CN100570344C - Time resolution X-ray diffractometer - Google Patents
Time resolution X-ray diffractometer Download PDFInfo
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- CN100570344C CN100570344C CNB2005100242995A CN200510024299A CN100570344C CN 100570344 C CN100570344 C CN 100570344C CN B2005100242995 A CNB2005100242995 A CN B2005100242995A CN 200510024299 A CN200510024299 A CN 200510024299A CN 100570344 C CN100570344 C CN 100570344C
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- completely reflecting
- reflecting mirror
- mirror
- target
- time resolution
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Abstract
A kind of time resolution X-ray diffractometer, it is made up of femtosecond titanium sapphire laser system, beam splitter, first completely reflecting mirror, second completely reflecting mirror, the 3rd completely reflecting mirror, the 4th completely reflecting mirror, the 5th completely reflecting mirror, the 6th completely reflecting mirror, the 7th completely reflecting mirror, target, concave mirror, target chamber, the special mirror in Wal, sample and detector, a turntable that loads described target is arranged in the described target chamber, target and concave mirror, also have the special mirror in Wal, sample outside this target chamber, detector is formed.Utilize time resolution X-ray diffractometer of the present invention, can study the transient process of the object of atomic scale, temporal resolution can reach the subpicosecond magnitude, lattice moves a resolution can reach milli magnitude, be particularly suitable for the research of crystalline material and Biochemical processes, for example can study the transient state diffraction, to explore biological 26S Proteasome Structure and Function relation with this.
Description
Technical field
The present invention relates to X-ray diffractometer, particularly a kind of time resolution X-ray diffractometer, the time resolution of this time resolution X-ray diffractometer can reach the subpicosecond magnitude, and lattice mobile space resolution can reach m
Magnitude has been widely used in material science and biochemical field.
Background technology
The X-ray diffractometer of Chu Shouing in the market, it all is the static diffractometer that utilizes X-ray tube to do, and the researchist that material science and biomedical sector are engaged in transient buildup, almost be to be on tiptoe to have a PROGRESS IN TIME-RESOLVED X-RAY DIFFRACTION instrument, work goes in for the study.
Obviously, it is very urgent to develop a PROGRESS IN TIME-RESOLVED X-RAY DIFFRACTION instrument, on science and technology, can capture the commanding elevation and give one a leg up in the field ahead of the curve for the scientific research personnel of China, China is had in this field scientific instrument independent intellectual property right, that high-tech content is arranged; Economically, the domestic and international market still belongs to blank at present, in case capture wide international market and home market, can obtain huge economic benefits.
Summary of the invention
The technical problem to be solved in the present invention is to overcome above-mentioned prior art deficiency, a kind of time resolution X-ray diffractometer is provided, so that the state of atom moment motion in observation biochemical reaction and the physical change process, describe unstable state and short-life intermediate state, thereby can understand how intramundane secret!
Essence of the present invention is the technology that a kind of pumping combines with probe, promptly utilize the part of femto-second laser pulse, in sample, activate a ultrafast process (this is pumping), and then remove to produce ultrafast X ray with another part of femtosecond pulse, remove to measure the ultrafast process of this activation, by the whole process of a series of time-delay perception (this is a probe).
Technical solution of the present invention is as follows:
A kind of time resolution X-ray diffractometer, it is characterized in that it is by the femtosecond titanium sapphire laser system, beam splitter, first completely reflecting mirror, second completely reflecting mirror, the 3rd completely reflecting mirror, the 4th completely reflecting mirror, the 5th completely reflecting mirror, the 6th completely reflecting mirror, the 7th completely reflecting mirror, target, concave mirror, target chamber, the special mirror in Wal, sample and detector are formed, turntable that is loaded with described target of installing in the described target chamber, described target and concave mirror, it outside this target chamber the special mirror in described Wal, sample and detector, on the laser output light path of femtosecond titanium sapphire laser system, settle described beam splitter, titanium precious stone laser is exported A light beam and B light beam behind this beam splitter, the A light beam is via first completely reflecting mirror, behind the optical delay line that second completely reflecting mirror and the 3rd completely reflecting mirror are formed, again through the 4th completely reflecting mirror, the 6th completely reflecting mirror and the 7th completely reflecting mirror are turned back back formation effect light beam irradiates to sample, the B light beam enters target chamber through the 5th completely reflecting mirror, by the concave reflection mirror reflection and converge and be mapped on the target, produce a characteristic X-ray, special mirror constitutes detecting light beam incident sample through the Wal again, the strain path that is produced on sample by detector detection effect light beam.
