CN101074939A - Method and apparatus for inspecting and controlling X-ray probe - Google Patents
Method and apparatus for inspecting and controlling X-ray probe Download PDFInfo
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- CN101074939A CN101074939A CNA2007100119010A CN200710011901A CN101074939A CN 101074939 A CN101074939 A CN 101074939A CN A2007100119010 A CNA2007100119010 A CN A2007100119010A CN 200710011901 A CN200710011901 A CN 200710011901A CN 101074939 A CN101074939 A CN 101074939A
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Abstract
A method for controlling X-ray crack detector includes adding X-ray dosage detection-control unit on existing X-ray crack detector to let said detector have detection-control function of radiation dosage for displaying dosage rate and accumulation dosage of radiation in real time, enabling to convert accumulation dosage to be blackness value of film for controlling exposure parameters so as to have optimum imaging-result.
Description
Technical field
The present invention relates to a kind of x-ray flaw detector radiation dose control method and detection control apparatus.
Background technology
When workpiece is carried out Real-time Imaging, because existing x-ray flaw detector does not have the radiation dose Detection ﹠ Controling, the user is when using x-ray flaw detector that workpiece is detected, can't know the dose rate and the integral dose of radiation, can only estimate the radiation dose of x-ray flaw detector by observing exposure parameter (as kV, mA and time shutter etc.), when the conditions such as material, thickness and film making focal length of workpiece change, all to could obtain needed radiation dose through repeatedly adjusting exposure parameter and making film, waste time and energy like this, and waste material.
Summary of the invention
According to the defective that existing x-ray flaw detector exists, the present invention proposes a kind of x-ray flaw detector control method.
Invent the radiation dose detection control apparatus that another purpose provides above-mentioned control x-ray flaw detector method.
Finishing the technical measures that the foregoing invention purpose taked is:
Existing x-ray flaw detector does not have the radiation dose pick-up unit, can't obtain radiation dose, therefore can not utilize the radiation dose adjustment to control parameters such as the voltage of x-ray flaw detector, electric current, time shutter, to reach the x-ray radiation of control x-ray flaw detector, the present invention proposes to adjust the x-ray flaw detector parameter with X ray absorbed dose rate and integral dose by the parameters relationships such as tube voltage, electric current and time shutter of radiation dose and x-ray flaw detector.
A kind of x-ray flaw detector control method, it is characterized in that: the time with x-ray inspection machine testing workpiece, workpiece is placed between the X-ray detector of ray window and detection control apparatus, adjust focal length, start x-ray flaw detector, X-ray detector converts the X ray that captures to microprocessor that electric signal is input to the x-ray inspection machine controller, microprocessor calculates X ray absorbed dose rate and integral dose by the calculation procedure of packing in advance, show by the x-ray flaw detector controller panel, adjust exposure parameter with the relation that traps x-ray dose by controller according to X ray absorbed dose rate that preestablishes and deposit in microprocessor and integral dose (or blackness value) simultaneously.
X ray absorbed dose rate and integral dose are to calculate by following formula:
L＝f(Q)；
H＝L·t；
D=algH+b; Wherein a and b are constant.
L represents the X ray absorbed dose rate; Q represents the value of change-over circuit output electric signal; H represents the accumulated exposure amount; D represents blackness value; T represents the time shutter.
For realizing that the detection control apparatus that above-mentioned control x-ray flaw detector method is adopted is characterized in that: detection control apparatus is made up of X-ray detector, change-over circuit, A/D circuit, microprocessor, demonstration and performance element, its structure is: the signal output part of X-ray detector is connected to change-over circuit, change-over circuit output connects the A/D circuit, the output of A/D circuit is connected to microprocessor, and the microprocessor outlet line connects display unit circuit and performance element circuit.
Detection control apparatus can be divided into x-ray dose pick-up unit and controller, and X-ray detector constitutes the x-ray dose pick-up unit with change-over circuit, and controller is made up of microprocessor, display unit, A/D circuit and performance element.Controller can be put into the inside of x-ray inspection machine controller, also can with the shared element of x-ray inspection machine controller.A for example shared microprocessor adds computing method and control program in original program to; Also can a shared display unit, on the x-ray flaw detector controller panel, increase radiation absorber dose rate, integral dose and the isoparametric demonstration of blackness value.
This detection control apparatus can be used for portable X-ray detection apparatus, fixed (movable type) x-ray flaw detector and various x-ray detection system.
