CN100549711C - 远程集成电路测试方法和装置 - Google Patents
远程集成电路测试方法和装置 Download PDFInfo
- Publication number
- CN100549711C CN100549711C CNB200510124294XA CN200510124294A CN100549711C CN 100549711 C CN100549711 C CN 100549711C CN B200510124294X A CNB200510124294X A CN B200510124294XA CN 200510124294 A CN200510124294 A CN 200510124294A CN 100549711 C CN100549711 C CN 100549711C
- Authority
- CN
- China
- Prior art keywords
- test
- group
- access mechanism
- test access
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/3025—Wireless interface with the DUT
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31912—Tester/user interface
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/094,455 | 2005-03-30 | ||
US11/094,455 US7237161B2 (en) | 2005-03-30 | 2005-03-30 | Remote integrated circuit testing method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1841076A CN1841076A (zh) | 2006-10-04 |
CN100549711C true CN100549711C (zh) | 2009-10-14 |
Family
ID=37030176
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB200510124294XA Expired - Fee Related CN100549711C (zh) | 2005-03-30 | 2005-11-29 | 远程集成电路测试方法和装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7237161B2 (zh) |
CN (1) | CN100549711C (zh) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006134411A1 (en) * | 2005-06-13 | 2006-12-21 | Infineon Technologies Ag | Built-in-self-test method for a semiconductor memory |
US20070006038A1 (en) * | 2005-06-29 | 2007-01-04 | Zhengrong Zhou | Methods and apparatus using a hierarchical test development tree to specify devices and their test setups |
US7970594B2 (en) * | 2005-06-30 | 2011-06-28 | The Mathworks, Inc. | System and method for using model analysis to generate directed test vectors |
US7383478B1 (en) * | 2005-07-20 | 2008-06-03 | Xilinx, Inc. | Wireless dynamic boundary-scan topologies for field |
JP4091631B2 (ja) * | 2005-11-17 | 2008-05-28 | ファナック株式会社 | 機械の信号処理装置 |
WO2007099479A2 (en) * | 2006-03-01 | 2007-09-07 | Koninklijke Philips Electronics N. V. | Ic circuit with test access control circuit using a jtag interface |
US7496815B2 (en) * | 2006-03-06 | 2009-02-24 | Sapphire Infotech, Inc. | Method and apparatus for automatic generation of system test libraries |
US7478305B2 (en) * | 2006-03-27 | 2009-01-13 | Sapphire Infotech, Inc. | Method and apparatus for interactive generation of device response templates and analysis |
US7519884B2 (en) | 2006-06-16 | 2009-04-14 | Texas Instruments Incorporated | TAM controller for plural test access mechanisms |
KR100789749B1 (ko) * | 2006-07-24 | 2008-01-02 | 한양대학교 산학협력단 | 시스템 온 칩 테스트 장치 |
US7730375B1 (en) * | 2006-11-05 | 2010-06-01 | Russell Robert J | Method and apparatus for controlling operating modes of an electronic device |
US7589548B2 (en) * | 2007-02-22 | 2009-09-15 | Teradyne, Inc. | Design-for-test micro probe |
US8248073B2 (en) * | 2007-04-06 | 2012-08-21 | Nec Corporation | Semiconductor integrated circuit and testing method therefor |
US7757198B1 (en) * | 2007-04-10 | 2010-07-13 | Lattice Semiconductor Corporation | Scan chain systems and methods for programmable logic devices |
US8005443B1 (en) * | 2007-07-09 | 2011-08-23 | Rf Micro Devices, Inc. | Design for testability circuitry for radio frequency transmitter circuitry |
CA3052820C (en) * | 2009-01-15 | 2024-03-19 | Electronic Warfare Associates, Inc. | Systems and methods of implementing remote boundary scan features |
TWI557746B (zh) | 2011-05-10 | 2016-11-11 | 電子戰協會公司 | 實施微電腦為基的電路之內容驗證的系統及方法 |
TWI546692B (zh) | 2011-10-27 | 2016-08-21 | 電子戰協會公司 | 包括與已知電路板資訊有關之電路測試及驗證等特徵的裝置鑑別之系統及方法 |
