transducer; be connected with former Array CCD transducer by logical design; realized that thorough elimination high light produces the problem of halation, benefited the human eye protection.
Realization of the present invention also is the decoder of the quick unit addressing circuit of picture, is made up of two-four decoder expanded circuits, and the quick element address of decoding after image signal is used Y respectively
0, Y
1, Y
2... Y
163839Expression.Can realize the addressing function of 163839 quick element addresses of picture.According to the difference of Array CCD transducer picture resolution, can suitably increase or reduce the quantity of Input Address line.
Realization of the present invention is that also integration time sequential pulse signal generating circuit 11 is made up of with door three d type flip flops and two.
Both actings in conjunction produce a pulse duration and equal to import the square wave clock signal period, and and CR
VA2The optical-integral-time pulse signal that rising edge is synchronous is for realizing as the quick unit light controlled basis that the provides time of integration.
Realization of the present invention also be as in the quick unit addressing circuit to select data selector in the circuit time of integration as quick unit light be eight to select a data selector, as in the quick unit addressing circuit to select the data latches in the circuit time of integration as quick unit light be three D data latches.
The present invention has designed optical-integral-time and has selected circuit, selects data to latch by data latches to optical-integral-time, chooses a kind of in eight kinds of optical-integral-times by data selector.When not having halation, the present invention and the same work of existing Array CCD transducer, the present invention can control each pixel unit of area array CCD when meeting the halation phenomenon, realizes eliminating the purpose of halation.
Anti-halation principle analysis of the present invention:
Light beam is gone into the computing formula of the quantity of electric charge and is in the area array CCD photosensitive unit potential well
In the formula, η is the quantum efficiency of material; Q is an electronic charge; A is the light-receiving area of photosensitive unit; Hv is the photon energy of wavelength; t
cBe optical-integral-time; Φ
E, λBe the incident light spectrum radiant flux.
As can be seen, after the CCD device was determined, η, q, A and hv were constant from formula, and light is injected into the signal charge amount Q in the potential well and the spectral radiant flux Φ of incident light
E, λAnd injection length t
cLinear.Because open ended peak signal quantity of electric charge Q is certain in the CCD potential well, as spectral radiant flux Φ
E, λDuring increase, suitably dwindle optical-integral-time t
c, just can avoid in the photosensitive unit potential well charge generation to overflow, during brightness divides than highlights in the images acquired scenery image just the halation phenomenon can not take place; Otherwise, as spectral radiant flux Φ
E, λWhen reducing, suitably increase optical-integral-time t
c, just can clearly collect in the image scene brightness than the image of dark-part.Each optical-integral-time as quick unit of choose reasonable Array CCD transducer can effectively be eliminated the halation phenomenon.
In order to collect the full detail of light and shade part in the scenery, each can be controlled separately as the optical-integral-time of quick unit in the demand side array CCD image sensor, when certain is overflowed by illumination as the electric charge in the quick unit potential well, suitably shorten its optical-integral-time, just can eliminate halation.Based on this design philosophy, the present invention increases on existing ccd image sensor basis as quick unit addressing circuit and optical-integral-time pulse-generating circuit, make the Array CCD transducer all as quick unit, can optical-integral-time reasonably be set according to its intensity of illumination, the Array CCD transducer can not overflow because of saturated the generation as the electric charge in the quick unit potential well like this, thereby reaches thorough elimination halation purpose.