Beneficial effect of the present invention:
Adapted x-ray dose detection control apparatus on existing x-ray flaw detector increases radiation dose Detection ﹠ Controling function, can show the dose rate and the integral dose of radiation in real time, conveniently checks radiation dose, understands equipment running status.Integral dose can be converted to the blackness value of film, can control exposure parameter, control x-ray flaw detector by the setting blackness value and finish exposure, thereby obtain the optimal imaging effect, reduce workload, reduce the film condensation material loss according to the radiation dose of setting.
Description of drawings
Fig. 1 radiation dose Detection ﹠ Controling theory diagram
Fig. 2 is the x-ray detection device circuit diagram
Fig. 3 is that embodiment 1 detection control apparatus of the present invention is used synoptic diagram
Fig. 4 is that embodiment 2 detection control apparatuss of the present invention are used synoptic diagram
Embodiment
Radiation dose Detection ﹠ Controling functional-block diagram is seen Fig. 1, detection control apparatus is made up of X-ray detector, change-over circuit, A/D circuit, microprocessor, demonstration and performance element, its circuit connects sees Fig. 2: the signal output part of X-ray detector is connected to change-over circuit, change-over circuit output connects the A/D circuit, the output of A/D circuit is connected to microprocessor, and the microprocessor outlet line connects display unit circuit and performance element circuit.
Embodiment 1 is the syndeton of 3 explanation a kind of portable X-ray detection apparatus and detection control apparatuss in conjunction with the accompanying drawings: radiation dose Detection ﹠ Controling principle is seen Fig. 1, the x-ray detection device circuit is seen Fig. 2, X-ray detector adopts marque GL1221, the signal of X-ray detector is connected to change-over circuit, they are installed together independent parts of composition is x-ray dose pick-up unit 2, x-ray dose pick-up unit 2 is connected the A/D circuit that is made of commodity LM331 and peripheral cell in the x-ray inspection machine controller 3 with stube cable 5 with dosage transmission cable 4, the A/D circuit connects commodity 89C51 microprocessor in the x-ray inspection machine controller 3, x-ray inspection machine controller 3 connects x ray generator 1 with stube cable 5, and the feed cable 6 of x-ray inspection machine controller 3 connects power supply.
During with the above-mentioned x-ray inspection machine testing workpiece of being furnished with detection control apparatus, its detection method is: workpiece 8 is placed between the ray window and x-ray dose pick-up unit 2 of x ray generator 1, then between workpiece 8 and x-ray dose pick-up unit 2, put into X-ray film 7 as imaging, during detection x-ray dose pick-up unit and X-ray film are put together, its detected radiation dose is the same with film big or small like this, start x-ray flaw detector, X-ray detector is converted into corresponding electric signal (voltage by change-over circuit with the X-radiation intensity that receives with the X ray that captures, electric current or frequency values), send into microprocessor through the A/D circuit, microprocessor is actual X ray absorbed dose rate with electrical signal conversion, accumulated exposure amount and blackness value, on x-ray inspection machine controller 3 control panels, show, make the user can directly on controller, observe the duty of machine and the exposure status of workpiece; According to the radiation parameter of radiation dose setting value control x-ray flaw detector, adjust the radiation intensity of x ray generator simultaneously.
Following formula provides absorbed dose rate, accumulated exposure amount and blackness value relation, and the X ray absorbed dose rate represents with L, and the value of change-over circuit output electric signal represents with Q, and the accumulated exposure amount represents with H, and the time shutter represents with t, and blackness value represents with D, then:
L＝f(Q)；
H＝L·t；
D=algH+b; Wherein a and b are constant.
