CN101008694A - Design and manufacture technology of optical switch - Google Patents

Design and manufacture technology of optical switch Download PDF

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Publication number
CN101008694A
CN101008694A CN 200610002666 CN200610002666A CN101008694A CN 101008694 A CN101008694 A CN 101008694A CN 200610002666 CN200610002666 CN 200610002666 CN 200610002666 A CN200610002666 A CN 200610002666A CN 101008694 A CN101008694 A CN 101008694A
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CN
China
Prior art keywords
nitride
silicon
window
optical fiber
light switch
Prior art date
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Granted
Application number
CN 200610002666
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Chinese (zh)
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CN100451705C (en
Inventor
董立军
陈大鹏
欧易
景玉鹏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Manufacturing International Shanghai Corp
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Institute of Microelectronics of CAS
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Filing date
Publication date
Application filed by Institute of Microelectronics of CAS filed Critical Institute of Microelectronics of CAS
Priority to CNB2006100026666A priority Critical patent/CN100451705C/en
Publication of CN101008694A publication Critical patent/CN101008694A/en
Application granted granted Critical
Publication of CN100451705C publication Critical patent/CN100451705C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Mechanical Light Control Or Optical Switches (AREA)

Abstract

This invention relates to light switch design and process method in fiber communication and micro process technique, which comprises the following steps: a, using LPCVD low pressure chemical depositing double side polish silicon slice stress force silicon nitride thickness; b, positive etching nitride hanging beam pattern; c, RIE reaction ion etch forming nitride hanging beam pattern; d, back etching erosion window and fiber groove erosion window; e, RIE reaction ion etches window and fiber groove window; f, coating light etches electron beam to evaporate metal film; g, developing and peeling gold electrode; h, KOH resolution forms nitride handing beam and fiber group under 80 degree for eight hour; I, etching beam to form down electrode board; j, binding two slices of silicon.

Description

A kind of light switch design and manufacture craft
Technical field
The present invention relates to optical-fibre communications and Micrometer-Nanometer Processing Technology field, particularly a kind of light switch design and manufacture craft.
Background technology
Photoswitch is the optical device of outbalance, and it can carry out the selective switch operation to light signal in optical network system.Though traditional mechanical optical switch cross-talk is little, good reproducibility, it is low to insert loss, and price is relatively cheap, along with the development of modern optical communication, requires light shutter device to have higher operating rate, lower insertion loss and longer mission life.
Summary of the invention
The present invention proposes a kind of photoswitch based on low stress membrane technology and fine process, be characterized in that structure and processing technology are simple, cost is low, can be integrated, low driving voltage, switching speed height, biggest advantage is the coupling precision problem that has solved optical fiber by simple back side grooving method.
Principle of work:
Among Fig. 1,1, gold electrode 2, low stress nitride silicon thin film 3, incident optical 4 monocrystalline silicon 5 gold electrodes 6 monocrystalline silicon 7 receive optical fiber.
Incident light enters from 3 (incident opticals) as shown in Figure 1, and by 1, thereby making alive drives 2 and makes 2 actions downwards block the light that come from 3 (optical fiber) on the electrode between 5, has realized the function of closing; Add reverse voltage and make 2 to upspring and realize the function open between 1,5, (receive optical fiber penetrates light from 7.
Description of drawings
Fig. 1 is the optical switch construction synoptic diagram.
Fig. 2-the 7th, light switch design of the present invention and production process charts.
Embodiment
Fig. 2-the 7th, light switch design of the present invention and manufacture craft, its process is as follows:
Manufacture craft flow process such as Fig. 2
A is with LPCVD (low pressure chemical meteorological deposit) 2 microns of two-sided deposit low stress nitride silicon thicknesses on (100) of twin polishing silicon chip;
The b positive etching nitride hanging beam pattern; As Fig. 3
CRIE (reactive ion etching) forms silicon nitride cantilevers beam figure;
The d back side makes corrosion window and optical fiber guttering corrosion window by lithography;
ERIE (reactive ion etching) forms corrosion window and optical fiber guttering corrosion window;
Photoetching of f gluing and electron beam evaporation gold thin film;
G develops and peels off the formation gold electrode; As Fig. 4
H KOH (30%) solution corrodes down at 80 degrees centigrade and formed silicon nitride cantilevers beam and optical fiber groove in 8 hours; As Fig. 5
The formation bottom crown is peeled off in i photoetching, electron beam evaporation; As Fig. 6
J key and two silicon chips.As Fig. 7.

