CN100401335C - Whole automatic analog electrostatic field mapping system - Google Patents
Whole automatic analog electrostatic field mapping system Download PDFInfo
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- CN100401335C CN100401335C CNB2005100187447A CN200510018744A CN100401335C CN 100401335 C CN100401335 C CN 100401335C CN B2005100187447 A CNB2005100187447 A CN B2005100187447A CN 200510018744 A CN200510018744 A CN 200510018744A CN 100401335 C CN100401335 C CN 100401335C
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Abstract
The present invention relates to a whole automatic simulating electrostatic field mapping system which comprises an electrostatic field simulating device, a probe, a voltage sensor, a probe mechanical driving device, a controller of the driving device and a computer for controlling the controller, wherein the input end of the voltage sensor is connected with the probe, and the output end of the voltage sensor is connected with the computer. The system of the present invention has the advantages of high automation and simple operation, an operator can freely set sampling points on the computer for controlling the controller in an 'interaction 'mode, the system can control the probe mechanical driving device through the controller according to the setting to drive the probe to move to the sampling point positions automatically and quickly. The operator can also set parameters, such as a scanning step distance, etc., in the computer for controlling the controller in an 'automation 'mode. The system controls the probe mechanical driving device through the controller according to the setting to drive the probe to start from the origin of coordinate to traverse the whole electrostatic field simulating device automatically according to the set parameters, and preserves data, such as the coordinates and the voltage of each sampling point, etc.
Description
Technical field
The present invention relates to the experimental provision of analog electrostatic field mapping technical field, particularly analog electrostatic field mapping.
Background technology
Because directly describing electrostatic field has difficulties, and the distribution of the distribution of steady current field and electrostatic field can be expressed with identical mathematical formulae, so come analog electrostatic field with the steady current field usually, the equipotential line of surveying and drawing various electric fields by the current potential between the potential electrode, and then analyze the distribution situation of electrostatic field.Therefore, analog electrostatic field mapping is the Physical Experiment that domestic and international institution of higher learning generally offer.
The experimental provision of present analog electrostatic field mapping as shown in Figure 8, experimental provision comprise conductive paper 16, electrode 11, probe 10, recording chart 17, with the recording pointer 18 of probe interlock, voltage table 19 etc.; Electrode is pressed in forms the static field simulation device on the conductive paper, probe is connected with voltage table, and recording chart is placed on the below of recording pointer.During mapping, load steady voltage on electrode, the manual driven probe slides on the conductive paper between two electrodes, and with the current potential on the each point on the conductive paper between the potential electrode, recording pointer is measured the position of each point at the recording chart record.
There is following defective in above-mentioned experimental provision: 1, the position of probe on conductive paper by recording pointer at recording chart record, low precision; 2, the current potential on the each point on the conductive paper is got voltage table by the manual read, and measuring error is big; 3, automaticity is low, complicated operation.
Summary of the invention
Technical matters to be solved by this invention is: a kind of whole automatic analog electrostatic field mapping system is provided, and the voltage of each sampled point can automatically be gathered according to setting by this system, and preserves the coordinate and the voltage data of each sampled point.
The present invention solves the problems of the technologies described above the technical scheme that is adopted:
Whole automatic analog electrostatic field mapping system, it comprises static field simulation device, probe; It also comprises: the controller of voltage sensor, probe mechanical actuation device, drive unit, be used to control the computing machine of controller; The input end of voltage sensor is connected with probe, and the output terminal of voltage sensor is connected with computing machine.
In the such scheme, probe mechanical actuation device drive unit comprises base, and base is provided with X axis guided way, the platform that moves, is used to drive the stepper motor of platform on the X axis guided way; Platform is provided with the slide block that Y-axis moves on guided way to guided way, in Y-axis, the stepper motor that is used to drive slide block; Probe is arranged on the slide block; The controller of drive unit is the controller that is used for the control step motor.
In the such scheme, it also comprises a connecting rod, and an end of connecting rod is connected with slide block, and the other end is provided with the probe connector, and probe is fixed on the slide block by connector, connecting rod.
In the such scheme, it comprises electrode, frosted glass the static field simulation device, is coated with metal coating on the front of frosted glass, and electrode is arranged on the back side of frosted glass; Metal coating extends to the back side of frosted glass, and contacts with electrode.
In the such scheme, electrode is a strip, has the groove that snaps in for strip shaped electric poles on the back side of frosted glass, and metal coating extends in the groove, and electrode card is in groove.
In the such scheme, electrode is a column, has the hole that snaps in for columnar electrode on the back side of frosted glass, and metal coating extends in the hole, and electrode card is in the hole.
The automaticity height of analog electrostatic field mapping system of the present invention, simple to operate, operating personnel can be under " alternately " pattern, on the computing machine of control controller, freely set sampled point, system can be according to setting by controller control probe mechanical actuation device, drive probe automatically, move quickly into sampling point position, gather the voltage of this point, and preserve the coordinate and the voltage data of each point.Operating personnel also can be under " automatically " pattern, on the computing machine of control controller, set parameters such as scanning step pitch, system is according to setting by controller control probe mechanical actuation device, drive probe from true origin, by the parameter of the setting whole static field simulation device of traversal automatically, and data such as the coordinate of each sampled point and voltage are preserved.
