CN202041591U - Intelligent test terminal for electronic device - Google Patents
Intelligent test terminal for electronic device Download PDFInfo
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- CN202041591U CN202041591U CN2011200041412U CN201120004141U CN202041591U CN 202041591 U CN202041591 U CN 202041591U CN 2011200041412 U CN2011200041412 U CN 2011200041412U CN 201120004141 U CN201120004141 U CN 201120004141U CN 202041591 U CN202041591 U CN 202041591U
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Abstract
The utility model discloses an intelligent test terminal for an electronic device, which comprises an embedded central controller or a personnel computer (PC), in addition, the intelligent test terminal is connected with a storage unit for storing test results and a man-machine operation unit for inputting operation instructions, and the embedded central controller also controls and connects a plurality of electronic device test modules for testing the electronic device through a digital switch. The intelligent test terminal for the electronic device has the advantages that the embedded controller is adopted as a core unit for realizing the control on the whole test terminal, and the providing of different test modules is realized on different electronic devices, so the corresponding test module can be selected for testing, the test parameter and the results can be automatically recorded, the test efficiency and the accuracy are improved, the test automation is realized, and the intelligent test terminal is particularly suitable for processing shops using a large number of electronic devices.
Description
Technical field
The utility model relates to a kind of intelligence test equipment, in particular a kind of intelligence test terminal device at electronic devices and components.
Background technology
In the electronic equipment production run of prior art, often be faced with different electronic devices and components supplied materials is carried out the QC detection, present QC supplied materials detects, generally be by the flow operations of detection person according to training, at different electronic devices and components for example resistance, electric capacity or inductance need adopt different test operation program and instrument, need do a lot of tests at a certain electronic devices and components, because manual operation may ignore a certain test, if and do not do a certain test, also can't verify.
Simultaneously, because the inspection parameter of electronic devices and components is inequality, detection person must could work through the method for testing of training and cognitive all materials, and its training time is long, inefficiency.
Material inspection machine kind at present commonly used is many, comprise as: the instrument and the equipment of multimeter, LCR digital electric bridge, transistor checker, capacitance measuring tester, vernier caliper, electronic scale or the like, operation is very complicated concerning detection person.
Therefore, the electronic devices and components detection technique of prior art is comparatively backward, awaits improving and development.
Summary of the invention
The purpose of this utility model is to provide a kind of intelligence test terminal of electronic devices and components, and it is of a great variety to change present testing apparatus, and the tester requires height, and workload is big, is difficult to problems such as management, utilizes automatic measurement module to improve efficient and the accuracy of measuring.
The technical solution of the utility model is as follows:
A kind of intelligence test terminal of electronic devices and components wherein, comprises an embedded central controller or a PC, and is connected with a storage unit that is used for store test results, and a human-machine operation unit that is used for the input operation instruction; Described embedded central controller also has several to be used for the electronic devices and components test module of electronic devices and components test by a digital switch control linkage.
Described intelligence test terminal, wherein, described electronic devices and components test module comprises resistance test module, diode/triode test module and/or amplifier test module at least.
Described intelligence test terminal, wherein, described electronic devices and components test module also comprises length testing module, LRC test module and/or weight test module.
Described intelligence test terminal, wherein, described embedded central controller or PC also are connected with display unit and a button or a touch-screen that is used to show detecting information.
Described intelligence test terminal, wherein, described embedded central controller or PC also be connected with one with the communication unit of external data transmission.
Described intelligence test terminal, wherein, described communication unit setting has USB interface or RS232 interface.
The intelligence test terminal of a kind of electronic devices and components provided by the utility model, owing to adopted embedded controller as the control of core cell realization to whole test terminal, different electronic devices and components have been provided by providing of different test modules, thereby can select corresponding test module to test, and write down test parameter and result automatically, improve testing efficiency and accuracy, realized the robotization of test, be particularly suitable for using in a large number the job shop of electronic devices and components.
Description of drawings
Fig. 1 is the intelligence test terminating circuit principle schematic of the utility model electronic devices and components.
Fig. 2 is the intelligence test end product side view of the utility model electronic devices and components.
Embodiment
Below preferred embodiment of the present utility model is described in detail.
The intelligence test terminal of the utility model electronic devices and components, as shown in Figure 1, it has comprised an embedded central controller, can adopt ARM11 particularly, can realize real-time processing; Control by this embedded central controller, can realize a plurality of electronic devices and components test modules are selected to connect by a digital switch, these electronic devices and components test modules can select to be provided with in resistance test module, diode/triode test module, length testing module, LRC test module, amplifier test module, weight test module and other special purpose test modules one or several, be preferably these test modules all are set.The specific implementation of above-mentioned each test module is that prior art is known, does not repeat them here.Described embedded central controller can be substituted by a PC.
Described embedded central controller also control linkage has a display unit that is used to show detecting information, and the human-machine operation unit that is used to accept operational order, can select the switching of described digital switch by user's operation, thereby realize relevant parameter testing at different electronic devices and components, and can be provided with and connect a button or described display unit is set to touch-screen, so that instruct input operation.In the intelligence test terminal of electronic devices and components described in the utility model, also be provided with a storage unit that is used for the store test results data, an and communication unit that is used for external data transmission, described communication unit can be set have USB interface or RS232 interface, be used for communicating with other equipment.Product design as shown in Figure 2.
The intelligence test end product of the utility model electronic devices and components can be accomplished with no paper office by the various electrical quantitys of real-time, online detected electrons components and parts material, on-line tracing, and complete monitoring promotes quality management and control level.The utility model terminal has reduced tester's technical requirement by intelligent test, has reduced testing staff's configuration, has reduced handling cost, has promoted enterprise competitiveness.
The intelligence test end product of these electronic devices and components can use present state-of-the-art embedded controller (ARM11), handles online data in real time.By each test module of the utility model, all test parameters are transferred to central processing unit, test cell is according to client's needs, can test resistance, conventional components and parts and integrated circuit such as electric capacity, triode, amplifier, test all electrical quantitys; By the processing of central processing unit, be presented in real time on the LCD screen.Operational order requirement according to different clients, on employed 5.6 or 7.0 inches TFT digital screens, the user can combine by human-machine operation unit----button operation and touch-screen, sets relevant technical parameter and operation requirement, as: preserve data time, whether print or the like.The result data that detects is selected storage according to client's needs, and all data all are stored in the storage unit, and storage unit can be SD card or the hard disk that moves, and as the raw readings of test, accomplishes with no paper office.
Be to guarantee the correspondence of test data, can also be provided with on the detected material and have electronic tag, so that follow the tracks of the circulation process of certain batch or some electronic devices and components.
The intelligence test terminal of the utility model electronic devices and components can be carried out record with the process that detects, and by each step that software dictates must be finished, has only through corresponding test process just to go out report, has realized monitoring and detection process scientific, robotization.This terminal can provide friendly operation interface, and detection person can learn by oneself by the help document of reading wherein, has improved efficient, has provided cost savings.
Should be understood that, for those of ordinary skills, can be improved according to the above description or conversion, and all these improvement and conversion all should belong to the protection domain of the utility model claims.
Claims (6)
1. the intelligence test terminal of electronic devices and components is characterized in that, comprises an embedded central controller or a PC, and is connected with a storage unit that is used for store test results, and a human-machine operation unit that is used for the input operation instruction; Described embedded central controller also has several to be used for the electronic devices and components test module of electronic devices and components test by a digital switch control linkage.
2. intelligence test terminal according to claim 1 is characterized in that, described electronic devices and components test module comprises resistance test module, diode/triode test module and/or amplifier test module at least.
3. intelligence test terminal according to claim 2 is characterized in that, described electronic devices and components test module also comprises length testing module, LRC test module and/or weight test module.
4. intelligence test terminal according to claim 1 is characterized in that, described embedded central controller or PC also are connected with display unit and a button or a touch-screen that is used to show detecting information.
5. intelligence test terminal according to claim 1 is characterized in that, described embedded central controller or PC also be connected with one with the communication unit of external data transmission.
6. intelligence test terminal according to claim 5 is characterized in that, described communication unit setting has USB interface or RS232 interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200041412U CN202041591U (en) | 2011-01-08 | 2011-01-08 | Intelligent test terminal for electronic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200041412U CN202041591U (en) | 2011-01-08 | 2011-01-08 | Intelligent test terminal for electronic device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202041591U true CN202041591U (en) | 2011-11-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011200041412U Expired - Fee Related CN202041591U (en) | 2011-01-08 | 2011-01-08 | Intelligent test terminal for electronic device |
Country Status (1)
| Country | Link |
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| CN (1) | CN202041591U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527523A (en) * | 2016-01-14 | 2016-04-27 | 苏州成科自控设备有限公司 | Actuator debugging drive switching device |
| CN109188118A (en) * | 2018-08-01 | 2019-01-11 | 北京群源电力科技有限公司 | A kind of electronic component test device |
-
2011
- 2011-01-08 CN CN2011200041412U patent/CN202041591U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527523A (en) * | 2016-01-14 | 2016-04-27 | 苏州成科自控设备有限公司 | Actuator debugging drive switching device |
| CN109188118A (en) * | 2018-08-01 | 2019-01-11 | 北京群源电力科技有限公司 | A kind of electronic component test device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111116 Termination date: 20140108 |