CN100464311C - System level memory environment test method and apparatus - Google Patents
System level memory environment test method and apparatus Download PDFInfo
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- CN100464311C CN100464311C CNB021208638A CN02120863A CN100464311C CN 100464311 C CN100464311 C CN 100464311C CN B021208638 A CNB021208638 A CN B021208638A CN 02120863 A CN02120863 A CN 02120863A CN 100464311 C CN100464311 C CN 100464311C
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Abstract
The invention discloses method and apparatus for system level memory environment testing wherein the main control unit controls the temp. and voltage of the measurand operational environment and reads testing information. The apparatus includes master control unit, high and low temp. ageing oven, high power source and voltage monitoring end installed on the measurand, the master control unit is connected to and communicates with high and low temp. ageing oven, controlling the temperature shifting or closing down of the high and low temp. ageing oven, the master control unit connects large power source and controls it to provide measurand with shifted voltage needed by the test. The master control unit also connects to measurand obtaining the feedback voltage data from measurand, and controls the starting and closedown of the measurand. The invention can transform the memory operational environment provide rigid operational environment and check the compatibility between memory and system.
Description
Technical field:
The present invention relates to a kind of method and device of system level memory environment test, especially a kind ofly can carry out the system level memory proving installation that temperature and voltage carry out simultaneously PC and server system.Belong to electronic technology field.
Background technology:
Internal memory is the critical component of computer platform, is one of decision machine system stability and the most important technical factor of reliability; The key of grasping the memory test technology is intactly to analyze comprehensively, test, to verify the real factor that influences the internal memory operate as normal, and this is exploitation high-performance computer system necessary technology basis; Eliminate stability, reliability hidden danger that complete machine causes because of the internal memory reason, improve the quality and the performance of computing machine; With efficient and scientific methods, and internal memory that can reliable and stable work low for the mainboard alternative costs accelerated product up-gradation, reduces the complete machine cost.All computer systems are manufactured manufacturer all needs the system level memory test platform to improve complete machine stability, reduces production costs, and improves the computing machine cost performance.
Also do not have standard, perfect system level memory environment test platform at present, can not can not make up 4 limit points (CORNER) test condition of evaluation system level internal memory performance automatically to temperature and two kinds of environmental baseline synchronous debuggings of voltage.
Summary of the invention:
The object of the present invention is to provide a kind of method and device of system level memory environment test, it provides effective instrument for the performance on the evaluation and test internal memory relative meaning, can provide voltage and temperature environment simultaneously for tested internal memory, ensure for PC, the server that satisfies production high stability and reliability provides test.
Another purpose of the present invention is to provide a kind of method and device of system level memory environment test, and it is simple in structure, and cost is lower, and draw the large power supply of bias-voltage stable, good reliability.
The object of the present invention is achieved like this:
A kind of method of system level memory environment test, main control computer is by the temperature sensor collecting temperature information in the high low temperature ageing oven of control, export adjustable internal memory supply voltage signal by D/A transition card control large power supply, measurand feeds back to main control computer by the A/D transition card with temperature, information of voltage and operation conditions, and main control computer sends the control information of system according to feedback information.
Main control computer is realized the remote auto unlatching or is closed measurand by on-off circuit.
Described measurand comprises at least: tested mainboard and the internal memory and the corresponding memory test software that are installed on this mainboard.
Described main control computer is by the control of the high low temperature ageing oven realization of control environment temperature, and the control of the supply voltage of measurand realizes by high-power programmable power supply; Main control computer is realized the remote auto unlatching or is closed tested mainboard by on-off circuit.
A kind of system level memory environment test device which comprises at least: main control computer, high low temperature ageing oven, large power supply and be arranged on voltage monitoring end on the measurand; Wherein,
This main control computer is connected with high low temperature ageing oven and communicates by letter, and controls inclined to one side temperature of drawing of this high low temperature ageing oven or shutdown;
This main control computer is connected with large power supply, controls this large power supply provides the bias-voltage that draws from the test needs to measurand;
This main control computer is connected with measurand, obtains the voltage data of this measurand feedback, and controls the unlatching of this measurand or close;
This measurand comprises tested mainboard and is installed in memory device on this mainboard that this measurand is placed in the high low temperature ageing oven, and is connected to obtain power supply with large power supply at least.
It also comprises the oscillograph that is used to show test data, and main control computer is connected with this oscillograph and transmits video data to this oscillograph.
Described main control computer blocks the temperature sensor interior with being arranged on high low temperature ageing oven by analog to digital conversion (A/D) and is connected, and obtains the temperature variation data of this high low temperature ageing oven.