Compared with prior art, whole automatic analog electrostatic field mapping system of the present invention also has the following advantages:
1, probe mechanical actuation device driving probe slides on the static field simulation device, and its control accuracy can reach the 0.1mm/ step, can realize the potential measurement of big density fully, and the quantity of measuring equipotential line can increase greatly;
2, but probe is in the static field simulation device and reflects on computers to certain some position coordinates precision;
3, the electrode of static field simulation device is arranged on the back side of frosted glass, and probe slides on the metal coating in frosted glass front, and probe can not run into electrode, therefore, can not bump the apparatus damage that electrode causes because of probe;
4, the metal coating flatness is good, and can not scratched by probe, therefore, the long service life of current-carrying plate, experiment effect is good.
5, have groove or hole on the back side of frosted glass, metal coating extends in the groove or hole of frosted glass, and electrode card is in groove or hole, and contacting between electrode and the metal coating is tight, contact uniformity coefficient unanimity, and experiment effect is good.
6, institute's plating can be selected arbitrarily, can be single metal, also can be alloy, also can add other material in metal, and therefore, the conductance of metal coating can be selected arbitrarily.
Description of drawings
Fig. 1 is the structured flowchart of the embodiment of the invention
Fig. 2 is the structural representation of probe mechanical actuation device
Fig. 3 is the structural representation at the static field simulation device back side
Fig. 4 is the A-A cut-open view of Fig. 3
Fig. 5 is the structural representation at the another kind of static field simulation device back side
Fig. 6 is the B-B cut-open view of Fig. 5
Fig. 7 is the workflow diagram that is used to control the single-chip microcomputer of controller
Fig. 8 is the structural representation of existing static field simulation device
Embodiment
The embodiment of the invention as shown in Figure 1, whole automatic analog electrostatic field mapping system comprise static field simulation device, probe; It also comprises: the controller of voltage sensor, probe mechanical actuation device, drive unit, be used to control the computing machine of controller; The input end of voltage sensor is connected with probe, and the output terminal of voltage sensor is connected with computing machine.The computing machine that is used to control controller is a single-chip microcomputer.
As shown in Figure 2, the probe actuation device comprises base 9, and base 9 is provided with X axis guided way 1, the platform 2 of operation on X axis guided way 1, be used to drive the stepper motor 3 of platform 2; Platform 2 is provided with the slide block 6 that Y-axis moves on guided way 5 to guided way 5, in Y-axis, the stepper motor 4 that is used to drive slide block 6.Drive unit also comprises a connecting rod 7, and an end of connecting rod 7 is connected with slide block 6, and the other end is provided with probe connector 8, and probe is fixed on the slide block 6 by connector 8, connecting rod 7; The controller of drive unit is the controller that is used for the control step motor.
Shown in Fig. 3,4, the static field simulation device comprises electrode 11, frosted glass 12, is coated with metal coating 13 on the front of frosted glass 12, and electrode 11 is arranged on the back side of frosted glass 12; Metal coating 13 extends to the back side of frosted glass 12, and contacts with electrode 11.Electrode 11 is a column, has the hole 14 that snaps in for columnar electrode 11 on the back side of frosted glass 12, and metal coating 13 extends in the hole 14, and electrode 11 is stuck in the hole 14.
Shown in Fig. 5,6, the electrode 11 of another kind of static field simulation device is a strip, has the groove 15 that snaps in for strip shaped electric poles 11 on the back side of frosted glass 12, and metal coating 13 extends in the groove 15, and electrode 11 is stuck in the groove 15.
On above-mentioned two kinds of static field simulation devices, the metal selection that is used for metal coating is the close metal of conductance of conductance and carbon, and the metal that is used for metal coating can be adjusted the conductance of metal by the method for other material that mixes therein.
Be used to control controller single-chip microcomputer workflow diagram as shown in Figure 7.
As shown in Figure 1, the embodiment of the invention also comprises a host computer, and host computer can transmit from being used to control the single-chip microcomputer acquisition and the processing experiment measured data of controller by USB flash disk or serial ports.Host computer can have analytic function and copying; Analytic function is meant that software can screen the data that collect, finish such as curve fitting, ask data computing such as variance, related coefficient to handle, and realizing experimental data " visual " with means such as curve, animation, forms, the processing of experimental result and report can all be finished by computer software.Copying is meant that software provides the electrostatic field mapping platform of " virtual ", the click by operator's mouse or drag, and system shows the distribution situation of electric field with the form of animation or curve, observes and analyze the distribution situation of electrostatic field etc. for the operator.
Embodiment of the invention measured result and notional result can directly compare, and deepen student's understanding and grasp to Theory Course, have both improved classmate's manipulative ability, bring into play the effect of the auxiliary theory teaching of laboratory again better.
