CN101140222B - Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials - Google Patents
Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials Download PDFInfo
- Publication number
- CN101140222B CN101140222B CN2007100599408A CN200710059940A CN101140222B CN 101140222 B CN101140222 B CN 101140222B CN 2007100599408 A CN2007100599408 A CN 2007100599408A CN 200710059940 A CN200710059940 A CN 200710059940A CN 101140222 B CN101140222 B CN 101140222B
- Authority
- CN
- China
- Prior art keywords
- light
- sample
- parameter
- photon
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
A spectrograph system and a method measure all optical parameters of turbid medium materials. The system comprises a computer respectively connected with a light source, a monochrometer, a sampling device and a signal measuring device. Wherein, lights emitted by the light source are projected to the sampling device through the monochrometer and a light path. Light signals from the sampling device are transmitted to the signal measuring device connected with the computer through the light path. In addition, the method obtains, inputs and calculates error values of actual light signals and measured light signals on all wavelengths of set bands to acquire and input sample system parameters, thus entering into a subprogram for refractive index calculation. Input sample optical parameters compares difference between light signals of actual measuring and calculated light signals. As the difference is less than the measuring error value, it is necessary to calculate and output other optical parameter spectrum of the sample. Otherwise, the light signal is returned to a subprogram of optical transmission theoretical calculation. The measuring system of the present invention brings great convenience and accurately measures all optical parameters of light signals and all materials including turbid medium materials.
Description
Technical field
The present invention relates to a kind of spectrometer system and method.Particularly relate to a kind of spectrometer system and method that the mensuration exactly of measuring light signal and optical parametric exactly comprises the turbidity dielectric materials whole optical parameter that can be used in.
Background technology
Spectrum is the funtcional relationship of optical parametric and optical wavelength, and different materials has different spectrum, reflects its material characteristics.To the mensuration of material characteristics spectrum, analysis is called spectroscopy with research.Spectrometer is based on the spectroscopy principle and is widely used in one of material analysis instrument of all trades and professions.Which kind of spectrometer no matter all needs to handle the optical signalling of being surveyed according to accurate description light and the interactional mathematics physics model of material and obtains optical parametric.In various spectrometers, measuring material is one of the most frequently used spectrometer from ultraviolet absorption spectrometer (spectrophotometer) of optical attenuation coefficient spectrum to the infrared spectral domain.
Generally speaking, the interaction of light and material mainly can be divided into absorption and scattering two classes.Stronger as material to scattering of light, then be called the optical opacity medium.Many materials are the optical opacity medium, as pottery, opaque plastic, milk, paint, cell suspension liquid, contaminated or have suspended particle water oil or other solution, people, the soft tissue of animal and plant etc.Light absorption and light scattering and be stored in light and the interaction of material in the turbid medium, and interactional room and time distributes and has at random character.The energy transmission of light in material and be distributed as a complex conditions problem in this case need be described and find the solution with mathematics physics model accurately.The turbid medium optical model of widespread use at present is a radiation transfer theory, and this theory is defined as absorption coefficient with the optical parametric of material, scattering coefficient and scattering phase function.Absorption coefficient is represented photon absorbed average time in the unit propagation distance in material, usually with interior heterogeneity or the particle kind of material, and concentration, size and shapes etc. are relevant.Scattering coefficient and scattering phase function are then represented the average time that photon is scattered in the unit propagation distance and the Probability Distribution of scattering angle in material.Under the situation of known scattering phase functional form, as Han Ni-Greenstein (Henyey-Greenstein) phase function etc., the scattering phase function can be by one or more scalar parameters decisions.Han Ni-Greenstein phase function is determined by a scalar parameter, be called anisotropic parameters, the mean value that it is defined as scattering angle cosine goes through visible list of references (Z.Song for example, K.Dong, X.H.Hu, and J.Q.Lu, " Monte Carlo Simulation of Converging Laser Beams Propagating in Biological Tissues ", Applied Optics, vol.38, pp.2944-2949 (1999)).
Except that above-mentioned optical parametric, the light refractive index of material also is an optical parametric, usually can be by the fresnel formula decision of the border coupling condition of electromagnetic wave between materials with different properties, go through visible list of references (H.Ding for example, J.Q.Lu, K.M.Jacobs, X.H.Hu, " Determination of Refractive Indices of Porcine Skin Tissues and Intralipid at 8 Wavelengths between 325 and 1557nm ", Journal of the Optical Society of America A, vol.22, pp.1151-1157 (2005)).If we suppose that the scattering phase function of material can be by Han Ni-Greenstein phase function description, then the scattering phase function can be by the unique decision of anisotropic parameters.For the uniform turbidity dielectric materials of macroscopic view, according to radiation transfer theory and defined 4 parameters of fresnel formula, it also is absorption coefficient, scattering coefficient, anisotropic parameters and refractive index, absorption and the scattering phase interaction of material be can describe fully, whole optical parameter or full optical parametric are called at this to light.These 4 optical parametrics change with optical wavelength usually, are the functions of wavelength therefore, are called whole optical parameter spectrum here.
Attenuation coefficient above-mentioned may be defined as absorption coefficient and scattering coefficient sum.The optical model of absorption spectrometer institute foundation commonly used is Beer Lambert law (Beer-Lambert law) at present, is a kind of approximate of radiation transfer theory.Thereby this spectrometer can't measure absorption coefficient and scattering coefficient and other optical parametrics respectively, and is limited to the analysis ability of material, as distinguishing identical absorbing medium of attenuation coefficient (as black ink) and scattering medium (as milky milk).And the whole optical parameter spectrum of measuring material can greatly improve spectrometer as the ability that comprises the material analysis and the research of turbid media.
The whole optical parameter spectrum of measuring material need provide the wide spectrum incident light of irradiation material sample, the different directions scattered light signal identical with position measurement and lambda1-wavelength outside sample then.Light can be owing to absorb disappearance that causes light or photon and the change that causes photon relay direction owing to scattering in the communication process of material.Interactional space of absorption in material and scattering and time distribute and are generally at random, and its statistical nature is by the optical parametric decision of material.The random nature of light scattering causes emergent light from the sample randomness on direction and the position distribution in three dimensions, and this makes measures relatively difficulty of scattered light signal that material tests product.The measuring method of reporting at present comprises utilizes the integrating sphere measurement to diffuse and the method for diffuse transmission light signal and utilize discrete detector or detector array is measured the method that reflected light signal distributes.The shortcoming of these methods or be the measuring system complexity, or for can't measure light signal and optical parametric exactly.Go through visible list of references (C.Chen for example, J.Q.Lu, H.Ding, K.M.Jacobs, Y.Du, and X.H.Hu, " A primary method for determination of optical parameters of turbid samples and application to intralipid between 550 and 1630nm ", Optics Express, vol.14, pp.7420-7435 (2006)).
