CN101131875A - Register testing method and system - Google Patents
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Abstract
This invention discloses a kind of system which can realize the test of the register, the system includes: the setting module, sets the corresponding relation between the property of the register and the test parameter; information gain module, gains each register information in the tested register, the said register information includes the register property; test parameter produce module, gains the register property from the register information which is gained by the information gain module, produces the corresponding test parameter of the said register property; execute module, uses the said test parameter produced by the said register property produce module to test the said tested register, gets the test result of the tested register. This invention also discloses the register test method, using this invention can reduce the workload of the register test.
Description
Technical field
The present invention relates to field tests, particularly relate to method and system at a kind of register testing.
Background technology
Register is the least unit of storage computation machine information, can describe by register address and content of registers, mode of operation according to register allows can be divided into register read-write register, read-only register, reads the zero clearing register and write the register of various attributes such as zero clearing register.
In the software development process of computing machine, often need to use the register of various attributes, by to being used in combination of various registers, finally be achieved the complete software function of entire chip.Such as, in computer chip, need to use the register of different attribute.And in computer chip, register quantity is very huge, such as in the Vc0336 chip that has comprised 10 modules, its the number of registers has just reached more than 1000, as seen, when needs carry out quality test to certain chip, particularly important to the test of register in this chip.
At present, the method for register testing specifically, is exactly the attribute according to tested register also based on the manual testing, and the test parameter of manual input register is realized register testing.The test parameter of register comprises: test number and/or test command.Such as, the attribute of tested register is a read-write register, and when testing, artificial earlier input one number is as the test number, and input " write order " then, test number and tested register address are to realize writing this test number to tested register; Then, input " read command " and tested register address, from this tested register reading numerical values, if the test number that the numerical value that reads equals to write then obtains the test result of " working properly ", otherwise, obtain the test result of " it is undesired to work ".For another example, the attribute of tested register is for writing 1 clear 0, just when writing " 1 " to register, the position of this register one writing is cleared, thereby when this property register tested, artificial earlier input " write order ", tested register address and constant " 1 ", write 1 to tested register, then, manually import " read command " and tested register address, read the value of this tested register, if the value of reading equals 0, then obtain the test result of " working properly ", otherwise, the test result of " it is undesired to work " obtained.
As seen, tested register for different attribute, the test parameter of artificial input is also different, when the register of various attributes is tested, need manually to set concrete test parameter value, and the quantity of register is many, manually once effectively test the different register of a large amount of attributes according to attribute register, require a great deal of time, workload is very heavy.Because the workload of manual testing's register is too big, problems such as the test leakage of register or mistake survey can appear unavoidably.
Therefore, the method for register testing exists the artificial proportion that participates in more, the problem that the test job amount is bigger at present.
Summary of the invention
In view of this, fundamental purpose of the present invention is to provide a kind of system of register testing, and this system can reduce the workload of scratchpad register.
Second fundamental purpose of the present invention is to provide a kind of method that realizes register testing, and this method can reduce the workload of scratchpad register.
In order to reach above-mentioned first purpose, the technical scheme that the present invention proposes is: a kind of system that realizes register testing, and this system comprises:
Module is set, is used to be provided with the corresponding relation of attribute register and test parameter;
The information acquisition module is used to obtain the register information of each tested register, and described register information comprises attribute register;
The test parameter generation module is used for obtaining attribute register from the register information that described information acquisition module obtains, and produces the test parameter corresponding with described attribute register;
Execution module, the test parameter that is used to utilize described test parameter generation module to produce is tested described tested register, obtains the test result of tested register.
Described test parameter generation module comprises: matching unit and parameter generating unit;
Described matching unit is used for according to the attribute register that sets in advance and the corresponding relation of test parameter, and coupling obtains the test parameter corresponding with the attribute register of described tested register, and described test parameter comprises at least one group of test command and/or test number;
Described parameter generating unit is used for the described test parameter that obtains according to matching unit, produces each group test command and/or test number, is input to execution module successively.
Described execution module comprises: test parameter interface unit and operating unit;
Described test parameter interface unit is used to receive the test parameter from the test parameter generation module;
Described operating unit is used to be used to the test parameter from described test parameter interface unit, and tested register is carried out test operation, obtains the test result of described tested register.
When described test parameter comprised at least one group of test command and/or test number, described execution module was further used for returning to described test parameter generation module with executing the intermediate result that obtains behind one group of test command/test number;
Described test parameter generation module is input to execution module with next group test command and/or the test number that produces after receiving described intermediate result.
Preferably, described system further comprises: the test result memory module;
Described test result memory module is used to store the test result of the described tested register that described execution module obtains.