Claims (5)
1. whole automatic analog electrostatic field mapping system, it comprises static field simulation device, probe, it is characterized in that: it also comprises: the controller of voltage sensor, probe mechanical actuation device, drive unit, be used to control the computing machine of controller; The input end of voltage sensor is connected with probe, and the output terminal of voltage sensor is connected with computing machine;
The probe mechanical actuation device comprises base (9), and base (9) is provided with X axis guided way (1), goes up the platform (2) that moves, the stepper motor (3) that is used to drive platform (2) at X axis guided way (1); Platform (2) be provided with Y-axis to guided way (5), Y-axis to guided way (5) go up operation slide block (6), be used to drive the stepper motor (4) of slide block (6); Probe is arranged on the slide block (6); The controller of drive unit is the controller that is used for the control step motor.
2. mapping system as claimed in claim 1 is characterized in that: it also comprises a connecting rod (7), and an end of connecting rod (7) is connected with slide block (6), and the other end is provided with probe connector (8), and probe is fixed on the slide block (6) by connector (8), connecting rod (7).
3. mapping system as claimed in claim 1 is characterized in that: it comprises electrode (11), frosted glass (12) the static field simulation device, is coated with metal coating (13) on the front of frosted glass (12), and electrode (11) is arranged on the back side of frosted glass (12); Metal coating (13) extends to the back side of frosted glass (12), and contacts with electrode (11).
4. mapping system as claimed in claim 3, it is characterized in that: electrode (11) is a strip, have the groove (15) that snaps in for strip shaped electric poles (11) on the back side of frosted glass (12), metal coating (13) extends in the groove (15), and electrode (11) is stuck in the groove (15).
5. mapping system as claimed in claim 3, it is characterized in that: electrode (11) is column, have the hole (14) that snaps in for columnar electrode (11) on the back side of frosted glass (12), metal coating (13) extends in the hole (14), and electrode (11) is stuck in the hole (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100187447A CN100401335C (en) | 2005-05-19 | 2005-05-19 | Whole automatic analog electrostatic field mapping system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100187447A CN100401335C (en) | 2005-05-19 | 2005-05-19 | Whole automatic analog electrostatic field mapping system |
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| Publication Number | Publication Date |
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| CN1707557A CN1707557A (en) | 2005-12-14 |
| CN100401335C true CN100401335C (en) | 2008-07-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2005100187447A Expired - Fee Related CN100401335C (en) | 2005-05-19 | 2005-05-19 | Whole automatic analog electrostatic field mapping system |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101762753B (en) * | 2008-12-23 | 2012-07-18 | 上海工程技术大学 | Intelligent electrostatic field mapping instrument |
| CN103954849A (en) * | 2014-05-12 | 2014-07-30 | 中国科学院上海高等研究院 | Electric field detection device |
| CN104408997B (en) * | 2014-11-06 | 2017-12-22 | 南阳理工学院 | Novel static electric field drawing apparatus |
| CN106898213B (en) * | 2017-04-14 | 2019-01-25 | 淮北师范大学 | A kind of concentric electrode static field simulation device and application method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6254175A (en) * | 1985-09-03 | 1987-03-09 | Toshiba Corp | Measuring instrument for adjacent electrostatic field |
| JP2000089662A (en) * | 1998-09-09 | 2000-03-31 | Canon Inc | Electronic orbit simulation tracing device |
| CN2374938Y (en) * | 1999-05-01 | 2000-04-19 | 株洲工学院 | Delineator for simulating electrostatic field |
| CN2485734Y (en) * | 2001-03-16 | 2002-04-10 | 陈楚南 | Page turning and drawer style demonstrator for electrostatic field and potential |
| RU2210815C2 (en) * | 2001-06-15 | 2003-08-20 | Военный инженерно-космический университет им. А.Ф. Можайского | Practice device to study electromagnetic field |
| CN2665846Y (en) * | 2003-12-09 | 2004-12-22 | 河海大学常州校区 | Electrostatic field three-dimensional experiment instrument |
-
2005
- 2005-05-19 CN CNB2005100187447A patent/CN100401335C/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6254175A (en) * | 1985-09-03 | 1987-03-09 | Toshiba Corp | Measuring instrument for adjacent electrostatic field |
| JP2000089662A (en) * | 1998-09-09 | 2000-03-31 | Canon Inc | Electronic orbit simulation tracing device |
| CN2374938Y (en) * | 1999-05-01 | 2000-04-19 | 株洲工学院 | Delineator for simulating electrostatic field |
| CN2485734Y (en) * | 2001-03-16 | 2002-04-10 | 陈楚南 | Page turning and drawer style demonstrator for electrostatic field and potential |
| RU2210815C2 (en) * | 2001-06-15 | 2003-08-20 | Военный инженерно-космический университет им. А.Ф. Можайского | Practice device to study electromagnetic field |
| CN2665846Y (en) * | 2003-12-09 | 2004-12-22 | 河海大学常州校区 | Electrostatic field three-dimensional experiment instrument |
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