The present invention utilizes digital circuit technique to combine with microelectronic manufacturing technology, quick unit addressing circuit of picture and optical-integral-time pulse-generating circuit on the basis of existing Array CCD transducer, have been set up, by each is set separately as quick unit light the time of integration, effectively solved the problem that always is difficult to eliminate the high light halation for a long time.The present invention can reasonably be provided with optical-integral-time according to its intensity of illumination, the Array CCD transducer can not overflow because of saturated the generation as the electric charge in the quick unit potential well like this, thoroughly eliminate halation, and the clear displayed image of energy, when not having halation, the present invention and the same work of existing Array CCD transducer are when meeting the halation phenomenon, the present invention can control as quick unit each of area array CCD, realizes eliminating the purpose of halation.A kind of energy anti-flare light area array CCD image sensor is provided, circuit structure is simple, be easy to realize, cost is low, the present invention can be made into CCD camera or the video camera machine with anti-halation function, be widely used in the various fields that needs the install machinery sighting device, as: the Visual Display application that the vision instrument of automobile driving at night is used, high light welds protective cover etc. have a wide range of applications in various fields such as military affairs, traffic, public security, fire-fightings.
Description of drawings:
Fig. 1 is horizontal displacement and an illumination graph of relation on the plane vertical with optical axis, the preceding 10cm place of car light;
Fig. 2 be before the car light on the plane vertical, 10cm place with optical axis horizontal displacement and illumination concern the actual measurement data table;
Fig. 3 (a) and Fig. 3 (b) all are the driving at night photos that adopt thermal infrared imager to take;
Fig. 4 is a plain edition Array CCD transducer DL32 type structured flowchart;
Fig. 5 is that anti-flare light area array CCD image sensor of the present invention is formed schematic diagram;
Fig. 6 is the main logical circuit schematic block diagram of extension of the present invention, also is the circuit block diagram of embodiment 1;
Fig. 7 is that the present invention is as the address decoding circuitry schematic diagram in the quick unit addressing circuit;
Fig. 8 is the decoding circuit menu of Fig. 7;
Fig. 9 is that the light integration time sequential pulse of optical-integral-time pulse signal generating circuit of the present invention produces circuit diagram;
Figure 10 is the sequential chart of Fig. 9 circuit;
Figure 11 is the photo that utilizes experimentation of the present invention to capture, and the shutter speed of CCD camera all has difference when taking every photos; Wherein Figure 11 (a) shutter speed is 1/50S; Figure 11 (b) shutter speed 1/100S; Figure 11 (c) shutter speed 1/250S; Figure 11 (d) shutter speed 1/500S; Figure 11 (e) shutter speed 1/1000S; Figure 11 (f) shutter speed 1/2000S; Figure 11 (g) shutter speed 1/4000S; Figure 11 (h) shutter speed 1/10000S.
Figure 12 is a simulation result photo of the present invention.
Embodiment:
Embodiment 1: the present invention is a kind of anti-flare light area array CCD image sensor, and its device architecture is mainly by constituting as quick district 3, memory block 4, horizontal shift memory 5 and the output circuit 6 that is connected with horizontal shift memory 5 of being connected successively, referring to Fig. 4.Output circuit 6 is made of output grid, signalling channel amplifier and compensated amplifier again.All all are connected to CR as quick cell gate the odd-numbered line of Array CCD transducer
VA2Terminal, all also all are connected to CR as quick cell gate the even number line of Array CCD transducer
VA3Terminal is at CR
VA2Terminal and CR
VA3Terminal and CR
VA1Terminal cooperatively interacts down and realizes the exposure control of Array CCD transducer as quick unit.On above existing ccd image sensor basis, set up quick unit addressing circuit 2 of picture and optical-integral-time pulse-generating circuit 1, as shown in Figure 5.Mainly select circuit 7 to constitute the time of integration as quick unit addressing circuit 2, select circuit 7 to form by data selector 8 and data latches 9 again the time of integration as quick unit light by address decoding circuitry, AND circuit with as quick unit light.Not dizzy optical control signal N-B with as quick element address decoded signal with after be connected respectively to the latch enable end G that optical-integral-time is selected the data latches 9 of circuit 7 separately, disconnect strange row in phase sensitivity district and CR
VA2Continuous each of terminal goes between as quick cell gate, also disconnects phase sensitivity district idol row and CR
VA3Continuous each of terminal goes between as quick cell gate, each is connected respectively to the output of selecting data selector 8 in the circuit 7 as quick unit light the time of integration as quick cell gate, data input pin D0～D2 with select the input of the data latches 9 in the circuit 7 to be connected the time of integration as the quick unit light of picture in the quick unit addressing circuit 2, data select input D0～D2 to finish the selection of optical-integral-time pulse signal.