Claims (3)

1. light switch design and manufacture craft, its step is as follows:
A is deposited on two-sided deposit low stress nitride silicon thickness on the silicon chip of twin polishing with LPCVD low pressure chemical meteorology;
The b positive etching nitride hanging beam pattern;
The cRIE reactive ion etching forms silicon nitride cantilevers beam figure;
The d back side makes corrosion window and optical fiber guttering corrosion window by lithography;
The eRIE reactive ion etching forms corrosion window and optical fiber guttering corrosion window;
Photoetching of f gluing and electron beam evaporation gold thin film;
G develops and peels off the formation gold electrode;
HKOH solution corrodes down at 80 degrees centigrade and formed silicon nitride cantilevers beam and optical fiber groove in 8 hours;
The formation bottom crown is peeled off in i photoetching, electron beam evaporation;
J key and two silicon chips.
2. according to the light switch design and the manufacture craft of claim 1, it is characterized in that silicon nitride thickness is 2 microns.
3. according to the light switch design and the manufacture craft of claim 1, it is characterized in that KOH solution is 30%.
CNB2006100026666A 2006-01-26 2006-01-26 Design and manufacture technology of optical switch Expired - Fee Related CN100451705C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2006100026666A CN100451705C (en) 2006-01-26 2006-01-26 Design and manufacture technology of optical switch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2006100026666A CN100451705C (en) 2006-01-26 2006-01-26 Design and manufacture technology of optical switch

Publications (2)

Publication Number Publication Date
CN101008694A true CN101008694A (en) 2007-08-01
CN100451705C CN100451705C (en) 2009-01-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2006100026666A Expired - Fee Related CN100451705C (en) 2006-01-26 2006-01-26 Design and manufacture technology of optical switch

Country Status (1)

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CN (1) CN100451705C (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101813796A (en) * 2010-02-26 2010-08-25 深圳大学 Production method of silicon-substrate X-ray phase grating and production device thereof
CN102480285A (en) * 2010-11-29 2012-05-30 中国科学院微电子研究所 Infrared sensor switching device and manufacturing method thereof
CN112735936A (en) * 2021-01-04 2021-04-30 北京理工大学 Micro-mirror side wall processing method for etching by inductively coupled plasma and focused ion beam

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1119681C (en) * 2000-01-14 2003-08-27 清华大学 Electrostatically driven optical microswitch with perpendicular miniature mirrow and its making process
JP2002116390A (en) * 2000-10-06 2002-04-19 Seiko Epson Corp Method for manufacturing optical switching device and optical switching device
JP3871118B2 (en) * 2002-03-18 2007-01-24 住友重機械工業株式会社 Microdevice manufacturing method
CN1226647C (en) * 2002-09-29 2005-11-09 吉林大学 Using (110) silicon wafer to manufacture micromechanical photoswitch, array of photoswitch and method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101813796A (en) * 2010-02-26 2010-08-25 深圳大学 Production method of silicon-substrate X-ray phase grating and production device thereof
CN102480285A (en) * 2010-11-29 2012-05-30 中国科学院微电子研究所 Infrared sensor switching device and manufacturing method thereof
CN102480285B (en) * 2010-11-29 2014-07-09 中国科学院微电子研究所 Infrared sensor switching device and manufacturing method thereof
CN112735936A (en) * 2021-01-04 2021-04-30 北京理工大学 Micro-mirror side wall processing method for etching by inductively coupled plasma and focused ion beam
CN112735936B (en) * 2021-01-04 2022-06-10 北京理工大学 Micro-light switch processing method for etching by inductively coupled plasma and focused ion beam

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Patentee before: Institute of Microelectronics, Chinese Academy of Sciences

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Granted publication date: 20090114

Termination date: 20190126