Described main control computer is communicated by letter with high low temperature ageing oven by serial communication interface, and controls the change or the shutdown of this high low temperature ageing oven temperature.The range of temperature of described high low temperature ageing oven is-40 ℃～100 ℃.
Described main control computer links the voltage monitoring end of receiving measurand by analog to digital conversion (A/D), gathers the change information of measurand operating voltage in real time.
Described main control computer is connected to the switch control end of this measurand by digital input/output signal, controls opening or closing of this measurand.
Described main control computer is connected with large power supply with digital-to-analog conversion (D/A) card by analog to digital conversion (A/D) card; Wherein, the output voltage of this large power supply sends voltage signal to main control computer by analog to digital conversion (A/D) card, and main control computer is sent to large power supply to the conditioning signal of large power supply by digital-to-analog conversion (D/A) card.
Described main control computer is connected with the temperature sensor of measurand by analog to digital conversion (A/D) card, gathers the temperature information of the temperature sensor transmission of this measurand.
The present invention is mainly used in the memory test field, and it comprises the chief component of internal memory running environment factor (temperature, voltage) is changed, for system provides the strictest system running environment, and then the compatible performance of checking internal memory and system.
By the system of this method of testing test, can normally operation under the changing environment of the voltage conditions of 0 ℃-55 ℃ temperature conditions and 3.0V-3.6V.But integrated manufacturer of computer system and dynamic random access storage device (Dynamic Random Access Memory, being called for short DRAM) production firm can carry out performance evaluating on the relative meaning to the mainboard of the internal memory product that adopts or produce and selection by native system, so just can make the user can adopt the system of ratio of performance to price optimum, as effective testing tool, use test memory of the present invention will improve stability, the reliability of computer system greatly.
Description of drawings:
Fig. 1 is for the outside formation of test memory of the present invention and structural representation is set.
Fig. 2 is the structural representation of temperature test part of the present invention.
Fig. 3 is the structured flowchart of the high-power programmable power supply part of the present invention.
Fig. 4 is power unit circuit theory diagrams of the present invention.
Embodiment:
The present invention is described in further detail below in conjunction with the drawings and specific embodiments.
Referring to Fig. 1 and Fig. 2, main control computer is controlled automatically to the environmental testing platform, environmental testing platform of the present invention is made of jointly high-power driving power supply and high low temperature ageing oven, the internal memory of tested machine connects collection point of the present invention, what the memory test program adopted is WinMTA memory test software or WinPIE program, by moving this program, can survey that can internal memory to be tested be stablized, operate as normal.Wherein, main control server is born whole control function of test platform.The test platform that controls environment is realized autorun.High low temperature ageing oven is mainly born temperature and is drawn inclined to one side function, is the important component part of environmental testing platform.The main board system of high-power driving power supply in being placed in high low temperature ageing oven powered, and the inclined to one side power supply that draws of test needs is provided.Particularly, present embodiment realizes that with the speed of 2 ℃/M 0 ℃-65 ℃ temperature is drawn partially, also can realize simultaneously 3.3V voltage ± 6% voltage draws partially.
In addition, the present invention also is provided with an oscillograph, is used to bear the signal parameter part of detecting; Uninterrupted power supply (ups) Unity is the stable power-supplying voltage of proving installation.
Main control computer and high low temperature ageing oven carry out automatic communication by serial ports among the present invention; The range of temperature of high low temperature ageing oven is-40 ℃～100 ℃.The standard temperature that this high low temperature ageing oven is implemented to be set by main control computer changes.
Be provided with temperature sensor in the high low temperature ageing oven, be used to monitor whether high low temperature ageing oven is in normal operating conditions, gather the temperature information in the temperature control box, it is connected with the A/D transition card, form with voltage feeds back to the A/D transition card, send temperature information to main control computer by the A/D transition card, operate according to feedback information by main control computer.The A/D transition card then carries out analog to digital conversion to the temperature information of temperature sensor collection.
Measurand is the tested mainboard that is equiped with internal memory.Because this tested mainboard is to be placed in the high low temperature ageing oven, along with the change of the temperature in the high low temperature ageing oven, the temperature of tested system also changes thereupon.So also just tested the stable and compatible of tested system.
Referring to Fig. 3, main control computer is controlled high-power programmable power supply by the D/A transition card, exports adjustable internal memory supply voltage signal; Monitor high-power programmable power supply and tested mainboard by the A/D transition card, whether observation voltage state of supply is normal.If undesired, in time close tested mainboard, avoid causing hardware damage.Wherein,
The D/A transition card is used to carry out digital-to-analog conversion, transmits all control informations of main control computer; The A/D transition card is used to carry out analog to digital conversion, and voltage, the temperature information of tested mainboard fed back to main control computer, and the health information of high-power programmable power supply and tested mainboard also sends main control computer to by this A/D transition card.