Described femtosecond titanium sapphire laser system is that a radiation wavelength is that 780～820nm, pulsewidth are that 5～100fs, output energy are the laser aid of 10～1000nJ.
Described beam splitter is the semi-transparent medium lamina membranacea of crossing of a half reflection, is a reflection 50%, the medium lamina membranacea through 50%.
Described completely reflecting mirror is the medium lamina membranacea of 100% total reflection.
Described target is movably solid target or a liquid target or a gas target, after the pulse of femto second titanium precious stone laser and its interaction, will produce characteristic X-ray K
α 1And K
α 2Line, corresponding radiation wavelength are 0.5～1.8
Described concave mirror is an aspherical concave mirror.
Described target chamber is a vacuum chamber, and vacuum tightness is 10
-5τ.
The special mirror in described Wal is made up of paraboloidal mirror and hyperbolic mirror.
Described sample is crystalline material or biological sample.
The CCD camera that described said detector is an X ray wave band.
Technique effect of the present invention is as follows
After femto-second laser running, incide on the beam splitter with light beam placement at 45, be divided into A light beam and B light beam that intensity equates.The A light beam is through optical delay line, is formed into then to be mapped on the testing sample behind the polylith completely reflecting mirror.The B light beam incides on the target through completely reflecting mirror, produce characteristic X-ray, focused on the back as detecting light beam by the special mirror in Wal, be used as with producing strain after light beam and the sample effect, and this strain is progressively constantly expanded to sample interior, therefore adopt different time delay, each layer carried out conventional chromatography record, just can obtain three-dimensional strain dynamic process.
Time resolution X-ray diffractometer of the present invention can be studied the transient process of the object of atomic scale, and temporal resolution can reach the subpicosecond magnitude, and lattice moves a resolution can reach m
Magnitude is particularly suitable for the research of crystalline material and Biochemical processes, for example can study the transient state diffraction with this, to explore biological 26S Proteasome Structure and Function relation.
Description of drawings
Fig. 1 is a time resolution X-ray diffractometer example structure schematic diagram of the present invention.
Embodiment
The invention will be further described below in conjunction with embodiment and accompanying drawing.
See also Fig. 1 earlier, Fig. 1 is a time resolution X-ray diffractometer example structure schematic diagram of the present invention.As seen from the figure, time resolution X-ray diffractometer of the present invention, it is characterized in that it is by femtosecond titanium sapphire laser system 1, beam splitter 2, first completely reflecting mirror 3, second completely reflecting mirror 4, the 3rd completely reflecting mirror 5, the 4th completely reflecting mirror 6, the 5th completely reflecting mirror 8, the 6th completely reflecting mirror 9, the 7th completely reflecting mirror 11, target 7, concave mirror 10, target chamber 12, the special mirror 13 in Wal, sample 14 and detector 15 are formed, a turntable that is loaded with target 7 is arranged in the described target chamber 12, target 7 and concave mirror 10 also have the special mirror 13 in Wal outside this target chamber 12, sample 14, detector 15 is formed;
On the laser output light path of femtosecond titanium sapphire laser system 1, settle described beam splitter 2, titanium precious stone laser is exported A light beam and B light beam behind this beam splitter 2, the A light beam is via first completely reflecting mirror 3, behind the optical delay line that second completely reflecting mirror 4 and the 3rd completely reflecting mirror 5 are formed again through the 4th completely reflecting mirror 6, the 6th completely reflecting mirror 9, the 7th completely reflecting mirror 11 is turned back back formation effect light beam irradiates to sample 14, the B light beam enters target chamber 12 through the 5th completely reflecting mirror 8, reflected and converge by concave mirror 10 and be mapped on the target 7, produce a characteristic X-ray, special mirror 13 constitutes detecting light beam incident sample 14, the strain path that detection effect light beam produces on sample 14 through the Wal again.