Preferably, described system further comprises: register tabulation module;
Described register tabulation module is used to store the register tabulation of being made up of the register information of all tested registers;
Described information acquisition module reads the register information of each tested register in the tabulation of described register successively.
Preferably, described system further comprises: update module;
Described update module is used for the register tabulation of described register tabulation module is upgraded.
Preferably, described system further comprises: testing time is provided with module;
Described testing time is provided with module, is used to set in advance the testing time to each tested register;
Described test parameter generation module according to the testing time that sets in advance, is input to execution module continuously with the test parameter of the tested register that produces.
Preferably, described system further comprises: the test result display module;
Described test result display module is used to store the test result of the described tested register that described execution module obtains.
In order to reach above-mentioned second purpose, the technical scheme that the present invention proposes is: a kind of method of register testing, and this method comprises:
The corresponding relation of attribute register and test parameter is set, obtains the register information of each tested register, described register information comprises attribute register; From register information, extract attribute register, produce the test parameter corresponding with described attribute register; The described test parameter that utilizes described test parameter generation module to produce is tested described tested register, obtains the test result of tested register.
The test parameter of the tested register of described generation comprises:
According to the corresponding relation of attribute register that sets in advance and test parameter, coupling obtains the test parameter corresponding with the attribute register of tested register, and described test parameter comprises at least one group of test command and/or test number; Produce each group test command corresponding and/or test number with described attribute information.
Preferably, before described method, further comprise: set up the register tabulation that the register information by all tested registers constitutes;
The described register information that obtains each tested register comprises: travel through described register tabulation, obtain the register information of each the tested register in the described register tabulation successively.
Preferably, further comprise after the described method: the test result of storing described tested register.
Preferably, further comprise after the described method: the test result that shows described tested register.
Preferably, described method further comprised extract attribute register from register information before: the test result that judges whether to store described tested register, when not storing the test result of described tested register or the test result of the described tested register of storage when " it is undesired work ", carry out described from register information the step of extraction attribute register.
In sum, the method and system of a kind of register testing that the present invention proposes has the following advantages:
The first, the present invention can be according to the corresponding relation that attribute register and test parameter are set, attribute register according to each the tested register that gets access to, automatically produce test parameter, thereby can reduce the workload of scratchpad register each tested register.
The second, the present invention's register of comprising the register information of all tested registers by traversal is tabulated and is realized test to each tested register, can avoid problems such as the test leakage of register or mistake surveys, thus the accuracy of raising scratchpad register.
Three, the present invention can also be when many people debug, the test result of tested register by storage, when the test result of described tested register of storage is " working properly ", no longer tests, thereby can further reduce the workload of scratchpad register.
Therefore, the method and system of a kind of register testing provided by the invention can reduce the workload of scratchpad register.
Description of drawings
Fig. 1 realizes the system architecture synoptic diagram of first preferred embodiment of register testing for the present invention;
Fig. 2 is the method flow synoptic diagram of second preferred embodiment of register testing of the present invention;
Fig. 3 is the method flow synoptic diagram of the 3rd preferred embodiment of register testing of the present invention.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, the present invention is described in further detail below in conjunction with the accompanying drawings and the specific embodiments.
Technical scheme of the present invention is: a kind of system that realizes register testing, this system comprises: be used to be provided with module is set, is used to obtain the information acquisition module of the register information of each tested register of attribute register and test parameter corresponding relation, the described test parameter that this register information comprises attribute register, be used to produce the test parameter generation module of the test parameter corresponding with described attribute register and be used to utilize described test parameter generation module to produce, the execution module that described tested register is tested.
Fig. 1 realizes the system architecture synoptic diagram of first preferred embodiment of register testing for the present invention, this system comprises: module 100, information acquisition module 110, test parameter generation module 120 and execution module 130 are set.
Wherein, module 100 is set, the corresponding relation of attribute register and test parameter is set; In the present embodiment, suppose that attribute register comprises read-write register and writes two kinds in 1 zero clearing register, then the test parameter of the read-write register correspondence of She Zhiing is: " write order " and " test number "; " read command " and " comparison command " and " test number " that draw test result.The test parameter of writing 1 zero clearing register correspondence that is provided with is: " write order " and " 1 ", " read command " and " comparison command " and " 0 " that finally obtain test result.
Test parameter generation module 120 obtains attribute register from the register information of the tested register of information acquisition module 110 input, produce the test parameter corresponding with this attribute register and produce the test parameter of tested register.