US9131000B2 (en) | 2012-04-13 | 2015-09-08 | Ixia | Methods, systems, and computer readable media for heuristics-based adaptive protocol parsing |
US9121892B2 (en) * | 2012-08-13 | 2015-09-01 | Analog Devices Global | Semiconductor circuit and methodology for in-system scan testing |
US9384108B2 (en) * | 2012-12-04 | 2016-07-05 | International Business Machines Corporation | Functional built-in self test for a chip |
US9065556B2 (en) * | 2012-12-14 | 2015-06-23 | Ixia | Methods, systems, and computer readable media for processing multiple control and user data flows at a port processor |
CN203117963U (zh) * | 2012-12-17 | 2013-08-07 | 新唐科技股份有限公司 | 提供图形化接脚接口的调试系统与装置 |
US9397901B2 (en) | 2012-12-18 | 2016-07-19 | Ixia | Methods, systems, and computer readable media for classifying application traffic received at a network traffic emulation device that emulates multiple application servers |
CN103136079B (zh) * | 2013-03-06 | 2014-04-02 | 中国人民解放军国防科学技术大学 | 基于大规模计算机系统的并行边界扫描方法 |
US9726722B1 (en) * | 2013-05-24 | 2017-08-08 | Marvell Israel (M.I.S.L.) Ltd | Systems and methods for automatic test pattern generation for integrated circuit technologies |
CN103440133A (zh) * | 2013-08-30 | 2013-12-11 | 上海高清数字科技产业有限公司 | 一种芯片测试软件的开发方法和系统 |
CN105468797B (zh) * | 2014-08-22 | 2019-10-22 | 深圳市中兴微电子技术有限公司 | 一种信息处理方法及装置 |
CN107305515A (zh) * | 2016-04-25 | 2017-10-31 | Emc公司 | 计算机实现方法、计算机程序产品以及计算系统 |
US20190242941A1 (en) * | 2018-02-06 | 2019-08-08 | Marvell World Trade Ltd. | Methods and Apparatus for Testing an Integrated Circuit |
CN109725247B (zh) * | 2018-12-18 | 2020-11-20 | 蒂姆维澳(上海)网络技术有限公司 | 一种电路板远程维护保障方法及系统 |
US11381464B2 (en) | 2019-11-28 | 2022-07-05 | Keysight Technologies, Inc. | Methods, systems, and computer readable media for implementing a generalized model for defining application state machines |
US11209483B2 (en) * | 2020-02-28 | 2021-12-28 | Micron Technology, Inc. | Controller accessible test access port controls |
CN114416450B (zh) * | 2022-01-18 | 2022-09-27 | 深圳市百泰实业股份有限公司 | 一种pcba生产测试管理方法 |
CN115065426B (zh) * | 2022-05-18 | 2023-11-17 | 珠海迈科智能科技股份有限公司 | 一种无线路由器产品的生产测控系统及其方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4517512A (en) * | 1982-05-24 | 1985-05-14 | Micro Component Technology, Inc. | Integrated circuit test apparatus test head |
US4788708A (en) * | 1987-11-25 | 1988-11-29 | Tele-Technix, Inc. | Universal headset tester |
US4980887A (en) * | 1988-10-27 | 1990-12-25 | Seiscor Technologies | Digital communication apparatus and method |
CA1335832C (en) * | 1989-04-21 | 1995-06-06 | Wing-Man Chan | Remote test access system for isdn testing |
US6275962B1 (en) * | 1998-10-23 | 2001-08-14 | Teradyne, Inc. | Remote test module for automatic test equipment |
US6393591B1 (en) * | 1999-02-12 | 2002-05-21 | Xilinx, Inc. | Method for remotely testing microelectronic device over the internet |
-
2005
- 2005-03-30 US US11/094,455 patent/US7237161B2/en active Active
- 2005-11-29 CN CNB200510124294XA patent/CN100549711C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1841076A (zh) | 2006-10-04 |
US20060242499A1 (en) | 2006-10-26 |
US7237161B2 (en) | 2007-06-26 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: AVAGO TECHNOLOGIES GENERAL IP Free format text: FORMER OWNER: ANJELEN SCI. + TECH. INC. Effective date: 20061124 |
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C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20061124 Address after: Singapore Singapore Applicant after: Avago Technologies General IP (Singapore) Pte. Ltd. Address before: American California Applicant before: Anjelen Sci. & Tech. Inc. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091014 Termination date: 20121129 |