Described femtosecond titanium sapphire laser system 1 is that a radiation wavelength is that 780～820nm, pulsewidth are that 5～100fs, output energy are the laser aid of 10～1000nJ.
Described beam splitter 2 is the semi-transparent medium lamina membranaceas of crossing of a half reflection, is a reflection 50%, the medium lamina membranacea through 50%.
Described completely reflecting mirror is the medium lamina membranacea of a piece to the 800nm100% total reflection, wherein the first total reflection medium film plate 3, the second total reflection medium film plate 4, the 3rd total reflection medium film plate 5 are formed an optical delay line, in order to adjust the relative optical delay of A bundle and B interfascicular.
Described target 7 is movably copper targets, after the pulse of femto second titanium precious stone laser and its interaction, will produce characteristic X-ray K
α 1And K
α 2Line, corresponding radiation wavelength are 1.540562 and 1.544398
Described concave mirror 10 is aspherical concave mirrors.It is used to focus on as the target practice lens.
Said vacuum chamber 12 adopts 3 mechanical pumps and 3 diffusion pumps, can make the interior vacuum tightness of target chamber reach 5 * 10
-7The vacuum chamber of τ can be ordered in the market.
The special mirror 13 in said Wal is made up of two paraboloidal mirrors and hyperbolic mirror, and market is on sale.
Said sample 14 can be a crystalline material, also can be biological sample.
Said X-ray detector 15 is CCD cameras of an X ray wave band.
The principle of work and the basic process of time resolution X-ray diffractometer of the present invention are:
Incide semi-reflection and semi through after the medium lamina membranacea 2 when the pulse of femto second titanium precious stone laser, be divided into A light beam and B light beam.After delayed line of A light beam femtosecond pulse and the refluxing reflection mirror, irradiation sample 14.B light beam femtosecond pulse enters vacuum chamber 12 through 8 reflections of the 5th completely reflecting mirror, is focused into by concave mirror 10 to be mapped on the solid copper target 7, produces the K of copper
α 1Line and K
α 2Line, this X ray is as x-ray source, special mirror focuses on through the Wal, survey sample 14 by the strain path that is produced after the A beam lighting, in different time delays, take the different x-ray diffractogram, adjust lag line again, just can obtain the crystal dynamic changing process, temporal resolution can reach 2 psecs, and lattice mobile space resolution can reach milli dust spacing.
Claims (10)
1, a kind of time resolution X-ray diffractometer, it is characterized in that it is by femtosecond titanium sapphire laser system (1), beam splitter (2), first completely reflecting mirror (3), second completely reflecting mirror (4), the 3rd completely reflecting mirror (5), the 4th completely reflecting mirror (6), the 5th completely reflecting mirror (8), the 6th completely reflecting mirror (9), the 7th completely reflecting mirror (11), target (7), concave mirror (10), target chamber (12), the special mirror (13) in Wal, sample (14) and detector (15) are formed, turntable that is loaded with described target (7) of installing in the described target chamber (12), described target (7) and concave mirror (10), it outside this target chamber (12) the special mirror (13) in described Wal, sample (14) and detector (15), on the laser output light path of femtosecond titanium sapphire laser system (1), settle described beam splitter (2), titanium precious stone laser is exported A light beam and B light beam behind this beam splitter (2), the A light beam is via first completely reflecting mirror (3), second completely reflecting mirror (4) and
Behind the optical delay line that completely reflecting mirror (5) is formed again through the polylith completely reflecting mirror is turned back after formation effect light beam irradiates arrive sample (14), the B light beam enters target chamber (12) through the 5th completely reflecting mirror (8), reflected and converge by concave mirror (10) and be mapped on the target (7), produce a characteristic X-ray, special mirror (13) constitutes detecting light beam incident sample (14) through the Wal again, goes up the strain path that produces at sample (14) by detector (15) detection effect light beam.
