CN101021559A - Test-blind eliminating instrument and test system for eliminating cable fault test blind zone - Google Patents
Test-blind eliminating instrument and test system for eliminating cable fault test blind zone Download PDFInfo
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- CN101021559A CN101021559A CN 200710017538 CN200710017538A CN101021559A CN 101021559 A CN101021559 A CN 101021559A CN 200710017538 CN200710017538 CN 200710017538 CN 200710017538 A CN200710017538 A CN 200710017538A CN 101021559 A CN101021559 A CN 101021559A
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Abstract
The invention relates to the test blind mitigation device to eliminate the cable malfunction test blind area. It includes the test device to test the cable malfunction point by the impulse signal which includes the blind mitigation circuit to delay the impulse to reach the tested cable. The invention also relates to the test system including the test device, the tested cable and the blind mitigation circuit to delay the impulse to reach the tested cable. The blind mitigation set between the device and the tested cable prolongs the time which the impulse reaches to the cable, so the fault signal can not overlap on the impulse signal sent from the test device and the device can detect the fault of the signal to decrease the cost.
Description
Technical field
The present invention relates to a kind of test disappear blind instrument and a kind of test macro, particularly a kind of test macro that is used to eliminate the cable fault detect blind area belongs to field tests.
Background technology
During the test cable fault, generally testing tool is directly connected an end of tested cable, can directly demonstrate cable position distance by testing tool.So-called cable fault detect blind area, be meant with testing tool can not measure from testing tool through a termination of stube cable to the cable length scope certain trouble spot of cable itself, that is to say when the trouble spot to appear at this test blind area, be difficult to judge accuracy position of fault point with instrument.Detection waveform when the trouble spot was positioned at the test blind area when Fig. 1 measured tested cable for the traditional test instrument is converted into the oscillogram of cable length.According to
Formula is converted into length waveform figure with time waveform figure, and wherein, L is a line length, and v is the transmission speed of electric wave in cable, and t is the transmission time.As shown in Figure 1, L
Arteries and veinsThe length that the original pulse width that sends for testing tool converts according to following formula, when the trouble spot is positioned at the test blind area, the length L of fault reflected impulse Front distance testing tool test lead
SoBe positioned at L
Arteries and veinsInterior or critical in L
Arteries and veinsThe time, the fault reflected impulse just is superimposed on the original pulse, and as shown in Figure 1, surveying instrument has just detected less than this fault reflected impulse.
In order to reduce to test the blind area, adopt following several method usually in practice.A kind of is the tested cable length that extends artificially, promptly increases by one section good cable with the failure cable same model at the instrument test end, cumbersome during practical application, also seldom use; Be exactly by improving the technical feature of testing tool in addition, promptly improve the speed of testing tool A/D converter, as adopt the A/D converter of 20MHz frequency, can bring up to more than the 100MHz in order to reduce the blind area, but correspondingly increase the cost of testing tool, so also use seldom like this.Can certainly reduce the test pulse width in the testing tool, but the general minimum of the effective width of test pulse also there is 0.2 μ s, is scaled the distance of cable, have approximately about 20m,, can't detect abort situation in the interior test blind area that still belongs to of this distance.
Summary of the invention
Technical matters to be solved by this invention is at the deficiencies in the prior art, and a kind of test that is used to eliminate the cable fault detect blind area disappear blind instrument and test macro are provided, and is used for removing effectively the test blind area, conveniently tests out the trouble spot in the test blind area.
For this reason, the invention provides a kind of test that is used to eliminate the cable fault detect blind area blind instrument that disappears, comprise the testing tool that is used to use the pulsed test signal Method of Cable Trouble Point, it is characterized in that, comprise also in the described testing tool that being used for delayed pulse arrives the blind circuit of disappearing of described tested cable, the cable link of the described testing tool of input termination of the described blind circuit that disappears, the described tested cable of the output termination of the described blind circuit that disappears.
The present invention also provides a kind of test macro that is used to eliminate the cable fault detect blind area, comprise the testing tool that is used to use the pulsed test signal Method of Cable Trouble Point, tested cable, it is characterized in that, between described testing tool and described tested cable, be provided with and be used for delayed pulse and arrive the blind circuit of disappearing of described tested cable, the cable link of described testing tool connects the input end of the described blind circuit that disappears, and the output terminal of the described blind circuit that disappears connects an end of described tested cable.
The present invention is used for delayed pulse by adding between testing tool and tested cable and arrives the blind circuit of disappearing of described tested cable, by prolonging the time that pulse arrives cable, thereby being superimposed on the pulse signal that testing tool sends, the fault-signal of having avoided the trouble spot can not make instrument detecting arrive the defective of this fault-signal, make, the test of test cable trouble spot is convenient, and reduced the cost that instrument drops into widely, need not use high-frequency testing tool just can reach the requirement that detects the trouble spot in the traditional test blind area.