Summary of the invention
Technical matters to be solved by this invention is, provides a kind of measuring system simple, can be used in spectrometer system and the method for measuring the material whole optical parameter that comprises turbid medium exactly of measuring light signal and optical parametric exactly.
The technical solution adopted in the present invention is: a kind of mensuration comprises the spectrometer system of turbidity dielectric materials whole optical parameter, described whole optical parameter is: absorption coefficient, scattering coefficient, anisotropic parameters and refractive index, system includes: the Lights section, monochromator part, light path part, the sampling device part, signal measurement part and computing machine part; Wherein, be used to control with the computing machine part of data processing and calculating respectively with the Lights section, monochromator part, sampling device part, and signal measurement partly be connected; The light that the light source portion branch sends is injected into the sampling device part by monochromator part, light path part; Extremely divide the signal measurement part that links to each other from the light signal of sampling device part outgoing by light path part with computer department; Wherein, described sampling device partly include be used to regulate incident light enter sample incident angle sample rotary table and the sample box that sample is equipped with in thereon inside is set; Described light path part includes: be used for the first surface catoptron that is positioned at monochromator part output terminal of collimated light beam, the catoptron that is positioned at the light splitting piece of first surface mirror reflects light one side and receives the collimation transmitted light beam of sampling device sample partly; Second curved reflector of the reflected light that is positioned at catoptron one side that is used to focus on, and the catoptrical slit that receives second curved reflector; Described signal measurement partly includes: the linear array photodetector that receives the diffuse reflection light beam of sample; A side joint that is positioned at light splitting piece is received mirror and is used for measuring indirectly the first discrete photodetector of incident intensity signal to folded light beam; The diffuse transmission light beam that receives sample is used for measuring the second discrete photodetector of diffuse transmission light intensity signal; Be positioned at the 3rd discrete photodetector that slit emergent light one side is used for measuring collimation transmitted intensity signal; Receive the light signal of each photodetector, and deliver to the signal processing circuit of computing machine part (16) after handling.
Described the Lights section includes light source and photomodulator, wherein, the control end of light source divides by cable and computer department and links to each other, the output beam of light source by monochromator part, photomodulator and light splitting piece after as monochromatic incident beam enter sampling device partly in.
Described light source is obtained by the incoherent wide spectrum light source of continuous spectrum, and its irradiates light wavelength is continuous distribution in the spectral domain of setting.
Light source in described the Lights section is made up of as coherent source a plurality of laser instruments, and its output beam wavelength is a discrete form, can directly obtain monochromatic output light to light path part.
The diameter of described incident beam is between 1 millimeter～100 millimeters.
Described monochromator partly is made up of light beam focussed collimated light path and spectrum light splitter spare.
Be used to measure the method for the spectrometer system that comprises the turbidity dielectric materials whole optical parameter, include as the next stage:
Phase one: obtain and import measured light signal and measurement error value on all wavelengths that sets in the wave band, obtain and import the sample system parameter simultaneously;
Subordinate phase: enter the refractive index counting subroutine in the calculation procedure, the sample refractive index of calculating on all wavelengths in the set wave band of decision promptly obtains the sample refractive index spectra;
Phase III: input sample optical parametric initial value and adjust the sample optical parameter value enter light transmission Theoretical Calculation subroutine in the calculation procedure in set wave band obtains to calculate light signal;
Quadravalence section: setting on the wavelength, relatively measured light signal and the difference of calculating light signal;
Five-stage: in the comparison of quadravalence section, when difference during, output sample whole optical parameter spectrum less than measurement error value, otherwise, return the phase III;
The described measured light signal that obtains input and calculate on all wavelengths in setting wave band is: mirror is that mirror is to reflectivity to the ratio of reflected light and incident intensity, the intensity that diffuses is diffuse reflectance with the ratio of incident intensity, the collimation transmitted light is a collimated transmittance with the ratio of incident intensity, and the diffuse transmission light intensity is a diffuse transmittance with the ratio of incident intensity.
Described sample system parameter includes: the incident light parameter, and sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
Refractive index counting subroutine in the described calculation procedure includes following steps:
The first step: systematic parameter per sample, the sample box material refractive index on the lambda1-wavelength of setting, and the mirror of actual measurement is set in the initial value of the sample refractive index on the lambda1-wavelength to the function curve of reflectivity and incident angle;
Second step: obtain the mirror of calculating to reflectivity and incident angle function curve according to the Fresnel equation;
The 3rd step: that relatively calculate and the difference of mirror actual measurement to reflectivity and incident angle curve, and follow back second and go on foot until difference less than measurement error value by adjusting the sample refractive index repeatedly;
The 4th step: judging whether refractive index spectra calculates on all wavelengths in set wave band finishes, and has not calculated, and returns the first step, has calculated and has then exported the sample refractive index spectra, and returned master routine.
Described sample system parameter includes: the area in incident beam cross section, and direction and distribute power, the form parameter of sample and sample box, and photodetector is with respect to the direction parameter of sample box.
Light transmission Theoretical Calculation subroutine in the described calculation procedure has the following steps:
S1: the total number of light photons N of incident beam intensity is represented in input
0
S2: input sample system parameter;
S3: the incident direction by photon determines its initial direct of travel;
S4: the initial value of setting tracked photon number N: N=1;
S5: determine the total distance of photon at random according to absorption coefficient;
S7: judge that tracked photon number N is greater than 1?, N enters S8 greater than 1, otherwise enters S9;
S8: determine the photon scattering angle also promptly to advance after the direction at random according to the scattering phase function, enter S9;
S9: determine the free traveling distance of photon at random according to scattering coefficient;
S10: follow the trail of photon to next scattering point;
S11: judge that photon accumulative total traveling distance is greater than total distance? be to enter S12, otherwise enter S13;
S12: judge after photon is absorbed to enter S6;
S6: will enter S5 after the tracked photon number N increase by 1;
S13: judge that photon contacts the sample border? be to enter S14, otherwise enter S8;
S14: determine at random that according to edge reflection coefficient photon overflows sample based on the Fresnel Equation for Calculating? be to enter S15, continue to enter S8 after the tracking otherwise get back to sample media according to reflection direction;
S15: judge whether to be accepted by photodetector? be to enter S17, otherwise enter S16;
S16: judge after photon is escaped to enter S6;
S17: will be increased by 1 by the photon number that this photodetector is accepted and also calculate the corresponding light signal of storage, and be photon number and N that this photodetector is accepted
0The ratio;
S18: judge that whether tracked photon number N is greater than the total number of light photons N that represents incident beam
0Be to enter S19, otherwise enter S6;
S19: light signal is calculated in end of subroutine and output, returns master routine.