When X-ray detector is operated in the range of linearity, absorbed dose rate scope 100mR/s～500mR/s, change-over circuit is output as the magnitude of voltage of 1V～5V linearity, X ray absorbed dose rate L=f (Q)=(100 ÷ 1) * Q=100 * Q, mathematical relation such as the following table between absorbed dose rate, accumulated exposure amount and the blackness value at this moment:
| Magnitude of voltage Q | A | b | Absorbed dose rate L=100 * Q | Time shutter t | Accumulated exposure amount H=Lt | Blackness value D=algH+b |
| 1V | 1 | 0 | 100mR/s | 30s | 3R | 0.477 |
| 2V | 1 | 0 | 200mR/s | 50s | 10R | 1 |
| 3V | 1 | 0 | 300mR/s | 100s | 30R | 1.477 |
| 4V | 1 | 0 | 400mR/s | 120s | 48R | 1.68 |
| 5V | 1 | 0 | 500mR/s | 160s | 80R | 1.9 |
Control exposure parameter with the X ray absorbed dose rate: the detected radiation intensity of X-ray detector is converted into value of electrical signals L by change-over circuit
SamplingSend in the microprocessor, with setting value L
SetSubtract each other error amount Δ L, by calculating the adjusted value of exposure parameter, after D/A conversion, go to control exposure parameter (x-ray tube voltage value for example, the x-ray tube current value), thereby change the radiation intensity of x ray generator, realize the closed-loop control of X ray absorbed dose rate, obtain stable radiation dose.Its mathematic(al) representation is as follows;
Δ L=L
Sampling-L
Set
ΔU＝cΔL/P；
ΔI＝dP
2/ΔL；
Δ U in the formula---x-ray tube voltage increment
Δ I---x-ray tube current increment
P---X-ray tube power
C, d---X-ray tube is adjusted coefficient
Accumulated exposure amount or blackness value control X ray switch; The detected radiation intensity of X-ray detector is converted into electric signal by change-over circuit and sends in the microprocessor, calculate accumulated exposure amount or blackness value by microprocessor, compare with setting value, when reaching setting value, microprocessor output control signal, make the action of X ray ON-OFF control circuit, turn-off X ray.
The syndeton of 2 one kinds of mobile X-ray detection apparatus of embodiment and detection control apparatus is seen accompanying drawing 4, X-ray detector adopts marque GL1221, the signal of X-ray detector is connected to change-over circuit, they are installed together independent parts of composition is x-ray dose pick-up unit 5, x-ray dose pick-up unit 5 connects the A/D circuit that is made of commodity LM331 and peripheral cell in the x-ray inspection machine controller 4 with dosage transmission cable 8, the A/D circuit connects marque 89C51 microprocessor in the x-ray inspection machine controller 4, the microprocessor signals output terminal connects the display unit that is contained on the control panel, the parameter of the control of microprocessor signals output simultaneously x-ray flaw detector.X-ray inspection machine controller 4 signal output parts connect anode high voltage generator 2 and cathode high voltage generator 3 with stube cable 7, anode high voltage generator 2 is connected X-ray tube 1 with cathode high voltage generator 3 with high-tension cable 6, X-ray tube 1 places in the unwheeling 10, and cooling recirculation system 9 connects X-ray tube 1.During with the above-mentioned x-ray inspection machine testing workpiece 12 of being furnished with detection control apparatus, its detection method is with embodiment 1.
Claims (2)
1 one kinds of x-ray flaw detector control methods, it is characterized in that: the time with x-ray inspection machine testing workpiece, workpiece is placed between the X-ray detector of ray window and detection control apparatus, adjust focal length, start x-ray flaw detector, X-ray detector converts the X ray that captures to microprocessor that electric signal is input to the x-ray inspection machine controller, microprocessor calculates X ray absorbed dose rate and integral dose by the calculation procedure of packing in advance, adjusts exposure parameter with the relation that traps x-ray dose by controller according to X ray absorbed dose rate that preestablishes and deposit in microprocessor and integral dose (or blackness value);
X ray absorbed dose rate and integral dose are to calculate by following formula:
L＝f(Q)；
H＝L·t；
D=algH+b; Wherein a and b are constant.
L represents the X ray absorbed dose rate; Q represents the value of change-over circuit output electric signal; H represents the accumulated exposure amount; D represents blackness value; T represents the time shutter.
2 for realizing that the detection control apparatus that the described a kind of x-ray flaw detector control method of claim 1 is adopted is characterized in that: detection control apparatus is made up of X-ray detector, change-over circuit, A/D circuit, microprocessor, demonstration and performance element, and its structure is; The signal output part of X-ray detector is connected to change-over circuit, and change-over circuit output connects the A/D circuit, and the output of A/D circuit is connected to microprocessor, and the microprocessor outlet line connects display unit circuit and performance element circuit.