Below by drawings and Examples, technical scheme of the present invention is described in further detail.
Description of drawings
Detection waveform when the trouble spot was positioned at the test blind area when Fig. 1 measured tested cable for the traditional test instrument is converted into the oscillogram of cable length;
Fig. 2 is the system diagram of first preferred embodiment of the present invention;
Fig. 3 is the inductance capacitance delay circuit;
Fig. 4 is the testing tool internal frame diagram;
Fig. 5 test waveform figure behind the blind circuit that disappears for the present invention has increased;
Fig. 6 is the system diagram of second preferred embodiment of the present invention.
Description of reference numerals:
The 1-testing tool; The tested cable of 2-; The 3-blind circuit that disappears;
The 4-pulse producer; The 5-display; The 6-CPU chip;
The 7-A/D modular converter; The 8-input circuit; The 9-potentiometer.
Embodiment
Fig. 2 is the disappear synoptic diagram of blind instrument of a kind of test for first preferred embodiment of the invention.As shown in Figure 2, the present invention includes the testing tool 1 that is used to use the pulsed test signal Method of Cable Trouble Point, comprise also in the testing tool 1 that being used for delayed pulse arrives the blind circuit 3 of disappearing of tested cable, the disappear cable link of input termination testing tool 1 of blind circuit 3, the tested cable 2 of the output termination of the blind circuit 3 that disappears.
In the foregoing description, the blind circuit 3 that disappears can adopt the inductance capacitance delay circuit.Fig. 3 is the inductance capacitance delay circuit, and the inductance capacitance delay circuit can be an inductance and described inductance two ends by ground connection behind the electric capacity; Or the inductance capacitance delay circuit is the series connection of more than one inductance, and each described inductance two ends is by ground connection behind the electric capacity, as shown in Figure 3.The inductance capacitance delay circuit is a lumped parameter LC extended line, is equivalent to a length be
Cable, v wherein is the transmission speed of electric wave in cable and extended line, t
The court of a feudal rulerBe the time delay of extended line.
Fig. 4 is the testing tool internal frame diagram, and testing tool 1 can comprise pulse producer 4, display 5, cpu chip 6, A/D modular converter 7, input circuit 8 and potentiometer 9.
Fig. 5 test waveform figure behind the blind circuit that disappears for the present invention has increased.Between testing tool and tested cable, increased delay circuit, just in the reflected ray length L in fault reflected impulse forward position
SoThe front be equivalent to increase by one section line length L by the blind circuit that disappears
ProlongCable makes L
SoAdd L
The court of a feudal rulerLine length more than or equal to L
Arteries and veins, as shown in Figure 5.
Fig. 6 is the system diagram of second preferred embodiment of the present invention.As shown in Figure 6, the present invention includes the testing tool 1 that is used to use the pulsed test signal Method of Cable Trouble Point, tested cable 2, between testing tool 1 and tested cable 2, be provided with and be used for delayed pulse and arrive the blind circuit 3 of disappearing of tested cable 2, testing tool 1 connects the input end of the blind circuit 3 that disappears, and the output terminal of the blind circuit 3 that disappears connects an end of tested cable 2.The shielding layer grounding of tested cable 2.
In the foregoing description, the blind circuit 3 that disappears can adopt the inductance capacitance delay circuit.The inductance capacitance delay circuit can be an inductance and described inductance two ends by ground connection behind the electric capacity; Or the inductance capacitance delay circuit is the series connection of more than one inductance, and each described inductance two ends is by ground connection behind the electric capacity, as shown in Figure 3.The inductance capacitance delay circuit is a lumped parameter LC extended line, is equivalent to a length be
Cable, v wherein is the transmission speed of electric wave in cable and extended line, t
ProlongBe the time delay of extended line.
Among second embodiment, the testing tool internal frame diagram as shown in Figure 4, testing tool 1 can comprise pulse producer 4, display 5, cpu chip 6, A/D modular converter 7, input circuit 8 and potentiometer 9.
Among second embodiment, increased behind the blind circuit that disappears test waveform figure as shown in Figure 5.Between testing tool and tested cable, increased delay circuit, just in the reflected ray length L in fault reflected impulse forward position
SoThe front be equivalent to increase by one section line length L by the blind circuit that disappears
ProlongCable makes L
SoAdd L
ProlongLine length more than or equal to L
Arteries and veins, as shown in Figure 5.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to preferred embodiment, those of ordinary skill in the art is to be understood that, can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and scope of technical solution of the present invention.