Optical-integral-time pulse-generating circuit 1 mainly is made of multichannel frequency divider 10 and time sequential pulse signal generating circuit 11, and the output signal of multichannel frequency divider 10 is connected respectively to time sequential pulse signal generating circuit 11 corresponding inputs, CR by different frequency
VA2The signal of terminal is divided into two-way, one the road is connected to the input of time sequential pulse signal generating circuit 11, directly export as one road optical-integral-time pulse control signal on another road, the output signal of time sequential pulse signal generating circuit 11 is connected respectively on the data selector 9 in the optical-integral-time selection circuit 7 in the quick unit addressing circuit 2 of picture.
The output signal that is to say multichannel frequency divider 10 is connected respectively to different time sequential pulse signal generating circuit 11 inputs, CR
VA2Signal also is connected on the time sequential pulse signal generating circuit 11.The output signal of time sequential pulse signal generating circuit 11 is connected to as the quick unit light of picture in the quick unit addressing circuit 2 by data wire and selects the time of integration on the data selector 8 in the circuit 7.Eight kinds of light integration time sequential pulse signals, data selection input D0～D2 signal and latch enable signal all are connected to as quick unit light and select on the circuit 7 time of integration, latch enable signal G is used for latch data and selects the numerical value of signal D0～D2, the numerical value of D0～D2 to determine data selector to select any in eight kinds of optical-integral-time pulses actually.As selecting the output signal of the data selector 8 in the circuit 7 to be connected respectively to each grid of area array CCD the time of integration as quick unit light in the quick unit addressing circuit 2, thereby realize that each is as the quick unit light set-up function of the time of integration as quick unit.
The function of optical-integral-time pulse-generating circuit 1 is to produce eight kinds of optical-integral-time pulse signals, as the function of quick unit addressing circuit 2 be can be addressed to the Array CCD transducer by address bus A0～A17, Enable Pin G each as quick unit, and select input D0～D2 can select any in eight kinds of optical-integral-time pulses by data.As quick unit addressing circuit 2 and optical-integral-time pulse-generating circuit 1 both cooperatively interact common finished surface array CCD image sensor each as the quick unit light set-up function of the time of integration.
In order to collect the full detail of light and shade part in the scenery, each can be controlled separately as the optical-integral-time of quick unit in the demand side array CCD image sensor, is equivalent to as quick unit an electronic shutter is set for each.When certain is overflowed by illumination as the electric charge in the quick unit potential well, suitably shorten its optical-integral-time, just can eliminate halation.
When not having the halation phenomenon to take place, because not dizzy optical control signal N-B exists and relation with the quick element address of picture decoded signal, making not dizzy optical control signal N-B is 0 level, it also is 0 entirely that data are selected input D0～D2, then the output of each data selector 8 all with optical-integral-time pulse control signal CR
VA2Be communicated with, odd-numbered line all as the optical-integral-time of quick unit directly by CR
VA2Control, i.e. the present invention and existing Array CCD transducer have same function.When the halation phenomenon took place, each that the present invention can the opposite array CCD image sensor was controlled separately as the optical-integral-time of quick unit, realizes eliminating the purpose of halation, as shown in Figure 6.