2, time resolution X-ray diffractometer according to claim 1 is characterized in that described femtosecond titanium sapphire laser system (1) is that a radiation wavelength is that 780～820nm, pulsewidth are that 5～100fs, output energy are the laser aid of 10～1000nJ.
3, time resolution X-ray diffractometer according to claim 1 is characterized in that described beam splitter (2) is the semi-transparent medium lamina membranacea of crossing of a half reflection.
4, time resolution X-ray diffractometer according to claim 1 is characterized in that described completely reflecting mirror is the medium lamina membranacea of 100% total reflection.
5, time resolution X-ray diffractometer according to claim 1 is characterized in that described target (7) is a mobile solid target or liquid target or gas target, after the pulse of femto second titanium precious stone laser and its interaction, will produce characteristic X-ray K
α 1And K
α 2Line, corresponding radiation wavelength are 0.5
6, time resolution X-ray diffractometer according to claim 1 is characterized in that described concave mirror (10) is an aspherical concave mirror.
7, time resolution X-ray diffractometer according to claim 1 is characterized in that described target chamber (12) is a vacuum chamber, and vacuum tightness is 10
-5τ.
8, time resolution X-ray diffractometer according to claim 1 is characterized in that the special mirror in described Wal (13) is made up of paraboloidal mirror and hyperbolic mirror.
9, time resolution X-ray diffractometer according to claim 1 is characterized in that described sample (14) is crystalline material or biological sample
10,, it is characterized in that described detector (15) is the CCD camera of an X ray wave band according to each described time resolution X-ray diffractometer of claim 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100242995A CN100570344C (en) | 2005-03-10 | 2005-03-10 | Time resolution X-ray diffractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100242995A CN100570344C (en) | 2005-03-10 | 2005-03-10 | Time resolution X-ray diffractometer |
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| Publication Number | Publication Date |
|---|---|
| CN1657922A CN1657922A (en) | 2005-08-24 |
| CN100570344C true CN100570344C (en) | 2009-12-16 |
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ID=35007551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100242995A Expired - Fee Related CN100570344C (en) | 2005-03-10 | 2005-03-10 | Time resolution X-ray diffractometer |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6392850B2 (en) * | 2014-03-27 | 2018-09-19 | 株式会社リガク | Beam generating unit and X-ray small angle scattering apparatus |
| CN108572186A (en) * | 2018-07-23 | 2018-09-25 | 中国工程物理研究院激光聚变研究中心 | Semiconductor transient state X-ray nonlinear optical effect test device and its test method |
| CN111103311A (en) * | 2019-12-12 | 2020-05-05 | 上海交通大学 | Picosecond laser driven ultrafast X-ray dynamic imaging method |
| CN113936841B (en) * | 2021-11-16 | 2024-04-12 | 中国科学院上海应用物理研究所 | Compact X-ray crystal beam splitting delay system |
| CN114062406B (en) * | 2022-01-04 | 2022-03-22 | 中国工程物理研究院流体物理研究所 | Time-resolved polycrystalline X-ray diffraction target device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1563959A (en) * | 2004-04-06 | 2005-01-12 | 中国科学院上海光学精密机械研究所 | Time resolution x-ray diffraction chromatography appts. |
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2005
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1563959A (en) * | 2004-04-06 | 2005-01-12 | 中国科学院上海光学精密机械研究所 | Time resolution x-ray diffraction chromatography appts. |
Non-Patent Citations (3)
| Title |
|---|
| 时间分辨的X射线衍射. 高鸿奕，陈建文，李儒新，谢红兰，朱化凤，徐至展.物理学进展，第24卷第4期. 2004 * |
| 超快X射线衍射. 谢红兰，高鸿奕，陈建文，陆培祥，徐至展.物理学进展，第21卷第4期. 2001 * |
| 飞秒X射线衍射研究进展. 谢红兰，陈建文，高鸿奕，陈敏，陆培祥，徐至展.激光与电子学进展，第12期. 2001 * |
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| CN1657922A (en) | 2005-08-24 |
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Granted publication date: 20091216 Termination date: 20110310 |