Claims (10)
1. a test that is used to eliminate the cable fault detect blind area blind instrument that disappears, comprise the testing tool that is used to use the pulsed test signal Method of Cable Trouble Point, it is characterized in that, comprise also in the described testing tool that being used for delayed pulse arrives the blind circuit of disappearing of tested cable, the cable link of the described testing tool of input termination of the described blind circuit that disappears, the described tested cable of the output termination of the described blind circuit that disappears.
2. the test that is used to the to eliminate the cable fault detect blind area according to claim 1 blind instrument that disappears is characterized in that the described blind circuit that disappears is the inductance capacitance delay circuit.
3. the test that is used to the to eliminate the cable fault detect blind area according to claim 2 blind instrument that disappears it is characterized in that described inductance capacitance delay circuit is an inductance, and described inductance two ends is by ground connection behind the electric capacity.
4. the test that is used to the to eliminate the cable fault detect blind area according to claim 2 blind instrument that disappears is characterized in that described inductance capacitance delay circuit is more than one inductance series connection, and each described inductance two ends is by ground connection behind the electric capacity.
5. test macro that is used to eliminate the cable fault detect blind area, comprise the testing tool that is used to use the pulsed test signal Method of Cable Trouble Point, tested cable, it is characterized in that, between described testing tool and described tested cable, be provided with and be used for delayed pulse and arrive the blind circuit of disappearing of described tested cable, the cable link of described testing tool connects the input end of the described blind circuit that disappears, and the output terminal of the described blind circuit that disappears connects an end of described tested cable.
6. the test macro that is used to eliminate the cable fault detect blind area according to claim 5 is characterized in that, the described blind circuit that disappears is arranged in the described testing tool.
7. according to claim 5 or the 6 described test macros that are used to eliminate the cable fault detect blind area, it is characterized in that the described blind circuit that disappears is the inductance capacitance delay circuit.
8. the test macro that is used to eliminate the cable fault detect blind area according to claim 7 is characterized in that, described inductance capacitance delay circuit is an inductance, and described inductance two ends are by ground connection behind the electric capacity.
9. the test macro that is used to eliminate the cable fault detect blind area according to claim 7 is characterized in that, described inductance capacitance delay circuit is more than one inductance series connection, and each described inductance two ends is by ground connection behind the electric capacity.
10. according to claim 5 or the 6 described test macros that are used to eliminate the cable fault detect blind area, it is characterized in that the shielding layer grounding of described tested cable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710017538A CN101021559B (en) | 2007-03-21 | 2007-03-21 | Test-blind eliminating instrument and test system for eliminating cable fault test blind zone |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710017538A CN101021559B (en) | 2007-03-21 | 2007-03-21 | Test-blind eliminating instrument and test system for eliminating cable fault test blind zone |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101021559A true CN101021559A (en) | 2007-08-22 |
| CN101021559B CN101021559B (en) | 2010-05-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200710017538A Expired - Fee Related CN101021559B (en) | 2007-03-21 | 2007-03-21 | Test-blind eliminating instrument and test system for eliminating cable fault test blind zone |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102193035A (en) * | 2010-03-09 | 2011-09-21 | 上海仪器仪表研究所 | Automatic sorting, detecting and evaluating system for impedance elements |
| CN102213741A (en) * | 2011-05-26 | 2011-10-12 | 长沙理工大学 | Method and device for measuring distance of fault travelling wave of short-distance cable |
| CN105137291A (en) * | 2015-09-22 | 2015-12-09 | 国家电网公司 | Pulse optimization method used for increasing ranging accuracy of cable faults and pulse generating circuit |
| CN106443359A (en) * | 2016-11-11 | 2017-02-22 | 南京工程学院 | Short-distance cable fault ranging system and ranging method with low-voltage pulse method |
-
2007
- 2007-03-21 CN CN200710017538A patent/CN101021559B/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102193035A (en) * | 2010-03-09 | 2011-09-21 | 上海仪器仪表研究所 | Automatic sorting, detecting and evaluating system for impedance elements |
| CN102213741A (en) * | 2011-05-26 | 2011-10-12 | 长沙理工大学 | Method and device for measuring distance of fault travelling wave of short-distance cable |
| CN105137291A (en) * | 2015-09-22 | 2015-12-09 | 国家电网公司 | Pulse optimization method used for increasing ranging accuracy of cable faults and pulse generating circuit |
| CN105137291B (en) * | 2015-09-22 | 2018-02-06 | 国家电网公司 | For improving the pulse optimization method and pulse generating circuit of cable fault localization precision |
| CN106443359A (en) * | 2016-11-11 | 2017-02-22 | 南京工程学院 | Short-distance cable fault ranging system and ranging method with low-voltage pulse method |
| CN106443359B (en) * | 2016-11-11 | 2021-08-03 | 南京工程学院 | Short-distance cable fault distance measurement system and method based on low-voltage pulse method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101021559B (en) | 2010-05-19 |
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