Embodiment 2: overall plan is with embodiment 1, address decoding circuitry as quick unit addressing circuit 2 is made up of two-four decoder expanded circuits, referring to Fig. 7, be to search out the quick cell position of picture that needs to set optical-integral-time fast by address wire as quick element address.The Array CCD transducer is selected the DL32 type for use, and it is 512 row * 320 row as quick unit cell arrangement mode, total 28000H the quick unit of picture.As quick element address arranged mode be: the 1st row, the 1st row are 00000H as quick element address, and the 1st row, the 2nd row are 00001H...... as quick element address, and the 512nd row, the 320th column address are 27FFFH.The decoded mode identical with two-four decoders adopted in picture quick element address addressing, as shown in Figure 7.Then addressing 28000H the quick unit of picture needs 18 address wires altogether.The quick element address of decoding after image is used Y respectively
0, Y
1, Y
2... Y
163839Expression.The menu of two-four decoders is referring to Fig. 8.
Embodiment 3: overall plan is made up of three-eight decoder expanded circuits as the address decoding circuitry of quick unit addressing circuit 2 with embodiment 1.
Embodiment 4: overall plan is with embodiment 1 or embodiment 2, light integration time sequential pulse produce integration time sequential pulse in the circuit 1 produce circuit 11 be by three d type flip flops with two with constitute.Both acting in conjunction generations equated with the input clock signal cycle, and and CR
VA2The pulse signal that rising edge is synchronous.
The function of optical-integral-time pulse-generating circuit is to produce pulse duration to be respectively 1/100S, 1/250S, 1/500S, 1/1000S, 1/2000S, 1/4000S, 1/10000S totally 7 kinds of optical-integral-time pulse signals.The multichannel frequency divider is respectively the square wave clock signal of 1/100S, 1/250S, 1/500S, 1/1000S, 1/2000S, 1/4000S, 1/10000S with external timing signal cycle of being transformed into of 1MHz, and these seven kinds of clock signals are represented with F0～F6 respectively.
With CR
VA2The quick unit of picture that electrode links to each other, its light integration time sequential pulse signal generating circuit 11 is divided into 7 because of the clock signal period difference.The seven kind optical-integral-time pulse signals corresponding with seven kinds of clock signal F0～F6 are represented with T0～T6 respectively.T1 optical-integral-time time sequential pulse signal generating circuit operation principle as shown in Figure 9.
CR
VA2=0,3 d type flip flops are initial condition, Q1=0, Q2=Q3=1.The T0 moment, CR
VA2=1, before clock signal F1 rising edge arrived, the state of d type flip flop remained unchanged.T1 constantly, F1=1, Q1=1 then, Q2=0, Q3=1.T2 constantly, when second rising edge of a pulse of F1 arrived, Q1 remained unchanged, Q2=1, Q3=0, the CLK clock signal of Q3 by having blocked the D2 trigger with door.The T3 moment, CR
VA2Become 0 by 1.The T4 moment, CR
VA2When becoming first F1 rising edge after 0 and arrive by 1, Q1=0 has blocked the output of P pulse signal.D2 trigger/Q2 end output signal T1, pulse duration just in time is the one-period of clock signal F1, and pulse front edge and CR
VA2Identical.The sequential of above-mentioned analysis as shown in figure 10.With CR
VA3The quick unit of picture that electrode links to each other, its optical-integral-time pulse signal generating circuit and CR
VA2Identical.
Embodiment 5: overall plan is with embodiment 1 or embodiment 2 or embodiment 4, as in the quick unit addressing circuit 2 to select data selector in the circuit time of integration as quick unit light be eight to select a data selector, as in the quick unit addressing circuit to select the data latches in the circuit time of integration as quick unit light be three D data latches.
DL32 type area array CCD adopts interlaced scan mode, and promptly a two field picture is made up of strange, two of idols.Odd field is CR
VA2Electrode is a high level, CR
VA1And CR
VA3Be low level, with CR
VA2Electrode connect 256 * 320 is in optical-integral-time as quick unit; Even field is CR
VA3Electrode is a high level, CR
VA2With CR
VA1Be low level, with CR
VA3What electrode connected 256 * 320 is in optical-integral-time as quick unit.
