CN100401085C - Electronic system for testing key - Google Patents
Electronic system for testing key Download PDFInfo
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- CN100401085C CN100401085C CNB2004100897333A CN200410089733A CN100401085C CN 100401085 C CN100401085 C CN 100401085C CN B2004100897333 A CNB2004100897333 A CN B2004100897333A CN 200410089733 A CN200410089733 A CN 200410089733A CN 100401085 C CN100401085 C CN 100401085C
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Abstract
The present invention relates to a test system for the electronic specification of keys. The test system comprises an electronic product to be tested and a microcontrolled device, wherein the electronic product to be tested is provided with at least one key corresponding to a key pin; the microcontrolled device is provided with a test pin connected with the key pin of the electronic product to be tested. A continuous simulating key waveshape which is generated in the test pin of the microcontrolled device is used for testing the electronic product, wherein the simulating key waveshape provides a first site standard of a continuous first time and a second site standard of a continuous second time within a sampling time, and the second time equals to the sampling time subtracted by the first time.
Description
Technical field
The invention relates to a kind of electronics specification test macro of button, refer to a kind of electronics specification test macro of simulating the button of automatic keying function especially.
Background technology
When the button of general test electronic installation, can verify the quality of this electronic installation button usually by artificial mode, under this mechanism, the artificial button deadline normally begins to such an extent that finish with the time of several seconds; Should be for electronic installation to be measured with the level estimate of millisecond and microsecond, it is powerless that manpower will seem.
From the above, during known testing electronic devices button, because the limit of manpower and the action that can't reach high speed button like this, and determinand also will differently because of the duration demand of time will have different test specifications.Therefore,, and can design continuous button waveform generation system, become a problem that needs to be resolved hurrily then according to the duration of determinand required time as the promptly short button time test determinand of millisecond even microsecond how.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of electronics specification test macro of button, can produce continuous analogue-key waveform in the button pin position of electronic product to be measured to test this electronic product, with meet electronic product by bonding electron specification test request, save expending of artificial button simultaneously.
For achieving the above object, the electronics specification test macro of button provided by the invention comprises:
One electronic product to be measured has at least one button, and this button is to there being a button pin position;
One micromonitor system, has a test pin position to be connected to the button pin position of this electronic product to be measured, this micromonitor system produces continuous analogue-key waveform to test this electronic product in this test pin position, wherein, the analogue-key waveform is in a sample time, one first standard that continues the very first time, and second standard of second time of continuing are provided, in the middle of, second time was to deduct this very first time sample time.
First standard of this that wherein this micromonitor system produced is noble potential, and its expression button unclamps, and this second standard is electronegative potential, and its expression button is pressed.
Wherein whether this micromonitor system is to calculate this very first time with one first counting module to arrive, and calculate and whether arrive this sample time with one second counting module, with when this first count module batch total counts up to into, the position standard of analogue-key waveform is changed into second standard by first standard, and when this second count module batch total counts up to into, the position standard of analogue-key waveform is changed into first standard by second standard.
Wherein the second counting module be each millisecond counting once, and behind counting four times, change the position standard of analogue-key waveform.
Wherein the first counting module is that per 128 microseconds are counted once, and behind counting four times, the position that changes the analogue-key waveform is accurate.
Description of drawings
Fig. 1 is a preferred embodiment of the electronics specification test macro of button of the present invention.
Fig. 2 shows according to analogue-key waveform of the present invention.
Fig. 3 (A), (B) reach the master routine that (C) shows respectively according to micromonitor system of the present invention, the counting procedure and second of the first counting module is counted the flow process of the counting procedure of module.
Embodiment
For more understanding technology contents of the present invention, be described as follows especially exemplified by a preferred embodiment:
Fig. 1 shows a preferred embodiment of the electronics specification test macro of button of the present invention, it comprises a micromonitor system 11 and an electronic product 12 to be measured, micromonitor system 11 has a test pin position 111, electronic product 12 to be measured has at least one button 121, and 121 pairs of each buttons should have a button pin position 122.