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| CN2007100119010A CN101074939B (en) | 2007-06-29 | 2007-06-29 | Method and apparatus for inspecting and controlling X-ray probe |
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| CN2007100119010A CN101074939B (en) | 2007-06-29 | 2007-06-29 | Method and apparatus for inspecting and controlling X-ray probe |
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| CN101074939A true CN101074939A (en) | 2007-11-21 |
| CN101074939B CN101074939B (en) | 2011-03-16 |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103207191A (en) * | 2013-03-25 | 2013-07-17 | 国家电网公司 | Method for accurately controlling photographic density during radiographic inspection |
| CN104122275A (en) * | 2014-06-30 | 2014-10-29 | 中国化学工程第十四建设有限公司 | Radiographic method for 9% Ni steel |
| CN105636327A (en) * | 2015-12-28 | 2016-06-01 | 上海奕瑞光电子科技有限公司 | Transmission visible light based exposure control system and method |
| CN107068216A (en) * | 2017-06-01 | 2017-08-18 | 哈电集团（秦皇岛）重型装备有限公司 | HTGR heat exchanger tube weld seam X-ray detectoscope |
| CN107068217A (en) * | 2017-06-01 | 2017-08-18 | 哈电集团（秦皇岛）重型装备有限公司 | HTGR heat exchanger tube weld seam x-ray inspection method |
| CN109247948A (en) * | 2018-09-19 | 2019-01-22 | 晓智科技（成都）有限公司 | It is a kind of that imaging system is accurately measured based on X-ray |
| CN110095483A (en) * | 2019-05-09 | 2019-08-06 | 上海电机学院 | One kind overcoming the curved film feed device of long cantilever |
| CN112987070A (en) * | 2019-12-18 | 2021-06-18 | 广州兰泰胜辐射防护科技有限公司 | Detection signal processing method, device and circuit |
| CN113822886A (en) * | 2021-11-23 | 2021-12-21 | 宁波隆源精密机械有限公司 | Processing detection system and method for electric control cover plate of new energy automobile |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2556699A1 (en) * | 1975-12-17 | 1977-06-23 | Philips Patentverwaltung | X-RAY GENERATOR WITH AUTOMATIC EXPOSURE |
| US4811374A (en) * | 1986-11-13 | 1989-03-07 | Medicor Usa Ltd. | Apparatus for setting exposure parameters of an X-ray generator |
| JP2000070389A (en) * | 1998-08-27 | 2000-03-07 | Mitsubishi Electric Corp | Exposure value computing device, exposure value computing, and recording medium |
| US6983230B2 (en) * | 2001-09-11 | 2006-01-03 | Sterigenics Us, Inc. | Method and apparatus for simulating a radiation dose delivered to an object |
-
2007
- 2007-06-29 CN CN2007100119010A patent/CN101074939B/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103207191A (en) * | 2013-03-25 | 2013-07-17 | 国家电网公司 | Method for accurately controlling photographic density during radiographic inspection |
| CN104122275A (en) * | 2014-06-30 | 2014-10-29 | 中国化学工程第十四建设有限公司 | Radiographic method for 9% Ni steel |
| CN105636327A (en) * | 2015-12-28 | 2016-06-01 | 上海奕瑞光电子科技有限公司 | Transmission visible light based exposure control system and method |
| CN107068216A (en) * | 2017-06-01 | 2017-08-18 | 哈电集团（秦皇岛）重型装备有限公司 | HTGR heat exchanger tube weld seam X-ray detectoscope |
| CN107068217A (en) * | 2017-06-01 | 2017-08-18 | 哈电集团（秦皇岛）重型装备有限公司 | HTGR heat exchanger tube weld seam x-ray inspection method |
| CN107068217B (en) * | 2017-06-01 | 2019-05-24 | 哈电集团（秦皇岛）重型装备有限公司 | High temperature gas cooled reactor heat exchanger tube weld seam x-ray inspection method |
| CN109247948A (en) * | 2018-09-19 | 2019-01-22 | 晓智科技（成都）有限公司 | It is a kind of that imaging system is accurately measured based on X-ray |
| CN110095483A (en) * | 2019-05-09 | 2019-08-06 | 上海电机学院 | One kind overcoming the curved film feed device of long cantilever |
| CN112987070A (en) * | 2019-12-18 | 2021-06-18 | 广州兰泰胜辐射防护科技有限公司 | Detection signal processing method, device and circuit |
| CN113822886A (en) * | 2021-11-23 | 2021-12-21 | 宁波隆源精密机械有限公司 | Processing detection system and method for electric control cover plate of new energy automobile |
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| CN101074939B (en) | 2011-03-16 |
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