For all can freely be provided with as quick unit light the time of integration, needing will original and CR
VA2Electrode be connected all disconnect as contact conductors of quick unit 3, and with each as the grid of quick unit respectively with as selecting the lead-out terminal of the data selector in the circuit to be connected the time of integration as quick unit light in the quick unit addressing circuit 2.With CR
VA3Picture quick unit variation and CR that electrode connects
VA2Identical.
With CR
VA2256 * 320 quick unit light of picture that electrode is connected are set principle as shown in the figure 6 time of integration.Frequency is the f of 1MHz
0Behind clock signal process multichannel frequency divider and the light integrated pulse signal generating circuit, be transformed into 7 kinds of optical-integral-time pulse signals, represent with T0～T6 respectively.CR
VA2And T0～T6 totally eight kinds of light integrated pulse signals deliver to all and select a data selector input as eight of quick unit, D0～D2 eight selects data selector data to select port.
Embodiment 6: the course of work of the present invention
Overall constitute or with embodiment 1, or with embodiment 2, or with embodiment 3, or with embodiment 4, or with embodiment 5, after system powers on, N-B produces a low level pulse signal, selects a data selector that all optical-integral-time pulse signals as quick unit of ccd sensor all are set at CR by eight
VA2Signal.When no halation phenomenon takes place, with CR
VA2The optical-integral-time of 256 * 320 quick unit of picture that electrode connects is by CR
VA2The width decision of pulse signal.
When array CCD image sensor was as quick unit generation halation phenomenon face to face, to make this be low level as quick element address signal Yx by produce circuit as quick element address.The Yx signal latchs the data of new optical-integral-time pulse selecting signal D0～D2 as this enable signal as quick cell data latch.Therefore, by the quick element address signal Y of picture
0, Y
1... Yn and optical-integral-time pulse selecting signal D0～D2, just can choose in eight kinds of optical-integral-time pulse signals and optical-integral-time less than CR
VA2Any conduct as the optical-integral-time pulse signal of quick unit, thereby realize as the quick unit light set-up function time of integration.
Embodiment 7:
In order to verify anti-halation effect of the present invention, be beneficial to prior art and carry out the experiment of vehicle meeting,
(1) time is night; (2) first and second two automobiles are parked on the highway in opposite directions, at a distance of 10m, all open headlight; (3) with tripod fixedly colourful CCD video camera in first driver's eye position; (4) camera shutter speed is set to totally eight grades of 1/50S, 1/100S, 1/250S, 1/500S, 1/1000S, 1/2000S, 1/4000S, 1/10000S respectively, utilizes video card and takes eight photos of a second automobile by computer altogether.Every photos and when taking this photos the shutter speed of CCD camera respectively shown in Figure 11 (a)～Figure 11 (h).These figure all are the pictures that adopt traditional Array CCD transducer to be obtained.
Figure 11 (a)～every photos of Figure 11 (h) all has pluses and minuses separately, but all follow a common rule: if CCD camera shutter velocity amplitude is big more, the ccd image sensor optical-integral-time is long more, at a distance light is clear more than the contour images of scenery such as the tree crowns of dark areas trees, road edge in the place ahead in the photo scenery, and a second car light light place image generation halation phenomenon is serious more; If the camera shutter velocity amplitude is more little, camera ccd image sensor optical-integral-time is short more, at a distance light is fuzzy more than the contour images of scenery such as the tree crowns of dark areas trees, road edge in the place ahead in the photo scenery, and a second car light light place image generation halation phenomenon is light more.
Embodiment 8: formation scheme of the present invention is with embodiment 5,
Adopt the present invention that the photo that embodiment 7 is obtained is carried out emulation.During driving at night,, need camera shutter speed is adjusted to maximum 1/50S because light is darker.When the two automobiles meeting, because the opposite car lamp wiring is stronger, the halation phenomenon will take place in the quick unit of picture corresponding with a second car light in the Array CCD transducer.The present invention is when array CCD image sensor is as quick unit generation halation face to face, suitably shortens this as quick unit light time of integration, can eliminate halation.
