CN100375235C - Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area - Google Patents

Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area Download PDF

Info

Publication number
CN100375235C
CN100375235C CNB2005100045732A CN200510004573A CN100375235C CN 100375235 C CN100375235 C CN 100375235C CN B2005100045732 A CNB2005100045732 A CN B2005100045732A CN 200510004573 A CN200510004573 A CN 200510004573A CN 100375235 C CN100375235 C CN 100375235C
Authority
CN
China
Prior art keywords
silicon
silicon dioxide
nanowires
silicon nanowires
growing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2005100045732A
Other languages
Chinese (zh)
Other versions
CN1808688A (en
Inventor
王晓欣
王启明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Semiconductors of CAS
Original Assignee
Institute of Semiconductors of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Semiconductors of CAS filed Critical Institute of Semiconductors of CAS
Priority to CNB2005100045732A priority Critical patent/CN100375235C/en
Publication of CN1808688A publication Critical patent/CN1808688A/en
Application granted granted Critical
Publication of CN100375235C publication Critical patent/CN100375235C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Silicon Compounds (AREA)

Abstract

The present invention relates to a growth controlling method for preparation of silicon dioxide or silicon nanowires in large area. The present invention comprises the following procedures: step 1, the underlay of a single crystal silicon wafer is deposited with an amorphous film with the method of physical vapor deposition, magnetron sputtering or chemical vapour deposition; step 2, then flowing mixed gas of N2 and Ar or N2, H2 and Ar and H2 are charged into a reaction cavity of a sealing quartz tube as protective gas; step 3, the single crystal silicon wafer with the amorphous film is directly annealed to be deposited, and the silicon substrate is grown with the silicon dioxide/the silicon nanowires in large area; step 4, the deposited amorphous silicon oxide film is provided with a slot which is exposed out of the substrate of the single crystal silicon with photo-etch process and wet etching, and the width of the slot is the width a plurality of microns; step 5, then the flowing protective gas is charged into a reaction chamber of the sealing quartz tube, and the substrate of the single crystal silicon is orderly grown with the silicon dioxide/the silicon nanowires in large area in the direction which is perpendicular to the slot.