Described sample system parameter includes: the incident light parameter, and sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
Mensuration of the present invention comprises the spectrometer system and the method for turbidity dielectric materials whole optical parameter, and measuring system is simple, and is easy to use, can measure light signal and the material whole optical parameter that comprises turbid material exactly.Can greatly improve spectrometer as the ability that comprises the material analysis and the research of turbid media.
Description of drawings
Fig. 1 is the structural representation of spectrometer system of the present invention;
Fig. 2 is the synoptic diagram of sampling device in the embodiments of the invention;
Fig. 3 is the process flow diagram of assay method of the present invention;
Fig. 4 is the index meter operator program flow diagram in the assay method of the present invention;
Fig. 5 is the light transmission Theoretical Calculation subroutine flow chart in the assay method of the present invention.
Wherein:
1: light source 2: the monochromator part
3: first surface catoptron 4: photomodulator
5: light splitting piece 6: photodetector
7: photodetector 8: sample
9: sample rotary table 10: photodetector
11: 12: the second curved reflectors of catoptron
13: slit or aperture 14: photodetector
15: signal processing circuit 16: the computing machine part
17: output beam 18: the output beam beam splitting
19: incident beam 20: mirror is to folded light beam
21: diffuse reflection light beam 22: the collimation transmitted light beam
23: diffuse transmission light beam 24-32: signal and umbilical cable
33: sample box
Embodiment
Below in conjunction with drawings and Examples mensuration of the present invention is comprised that the spectrometer system of turbidity dielectric materials whole optical parameter and method make a detailed description.
Accurately measure the material whole optical parameter that comprises turbid medium and need measure reflection and optical signal transmissive on the different directions of sample outgoing.Mirror is defined as the reflected light of propagating along the direction that satisfies the light reflection law to reflected light, and the collimation transmitted light is along the light on the transmission direction that is not subjected to diffuse transmission influence.Diffuse and diffuse transmission light is defined as respectively and departs from the light of mirror on reflection direction and collimation transmission direction in its direction of propagation under the constant condition of optical wavelength, also promptly from the outgoing of the sample plane of incidence diffuse and from sample transmission plane diffuse transmission light.
As shown in Figure 1, mensuration of the present invention comprises the spectrometer system of turbidity dielectric materials whole optical parameter, includes: the Lights section, monochromator part 2, light path part, sampling device part, signal measurement part and computing machine part 16; Wherein, be used to control with the computing machine part 16 of data processing and calculating respectively with the Lights section, monochromator part 2, sampling device part, and signal measurement partly be connected; The light that the light source portion branch sends is injected into the sampling device part by monochromator part 2, light path part; From the light signal of sampling device part outgoing by light path part to the signal measurement part that links to each other with computing machine part 16.
Described sampling device partly includes and is used to regulate sample rotary table 9 and the setting sample 8 thereon that incident light 19 enters the incident angle of sample 8.As shown in Figure 2, the control program in the computing machine 16 is controlled sample rotary table 9 by cable 27 and is regulated the incident angle that incident light 19 enters sample 8, and the scope of incident angle is that 0 degree is to 80 degree.
Described the Lights section includes light source 1 and external photomodulator 4, and described light source 1 comprises required power supply, cooling device and electric light source device, and modulator 4 can be by machinery, and electric light or acousto-optic mode are modulated the beam intensity of light source output.Wherein, the control end of light source 1 links to each other with computing machine part 16 by cable 25, and the output beam 17 of light source 1 enters in the sample 8 of sampling device in partly as monochromatic incident beam 19 by monochromator part 2, photomodulator 4 and light splitting piece 5 backs.
Described light source 1 is obtained by the incoherent wide spectrum light source of continuous spectrum, and its irradiates light wavelength is continuous distribution in the spectral domain of setting, and the output light of wide spectrum light source 1 can obtain monochromatic output beam by monochromator 2.
Described the Lights section also can be made up of as coherent source a plurality of semiconductor lasers, and its irradiates light wavelength for separating spectrum, can need not monochromator 2 and can directly obtain the first surface catoptron 3 of monochromatic output light 17 to light path part in the spectral domain of setting.
Described monochromator part 2 is made up of the light beam focussed collimated light path and the spectrum light splitter spare of inside.Described spectrum light splitter spare can be by grating or prism or the realization of light filter plate.
By the light path order, monochromator 2 as shown in fig. 1 forms monochromatic incident beam 19 between light source 1 and sample 8, and its wavelength can be selected lambda1-wavelength by cable 24 control monochromators 2 by the control program in the computing machine 16.Another kind of light path implementation of the present invention is for to be placed on monochromator 2 between sample 8 and the photodetector 7,22,23, and flashlight is carried out after the spectrum beam split by the wavelength detection light signal.Under the situation of using a plurality of photodetectors, a kind of implementation method in back needs a plurality of monochromators or mechanical rotation device in order to switch different light signals, and it is more complicated that spectrometer system may become.
Described light path part is made up of one group of catoptron and light splitting piece, includes: be used for the first surface catoptron 3 that is positioned at monochromator part 2 output terminals of collimated light beam, the catoptron 11 that is positioned at the light splitting piece 5 of first surface catoptron 3 reflected light one side and receives the collimation transmitted light beam 22 of sampling device sample 8 partly; Second curved reflector 12 of the reflected light that is positioned at catoptron 11 one side that is used to focus on, and the catoptrical slit 13 that receives second curved reflector 12.
Light path part is coupled to the light source output beam in the sample 8 and by second curved reflector 12 will collimate the transmission signal optical coupling in photodetector 14 with slit 13 formed spatial filter arrangement.Light splitting piece 5 and photodetector 6 are used for monitoring the Strength Changes of light source output beam 17 in addition, also can measure incident intensity indirectly by the fixed light strength relationship between the incident beam 19 of light beam 18 and sample 8.The diameter of described incident beam 19 can be between 1 millimeter～100 millimeters.
Described signal measurement partly includes: the linear array photodetector 7 that receives the diffuse reflection light beam 21 of sample 8; A side joint that is positioned at light splitting piece 5 is received mirror and is used for measuring indirectly the discrete photodetector 6 of incident intensity signal to folded light beam 20; The diffuse transmission light beam 23 that receives sample 8 is used for measuring the discrete photodetector 10 of diffuse transmission light intensity signal; Be positioned at the discrete photodetector 14 that slit 13 emergent lights one side is used for measuring collimation transmitted intensity signal; Receive the light signal of each photodetector 6,7,10,14, and deliver to the signal processing circuit 15 of computing machine part 16 after handling.Wherein, linear array photodetector 7 is used for measuring mirror when sample 8 is positioned at as depicted in figs. 1 and 2 different orientation position to the funtcional relationship of the incident angle of reflected light and diffusion light strength signal and incident light 19; Discrete photodetector 6 is used for measuring indirectly the incident intensity signal, and discrete photodetector 10 is used for measuring the diffuse transmission light intensity signal, and discrete photodetector 14 is used for measuring collimation transmitted intensity signal.Each photodetector of optical signals becomes electric signal and amplifies the back and delivers to amplifier and the analog-digital converter that constitutes signal processing circuit 15 by signal cable 29,30,31 and 32, becomes behind the real-time optical signal by signal cable 28 to deliver to calculation procedure in the computing machine 16 that is used to control with data processing and calculating.
Amplifier in the signal processing circuit 15 is generally the current/voltage converter amplifier circuit of forming with the high-precision instrument operational amplifier of low noise (as the AD8663 of Analog Devices company product); Analog-digital converter is for 16 or the analog digital converter ic of the analog digital conversion integration block of seniority (AD7693 that produces as Analog Devices company) composition more; Linear array photodetector 7 is arranged by the individual photodetector pixels of 2 to 4096 (or more) usually and is realized (as the S8865-128 of Hamamatsu company product), but the space distribution of measured light intensity.
The function of control of the present invention and data processing and calculating section is realized by control program in the computing machine 16 and calculation procedure.
Calculation procedure in the computing machine 16 at first deposits the real-time optical signal in the calculator memory storage system as the function of time, carries out demodulation to improve signal to noise ratio (S/N ratio) by signal handler then.The demodulating process of signal handler can be finished by the Fourier transform to the time.Mirror after the demodulation to the ratio of reflected light or diffuse intensity and incident intensity be mirror to reflectivity or diffuse reflectance, collimation transmitted light or diffuse transmission light intensity are collimated transmittance or diffuse transmittance with the ratio of incident intensity.The mirror that above-mentioned signal handler is exported is to reflectivity, and diffuse reflectance, the funtcional relationship of collimated transmittance and diffuse transmittance and lambda1-wavelength also are that the measured light signal deposits the calculator memory storage system in as measured light signal spectrum.The whole optical parameter spectrum that calculation procedure in the computing machine 16 is determined sample 8 according to sample system parameter and other parameter of measured light signal of being stored and input then.
As shown in Figure 3, the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter of the present invention included as the next stage:
Phase one: obtain input and calculate measured light signal and the measurement error value that sets on the interior all wavelengths of wave band, obtain and import the sample system parameter simultaneously; At the measured light signal of setting on the wavelength be: reflected light is that mirror is to reflectivity with the ratio of incident intensity, or the ratio of diffuse intensity and incident intensity is a diffuse reflectance, the collimation transmitted light is a collimated transmittance with the ratio of incident intensity, and the diffuse transmission light intensity is a diffuse transmittance with the ratio of incident intensity.
Subordinate phase: enter the refractive index counting subroutine in the calculation procedure, according to the funtcional relationship of mirror between reflectivity and incident angle and the refractive index of sample box material that the linear array photodetector is surveyed, the sample refractive index of calculating on all wavelengths in the set wave band of decision promptly obtains the sample refractive index spectra;
Phase III: input sample optical parametric initial value and adjust the sample optical parameter value enter light transmission Theoretical Calculation subroutine in the calculation procedure in set wave band obtains to calculate light signal; According to the sample system parameter of input and the absorption coefficient in the sample optical parametric, the initial value of scattering coefficient and anisotropic parameter or setting value obtain the calculating light signal on the lambda1-wavelength that sets.
Quadravalence section: setting on the wavelength, relatively measured light signal and the difference of calculating light signal;
Five-stage: in the comparison of quadravalence section, when difference during, output sample whole optical parameter spectrum less than measurement error value, otherwise, return the phase III.Promptly by adjusting the sample optical parametric repeatedly and follow back the phase III till the difference of calculating light signal and measured light signal is less than measurement error value, and export in the sample optical parameter value that sets on the lambda1-wavelength.
Described in the above sample system parameter includes: the incident light parameter, and sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
As depicted in figs. 1 and 2, the Control Software in the computing machine 16 by cable 27 control turntables 9 regulate incident lights 19 enter to sample box 8 incident angle, the scope of incident angle is that 0 degree is to 80 degree.Two or more incident angles in the incident scope are measured mirrors to intensity of reflected light and obtain mirror to reflectivity by linear array photodetector 7.According to the funtcional relationship of the mirror of surveying to reflectivity and incident angle, adjust the sample refractive index value and fit to reflectivity and incident angle funtcional relationship with the calculating mirror that is obtained based on the Fresnel equation, can determine the refractive index and the corresponding refractive index spectra of sample.
In the method for the invention, the refractive index counting subroutine in the described calculation procedure includes following steps:
The first step: systematic parameter per sample, sample box material (being generally optical glass) refractive index on the lambda1-wavelength of setting, and the mirror of actual measurement is set in the initial value of the sample refractive index on the lambda1-wavelength to the function curve of reflectivity and incident angle;
Second step: obtain the mirror of calculating to reflectivity and incident angle function curve according to the Fresnel equation;
The 3rd step: that relatively calculate and the difference of mirror actual measurement to reflectivity and incident angle curve, and follow back second and go on foot until difference less than measurement error value by adjusting the sample refractive index repeatedly; Promptly until that calculate and mirror actual measurement till the difference of reflectivity and incident angle curve is less than prior setting value.
The 4th step: judging whether refractive index spectra calculates on all wavelengths in set wave band finishes, and has not calculated, and returns the first step, has calculated then to export sample and reflect spectrum, and has returned master routine.
As shown in Figure 4, above-mentioned refractive index counting subroutine is specific as follows:
S1: input sample system parameter and sample box material refractive index;
S2: input actual measurement mirror is to the function curve of reflectivity and incident angle;
S3: select lambda1-wavelength;
S4: set the refractive index initial value of sample on selected lambda1-wavelength;
S5: according to Fresnel Equation for Calculating mirror to reflectivity and incident angle function curve;
S7: relatively calculate the difference with actual measurement reflectivity and incident angle function curve, as entering S6, otherwise enter S8 greater than setting value;
S6: adjust the sample refractive index, and enter S5;
S8: store selected wavelength and the last sample refractive index of determining;
S9: judge that whether the number of wavelengths of being stored need equals the interior number of wavelengths of wavelength coverage of mensuration, enters S10 in this way, otherwise enters S3;
S10: end of subroutine is also exported the sample refractive index spectra;
Include in the sample system parameter described in the above-mentioned refractive index counting subroutine: the area in incident beam cross section, direction and distribute power, the form parameter of sample and sample box, and photodetector is with respect to direction parameter of sample box etc.
In the method for the invention, the light transmission Theoretical Calculation subroutine in the described calculation procedure includes following steps:
The first step: input sample system parameter, the absorption coefficient in measured light signal and the sample optical parametric, the initial set value of scattering coefficient and anisotropic parameter; Import tracked incident beam total number of light photons N
0And determine photon total distance of advancing at random according to set absorption of sample coefficient;
Second step: judge that tracked accumulative total photon number N is greater than 1? the decision photon scattering angle direction of also promptly advancing, and determine the photon free path of advancing at random; And follow the trail of photon to next scattering point;
The 3rd step: judge that photon accumulative total traveling distance is greater than total distance? does photon contact sample border or sample box border? does photon overflow sample box? and whether photon is detected device acceptance;
The 4th step: calculate light signal; And judge that whether accumulative total photon number N is greater than total number of light photons N
0
The 5th step: light signal is calculated in output, and returns master routine.
As shown in Figure 5, above-mentioned light transmission Theoretical Calculation subroutine is specific as follows:
S1: the total number of light photons N of incident beam intensity is represented in input
0
S2: input sample system parameter;
S3: the incident direction by photon determines its initial direct of travel;
S4: the initial value of setting tracked photon number N: N=1;
S5: determine the total distance of photon at random according to absorption coefficient;
S7: judge that tracked photon number N is greater than 1?, N enters S8 greater than 1, otherwise enters S9
S8: determine the photon scattering angle also promptly to advance after the direction at random according to the scattering phase function, enter S9;
S9: determine the free traveling distance of photon at random according to scattering coefficient;
S10: follow the trail of photon to next scattering point;
S11: judge that photon accumulative total traveling distance is greater than total distance? be to enter S12, otherwise enter S13;
S12: judge after photon is absorbed to enter S6;
S6: will enter S5 after the tracked photon number N increase by 1;
S13: judge that photon contacts the sample border? be to enter S14, otherwise enter S8;
S14: determine at random that according to edge reflection coefficient photon overflows sample based on the Fresnel Equation for Calculating? be to enter S15, continue to enter S8 after the tracking otherwise get back to sample media according to reflection direction;
S15: judge whether to be accepted by photodetector? be to enter S17, otherwise enter S16;
S16: judge after photon is escaped to enter S6;
S17: will (be photon number and N that this photodetector is accepted by photon number increase by 1 and the corresponding light signal of calculating storage that this photodetector is accepted
0The ratio);
S18: judge that whether tracked photon number N is greater than the total number of light photons N that represents incident beam
0Be to enter S19, otherwise enter S6;
S19: light signal is calculated in end of subroutine and output.
Include in the sample system parameter described in the above-mentioned light transmission Theoretical Calculation subroutine: the incident light parameter, sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
Below the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter of the present invention is provided further instruction
The core of the calculation procedure part of the assay method of spectrometer system of the present invention is the optical signalling computing method based on radiation transfer theory in the turbid media.Radiation transfer theory can be expressed as the differentio-integral equation of a radiation transfer equation, and boundary condition is then based on the Fresnel equation of the boundary condition of electromagnetic wave propagation.Radiation transfer equation and time, irrelevant form can be expressed as follows
s·▽L(r，s)＝-(μ
a+μ
s)L(r，s)+μ
s∫
4πp(s，s′)L(r，s′)dΩ′。
S is the unit vector of optical propagation direction in the following formula, representative vector dot product operator, ▽ representative vector gradient operator, r are the coordinate vector in the three dimensions, L (r, s) be luminous flux (luminous power in the unit area unit solid angle), a is an absorption coefficient, and s is a scattering coefficient, p (s, s ') is scattering phase function (being proportional to light scatters to the s direction from s ' direction probability)
Representative is the three-dimensional viewpoin integration of 4 s ' direction to the total solid angle of three bit spaces.Boundary value problem based on radiation transfer equation has two kinds of solutions usually: numerical solution method and be the statistical method of representative with the Monte Carlo method.The numerical solution method is found the solution based on the boundary condition of Fresnel equation for basis after aforesaid radiation transfer equation being converted into DIFFERENCE EQUATIONS.Monte Carlo method then is according to the described optical delivery process of aforesaid radiation transfer equation, represents incident beam with many photons, calculates the track of advancing of each photon transmission course in three dimensions.The track of advancing of photon determines by a plurality of stochastic variables, and the distribution function of these stochastic variables is respectively by absorption coefficient, scattering coefficient and the decision of scattering phase function.Near the advance track of the photon zone boundary of being considered handled according to the edge reflection coefficient formula based on the Fresnel Equation for Calculating usually.Calculate at the track of advancing to all photons (hundreds of thousands or more) and to carry out statistical study again after finishing, what those were detected photon that optical fiber collects and incident photon sum represents the calculating light signal than promptly.
The present age, reflection and transmitted light can take place when being incident in two kinds of interfaces between the different medium in the electromagnetic wave of mass color, the Fresnel equation is the equation that obtains based on the electromagnetic wave boundary condition, can be used to according to the refractive index of incident angle and two media calculate light at the mirror on border to reflectivity.For unpolarized incident light, be used for the mirror of calculating on optical transparency medium (as air, glass etc.) and turbid medium interface to reflectivity R
CalFresnel equation (θ) is
In the following formula incident angle, n
0Be the refractive index of optical transparency medium, n
rBe the real part of turbid medium refractive index, n
iBe the imaginary part of turbid medium refractive index,
Fig. 5 is a kind of logic flow that realizes described Monte Carlo method.This method is equivalent to a medium that comprises the light absorption center and the light scattering center of stochastic distribution with turbid medium, the concentration at light absorption center and light scattering center and the absorption coefficient of turbid medium, scattering coefficient is relevant respectively, and the stochastic distribution at light absorption center and light scattering center then embodies by the stochastic distribution to total distance of photon and free path.Before Monte Carlo method is calculated beginning, the photon number N that needs to import incident light parameter such as beam energy distribution and incident direction and represent incident beam
0, and the optical parametric of representative sample and boundary geometry parameter.Because Monte Carlo method is a statistical method, its result can comprise statistical error, so need carry out the photon number N of following calculation
0Must be enough big, could drop to the statistical error in the result of calculation enough little.But N
0Crossing conference causes computing time long.N generally speaking
0Between 9 powers of 4 powers to 10 10.