In addition, the quick unit of picture for halation takes place reduces one-level with its shutter speed value, promptly is adjusted into 1/100S; If with take place in the Array CCD transducer halation reduce one-level as quick unit shutter speed value after, the quick unit generation halation phenomenon of picture is still arranged, just the shutter speed value of these quick unit of vignetted image need be reduced one-level again, not have as quick unit that the halation phenomenon takes place or camera light has been reduced to minimum value the time of integration up to all.
Utilize MATLAB to realize the concrete operations of this anti-halation method: (1) replaces pixel brightness value among Figure 11 (a) greater than the brightness value of all pixels of 232 brightness number with corresponding pixel points among Figure 11 (b), rest of pixels is lighted number of degrees value and is remained unchanged, obtain emulating image P1, this step operation reality has shortened an optical-integral-time with the optical-integral-time of the quick unit of vignetted image exactly, and promptly optical-integral-time shortens to 1/100S from 1/50S; (2) pixel intensity among the image P1 is replaced greater than the brightness value of all pixels of 232 brightness number with corresponding pixel points among Figure 11 (c), rest of pixels point brightness value remains unchanged, obtain emulating image P2, this step operation is exactly through after shortening optical-integral-time to those, the optical-integral-time that the quick unit of picture of halation still takes place shortens an optical-integral-time again, and promptly optical-integral-time shortens to 1/250S from 1/100S; Carry out so repeatedly 7 times, pixel intensity replaces greater than the brightness value of all pixels of 232 brightness number with corresponding pixel points among Figure 11 (h) in image P6, and rest of pixels point brightness value remains unchanged.Finally obtain simulation result as shown in figure 12.These operations are just shortened the picture quick unit time for exposure in the Array CCD transducer through six times after, the quick unit light of the picture time of integration that halation still takes place is with minimum light pulse control signal time of integration 1/10000S control.
Figure 12 carries out photo that different optical-integral-times settings finish to corresponding as quick unit according to brightness different in the image scene, all shortcomings of Figure 11 (a)～Figure 11 (h) image have been overcome, drawn all advantages in above-mentioned eight width of cloth images, the halation phenomenon thoroughly is eliminated.From Figure 12 as seen: no halation phenomenon takes place, and light is clear than the contour images of scenery such as the tree crowns of the visible trees of dark areas, road edge at a distance in the place ahead in the photo scenery.
Claims (4)
1. anti-flare light area array CCD image sensor, mainly by constituting as quick district, memory block, horizontal shift memory and the output circuit that is connected with the horizontal shift memory of being connected successively, the strange row of Array CCD transducer all is connected to CR as the grid of quick unit to its device architecture
VA2Terminal, the idol row all is connected to CR as quick cell gate
VA3Terminal, CR
VA2Terminal, CR
VA3Terminal and CR
VA1Terminal together as quick district all as the quick unit light pulse control signal time of integration, it is characterized in that: on existing ccd image sensor basis, set up picture quick unit addressing circuit (2) and optical-integral-time pulse-generating circuit (1), the quick unit addressing circuit of picture (2) is mainly by address decoding circuitry, AND circuit and select the time of integration circuit (7) to constitute as quick unit light, select circuit (7) to form by data selector (8) and data latches (9) again the time of integration as quick unit light, not dizzy optical control signal N-B with as quick element address decoded signal with after be connected respectively to the latch enable end that optical-integral-time is selected the data latches (9) of circuit (7) separately, disconnect strange row in phase sensitivity district and CR
VA2Continuous each of terminal goes between as quick cell gate, also disconnects phase sensitivity district idol row and CR
VA3Continuous each of terminal goes between as quick cell gate, each is connected respectively to each corresponding output of selecting data selector (8) in the circuit (7) as quick unit light the time of integration as quick cell gate, and data select input D0～D2 to select the input of the data latches (9) in the circuit (7) to be connected the time of integration with the quick unit light of picture in the quick unit addressing circuit of picture (2); Optical-integral-time pulse-generating circuit (1) mainly is made of multichannel frequency divider (10) and time sequential pulse signal generating circuit (11), the output signal of multichannel frequency divider (10) is connected respectively to the corresponding input of time sequential pulse signal generating circuit (11), CR by different frequency
VA2The signal of terminal is divided into two-way, one the road is connected to the input of time sequential pulse signal generating circuit (11), directly export as one road optical-integral-time pulse control signal on another road, the output signal of time sequential pulse signal generating circuit (11) is connected respectively on the data selector (9) in the optical-integral-time selection circuit (7) in the quick unit addressing circuit of picture (2).