Description

The control growing method of large-area preparation silicon dioxide or silicon nanowires
Technical field
The present invention relates to a kind of preparation method of low-dimension nano material, the method for particularly a kind of large-area preparation silicon dioxide or silicon nanowires and control growing thereof belongs to nano material preparation and applied technical field.
Background technology
Silicon materials at traditional microelectronic industry in occupation of critical role, silicon nanowires is as the one-dimensional nano structure of silicon, because of its band structure, optics and electrons transport property, very big application prospect is arranged aspect (light) electronic device, interconnection line, the senser element and become a big research focus receiving.The amorphous carbon/silicon dioxide nano wire is observed strong blue light because of it in room temperature, also can be used widely in the integrated electro field of nanometer devices, receives much concern equally.Nanometer silica line can pass through silica white nano-wire, perhaps adopts low vacuum degree to obtain in preparation silicon nanowires process, so the preparation method of silicon nanowires and nanometer silica line is similar.The conventional method for preparing the silicon/silicon dioxide nano wire is divided into top-down template, as the Lithographic template method [referring to the special application number 03141848.1 of China, publication number CN 1474434A] and self-assembly method from bottom to top, as metal catalytic VLS (Vapor-liquid-solid) mechanism [referring to Chinese patent application number 02104179.2, publication number CN 1382626A].Oxide assisting growth OAG (Oxide-assisted growth) the self assembly mechanism that proposes is to adopt high temperature evaporation or pulse to swash ablation SiO recently 2With Si mixed-powder or SiO high-purity powder, collect a kind of straightforward procedure of silicon/silicon dioxide nano wire [referring to R.Q.Zhang from chamber wall or substrate, Y.Lifshitz and S.T.Lee, Adv.Mater., 15,635 (2003)], advantage is to avoid adopting metal or metallic compound as catalyst, but incompatible with silicon planar technique technology.
The controllable growth of nano wire is the necessary condition that realizes nanometer (light) electric device.The orderly preparation and the controllable growth of nano wire mainly contain Lithographic template method [referring to the special application number 03141848.1 of China, publication number CN 1474434A] and alumina formwork method [referring to the special application number 01113646.4 of China, publication number CN 1323051A] at present.The former is strict to process equipment, and generation yields poorly, the cost height; Latter's preparation process complexity, operation are difficult for grasping.
Summary of the invention
The control growing method that the purpose of this invention is to provide large-area preparation silicon dioxide or silicon nanowires has that technology and equipment are simple, heat treatment temperature is low, growth in situ, and controllable doped P type or N type are with advantages such as silicon integrated technique compatibilities.
The control growing method of a kind of large-area preparation silicon dioxide of the present invention or silicon nanowires is characterized in that, comprises the steps:
Step 1: on the monocrystalline silicon piece substrate, deposit one deck noncrystalline membrane with physical vaporous deposition, magnetron sputtering method or chemical vapour deposition technique;
Step 2: use photoetching process and wet etching on the amorphous state silicon oxide film of deposition, leave several microns wide groove, expose monocrystalline substrate;
Step 3: in airtight quartz ampoule reaction chamber, charge into mobile N then 2, Ar or N 2And H 2, Ar and H 2Mist is as protective gas;
Step 4: annealing back vertical trench direction ordering growth on monocrystalline substrate goes out large-area silica/silicon nano wire.
Wherein the thickness of noncrystalline membrane is 10~600nm, and noncrystalline membrane is SiO xThe material of 0<X≤2 wherein.
Wherein the flow of protective gas is 50~500sccm.
Annealing temperature wherein is under 1000~1300 ℃ of temperature, and the time is 1~5hrs.
The large-area silica/silicon nano wire that wherein grows on monocrystalline substrate is of a size of 10mm * 10mm, and the diameter of its nano wire is at 20~100nm, and length surpasses 100 μ m.
Wherein during grow silicon nanowires, the reative cell vacuum remains on 200~500Torr.
Beneficial effect of the present invention is:
1. do not need metal or metallic compound to make catalyst, products therefrom has very high-purity;
2. growth in situ is with silicon integrated technique compatibility;
3. control the method output height of nanowire growth, cost is low, and is simple to operate.
In addition, at deposited amorphous attitude SiO xCan mix elements such as B or P in the film, realize the preparation of large-area P type or N type silica/silicon nano wire, very important application prospect be arranged at microelectronics and nano-electron field.
Description of drawings
For further specifying concrete technology contents of the present invention, below in conjunction with embodiment and accompanying drawing describes in detail as after, wherein:
Fig. 1 is a flow chart of the present invention.
Fig. 2 is a large tracts of land nanometer silica line scanning electron microscope image of the present invention.
Fig. 3 is the scanning electron microscope image of control large tracts of land nanometer silica line growth of the present invention.
Specific embodiments
The invention will be further described below in conjunction with embodiment
The present invention is with deposited amorphous attitude SiO xThe monocrystalline silicon of (0<X≤2) film places the closed quartz tube reative cell that is filled with the protective gas that flows, and 1~5hrs anneals under 1000~1300 ℃ of temperature.Require airtight quartz ampoule reative cell to vacuumize during the preparation silicon nanowires, in the annealing process, the reative cell vacuum remains on 200~500Torr.Will be during control silica/silicon nanowire growth at amorphous state SiO xLeave groove with photoetching process and wet etching on (0<X≤2) film, then annealing.The size of nano wire and the area of growth are by annealing time and temperature control.
See also Fig. 1, Fig. 1 is a flow chart of the present invention, and the control growing method of a kind of large-area preparation silicon dioxide of the present invention or silicon nanowires comprises the steps:
The control growing method of a kind of large-area preparation silicon dioxide or silicon nanowires is characterized in that, comprises the steps:
Step 1: on the monocrystalline silicon piece substrate, deposit one deck noncrystalline membrane with physical vaporous deposition, magnetron sputtering method or chemical vapour deposition technique;
Step 2: use photoetching process and wet etching on the amorphous state silicon oxide film of deposition, leave several microns wide groove, expose monocrystalline substrate;
Step 3: in airtight quartz ampoule reaction chamber, charge into mobile N then 2, Ar or N 2And H 2, Ar and H 2Mist is as protective gas;
Step 4: annealing back vertical trench direction ordering growth on monocrystalline substrate goes out large-area silica/silicon nano wire.
Embodiment
One, SiO xFilm is in capacitance coupling type ultra high vacuum plasma enhanced chemical vapor deposition (PECVD) system, with SiH 4(concentration 15%, Ar dilution) and N 2O is a reacting gas, prepares at (100) Si sheet of handling through RCA.System response initial vacuum 1 * 10 -5Torr, pressure 110mtorr in the reaction, 200 ℃ of underlayer temperatures.Adjust SiH 4And N 2O flow-rate ratio 50/5, radio-frequency power 50W, growth time 30min deposits SiO on the single crystalline Si substrate 0.94Noncrystalline membrane.
Two, be heating source with the tubular horizontal resistance furnace, in airtight quartz ampoule reative cell, charge into mobile N 2/ H 2Mist is as protective gas, and its flow is respectively 500sccm and 25sccm, and the 2hrs that anneals under 1150 ℃ of temperature is at deposited amorphous attitude SiO 0.94Obtain the above large-area nanometer silica line of 10mm * 10mm on the monocrystalline substrate of film, the diameter of its nano wire is about 50nm (consulting Fig. 2);
Three, be heating source with the tubular horizontal resistance furnace, in airtight quartz ampoule reative cell, be evacuated, charge into mobile N during annealing 2And H 2Mist is as protective gas, and its flow is respectively 500sccm and 25sccm, the 2hrs that under 1150 ℃ of temperature, anneals, and the reative cell vacuum remains on 300Torr.At deposited amorphous attitude SiO 0.94Obtain large-area silicon nanowires on the monocrystalline substrate of film, the diameter of its nano wire is about 50nm;
Four, at deposited amorphous attitude SiO 0.94The monocrystalline silicon piece gluing photoetching of film forms the mask of the wide groove of 5 μ m, with hydrofluoric acid cushioning liquid corrosion SiO 0.94Film, till monocrystalline substrate is exposed at definite groove place, the deposition SiO that wet etching is crossed then 0.94It is in the airtight quartz ampoule reative cell of heating source that the monocrystalline silicon piece of film places with the tubular horizontal resistance furnace, charges into mobile N 2And H 2Mist is as protective gas, and its flow is respectively 500sccm and 25sccm, the 1h that under 1150 ℃ of temperature, anneals, and vertical trench direction ordering growth goes out large-area nanometer silica line on the monocrystalline silicon baseplane; When the growth of control silicon nanowires, require airtight quartz ampoule reative cell to vacuumize, in the annealing process, the reative cell vacuum remains on 300Torr, and vertical trench direction ordering growth goes out large-area silicon nanowires (consulting Fig. 3) on the monocrystalline silicon baseplane.

Claims (6)

1. the control growing method of large-area preparation silicon dioxide or silicon nanowires is characterized in that, comprises the steps:
Step 1: on the monocrystalline silicon piece substrate, deposit one deck noncrystalline membrane with physical vaporous deposition, magnetron sputtering method or chemical vapour deposition technique;
Step 2: use photoetching process and wet etching on the amorphous state silicon oxide film of deposition, leave several microns wide groove, expose monocrystalline substrate;
Step 3: in airtight quartz ampoule reaction chamber, charge into mobile N then 2, Ar or N 2And H 2, Ar and H 2Mist is as protective gas;
Step 4: annealing back vertical trench direction ordering growth on monocrystalline substrate goes out large-area silica/silicon nano wire.
2. the control growing method of large-area preparation silicon dioxide according to claim 1 or silicon nanowires is characterized in that, wherein the thickness of noncrystalline membrane is 10~600nm, and noncrystalline membrane is SiO xThe material of 0<X≤2 wherein.
3. large-area preparation silicon dioxide according to claim 1 or silicon nanowires control growing method is characterized in that wherein the flow of protective gas is 50~500sccm.
4. large-area preparation silicon dioxide according to claim 1 or silicon nanowires control growing method is characterized in that, annealing temperature wherein is under 1000~1300 ℃ of temperature, and the time is 1~5hrs.
5. large-area preparation silicon dioxide according to claim 1 or silicon nanowires control growing method, it is characterized in that, the large-area silica/silicon nano wire that wherein grows on monocrystalline substrate is of a size of 10mm * 10mm, the diameter of its nano wire is at 20~100nm, and length surpasses 100 μ m.
6. large-area preparation silicon dioxide according to claim 1 or silicon nanowires control growing method is characterized in that, wherein during grow silicon nanowires, the reative cell vacuum remains on 200~500Torr.
CNB2005100045732A 2005-01-18 2005-01-18 Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area Expired - Fee Related CN100375235C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2005100045732A CN100375235C (en) 2005-01-18 2005-01-18 Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2005100045732A CN100375235C (en) 2005-01-18 2005-01-18 Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area

Publications (2)

Publication Number Publication Date
CN1808688A CN1808688A (en) 2006-07-26
CN100375235C true CN100375235C (en) 2008-03-12

Family

ID=36840499

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005100045732A Expired - Fee Related CN100375235C (en) 2005-01-18 2005-01-18 Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area

Country Status (1)

Country Link
CN (1) CN100375235C (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101337654B (en) * 2007-07-04 2010-04-21 中国科学院合肥物质科学研究院 Micron grade blocky silicone base composite body assembled by silicon oxide or willemite nano-wires and method for preparing same
WO2009032413A1 (en) 2007-08-28 2009-03-12 California Institute Of Technology Method for reuse of wafers for growth of vertically-aligned wire arrays
EP2507842A2 (en) 2009-11-30 2012-10-10 California Institute of Technology Three-dimensional patterning methods and related devices
WO2011156042A2 (en) 2010-03-23 2011-12-15 California Institute Of Technology Heterojunction wire array solar cells
US9545612B2 (en) 2012-01-13 2017-01-17 California Institute Of Technology Solar fuel generator
US9476129B2 (en) 2012-04-02 2016-10-25 California Institute Of Technology Solar fuels generator
US10026560B2 (en) 2012-01-13 2018-07-17 The California Institute Of Technology Solar fuels generator
WO2013126432A1 (en) 2012-02-21 2013-08-29 California Institute Of Technology Axially-integrated epitaxially-grown tandem wire arrays
WO2013152132A1 (en) 2012-04-03 2013-10-10 The California Institute Of Technology Semiconductor structures for fuel generation
US9553223B2 (en) 2013-01-24 2017-01-24 California Institute Of Technology Method for alignment of microwires
CN103950932A (en) * 2014-04-16 2014-07-30 奇瑞汽车股份有限公司 Preparation method of high-purity orderly semiconductor silicon nanowire
CN106276922B (en) * 2016-08-10 2022-06-10 渤海大学 Cross vertical SiO2Nano-rod and preparation method thereof
CN110118806A (en) * 2019-05-29 2019-08-13 兰州大学 Ceramic Tube Type gas sensor and preparation method thereof
CN114167599B (en) * 2021-11-01 2023-11-07 中山大学 Image integrated super-structured surface and design method thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1323051A (en) * 2001-05-28 2001-11-21 东南大学 Prepn of ordered nanometer carbon pipe array on silicon chip
CN1382626A (en) * 2002-03-15 2002-12-04 清华大学 Process for synthesizing nano linear carbon array
CN1474434A (en) * 2003-07-25 2004-02-11 中国科学院上海微系统与信息技术研究 Method for producing silicon nano wire
US20040118698A1 (en) * 2002-12-23 2004-06-24 Yunfeng Lu Process for the preparation of metal-containing nanostructured films

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1323051A (en) * 2001-05-28 2001-11-21 东南大学 Prepn of ordered nanometer carbon pipe array on silicon chip
CN1382626A (en) * 2002-03-15 2002-12-04 清华大学 Process for synthesizing nano linear carbon array
US20040118698A1 (en) * 2002-12-23 2004-06-24 Yunfeng Lu Process for the preparation of metal-containing nanostructured films
CN1474434A (en) * 2003-07-25 2004-02-11 中国科学院上海微系统与信息技术研究 Method for producing silicon nano wire

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Oxide-assisted growth of semiconducting nanowires. Rui-Qin Zhang, Yeshayahu Lifshitz, Shuit-Tong Lee.Advanced Materials,Vol.15 No.7-8. 2003 *

Also Published As

Publication number Publication date
CN1808688A (en) 2006-07-26

Similar Documents

Publication Publication Date Title
CN100375235C (en) Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area
CN101550531B (en) Method for preparing silicon nano structures
CN100402432C (en) Localized growth method of nanowire array of copper oxide
CN103924298A (en) Gallium oxide heterogeneous structure as well as growth method and special device thereof
CN101913907A (en) Method for preparing ZnO nanorod/microrod crystals with accurate controllable growth position on substrate
CN112875742A (en) Gallium oxide nanotube and preparation method and application thereof
CN107140681A (en) β‑Ga2O3The preparation method of micro belt
CN103400760A (en) Method and device for growing bismuth selenide single crystal film on silicon substrate
CN109207957A (en) A kind of MoS2/MoO2The preparation method of hetero-junctions
CN103531447A (en) Method for reducing defect density of gallium nitride nanowire array crystal
CN110010449B (en) Method for efficiently preparing one-dimensional carbon nanotube/two-dimensional transition metal chalcogenide heterojunction
US8197598B2 (en) Method for manufacturing iron silicide nano-wires
Hsueh et al. CuO-nanowire field emitter prepared on glass substrate
CN101845619B (en) Method for preparing ZnO nano needle arrays
CN102432060A (en) Method for quickly preparing zinc oxide nanobelt under air atmosphere
CN104695020B (en) A kind of strip InAs nano belt and its preparation and application
CN102162135A (en) Preparation method of ZnS/Si nuclear-shell nanowires or nanobelts and polycrystal Si tubes
CN105529242B (en) A kind of method for preparing bead string shape monocrystalline silicon nano line
CN102030327A (en) Method for preparing silicon nano-wire by pulsed laser ablation
CN102304699A (en) Preparation method of Mn-doped AlN diluted magnetic semiconductor nanorod array
CN100357499C (en) Method of preparing room temperature ferromagnetism Zn(1-X)Mn(X)O diluted magnetic semiconductor nano-line
CN109336180B (en) Method for growing ultra-long molybdenum oxide nanobelts
CN104401936B (en) A kind of method at substrate level direction controllable growth carbon nano-tube bundle
CN108315815A (en) A kind of preparation method of antimony alkene
CN102891073B (en) Preparation method of low-temperature plasma auxiliary aluminum induced polycrystalline silicon carbide film

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee