CN100414272C - 一种光谱解析校正的积分式光辐射度测量系统和方法 - Google Patents
一种光谱解析校正的积分式光辐射度测量系统和方法 Download PDFInfo
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- CN100414272C CN100414272C CNB2005100508541A CN200510050854A CN100414272C CN 100414272 C CN100414272 C CN 100414272C CN B2005100508541 A CNB2005100508541 A CN B2005100508541A CN 200510050854 A CN200510050854 A CN 200510050854A CN 100414272 C CN100414272 C CN 100414272C
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Families Citing this family (7)
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CN101368847B (zh) * | 2007-08-16 | 2011-07-20 | 深圳市海川实业股份有限公司 | 一种校正物理紫外光强测量仪的方法 |
CN101614587B (zh) * | 2008-06-27 | 2012-09-05 | 深圳市海川实业股份有限公司 | 一种紫外灯有效功率的测试方法 |
CN102478641A (zh) * | 2010-11-27 | 2012-05-30 | 西安大昱光电科技有限公司 | Led路灯光电综合测试系统 |
CN102486534A (zh) * | 2010-12-01 | 2012-06-06 | 西安大昱光电科技有限公司 | Led日光灯光电参数测量系统 |
EP3385703A1 (en) * | 2017-04-07 | 2018-10-10 | Greentropism | Improved spectroscopic device and method for sample characterization |
CN109990980B (zh) * | 2019-04-17 | 2020-11-10 | 杭州赛美蓝光电科技有限公司 | 一种基于光谱仪的可见光探测器视觉函数修正方法 |
CN113588080B (zh) * | 2021-08-11 | 2024-04-02 | 长春希达电子技术有限公司 | 一种光源光谱的校准方法 |
Citations (3)
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CN1092161A (zh) * | 1993-03-06 | 1994-09-14 | 机械电子工业部第二○五研究所 | 瞬态分光辐射仪 |
JP2002267600A (ja) * | 2001-03-12 | 2002-09-18 | Minolta Co Ltd | 反射特性測定装置 |
CN2861990Y (zh) * | 2005-07-26 | 2007-01-24 | 潘建根 | 一种光谱解析校正的积分式光辐射度测量系统 |
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Patent Citations (3)
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CN1092161A (zh) * | 1993-03-06 | 1994-09-14 | 机械电子工业部第二○五研究所 | 瞬态分光辐射仪 |
JP2002267600A (ja) * | 2001-03-12 | 2002-09-18 | Minolta Co Ltd | 反射特性測定装置 |
CN2861990Y (zh) * | 2005-07-26 | 2007-01-24 | 潘建根 | 一种光谱解析校正的积分式光辐射度测量系统 |
Non-Patent Citations (4)
Title |
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光电探测器相对光谱灵敏度测试方法的研究. 吴继宗,鹿景荣,张凤宏.光学学报,第9卷第8期. 1989 |
光电探测器相对光谱灵敏度测试方法的研究. 吴继宗,鹿景荣,张凤宏.光学学报,第9卷第8期. 1989 * |
发光二极管光谱参数测试方法的研究. 金尚忠,王东辉,周文,张在宣.光电子.激光,第13卷第8期. 2002 |
发光二极管光谱参数测试方法的研究. 金尚忠,王东辉,周文,张在宣.光电子.激光,第13卷第8期. 2002 * |
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