Referring to Fig. 2,3, wherein, main control computer and high-power driving power supply stick into row communication by A/D card, D/A.Main control computer is by the running state information of A/D card acquisition system, and whether recording geometry is in normal running status.Judge by gathering the information of voltage of returning whether system is in normal power supply state, judge by gathering the temperature information of returning whether high low temperature ageing oven is in normal duty.According to gathering the temperature of returning, the control information that information of voltage sends system by D/A, the supply voltage of Adjustment System is according to the operation of 4CORNER condition, for total system provides strict ambient test conditions.
Main control computer and high low temperature ageing oven carry out communication by serial ports, the intelligent controller of high low temperature ageing oven is supported serial communication, main control computer can carry out remote opening and shutoff operation to high low temperature ageing oven by serial ports, it is carried out the initialization setting, its variation of temperature track is set, the inclined to one side curve of drawing of its temperature is moved according to the 4CORNER condition.Whether the running state information of gathering high low temperature ageing oven by serial ports observes high low temperature ageing oven according to the 4CORNER condition operation of setting simultaneously, the failure message of returning according to collection sends the remedial measures of system in time, the failure message of register system makes things convenient for tester's observation test curve after test finishes simultaneously, the failure judgement reason is carried out fault analysis afterwards.
Referring to Fig. 4, high-power programmable power supply is used for according to normal sequential, provides mainboard to power on, descend the required whole signals of electricity to satisfy the power demand of tested system under the full test configuration condition.
Wherein, the signal of main board power supply power supply comprises at least: power initiation PWR-GD, normal power supply source 5VSB, low enable PS-ON, power supply ground COM-GND ,+3.3VDC ,+5VDC ,+12VDC ,-12VDC.
Wherein, the good PWR-GD of power initiation puts height by feeder ear, expression+3.3VDC and+5VDC output is greater than the low level of power supply.In case this signal is put height, expression has been stored enough energy in the current transformer, can guarantee that power supply operates in critical field sustainably; Otherwise, when+3.3VDC or+when 5VDC voltage is lower than low threshold, perhaps be removed a period of time when feeder ear, the good PWR-GD signal of power initiation is put low.
Low enable PS-ON opening power then when being low level, otherwise power cutoff.
Normal power supply source 5VSB is used for providing electric energy when power remove.
High-power programmable power supply is on circuit board, and except that 3.3V and low enabling the PS-ON, other signal all adopts straight-through the connection.Simplify the track lengths of 3.3V on the plate, make its time-delay on regulator board in the ns level.With respect to the time of the power on signal POWER_ON on the mainboard between+3.3V powers on ,+3.3V power on and+time of 5V between powering on, power on signal POWER_ON signal can not impact the mainboard operate as normal valid till the time between the electricity under the+3.3V.
The present invention checks the compatible and stable of internal memory and tested system by changing the working environment of internal memory.Temperature and voltage are the main environmental factors that influences internal memory and system's operate as normal, and this test macro is only tested these two kinds of principal elements that influence system performance.
The characteristic of native system is, intelligence test can be in 72 hours no worker monitor states, can generate test report automatically, monitors whether operate as normal of the supply voltage of tested system and temperature control box automatically.
It should be noted last that above embodiment is only in order to explanation and unrestricted technical scheme described in the invention; Therefore, although this instructions has been described in detail the present invention with reference to the above embodiments,, those of ordinary skill in the art should be appreciated that still and can make amendment or replacement to the present invention with being equal to; And all do not break away from the technical scheme and the improvement thereof of the spirit and scope of the present invention, and it all should be encompassed in the middle of the claim scope of the present invention.
Claims (13)
1. the method for a system level memory environment test, it is characterized in that: main control computer is by the temperature sensor collecting temperature information in the high low temperature ageing oven of control, export adjustable internal memory supply voltage signal by D/A transition card control large power supply, measurand feeds back to main control computer by the A/D transition card with temperature, information of voltage and operation conditions, and main control computer sends the control information of system according to feedback information.
2. the method for system level memory environment test according to claim 1 is characterized in that: main control computer realizes that by on-off circuit remote auto opens or close measurand.
3. the method for system level memory environment test according to claim 1 and 2, it is characterized in that: described measurand comprises at least: tested mainboard and be installed in internal memory on this mainboard.