Test parameter generation module 120 comprises: matching unit 121 and parameter generating unit 122;
Matching unit 121, according to the corresponding relation of attribute information that sets in advance and test parameter, coupling obtains the test parameter corresponding with the attribute register of tested register, and test parameter comprises at least one group of test command and/or test number; Promptly set in advance out the corresponding relation of attribute and test parameter, the test parameter of read-write register correspondence comprises as previously mentioned: " write order " and " test number "; " read command " and " comparison command " and " test number " the three groups of test commands and/or the test number that draw test result.
In the present embodiment, parameter generating unit 122 produces the test number that described tested register is tested according to the strategy that sets in advance.The data policy that sets in advance can comprise four kinds, is respectively random number, maximal value, minimum value and user's input policing, and wherein, the random number strategy is meant from producing a random number, carries out register testing; If the numerical value of random number is too big, intercept according to the bit wide in each register information or according to the acquiescence bit wide that sets in advance, with the test of the value after intercepting relevant register; The minimum value strategy is just 0 to test with the minimum value of register; The maximal value strategy then is according to the bit wide in the register information or according to the acquiescence bit wide that sets in advance, and calculates the maximal value of register; Maximal value with each register self is tested; And user's input policing is according to the numerical value of user's input, carries out register testing; If the numerical value of user's input is too big, intercept according to the bit wide in each register information or according to the acquiescence bit wide that sets in advance, with the test of the value after intercepting relevant register.
Test parameter interface unit 131 receives the test parameter from test parameter generation module 120;
As shown in Figure 1, operating unit 132 also returns to test parameter generation module 120 by test parameter interface unit 131 and executes the intermediate result that obtains behind one group of test command/test number.
Present embodiment hypothesis be: directly finish the acquisition process of register information of each tested register and the test process of each tested register by personal computer (PC), if acquisition process and test process are by different operating system, such as, acquisition process is realized by PC and test process is realized by embedded environment, then test parameter interface unit 131 adopts by Usb or Uart or Jtag interface and receives test parameter from test parameter generation module 120, and the test command that transmits on the PC in the test parameter need be construed to the order that embedded environment can move as " read command " or " write order ", be input to operational module 132 again.
System also comprises:
Test result memory module 140, the test result of the tested register that storage execution module 130 obtains.
Test result display module 180, the test result of the tested register that demonstration execution module 130 obtains.
System also comprises: register tabulation module 150; The register tabulation that storage is made up of all tested registers, this register tabulation comprises the register information of each tested register;
At this moment, information acquisition module 110 obtains the register information of each the tested register in the register tabulation module 150 successively.
Certainly, information acquisition module 110 also can obtain the register information of each tested register by other mode, such as, dynamic input mode.
When system comprised register tabulation module 150, system can also comprise the update module 160 that the register tabulation in the register tabulation module 150 is upgraded; This renewal comprises deletion or newly-increased tested register, or revises certain register information of tested register.
System can also comprise: testing time is provided with module 170, sets in advance the testing time to each tested register;
Test parameter generation module 120 according to the testing time that sets in advance, is input to execution module 130 continuously with the test parameter of the tested register that produces.Such as testing time is twice, then the double execution module 130 that is input to of the test parameter of the tested register that will produce.
Fig. 2 below in conjunction with process flow diagram, provides a specific embodiment of the present invention for the method flow synoptic diagram of second preferred embodiment of register testing of the present invention.As shown in Figure 2, specifically may further comprise the steps:
Step 201: the corresponding relation that attribute register and test parameter are set.
Present embodiment, the attribute register of setting is identical with first embodiment with the corresponding relation of test parameter.Here do not give unnecessary details one by one.
Step 202: the register information that obtains each tested register.
In the present embodiment, the method for obtaining the register information of each tested register is: can obtain the register information of each tested register by traveling through tested register tabulation or the mode of having set up by dynamically receiving.
In the present embodiment, register information comprises: the register address of attribute register and/or tested register and/or register title and/or register default value and/or register bit wide and/or register system number.Carry out a step 203 to 204 for each tested register.
Step 203: from register information, extract attribute register, produce the test parameter corresponding with described attribute register.
In the present embodiment, produce and corresponding the comprising of described attribute register: according to the corresponding relation of attribute register that sets in advance and test parameter, coupling obtains the test parameter corresponding with the attribute register of tested register, and described test parameter comprises at least one group of test command and/or test number; Produce at least one group test command corresponding and/or test number with attribute information.Test parameter at tested register can be made up of at least one group of test number and/or test command, such as, for writing 1 zero clearing register, what produce is " write order " and " 1 ", " read command " and " comparison command " and " 0 " that finally obtain test result at the test parameter of tested register.
Step 204: utilize the test parameter that produces, tested register is tested at tested register.