2. anti-flare light area array CCD image sensor according to claim 1 is characterized in that: said address decoding circuitry as quick unit addressing circuit 2 is based on the expanded circuit of two-four decoders to be formed, and the quick element address of decoding after image signal is used Y respectively
0, Y
1, Y
2... Y
163839Expression.
3. anti-flare light area array CCD image sensor according to claim 1 is characterized in that: said integration time sequential pulse signal generating circuit (11) is made up of with door three d type flip flops and two.
4. anti-flare light area array CCD image sensor according to claim 3, it is characterized in that: it is eight to select a data selector that the quick unit light of picture in the quick unit addressing circuit of said picture (2) is selected data selector (8) in the circuit (7) time of integration, and selecting the data latches (9) in the circuit (7) time of integration as the quick unit light of picture in the quick unit addressing circuit (2) is three D data latches.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102572317A (en) * | 2011-12-31 | 2012-07-11 | 四川川大智胜软件股份有限公司 | Anti-blooming method for image sensor |
| CN103337509A (en) * | 2013-06-13 | 2013-10-02 | 中国兵器工业集团第二一四研究所苏州研发中心 | Anti-dispersion structure and manufacture technology of electron multiplying charge-coupled device(EMCCD) |
| CN104506783A (en) * | 2014-11-06 | 2015-04-08 | 北京市遥感信息研究所 | Multi-mode super CCD (Charge Coupled Device) sensor |
| CN106161984A (en) * | 2016-08-31 | 2016-11-23 | 钧捷科技（北京）有限公司 | The suppression of video image high light, profile and details enhancement process method and system |
| CN111246134A (en) * | 2020-01-16 | 2020-06-05 | 锐芯微电子股份有限公司 | Anti-dispersion method of image sensor and image sensor |
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2007
- 2007-07-11 CN CNB2007100182442A patent/CN100484204C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102572317A (en) * | 2011-12-31 | 2012-07-11 | 四川川大智胜软件股份有限公司 | Anti-blooming method for image sensor |
| CN102572317B (en) * | 2011-12-31 | 2014-06-25 | 四川川大智胜软件股份有限公司 | Anti-blooming method for image sensor |
| CN103337509A (en) * | 2013-06-13 | 2013-10-02 | 中国兵器工业集团第二一四研究所苏州研发中心 | Anti-dispersion structure and manufacture technology of electron multiplying charge-coupled device(EMCCD) |
| CN103337509B (en) * | 2013-06-13 | 2015-10-28 | 中国兵器工业集团第二一四研究所苏州研发中心 | The anti-disperse structure of electron multiplying charge coupled apparatus and manufacture craft |
| CN104506783A (en) * | 2014-11-06 | 2015-04-08 | 北京市遥感信息研究所 | Multi-mode super CCD (Charge Coupled Device) sensor |
| CN106161984A (en) * | 2016-08-31 | 2016-11-23 | 钧捷科技（北京）有限公司 | The suppression of video image high light, profile and details enhancement process method and system |
| CN106161984B (en) * | 2016-08-31 | 2020-03-31 | 钧捷智能（深圳）有限公司 | Video image highlight suppression, contour and detail enhancement processing method and system |
| CN111246134A (en) * | 2020-01-16 | 2020-06-05 | 锐芯微电子股份有限公司 | Anti-dispersion method of image sensor and image sensor |
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