The test pin position 111 of aforementioned micromonitor system 11 is connected to the button pin 122 of this electronic product 12 to be measured, and this micromonitor system 11 is to produce continuous analogue-key waveform 13 with the time counting of the first counting module 115 and the second counting module 116 in this test pin position, to test the corresponding button 121 of this electronic product 12.
For meet electronic product by bonding electron specification test request, as shown in Figure 2, aforementioned analogue-key waveform 13 is in a sample time S, and high levels that a duration T unclamps with the expression button, and the low level pressed with the expression button of duration S-T are provided.In addition, can also low level represent that button is pressed, high levels represents that button unclamps.Generally speaking, electronic installation is the level estimate with millisecond (ms) and microsecond (us), for example: sample time S=A * 1ms, duration T=B * 128us of unclamping of expression button, wherein A and B are positive integer, it can be adjusted according to the electronics specification.
For producing aforesaid analogue-key waveform 13, (A) of Fig. 3, (B) reach the master routine that (C) shows aforementioned micromonitor system 11 respectively, the counting procedure of the counting procedure of the first counting module 115 and the second counting module 116, in this micromonitor system 11, the counting procedure of the counting procedure of the first counting module 115 and the second counting module 116 is the timing interrupt routine, it interrupts master routine and is triggered and automatically performs after calculating a special time, wherein, the counting procedure of the first counting module 115 is that every 128us is triggered and automatically performs once, and the counting procedure of the second counting module 116 is that every 1ms is triggered and automatically performs once.
As shown in Figure 3, aforementioned master routine is that A and B are initialized as A=4, B=0, and test pin position 111 is initially set high levels, continues afterwards whether detecting A value is 0, and when A=0, A is made as 4 and will to test pin position setting be high levels again.
Be triggered and when carrying out at the counting procedure of the aforementioned first counting module 115, whether its detecting test pin position 111 is high levels, as otherwise return master routine, in this way, the B value is added 1 and detect the B value and whether reached 5, as otherwise return master routine, also will test pin position 111 is made as low level then the B value to be made as 0 in this way, owing to the counting procedure of the first counting module 115 is that every 128us is triggered and carries out once, therefore whether the first counting module 115 is to arrive in order to calculate the duration T that this expression button unclamps as can be known, that is, counting procedure at the first counting module 115 is triggered and after carrying out B=4 time, learn that duration T=4 * 128us arrives, and change the position standard of analogue-key waveform 13 into low level by high levels.
Be triggered and when carrying out at the counting procedure of the aforementioned second counting module 116, whether its detecting A value is 0, as denying, the A value is subtracted 1, then return master routine in this way, owing to the counting procedure of the second counting module 116 is that every 1ms is triggered and carries out once, therefore whether the second counting module 116 is to arrive in order to calculate this sample time S as can be known, that is, counting procedure at the second counting module 116 is triggered and after carrying out A=4 time, learn that sample time, S=4 * 1ms arrived, after returning master routine, change high levels into by low level with the position of analogue-key waveform 13 is accurate.So, just can produce continuous analog button waveform 13 up to specification in the test pin position 111 of this micromonitor system 11 by the counting procedure of aforementioned master routine, the first counting module 115 and the counting procedure of the second counting module 116, and can test the corresponding button 121 of electronic product 12.
By above explanation as can be known, the electronics specification test macro of button of the present invention is the continuous analog button waveform of being given birth to ms and us grade by micromonitor system from movable property, and can very verify the electronics specification of button accurately, also can be as efficient key testing instrument of designer, and can arbitrarily adjust the analogue-key waveform and have suitable elasticity.
The foregoing description is only given an example for convenience of description, and the interest field that the present invention advocated should be as the criterion so that claim is described certainly, but not only limits to the foregoing description.