In the present embodiment, when realizing test to tested register by software program, utilize the test parameter that produces at tested register, the method that tested register is tested is: according to the test parameter that produces, call corresponding test command executive routine according to this, the suction parameter of calling the test command executive routine comprises the address information of tested register, from realizing that certain is determined that tested register tests, when test parameter comprises the test number, call in the suction parameter of test command executive routine and also comprise the test number, at last, by the operation result of last test command executive routine, obtain the test result of tested register.
Fig. 3 is the method flow synoptic diagram of the 3rd preferred embodiment of register testing of the present invention, as shown in Figure 3, specifically may further comprise the steps:
Step 300: the corresponding relation that attribute register and test parameter are set.
Providing 6 kinds of attribute registers in the present embodiment is respectively: read-write register, write-only register, read the zero clearing register, write the zero clearing register, write 1 zero clearing register and write 0 zero clearing register.
Step 301: set up the register tabulation in advance.
In the present embodiment, register tabulation is that the register information by all tested registers constitutes.
Step 302: the register information that reads a tested register in the register tabulation.
Step 303: produce test parameter, tested register is tested according to test parameter.
In the present embodiment, step 303 is to match the test parameter of correspondence according to the attribute register of tested register, and according to the process that test parameter is tested tested register, provides above 6 kinds of concrete test processs of attribute in the present embodiment.
When the attribute register of tested register is read-write, the test number that will produce earlier, write tested register with " write order ", then, with the value that " read command " reads tested register, last, whether the value of relatively reading with " comparison command " equals to test number, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
When the attribute register of tested register when only writing, the test number that will produce earlier, write tested register with " write order ", then, with the value that " read command " reads tested register, last, whether the value of relatively reading with " comparison command " equals 0, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
When the attribute register of tested register when reading zero clearing, produce two " read commands " continuously, last, judge with " comparison command " whether last value of reading equals 0, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
When the attribute register of tested register when writing zero clearing, the test number that will produce earlier, write tested register with " write order ", then, with the value that " read command " reads tested register, last, whether the value of relatively reading with " comparison command " equals 0, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
When the attribute register of tested register when writing 1 zero clearing, earlier with numerical value " 1 ", write tested register with " write order ", then, with the value that " read command " reads tested register, last, whether the value of relatively reading with " comparison command " equals 0, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
When the attribute register of tested register when writing 0 zero clearing, earlier with numerical value " 0 ", write tested register with " write order ", then, with the value that " read command " reads tested register, last, whether the value of relatively reading with " comparison command " equals 0, if equal, then test result is " working properly ", otherwise is " it is undesired to work ".
As can be seen, corresponding different attribute register, the test parameter that tested register is tested is different, the test parameter that has comprises the test number, what have does not comprise the test number, though have comprise the test number, do not need to produce the test number yet.Present embodiment hypothesis needs to produce the test number, and according to the data policy that sets in advance, produce the test number after, whether also judge the test number that produces less than bit wide, if carry out test process, otherwise, behind the test number according to bit wide intercepting generation, carry out test process more earlier.Here, bit wide is meant the shared figure place of register, when the test number surpasses this figure place, need intercept it, otherwise be invalid test number, and bit wide can be 1,2,8 and 16 etc.
Step 304: the test result of storing tested register.
Step 305: judge whether that all registers are all tested intact, if, execution in step 302, otherwise execution in step 306.
In the present embodiment, judge whether that all registers are all tested intact, judge whether to have traveled through all registers in the register tabulation exactly, if, re-execute step 302, otherwise, execution in step 308.。
Step 306: export and show test results.
When present embodiment is " it is undesired to work " in the test result of tested register,, remind the tester to carry out respective handling by showing test results.
In the step 303 of present embodiment, can also utilize the test parameter that produces to repeat test operation, so that can access more reliable test result according to the testing time that sets in advance.
In the present embodiment, can also be before step 303, increase the step of the test result that has judged whether to store tested register, if stored the test result of tested register, and test result is " working properly ", can not test.
Being preferred embodiment of the present invention only below, is not to be used to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (15)
1. a system that realizes register testing is characterized in that, this system comprises:
Module is set, is used to be provided with the corresponding relation of attribute register and test parameter;
The information acquisition module is used to obtain the register information of each tested register, and described register information comprises attribute register;
The test parameter generation module is used for obtaining attribute register from the register information that described information acquisition module obtains, and produces the test parameter corresponding with described attribute register;
Execution module, the test parameter that is used to utilize described test parameter generation module to produce is tested described tested register, obtains the test result of tested register.