As shown in Figure 5, the Monte Carlo Calculation method need be to N
0It also is photon or by absorption of sample or overflow sample (also being that photon is escaped) until the end of advancing of this photon that individual incident photon carries out its traveling distance following calculation in sample one by one.Before the traveling distance following calculation to each photon began, the Monte Carlo Calculation program will be according to total distance of being determined photon by the stochastic distribution of absorption of sample coefficient decision with according to the free traveling distance length of being determined photon by the stochastic distribution of sample scattering coefficient decision.The first step of photon following calculation supposes that for following the tracks of the initial direct of travel in photon edge to the position that its free traveling distance determined photon is scattered in this position.Whether begin next free path at photon will be absorbed or overflow before advancing and test this photon.Be satisfied as one of above-mentioned condition, then begin the traveling distance following calculation of next photon.All be not satisfied as above-mentioned condition, the Monte Carlo Calculation program will be per sample scattering phase function (or at anisotropic parameters of determining under phase function form such as the Chinese Buddhist nun-Greenstein scattering phase function according to test sample) decision scattering angle also be the direction of next free path of advancing after, again according to determining the free path length of photon, thereby begin repeated calculation that the traveling distance of this photon is followed the tracks of until the photon end of advancing by the stochastic distribution of sample scattering coefficient decision.Accepted by photodetector (photodetector 7,10,14 among Fig. 1) as tracked photon, then will be increased by 1 by the photon number that this photodetector is accepted, as with calculate the relevant computational data record of light signal.After certain photon traveling distance following calculation is finished, the accumulative total N of the more tracked calculating photon of Monte Carlo Calculation program, as N greater than N
0, Monte Carlo Calculation finishes, otherwise N is increased by 1 back next incident photon is begun following calculation.When to N
0After the following calculation of individual incident photon is all finished, add up photon number and N that all are accepted by each photodetector
0Ratio promptly as exporting from the Monte Carlo Calculation program with the corresponding calculating light signal of measured light signal.
Program is determined in the described calculating of realization Fig. 3, is by refractive index counting subroutine shown in Figure 4, and light transmission Theoretical Calculation subroutine and iteration cycle process shown in Figure 5 are finished.The needed input data of refractive index counting subroutine are: the sample system parameter, and the refractive index of sample box material and actual measurement mirror are to the funtcional relationship of reflectivity and incident angle; The sample system parameter includes the area in irradiating light beam cross section, direction and distribute power, and the form parameter of sample and sample box, and photodetector is with respect to direction parameter of sample box etc.The needed input data of light transmission Theoretical Calculation subroutine are: sample system parameter, measured light signal, sample refractive index spectra, and the initial value of sample optical parametric; The measured light signal is included in the diffuse reflectance on all wavelengths, collimated transmittance and diffuse transmittance.The sample system parameter in the above-mentioned input data and the initial value of sample optical parametric are imported by user interface by the user, and measured light signal and sample refractive index spectra are then provided by the data processing and the calculation procedure of control and data processing and calculating section.
According to these input data, light Conveying Theory counting subroutine part in the calculation procedure is calculated the photon of representing the incident light energy with Monte Carlo method and obtain to calculate photon number by photodetector collection back after the sample outgoing in computer model, and its ratio with the incident light subnumber is defined as and the calculating light signal output of measured light signal equivalence accordingly.Determined light Conveying Theory counting subroutine whether to finish or iterative computation again and calculate difference with the measured light signal.As calculate with the difference of measured light signal less than setting value according to the experimental error decision of measured light signal, then sample optical parametric initial value is correct test sample optical parametric, light Conveying Theory counting subroutine finishes and merges storage with refractive index, is the sample whole optical parameter.As calculating difference with the actual measurement optical signalling greater than setting value, then light Conveying Theory counting subroutine enters iteration cycle process, also promptly adjusts the test sample optical parametric repeatedly and reenters light Conveying Theory counting subroutine and partly calculate light signal until calculating difference with the actual measurement optical signalling less than setting value.Above-mentioned smooth Conveying Theory counting subroutine part will be in the operation of all wavelengths in the set wave band, when obtaining the spectrum of sample whole optical parameter in set wave band till.
Sample optical parametric adjustment process in the above-mentioned iteration cycle process can be based on following principle design.At first determine the modulation direction of attenuation coefficient (for absorption coefficient and scattering coefficient sum): as surveying collimated transmittance greater than calculating collimated transmittance according to the difference of the collimated transmittance in actual measurement and the calculating light signal, then reduce attenuation coefficient, otherwise then increase attenuation coefficient.According to the difference of diffuse transmittance in actual measurement and calculating light signal and diffuse reflectance sum determine the modulation direction of absorption coefficient: as surveying diffuse transmittance and diffuse reflectance sum greater than calculating diffuse transmittance and diffuse reflectance sum thereafter, then reduce absorption coefficient, otherwise then increase absorption coefficient.Then according to actual measurement with calculate diffuse transmittance in the light signal and modulation direction that the difference of the ratio of diffuse reflectance is determined coefficient of anisotropy: as the ratio of actual measurement diffuse transmittance and diffuse reflectance greater than calculating the ratio of diffuse transmittance with diffuse reflectance, then increase coefficient of anisotropy, otherwise then reduce coefficient of anisotropy.