4. the method for system level memory environment test according to claim 3, it is characterized in that: described main control computer is realized the control of environment temperature by the high low temperature ageing oven of control, and the control of the supply voltage of measurand is realized by high-power programmable power supply; Main control computer is realized the remote auto unlatching or is closed tested mainboard by on-off circuit.
5. system level memory environment test device is characterized in that: which comprises at least a main control computer, high low temperature ageing oven, large power supply and be arranged on voltage monitoring end on the measurand; Wherein,
This main control computer is connected with high low temperature ageing oven and communicates by letter, and what this high low temperature ageing oven of control was set draws inclined to one side temperature and On/Off state;
This main control computer is connected with large power supply, controls this large power supply provides the bias-voltage that draws from the test needs to measurand;
This main control computer is connected with measurand, obtains the voltage data of this measurand feedback, and controls the unlatching of this measurand or close;
This measurand comprises tested mainboard and is installed in memory device on this mainboard that this measurand is placed in the high low temperature ageing oven, and is connected to obtain power supply with large power supply at least.
6. system level memory environment test device according to claim 5 is characterized in that: it also comprises the oscillograph that is used to show test data, and main control computer is connected with this oscillograph and transmits video data to this oscillograph.
7. system level memory environment test device according to claim 5, it is characterized in that: described main control computer blocks the temperature sensor interior with being arranged on high low temperature ageing oven by analog to digital conversion (A/D) and is connected, and obtains the temperature variation data of this high low temperature ageing oven.
8. system level memory environment test device according to claim 5 is characterized in that: described main control computer is communicated by letter with high low temperature ageing oven by serial communication interface, and controls the change or the shutdown of this high low temperature ageing oven temperature.
9. according to claim 5 or 7 or 8 described system level memory environment test devices, it is characterized in that: the range of temperature of described high low temperature ageing oven is-40 ℃～100 ℃.
10. system level memory environment test device according to claim 5 is characterized in that: described main control computer links the voltage monitoring end of receiving measurand by analog to digital conversion (A/D), gathers the change information of measurand operating voltage in real time.
11. system level memory environment test device according to claim 5 is characterized in that: described main control computer is connected to the switch control end of this measurand by digital input/output signal, controls opening or closing of this measurand.
12. system level memory environment test device according to claim 5 is characterized in that: described main control computer is connected with large power supply with digital-to-analog conversion (D/A) card by analog to digital conversion (A/D) card; Wherein, the output voltage of this large power supply sends voltage signal to main control computer by analog to digital conversion (A/D) card, and main control computer is sent to large power supply to the conditioning signal of large power supply by digital-to-analog conversion (D/A) card.
13. system level memory environment test device according to claim 5 is characterized in that: described main control computer is connected with the temperature sensor of measurand by analog to digital conversion (A/D) card, gathers the temperature information of the temperature sensor transmission of this measurand.
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| CNB021208638A CN100464311C (en) | 2002-06-06 | 2002-06-06 | System level memory environment test method and apparatus |
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| CN103970631A (en) * | 2014-05-23 | 2014-08-06 | 浪潮电子信息产业股份有限公司 | Method for testing reliability of internal storage based on VID dial switch hardware circuit |
| CN104268043B (en) * | 2014-09-25 | 2017-07-28 | 浪潮电子信息产业股份有限公司 | A kind of accelerated ageing detection method of server memory system |
| CN104615518A (en) * | 2015-03-04 | 2015-05-13 | 浪潮集团有限公司 | Memory rank margin test method combined with temperature and voltage variables |
| CN104950265B (en) * | 2015-05-29 | 2018-07-13 | 上海斐讯数据通信技术有限公司 | Draw the automatic test approach and system of inclined power supply |
| CN108446191A (en) * | 2017-12-31 | 2018-08-24 | 广东三木科技有限公司 | A kind of memory bar test system that can simulate varying environment |
| CN110570893B (en) * | 2018-06-05 | 2021-03-05 | 记忆科技(深圳)有限公司 | Flash automatic screening system and screening method for realizing voltage bias |
| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
| CN112834898B (en) * | 2020-12-29 | 2023-04-25 | 北京浪潮数据技术有限公司 | Method, device and equipment for testing stability of power chip of storage device |
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| CN104468251A (en) * | 2013-09-18 | 2015-03-25 | 深圳市共进电子股份有限公司 | System and method for automatic temperature test and long time test of network equipment |
| CN104468251B (en) * | 2013-09-18 | 2018-11-13 | 深圳市共进电子股份有限公司 | System and method for carrying out network equipment high/low temperature and long-time loop test automatically |
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