Claims (5)
1. the electronics specification test macro of a button comprises:
One electronic product to be measured has at least one button, and this button is to there being a button pin position;
One micromonitor system, has a test pin position to be connected to the button pin position of this electronic product to be measured, this micromonitor system produces continuous analogue-key waveform to test this electronic product in this test pin position, wherein, the analogue-key waveform is in a sample time, one first standard that continues the very first time, and second standard of second time of continuing are provided, in the middle of, second time was to deduct this very first time sample time.
2. the electronics specification test macro of button according to claim 1 is characterized in that first standard of this that wherein this micromonitor system produced is noble potential, and its expression button unclamps, and this second standard is electronegative potential, and its expression button is pressed.
3. the electronics specification test macro of button according to claim 1, it is characterized in that, wherein whether this micromonitor system is to calculate this very first time with one first counting module to arrive, and calculate and whether arrive this sample time with one second counting module, with when this first count module batch total counts up to into, the position standard of analogue-key waveform is changed into second standard by first standard, and when this second count module batch total counts up to into, the position standard of analogue-key waveform is changed into first standard by second standard.
4. as the electronics specification test macro of button as described in the claim 3, it is characterized in that, wherein the second counting module be each millisecond counting once, and behind counting four times, change the position standard of analogue-key waveform.
5. the electronics specification test macro of button according to claim 1 is characterized in that, wherein the first counting module be per 128 microseconds counting once, and behind counting four times, change the position standard of analogue-key waveform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100897333A CN100401085C (en) | 2004-11-03 | 2004-11-03 | Electronic system for testing key |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100897333A CN100401085C (en) | 2004-11-03 | 2004-11-03 | Electronic system for testing key |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1769917A CN1769917A (en) | 2006-05-10 |
| CN100401085C true CN100401085C (en) | 2008-07-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100897333A Expired - Fee Related CN100401085C (en) | 2004-11-03 | 2004-11-03 | Electronic system for testing key |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100401085C (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105511998A (en) * | 2015-11-25 | 2016-04-20 | 英业达科技有限公司 | Detection device of universal serial bus ports |
| CN105572507A (en) * | 2016-01-12 | 2016-05-11 | 中国信息安全测评中心 | Automation test circuit and method for key-type equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11296407A (en) * | 1998-04-10 | 1999-10-29 | Nec Corp | Recording/reproducing for key operation in program test and operation recognition system/method |
| CN1257241A (en) * | 1998-12-17 | 2000-06-21 | 英群企业股份有限公司 | Keyboard test system |
| CN1258034A (en) * | 1998-12-18 | 2000-06-28 | 英群企业股份有限公司 | Keyboard tester |
| JP2001086236A (en) * | 1999-09-13 | 2001-03-30 | Iwatsu Electric Co Ltd | Method and device for testing key telephone set |
| CN2611956Y (en) * | 2003-01-02 | 2004-04-14 | 英业达股份有限公司 | Tester for control key service time of notebook computer |
| CN1512189A (en) * | 2002-12-28 | 2004-07-14 | 鸿富锦精密工业（深圳）有限公司 | Key detector and method |
-
2004
- 2004-11-03 CN CNB2004100897333A patent/CN100401085C/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11296407A (en) * | 1998-04-10 | 1999-10-29 | Nec Corp | Recording/reproducing for key operation in program test and operation recognition system/method |
| CN1257241A (en) * | 1998-12-17 | 2000-06-21 | 英群企业股份有限公司 | Keyboard test system |
| CN1258034A (en) * | 1998-12-18 | 2000-06-28 | 英群企业股份有限公司 | Keyboard tester |
| JP2001086236A (en) * | 1999-09-13 | 2001-03-30 | Iwatsu Electric Co Ltd | Method and device for testing key telephone set |
| CN1512189A (en) * | 2002-12-28 | 2004-07-14 | 鸿富锦精密工业（深圳）有限公司 | Key detector and method |
| CN2611956Y (en) * | 2003-01-02 | 2004-04-14 | 英业达股份有限公司 | Tester for control key service time of notebook computer |
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| Publication number | Publication date |
|---|---|
| CN1769917A (en) | 2006-05-10 |
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