2. system according to claim 1 is characterized in that, described test parameter generation module comprises: matching unit and parameter generating unit;
Described matching unit is used for according to the attribute register that sets in advance and the corresponding relation of test parameter, and coupling obtains the test parameter corresponding with the attribute register of described tested register, and described test parameter comprises at least one group of test command and/or test number;
Described parameter generating unit is used for the described test parameter that obtains according to matching unit, produces each group test command and/or test number, is input to execution module successively.
3. system according to claim 1 is characterized in that, described execution module comprises: test parameter interface unit and operating unit;
Described test parameter interface unit is used to receive the test parameter from the test parameter generation module;
Described operating unit is used to be used to the test parameter from described test parameter interface unit, and tested register is carried out test operation, obtains the test result of described tested register.
4. system according to claim 3 is characterized in that, described test parameter comprises at least one group of test command and/or test number;
Described execution module is further used for returning to described test parameter generation module with executing the intermediate result that obtains behind one group of test command/test number;
Described test parameter generation module is input to execution module with next group test command and/or the test number that produces after receiving described intermediate result.
5. system according to claim 1 is characterized in that, described system further comprises: the test result memory module;
Described test result memory module is used to store the test result of the described tested register that described execution module obtains.
6. system according to claim 1 or 5 is characterized in that described system further comprises: register tabulation module;
Described register tabulation module is used to store the register tabulation of being made up of the register information of all tested registers;
Described information acquisition module reads the register information of each tested register in the tabulation of described register successively.
7. system according to claim 6 is characterized in that described system further comprises: update module;
Described update module is used for the register tabulation of described register tabulation module is upgraded.
8. system according to claim 1 is characterized in that described system further comprises: testing time is provided with module;
Described testing time is provided with module, is used to set in advance the testing time to each tested register;
Described test parameter generation module according to the testing time that sets in advance, is input to execution module continuously with the test parameter of the tested register that produces.
9. system according to claim 1 is characterized in that, described system further comprises: the test result display module;
Described test result display module, the test result of the described tested register that is used to show that described execution module obtains.
10. the method for a register testing is characterized in that, this method comprises:
The corresponding relation of attribute register and test parameter is set, obtains the register information of each tested register, described register information comprises attribute register; From register information, extract attribute register, produce the test parameter corresponding with described attribute register; The described test parameter that utilizes described test parameter generation module to produce is tested described tested register, obtains the test result of tested register.
11. method according to claim 10 is characterized in that, the test parameter of the tested register of described generation comprises:
According to the corresponding relation of attribute register that sets in advance and test parameter, coupling obtains the test parameter corresponding with the attribute register of tested register, and described test parameter comprises at least one group of test command and/or test number; Produce each group test command corresponding and/or test number with described attribute information.
12. method according to claim 10 is characterized in that, before described method, further comprises: set up the register tabulation that the register information by all tested registers constitutes;
The described register information that obtains each tested register comprises: travel through described register tabulation, obtain the register information of each the tested register in the described register tabulation successively.
13. method according to claim 10 is characterized in that, further comprises after the described method: the test result of storing described tested register.
14. method according to claim 10 is characterized in that, further comprises after the described method: the test result that shows described tested register.
15. method according to claim 10, it is characterized in that, described method further comprised extract attribute register from register information before: the test result that judges whether to store described tested register, when not storing the test result of described tested register or the test result of the described tested register of storage when " it is undesired work ", carry out described from register information the step of extraction attribute register.
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| CN102360325A (en) * | 2011-09-26 | 2012-02-22 | 青岛海信信芯科技有限公司 | Debugging method and device of register |
| CN104317704A (en) * | 2014-09-30 | 2015-01-28 | 中国电子科技集团公司第四十一研究所 | Measuring software integration method for production line automatic test system |
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| CN108062267A (en) * | 2017-11-24 | 2018-05-22 | 中国人民解放军国防科技大学 | Configurable register file self-testing method and generating device |
| CN109344082A (en) * | 2018-11-01 | 2019-02-15 | 郑州云海信息技术有限公司 | A kind of method and system of automatic scratchpad register |
| CN109361567A (en) * | 2018-11-14 | 2019-02-19 | 北京中电华大电子设计有限责任公司 | A kind of method and device of test lot product UART communication compatibility |
| CN109361567B (en) * | 2018-11-14 | 2020-09-15 | 北京中电华大电子设计有限责任公司 | Method and device for testing UART (universal asynchronous receiver/transmitter) communication compatibility of batch products |
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| CN112905396B (en) * | 2019-11-19 | 2023-08-25 | 杭州海康威视数字技术股份有限公司 | Information display method, device and equipment and storage medium |
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