Claims (13)
1. a mensuration comprises the spectrometer system of turbidity dielectric materials whole optical parameter, described whole optical parameter is: absorption coefficient, scattering coefficient, anisotropic parameters and refractive index is characterized in that, system includes: the Lights section, monochromator part (2), light path part, sampling device part, signal measurement part and computing machine part (16); Wherein, be used to control with the computing machine part (16) of data processing and calculating respectively with the Lights section, monochromator part (2), sampling device part, and signal measurement partly be connected; The light that the light source portion branch sends is injected into the sampling device part by monochromator part (2), light path part; From the light signal of sampling device part outgoing by light path part to the signal measurement part that links to each other with computing machine part (16); Wherein, described sampling device partly includes and is used to regulate that incident light enters the sample rotary table (9) of the incident angle of sample and the sample box (33) of sample (8) is equipped with in the inside that is provided with thereon; Described light path part includes: be used for the first surface catoptron (3) that is positioned at monochromator part (2) output terminal of collimated light beam, the catoptron (11) that is positioned at the light splitting piece (5) of first surface catoptron (3) reflected light one side and receives the collimation transmitted light beam (22) of sampling device sample (8) partly; Second curved reflector (12) of reflected light one side that is positioned at catoptron (11) that is used to focus on, and the catoptrical slit (13) that receives second curved reflector (12); Described signal measurement partly includes: the linear array photodetector (7) that receives the diffuse reflection light beam (21) of sample (8); A side joint that is positioned at light splitting piece (5) is received mirror and is used for measuring indirectly the first discrete photodetector (6) of incident intensity signal to folded light beam (20); The diffuse transmission light beam (23) that receives sample (8) is used for measuring the second discrete photodetector (10) of diffuse transmission light intensity signal; Be positioned at the 3rd discrete photodetector (14) that slit (13) emergent light one side is used for measuring collimation transmitted intensity signal; Receive the light signal of each photodetector (6,7,10,14), and deliver to the signal processing circuit (15) of computing machine part (16) after handling.
2. mensuration according to claim 1 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, described the Lights section includes light source (1) and photomodulator (4), wherein, the control end of light source (1) links to each other with computing machine part (16) by cable (25), and the output beam (17) of light source (1) enters in the sampling device part as monochromatic incident beam (19) by monochromator part (2), photomodulator (4) and light splitting piece (5) back.
3. mensuration according to claim 2 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, described light source (1) is obtained by the incoherent wide spectrum light source of continuous spectrum, and its irradiates light wavelength is continuous distribution in the spectral domain of setting.
4. mensuration according to claim 2 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, light source in described the Lights section (1) is made up of as coherent source a plurality of laser instruments, its output beam wavelength is a discrete form, can directly obtain monochromatic output light (17) to light path part.
5. mensuration according to claim 2 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, the diameter of described incident beam (19) is between 1 millimeter～100 millimeters.
6. mensuration according to claim 1 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, described monochromator part (2) is made up of light beam focussed collimated light path and spectrum light splitter spare.
7. one kind is used for the method that the described mensuration of claim 1 comprises the spectrometer system of turbidity dielectric materials whole optical parameter, it is characterized in that, includes as the next stage:
Phase one: obtain and import measured light signal and measurement error value on all wavelengths that sets in the wave band, obtain and import the sample system parameter simultaneously;
Subordinate phase: enter the refractive index counting subroutine in the calculation procedure, the sample refractive index of calculating on all wavelengths in the set wave band of decision promptly obtains the sample refractive index spectra;
Phase III: input sample optical parametric initial value and adjust the sample optical parameter value enter light transmission Theoretical Calculation subroutine in the calculation procedure in set wave band obtains to calculate light signal;
Quadravalence section: setting on the wavelength, relatively measured light signal and the difference of calculating light signal;
Five-stage: in the comparison of quadravalence section, when difference during, output sample whole optical parameter spectrum less than measurement error value, otherwise, return the phase III.
8. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 7, it is characterized in that, measured light signal on the described all wavelengths that obtains and import in setting wave band is: mirror is that mirror is to reflectivity to the ratio of reflected light and incident intensity, the intensity that diffuses is diffuse reflectance with the ratio of incident intensity, the collimation transmitted light is a collimated transmittance with the ratio of incident intensity, and the diffuse transmission light intensity is a diffuse transmittance with the ratio of incident intensity.
9. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 7, it is characterized in that, described sample system parameter includes: the incident light parameter, and sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
10. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 7 is characterized in that, the refractive index counting subroutine in the described calculation procedure includes following steps:
The first step: systematic parameter per sample, the sample box material refractive index on the lambda1-wavelength of setting, and the mirror of actual measurement is set in the initial value of the sample refractive index on the lambda1-wavelength to the function curve of reflectivity and incident angle;
Second step: obtain the mirror of calculating to reflectivity and incident angle function curve according to the Fresnel equation;
The 3rd step: that relatively calculate and the difference of mirror actual measurement to reflectivity and incident angle curve, and follow back second and go on foot until difference less than measurement error value by adjusting the sample refractive index repeatedly;
The 4th step: judging whether refractive index spectra calculates on all wavelengths in set wave band finishes, and has not calculated, and returns the first step, has calculated and has then exported the sample refractive index spectra, and returned master routine.
11. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 10, it is characterized in that, described sample system parameter includes: the area in incident beam cross section, direction and distribute power, the form parameter of sample and sample box, and photodetector is with respect to the direction parameter of sample box.
12. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 7 is characterized in that, the light transmission Theoretical Calculation subroutine in the described calculation procedure has the following steps:
S1: the total number of light photons N of incident beam intensity is represented in input
0
S2: input sample system parameter;
S3: the incident direction by photon determines its initial direct of travel;
S4: the initial value of setting tracked photon number N: N=1;
S5: determine the total distance of photon at random according to absorption coefficient;
S7: judge that tracked photon number N is greater than 1?, N enters S8 greater than 1, otherwise enters S9;
S8: determine the photon scattering angle also promptly to advance after the direction at random according to the scattering phase function, enter S9;
S9: determine the free traveling distance of photon at random according to scattering coefficient;
S10: follow the trail of photon to next scattering point;
S11: judge that photon accumulative total traveling distance is greater than total distance? be to enter S12, otherwise enter S13;
S12: judge after photon is absorbed to enter S6;
S6: will enter S5 after the tracked photon number N increase by 1;
S13: judge that photon contacts the sample border? be to enter S14, otherwise enter S8;
S14: determine at random that according to edge reflection coefficient photon overflows sample based on the Fresnel Equation for Calculating? be to enter S15, continue to enter S8 after the tracking otherwise get back to sample media according to reflection direction;
S15: judge whether to be accepted by photodetector? be to enter S17, otherwise enter S16;
S16: judge after photon is escaped to enter S6;
S17: will be increased by 1 by the photon number that this photodetector is accepted and also calculate the corresponding light signal of storage, and be photon number and N that this photodetector is accepted
0The ratio;
S18: judge that whether tracked photon number N is greater than the total number of light photons N that represents incident beam
0Be to enter S19, otherwise enter S6;
S19: light signal is calculated in end of subroutine and output, returns master routine.
13. the method that is used to measure the spectrometer system that comprises the turbidity dielectric materials whole optical parameter according to claim 12, it is characterized in that, described sample system parameter includes: the incident light parameter, sample and sample box form parameter, photodetector is with respect to the direction parameter of sample box.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007100599408A CN101140222B (en) | 2007-10-19 | 2007-10-19 | Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007100599408A CN101140222B (en) | 2007-10-19 | 2007-10-19 | Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101140222A CN101140222A (en) | 2008-03-12 |
| CN101140222B true CN101140222B (en) | 2011-01-19 |
Family
ID=39192261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007100599408A Expired - Fee Related CN101140222B (en) | 2007-10-19 | 2007-10-19 | Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101140222B (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102353343B (en) * | 2011-07-06 | 2013-05-29 | 中国科学院上海技术物理研究所 | Synchronous detecting system and method for planet-surface geometrical-characteristic and substance component thereof |
| CN102288548A (en) * | 2011-07-21 | 2011-12-21 | 天津大学 | Measuring method for improving ingredient detection accuracy of turbid medium |
| CN103472000B (en) * | 2013-09-25 | 2015-11-18 | 北京无线电计量测试研究所 | Containing detection method and the device of component ratio each in the atomic gas of cushion gas |
| CN103529006B (en) * | 2013-10-18 | 2016-08-17 | 大连海事大学 | A kind of Portable fluorescence based on micro-fluidic chip detection device |
| CN104949940B (en) * | 2015-06-19 | 2018-03-06 | 苏州大学 | A kind of apparatus and method for measuring scatterer scattering function real and imaginary parts |
| CN105300928B (en) * | 2015-10-15 | 2018-08-24 | 温州医科大学 | A kind of large area obtains tissue optical parameter and the light reflection imaging technique of microstructure |
| CN105738302B (en) * | 2016-02-02 | 2019-04-19 | 上海交通大学 | Plant strain growth period chlorophyll content high-precision automatic measurement device and measuring method |
| US10983325B2 (en) * | 2016-12-12 | 2021-04-20 | Molecular Devices, Llc | Trans-illumination imaging with an array of light sources |
| CN107345893B (en) * | 2017-07-24 | 2020-07-07 | 哈尔滨工业大学 | Particle scattering phase function measuring device and measuring method |
| KR20200140349A (en) * | 2018-04-08 | 2020-12-15 | 루머스 리미티드 | Optical sample characterization |
| KR20210128430A (en) | 2019-03-02 | 2021-10-26 | 스펙-이미징 에이비 | Assemblies for Spectrophotometric Measurement of Cloudy Samples Using Multi-Color Rectangular Light Sheets |
| CN110926762B (en) * | 2019-11-22 | 2021-08-27 | 国网浙江省电力有限公司电力科学研究院 | System and method for detecting out-of-band inhibition capability of ultraviolet imager |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1421691A (en) * | 2002-12-20 | 2003-06-04 | 中国科学院上海光学精密机械研究所 | Fluorescent holographic tomographic X-ray imaging equipment |
| CN101051025A (en) * | 2007-05-11 | 2007-10-10 | 中国科学院光电技术研究所 | Biochemical sensitive detector for surface plasma |
-
2007
- 2007-10-19 CN CN2007100599408A patent/CN101140222B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1421691A (en) * | 2002-12-20 | 2003-06-04 | 中国科学院上海光学精密机械研究所 | Fluorescent holographic tomographic X-ray imaging equipment |
| CN101051025A (en) * | 2007-05-11 | 2007-10-10 | 中国科学院光电技术研究所 | Biochemical sensitive detector for surface plasma |
Non-Patent Citations (3)
| Title |
|---|
| Cheng chen et al.A primary method for determination of optical parameters of turbid samples and application to intralipid between 550 and 1630nm.optics express.2006,14(16),7420-7435. * |
| Huafeng Ding et al.Determination of refractive indices of porcine skin tissues and Intralipid at eight wavelengths between 325 and 1557 nm.J.Opt.Soc.Am.A.2005,22(6),1151-1157. * |
| JP特开2000-28484A 2000.01.28 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101140222A (en) | 2008-03-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101140222B (en) | Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials | |
| US7920252B2 (en) | Method and apparatus for spectrophotometric characterization of turbid materials | |
| CN101548162B (en) | Compact catadioptric spectrometer | |
| Coles et al. | Simultaneous measurements of angular scattering and intensity scintillation in the atmosphere | |
| JPH07209177A (en) | Method and apparatus for measuring scattering absorbing member | |
| CN101446548A (en) | Device for realizing measurement of milk ingredient based on response conversion and method thereof | |
| CN103149158B (en) | A kind of biprism water quality monitoring optical fiber sensing system | |
| CN103499391A (en) | Spectrum measuring system | |
| CN103499393B (en) | The measuring method of spectrum | |
| CN105066889A (en) | A portable thin film thickness measuring device and a film thickness measuring method thereof | |
| CN113654661A (en) | Spectrometer based on super surface lens | |
| CN103353440B (en) | Device and method for measuring material diffuse reflectance by adopting gas absorption spectrum | |
| CN103472014A (en) | Gas multi-reflect pool detection device with multi-dimensional laser self-alignment function | |
| CN203534951U (en) | Single optical fiber transmission gas multiple-reflection tank detection device | |
| CN107561008A (en) | A kind of device for VUV diffusing reflection plate BRDF feature measurements | |
| Gevaux et al. | Evaluating edge loss in the reflectance measurement of translucent materials | |
| CN101706405B (en) | Device and method thereof for acquiring transmission fluctuation spatial correlation spectrum | |
| CN203534960U (en) | Multi-dimensional laser automatically aligned gas multiple-reflection tank detection device | |
| CN101103905A (en) | Optical system for detecting turbidity medium and biological tissue optical parameter and detecting method | |
| CN104523241A (en) | Detecting device and detecting method for optical characteristics of biological tissue | |
| CN103471994A (en) | Detection device for gas multi-reflect pool with single fiber transmission function | |
| Zhang et al. | Design method of variable optical path length multi-pass cell | |
| CN207366434U (en) | A kind of 96 hole all-wave length microplate reader | |
| WO2002040971A1 (en) | Method and apparatus for determination of optical parameters of turbid media and use thereof | |
| CN109632651A (en) | Turbid media multi-parameter spectral measurement method and measuring system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110119 Termination date: 20181019 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |