CN100365494C - LCD device of thin film transistor possessing function of restoring disconnection, and detection circuit with high impedance - Google Patents
LCD device of thin film transistor possessing function of restoring disconnection, and detection circuit with high impedance Download PDFInfo
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- CN100365494C CN100365494C CNB2004101016573A CN200410101657A CN100365494C CN 100365494 C CN100365494 C CN 100365494C CN B2004101016573 A CNB2004101016573 A CN B2004101016573A CN 200410101657 A CN200410101657 A CN 200410101657A CN 100365494 C CN100365494 C CN 100365494C
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Abstract
The present invention relates to a thin film transistor liquid crystal display with a broken wire repairing function and a high impedance detection circuit thereof. The thin film transistor liquid crystal display with a broken wire repairing function is provided with a repairing circuit, and the repairing circuit comprises a repairing operation amplifier and the high impedance detection circuit; the high impedance detection circuit is used for detecting the input end state of the operation amplifier; when the input end state has a signal by detection, the high impedance detection circuit enables a control signal to enable the operation amplifier; when the input state has no signal by detection, the high impedance detection disenables the control signal to close the operation amplifier so as to avoid the phenomenon of competition generated between the output of the operation amplifier and the output of other operation amplifiers.
Description
Technical field
The invention relates to a kind of Thin Film Transistor-LCD and detection circuit with high impedance of tool reparation broken string ability.
Background technology
LCD (Liquid Crystal Display is hereinafter to be referred as LCD) has the little and lightweight characteristic of volume, so it is a main flow Portable display; Again because of the declining to a great extent of its price, thus the medium and small-sized display of tool market potential become, and most popular with Thin Film Transistor-LCD (Thin Film Transistor Liquid Crystal Display is hereinafter to be referred as TFT-LCD).
Among the general TFT-LCD, a shared electrode base board and an active-matrix substrate oppose and put, and liquid crystal material is folded between this two substrate.As shown in Figure 1, an active-matrix substrate 10 is provided with the matrix circuit of many data lines 12 and multi-strip scanning line 13 formations.These data lines 12 are vertically equidistantly put on this substrate 10, and these sweep traces 13 level on this substrate 10 is equidistantly put.Vertically to constituting the pixel 14 that many matrix forms are arranged with level to data line 12 that is provided with and sweep trace 13, these pixels constitute a viewing area 11 for these.Wherein be separated by with an insulation course (not shown) between these data lines 12 and these sweep traces 13, do not join so constitute pixel 14 though be perpendicular to one another setting.An all corresponding metal-oxide half field effect transistor of each pixel 14 (MOSFET) and a liquid crystal capacitance and a storage capacitors (not shown).The gate of each MOSFET is connected with a corresponding scanning line, and its source electrode is connected with a corresponding data line, and its drain is connected with this two electric capacity, and the other end of this two electric capacity is ground connection then.When power supply was delivered in this Thin Film Transistor-LCD, this MOSFET was these data lines 12 and sweep trace 13 controls, and controlled the brightness of respective pixel by these electric capacity.For making each pixel 14 show required picture, the circuit 12,13 that drives these MOSFET need by a data line driver element 16,16 ' and one scan line driver element 15 driven.
With large scale product trend, these circuits are all made thin as much as possible with ccontaining more longer circuits, thus circuit have because of process technique and other factor cause open circuit may.When circuit had the part of opening circuit, the pixel of the latter half circuit control of being opened circuit by this tool just can not be luminous.The bad pixel of a little can be the LCD specification and accepts, but too much pixel can't luminously just make this LCD become bad product, and therefore a large amount of bad products is just thrown aside.In view of this, therefore the technology of various reparation circuits just proposes, and below will introduce a kind of circuit recovery technique the most commonly used.
Figure 2 shows that the Thin Film Transistor-LCD of known tool reparation broken string ability.As shown in Figure 2, on the substantially identical substrate 10 with active-matrix substrate shown in Figure 1, the data line 28 in the data line 12 disconnect and form two segment data lines 28 ', 28 ".After data line driver element 16 is sent document signal, only data line 28 ' document signal deliver among its corresponding pixel MOSFET.For repairing this data line 28 that opens circuit, this TFT-LCD utilize repair operational amplifier 24,24 ' (in fact can be a plurality of, among the figure quantity only for explanation with) and repair reparation circuit that circuit 26,27 forms and make data line 28 and " also can receive due document signal.Contact a, c, e, f only just make its conducting with the laser processing mode in normal all not conductings down when needs are repaired.B point and d point then panel make initial the time just conducting, the error when using reduction and handling because of laser causes defective products.In addition, the open circles among the figure is meant that contact does not have conducting, and filled circles is meant the contact conducting.
In the figure, clearer for making drawing explanation, sweep trace do not show, is the example explanation with the tool partial data line reparation of opening circuit only.Whether and break in these data lines 12 is that the test cell (also showing among the figure) that provides with an outside is tested.When this data line 28 is detected as broken string, then select less nearer reparation operational amplifier 24 of RC load and reparation circuit 26,27 to come repair data line 28.Repair circuit 26 and be located at the last periphery of this matrix viewing area 11,27 in reparation circuit is established around this matrix viewing area.When this data line 28 is detected as when broken string, nearer reparation operational amplifier 24 can with repair the condition that circuit 26,27 is connected under provide repair to this data line 28.The output contact c of 16 pairs of data lines 28 of data line driver element repairs circuit 26 with input end earlier and joins, the input end of repairing operational amplifier 24 then joins with contact a with input end reparation circuit 26, to be received from the document signal that this data line driver element 16 is provided.Contact e and the data line 28 of then output terminal being repaired circuit 27 " join.Therefore, the signal of the data line 28 of data line driver element 16 can be via repairing operational amplifier 24 and output to data line part 28 " corresponding pixel MOSFET.In brief, because of these data line 28 broken strings, therefore this data line 28 is only at its data line 28 ' can receive the document signal of data line driver element 16 outputs, data line 28 " then need mat repair circuit can receive its should receive document signal, providing of the above-mentioned transit route of mat can be reached this purpose.
In the figure, the tool partial data line 28 that opens circuit is one, but in fact the tool partial data line that opens circuit has many, but recoverable data line quantity by the reparation circuit that provided, repair operational amplifier quantity and limited; Though sweep trace is not shown among the figure, tool open circuit the part sweep trace also can equivalent way be repaired.These repair operational amplifiers 24,24 ' be actually be located at data line driver element 16,16 ' in, its position in graphic is for convenience of description.In addition, the formation of above-mentioned contact a, b, c, d and e is able to laser welding modes such as (laser fuse) for it.
Panel make initial the time output terminal of a plurality of operational amplifiers will be connected to same output terminal and repair on the circuit 27.So having done following points considers:
One, if broken string occurs in a certain side, the signal that the technology that then can utilize laser to weld will break is connected to the operational amplifier input end near this side, and by this operational amplifier generation reparation signal, so can reduce operational amplifier output terminal to the distance between the broken string, and effectively reduce the load (loading) that output terminal is seen, reduce the probability of repairing failure.
Two, because the laser welding needs extra processing procedure (process step), and the problem of yield arranged, therefore the output terminal that is about to a plurality of operational amplifiers when panel is made is connected to same output terminal and repairs circuit, except the cost (cost) that can reduce extra processing procedure, the problem that also can avoid yield to reduce.
Three, if one group is repaired line and only connects an operational amplifier, can cause because of the reparation line is many more, and strengthen the distance of glass visible area to glass edge.
Reduce the product fraction defective though above-mentioned recovery technique can provide with repair function data line 28 really, still there is shortcoming in it.Operational amplifier 24 ' make its input end f suspension joint because of not needing repair data line 28, so will make it uncertain output be arranged at output terminal d, this output will form output competition (output competition) with operational amplifier 24, so the signal potentially unstable on the output terminal reparation circuit or incorrect makes that receiving these color of pixel of repairing the output signal of operational amplifiers has deviation.
Summary of the invention
In view of the problems referred to above, the objective of the invention is to propose a kind of Thin Film Transistor-LCD of tool function of restoring disconnection.
For reaching above-mentioned purpose, the Thin Film Transistor-LCD of tool function of restoring disconnection of the present invention has that a plurality of data line driver elements drive many data lines, a plurality of scanning line driving unit drives the multi-strip scanning line and many groups are repaired the data line that circuit is repaired broken string.Repairing circuit for every group comprises: at least one input end is repaired circuit, when having broken string to repair, is connected to the data line of a broken string of a plurality of data line driver elements; A plurality of operational amplifiers, each operational amplifier have an input end, an output terminal and a control end, and its input end is when having broken string to repair, and one of them operational amplifier is connected to input end and repairs circuit; One high impedance detecting module, it is the input end suspension joint and export the output function that control signal is controlled each operational amplifier respectively whether of a plurality of operational amplifiers of detecting, when the input end that detects operational amplifier is suspension joint with the control signal forbidden energy of correspondence, when the input end that detects operational amplifier has voltage with the control signal activation of correspondence; And at least one output terminal repair circuit, every output terminal is repaired circuit and is connected with the output terminal of each operational amplifier.Wherein, operational amplifier also receives the control signal of high impedance detecting module, and when this control signal during by forbidden energy, the output of this operational amplifier is set to high impedance status, and when this control signal was enabled, this operational amplifier came output signal according to the signal of input end; The high impedance detecting module can comprise a plurality of high impedance detecting units, and the signal that receives each input end of repairing operational amplifier respectively is as test signal, and suspension joint and the signal that outputs test result are respectively controlled the output state that each repairs operational amplifier as operating control signal to detect this test signal.
For reaching above-mentioned purpose, the present invention also provides a kind of Thin Film Transistor-LCD of tool function of restoring disconnection, this LCD has at least one scanning line driving unit and drives that multi-strip scanning line, at least one data line driver element drive many data lines and many groups are repaired the sweep trace that circuit is repaired broken string, repairing circuit for every group comprises: at least one input end is repaired circuit, when having broken string to repair, be connected to the broken string sweep trace of a scanning line driving unit of aforementioned at least one scanning line driving unit; A plurality of reparation operational amplifiers, each is repaired operational amplifier and has an input end, an output terminal and a control end, and when having broken string to repair, one of them input end of repairing operational amplifier is connected to aforementioned input end reparation circuit; One high impedance detecting module, it is the input end suspension joint and export an operating control signal respectively and control the state output terminal that each repairs operational amplifier whether of the aforementioned a plurality of reparation operational amplifiers of detecting, wherein, when detecting the input end of repairing operational amplifier operating control signal forbidden energy with correspondence when being floating, when detecting the operating control signal activation with correspondence when voltage is arranged of the input end of repairing operational amplifier; And at least one output terminal repair circuit, every output terminal is repaired circuit and is connected with the output terminal of each aforementioned reparation operational amplifier; Wherein, aforementioned reparation operational amplifier also receives the operating control signal of aforementioned high impedance detecting module, and when this operating control signal during by forbidden energy, the output of this reparation operational amplifier is set to high impedance status, and when this operating control signal was enabled, this operational amplifier came output signal according to the signal of input end.
Another object of the present invention is to propose a kind of detection circuit with high impedance, it is whether be used for detecting a contact be high impedance, can apply to the Thin Film Transistor-LCD of tool function of restoring disconnection, use detecting and repair the input end state of operational amplifier, and the action of operational amplifier is repaired in control.
For reaching above-mentioned purpose, detection circuit with high impedance of the present invention, promptly described high impedance detecting unit comprises one first switch, tool one first end and one second end and by the control of one first switch controlling signal, this first end is connected in aforementioned contact; One resistance, tool one first end and one second end, this first end ground connection; One second switch, tool one first end and one second end and by second switch control signal control, this first end is connected in second end of aforementioned resistance, second end is connected in second end of aforementioned first switch; One electric capacity, tool one first end and one second end, this first end ground connection, second end is connected in second end of aforementioned first switch; One comparer is the voltage and a reference voltage of second end of comparison of aforementioned first switch, and exports a comparison signal; And a Logical processing unit, be to receive aforementioned comparison signal, and according to the voltage of this comparison signal with aforementioned control signal activation or forbidden energy;
Wherein aforementioned first switch opened circuit after elder generation's conducting a period of time, and aforementioned afterwards second switch is conducting a period of time again, and perseveration; And aforementioned second switch control signal can be the reverse signal of aforementioned first switch controlling signal; Conducting when aforementioned second switch opens circuit at aforementioned first switch makes aforementioned electric capacity via this second switch discharge; And aforementioned Logical processing unit comprises a counter and a comparer, and counter is that the aforementioned comparison signal of counting is the number of times of first state; Comparer then is the count value and a critical value of comparison of aforementioned counter, when this count value is higher than this critical value, and with aforementioned control signal activation, otherwise with aforementioned control signal forbidden energy.
The Thin Film Transistor-LCD of tool function of restoring disconnection of the present invention replaces general reparation operational amplifier with the reparation operational amplifier with control function, and utilize the high impedance detecting module to detect the input end state of repairing operational amplifier, and the state output terminal of control reparation operational amplifier, to repair the data line or the sweep trace of broken string.
Description of drawings
Fig. 1 is an inner structure synoptic diagram of a Thin Film Transistor-LCD;
Fig. 2 is the part-structure synoptic diagram of the TFT-LCD of a known tool function of restoring disconnection;
Fig. 3 is the part-structure synoptic diagram of the TFT-LCD embodiment of a tool function of restoring disconnection of the present invention;
Fig. 4 is the synoptic diagram of high impedance detecting unit of the present invention;
Fig. 5 is the time sequential routine figure of Fig. 4 high impedance detecting unit;
Fig. 6 is another embodiment of high impedance detecting module.
Embodiment
Feature of the present invention and operation principles will cooperate graphic being described in detail as follows, wherein identical or etc. class part part with identical or etc. the representative of class number designation.
Fig. 3 shows an embodiment of the Thin Film Transistor-LCD (TFT-LCD) of tool function of restoring disconnection of the present invention.As shown in the drawing, this TFT-LCD has an active-matrix substrate 10, and this active-matrix substrate 10 is provided with many vertical data lines 12 and the sweep trace (not shown) of many levels to equidistant arrangement to equidistant arrangement.These data lines 12 constitute the pixel that matrix form is arranged with the matrix circuit that sweep trace cuts formation mutually, and these pixels then constitute viewing area 11.For making each pixel show required picture, data line 12 and sweep trace by data line driver element 16,16 ' and one scan line driver element (not shown) driven.Among the figure, shown data line driver element 16,16 ' be two groups, in fact decide on the panel size.
In order to repair the sweep trace of broken string, this TFT-LCD also comprises at least one group and repairs circuit, and this embodiment only shows that is repaired a circuit.This reparation circuit comprises at least one input end and repairs circuit 26, at least one output terminal and repair circuit 27, a plurality of reparation operational amplifier 34,34 ' and high impedance detecting module 35.Repair the quantity of operational amplifier and decide on the quantity of data line driver element, this embodiment shows that two are repaired operational amplifier.Repair operational amplifier 34,34 ' output terminal and 27 conductings of output terminal reparation circuit.And high impedance detecting module 35 be used for detecting each repair operational amplifier 34,34 ' the input end state, and produce the state that control signal is controlled its output.Though the high impedance detecting module 35 that shows in graphic and repair operational amplifier 34,34 ' the position data line driver element 16,16 ' the outside, in fact be located at data line driver element 16,16 ' in for good.In the present embodiment, high impedance detecting module 35 comprise two high impedance detecting units 350,350 ' and these high impedance detecting units be when a horizontal-drive signal is moved, to detect.As shown in Figure 3, the difference of the Thin Film Transistor-LCD of the Thin Film Transistor-LCD of tool function of restoring disconnection of the present invention and known tool function of restoring disconnection (as shown in Figure 2) is to replace general reparation operational amplifier with the reparation operational amplifier with control function, and utilize the high impedance detecting module to detect the input end state of repairing operational amplifier, and the state output terminal of operational amplifier is repaired in control.
When the data line 28 that detects this TFT-LCD had broken string, its disposal route was identical with known technology, no longer repeat specification.Yet, since repair in the general restorative procedure operational amplifier 34 ' input end f be floating, may there be noise, so repair operational amplifier 34 ' output terminal d have uncertain voltage output, this uncertain voltage output forms output competition (output competence) with the output terminal b that repairs operational amplifier 34, so the time be sent to data line 28 " document signal may be incorrect or unstable, cause image color distortion.Therefore, whether the present invention utilizes high impedance detecting module 35 to detect the reparation operational amplifier received signal, and the output terminal that (suspension joint) will repair operational amplifier under the state of received signal not closes, and makes it can not influence the output that other repairs operational amplifier.As shown in Figure 3, therefore high impedance detecting unit 350 comes this reparation operational amplifier 34 of activation with an operating control signal CS1 activation because of input end and the input end reparation circuit 26 of repairing operational amplifier 34 joins.On the contrary, high impedance detecting unit 350 ' is then repaired circuit 26 with input end and is not joined (suspension joint) because of repairing operational amplifier 34 ' input end, thus with operating control signal CS2 forbidden energy close this reparation operational amplifier 34 '.Therefore, because therefore the reparation operational amplifier 34 of actual participation repair ' be closed not so its output does not influence the output of repairing operational amplifier 34, also must be avoided exporting warfare, and then this reparations is correctly worked with circuit is stable.More than explanation is the data line reparation of opening circuit at tool and be, but in fact also is applicable to the reparation of the sweep trace that tool is opened circuit.
Figure 4 shows that an embodiment of high impedance detecting unit of the present invention, Figure 5 shows that the sequential chart of the high impedance detecting unit operation of Fig. 4.As shown in Figure 4, this high impedance detecting unit 350 comprises one first switch S 1, a second switch S2, a capacitor C 1, a resistance R 1, a comparer 351 and a Logical processing unit 352.One end of first switch S 1 is connected in the input end of the reparation operational amplifier of desire detecting, and as input signal, the other end then is connected in an input end of comparer 351 with the signal that receives the input end of repairing operational amplifier.This input signal when 1 conducting of first switch S to capacitor C 1 charging and become the input signal Vin of comparer 351; When the 1 not conducting of first switch S and during second switch S2 conducting, capacitor C 1 voltage Vin is via resistance R 1 discharge, wherein first and second switch S 1, S2 are by switch controlling signal SCS1, SCS2 control shown in Figure 5.In addition, influence the signal of the input end of operational amplifier for the switch motion of avoiding first and second switch S 1, S2, and then influence delivers to the data line that tool opens circuit or the signal of sweep trace, and the detecting action of high impedance detecting unit 350 can be carried out when scanning line driving unit is not sent the scanning signal to sweep trace.
As shown in Figure 5, when horizontal-drive signal H-sync is high levels, representative is at the switched scan line, scans the duty that becomes high levle when signal SS is in the low level of off working state this moment, and the high impedance detecting unit can be repaired operational amplifier and detect each.When beginning to detect, switch controlling signal SCS1 makes 1 conducting of first switch S earlier, makes capacitor C 1 charging.Then, switch controlling signal SCS1 disconnects first switch S 1, and switch controlling signal SCS2 makes second switch S2 conducting, makes capacitor C 1 discharge.Comparer 351 is the voltage Vin and a reference voltage Vref of capacitor C 1 relatively, when the voltage Vin of capacitor C 1 is higher than reference voltage Vref, the comparative voltage Vout of the high logic level of comparer 351 outputs, and when the voltage Vin of capacitor C 1 is lower than reference voltage Vref, the comparative voltage Vout of the low logic level of comparer 351 outputs.That is to say that when the input end of operational amplifier and input end were repaired circuit and joined, the voltage Vin of capacitor C 1 can be greater than reference voltage Vref in 1 conduction period of first switch S, so the time comparative voltage Vout be the accurate position of high logic; And when the input end of operational amplifier during in floating, even the voltage Vin of capacitor C 1 also can be lower than reference voltage Vref in 1 conduction period of first switch S, so the time comparative voltage Vout be the accurate position of low logic.In addition, switch controlling signal SCS2 also can be the reverse signal of switch controlling signal SCS1, and this moment, second switch S2 was except being disconnected when first switch conduction, and the equal conducting of all the other times makes capacitor C 1 discharge.
Because comparative voltage Vout might cause misjudgment because of noise, thus comparative voltage Vout obtained in the mode of repeated test, and utilize Logical processing unit 352 to produce operating control signal CS for the number of times of accurate of high logic according to this comparative voltage Vout.Logical processing unit 352 receives comparative voltage Vout, and utilizes the number of times of counter 353 counting comparative voltage Vout for the accurate position of high logic in test period, and utilizes a comparer 354 to come a comparison count value and a critical value.When count value during greater than critical value, Logical processing unit 352 will be operated controlling signal activation CS and be activated pairing reparation operational amplifier.On the contrary, if after end of test (EOT), count value is not during yet greater than critical value, and then this Logical processing unit 352 will be operated the output that controlling signal CS forbidden energy is closed pairing reparation operational amplifier.
The accurate position of the work of each signal all can be high levle or low level in the above-mentioned high impedance detecting unit 350, provide switch controlling signal SCS1, the SCS2 of first and second switch S 1, S2 to can be an inside or the external signal generator provides, the value of capacitor C 1 and resistance R 1 can be chosen to be the sending-end impedance of the reparation operational amplifier that is suitable for detecting this correspondence.The conducting of switch S 1, S2 and the time of disconnection correctly are principle can make high impedance detecting action smoothly, decide according to deviser's design.
Fig. 6 is another embodiment of high impedance detecting module.In the framework of Fig. 3, high impedance detecting module 35 comprised a plurality of high impedance detecting units 350,350 ', but in the framework of Fig. 6, high impedance detecting module 35 ' only comprise a high impedance detecting unit 350, and this high impedance detecting unit is to detect when a horizontal-drive signal is moved.This high impedance detecting module 35 ' except high impedance detecting unit 350, also comprise a multiplexer 61 and a plurality of latch lock units 63.Because high impedance detecting module 35 ' only utilize a high impedance detecting unit 350 to detect the input end signal RS1～RSn of a plurality of reparation operational amplifiers respectively, therefore must utilize multiplexer 61 to switch and select the input end signal of single reparation operational amplifier to detect, and utilize a plurality of latch lock units 63 to take a sample and keep the test result of the correspondence that (S/H) high impedance detecting unit 350 exported as test signal.Because single detecting unit must detect a plurality of reparation operational amplifiers in turn, thus the detecting cycle will increase with the number of repairing operational amplifier, but the detecting behavior is constant.
The present invention describes in detail as above at specific embodiment, and being familiar with this operator must be to change of the present invention or change under the condition of not disobeying spirit of the present invention and scope.For example, tools such as impact damper one control end and its output that these operational amplifiers are able to the tool control end do not change the assembly replacement of the signal size of input originally, these high impedance detecting units must be located within data or the scanning line driving unit or outside, and the number that operational amplifier, input end and output terminal are repaired circuit not necessarily is required to be equal.In addition, above-mentioned explanation not only can be used among the TFT-LCD, also can be used for any have with multi-strip scanning line and drive wire constitute many light emitting pixels and being in the display made from the manufacture of semiconductor technology or other electronic installation.These changes or change still do not depart from the scope of the present invention, and spirit of the present invention and scope will define as in the claim.
Claims (16)
1. the Thin Film Transistor-LCD of a tool function of restoring disconnection, this LCD has at least one data line driver element and drives that many data lines, at least one scanning line driving unit drive the multi-strip scanning line and many groups are repaired the data line that circuit is repaired broken string, repairs circuit for every group and comprises:
At least one input end is repaired circuit, when having broken string to repair, is connected to the broken string data line of a data line driver element of aforementioned at least one data line driver element;
A plurality of reparation operational amplifiers, each is repaired operational amplifier and has an input end, an output terminal and a control end, and when having broken string to repair, one of them input end of repairing operational amplifier is connected to aforementioned input end reparation circuit;
One high impedance detecting module, it is the input end suspension joint and export an operating control signal respectively and control the state output terminal that each repairs operational amplifier whether of the aforementioned a plurality of reparation operational amplifiers of detecting, wherein, when detecting the input end of repairing operational amplifier operating control signal forbidden energy with correspondence when being floating, when detecting the operating control signal activation with correspondence when voltage is arranged of the input end of repairing operational amplifier; And
At least one output terminal is repaired circuit, and every output terminal is repaired circuit and is connected with the output terminal of each aforementioned reparation operational amplifier;
Wherein, aforementioned reparation operational amplifier also receives the operating control signal of aforementioned high impedance detecting module, and when this operating control signal during by forbidden energy, the output of this reparation operational amplifier is set to high impedance status, and when this operating control signal was enabled, this operational amplifier came output signal according to the signal of input end.
2. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 1, it is characterized in that, wherein aforementioned high impedance detecting module comprises a plurality of high impedance detecting units, and receive aforementioned each signal of input end of repairing operational amplifier respectively as test signal, and suspension joint and the signal that outputs test result are respectively controlled the output state that each repairs operational amplifier as operating control signal to detect this test signal.
3. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 1 is characterized in that, wherein aforementioned high impedance detecting module comprises:
One multiplexer is the signal that receives the input end of aforementioned a plurality of reparation operational amplifiers, and selects signal to select one of them signal to be output as a test signal according to one;
One high impedance detecting unit is to receive aforementioned test signal, and detects this test signal and whether produce a test result signal behind the suspension joint; And
A plurality of latch lock units are the test result signals that receive aforementioned high impedance detecting unit simultaneously, and according to the sampling of the breech lock control signal of correspondence and keep aforementioned test result signal, and the corresponding aforementioned operation control signal of output.
4. as the Thin Film Transistor-LCD of claim 2 or 3 described tool function of restoring disconnection, it is characterized in that wherein aforementioned high impedance detecting unit is to detect when a horizontal-drive signal is moved.
5. as the Thin Film Transistor-LCD of claim 2 or 3 described tool function of restoring disconnection, it is characterized in that wherein aforementioned high impedance detecting unit comprises:
One first switch, tool one first end and one second end and by one first switch controlling signal control, this first end is connected in aforementioned test signal;
One resistance, tool one first end and one second end, this first end ground connection;
One second switch, tool one first end and one second end and by second switch control signal control, this first end is connected in second end of aforementioned resistance, second end is connected in second end of aforementioned first switch;
One electric capacity, tool one first end and one second end, this first end ground connection, second end is connected in second end of aforementioned first switch;
One comparer is the voltage and a reference voltage of second end of comparison of aforementioned first switch, and exports a comparison signal; And
One Logical processing unit is to receive aforementioned comparison signal, and exports aforementioned test result signal according to the voltage of this comparison signal;
Wherein aforementioned first switch opened circuit after elder generation's conducting a period of time, and aforementioned afterwards second switch is conducting a period of time again, and perseveration one predetermined period.
6. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 5 is characterized in that, wherein aforementioned second switch control signal is the reverse signal of aforementioned first switch controlling signal.
7. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 5 is characterized in that, conducting when wherein aforementioned second switch opens circuit at aforementioned first switch makes aforementioned electric capacity via this second switch discharge.
8. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 5 is characterized in that, wherein aforementioned Logical processing unit comprises:
One counter is that the aforementioned comparison signal of counting is the number of times of first state; And
One comparer is the count value and a critical value of comparison of aforementioned counter, when this count value is higher than this critical value, and with the activation of aforementioned test result signal, otherwise with aforementioned test result signal forbidden energy.
9. the Thin Film Transistor-LCD of a tool function of restoring disconnection, this LCD has at least one scanning line driving unit and drives that multi-strip scanning line, at least one data line driver element drive many data lines and many groups are repaired the sweep trace that circuit is repaired broken string, repairs circuit for every group and comprises:
At least one input end is repaired circuit, when having broken string to repair, is connected to the broken string sweep trace of a scanning line driving unit of aforementioned at least one scanning line driving unit;
A plurality of reparation operational amplifiers, each is repaired operational amplifier and has an input end, an output terminal and a control end, and when having broken string to repair, one of them input end of repairing operational amplifier is connected to aforementioned input end reparation circuit;
One high impedance detecting module, it is the input end suspension joint and export an operating control signal respectively and control the state output terminal that each repairs operational amplifier whether of the aforementioned a plurality of reparation operational amplifiers of detecting, wherein, when detecting the input end of repairing operational amplifier operating control signal forbidden energy with correspondence when being floating, when detecting the operating control signal activation with correspondence when voltage is arranged of the input end of repairing operational amplifier; And
At least one output terminal is repaired circuit, and every output terminal is repaired circuit and is connected with the output terminal of each aforementioned reparation operational amplifier;
Wherein, aforementioned reparation operational amplifier also receives the operating control signal of aforementioned high impedance detecting module, and when this operating control signal during by forbidden energy, the output of this reparation operational amplifier is set to high impedance status, and when this operating control signal was enabled, this operational amplifier came output signal according to the signal of input end.
10. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 9, it is characterized in that, wherein aforementioned high impedance detecting module comprises a plurality of high impedance detecting units, and receive aforementioned each signal of input end of repairing operational amplifier respectively as test signal, and suspension joint and the signal that outputs test result are respectively controlled the output state that each repairs operational amplifier as operating control signal to detect this test signal.
11. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 9 is characterized in that, wherein aforementioned high impedance detecting module comprises:
One multiplexer is the signal that receives the input end of aforementioned a plurality of reparation operational amplifiers, and selects signal to select one of them signal to be output as a test signal according to one;
One high impedance detecting unit is to receive aforementioned test signal, and detects this test signal and whether produce a test result signal behind the suspension joint; And
A plurality of latch lock units are the test result signals that receive aforementioned high impedance detecting unit simultaneously, and according to the sampling of the breech lock control signal of correspondence and keep aforementioned test result signal, and the corresponding aforementioned control signal of output.
12. the Thin Film Transistor-LCD as claim 10 or 11 described tool function of restoring disconnection is characterized in that, wherein aforementioned high impedance detecting unit is to detect when a horizontal-drive signal is moved.
13. the Thin Film Transistor-LCD as claim 10 or 11 described tool function of restoring disconnection is characterized in that, wherein aforementioned high impedance detecting unit comprises:
One first switch, tool one first end and one second end and by one first switch controlling signal control, this first end is connected in aforementioned test signal;
One resistance, tool one first end and one second end, this first end ground connection;
One second switch, tool one first end and one second end and by second switch control signal control, this first end is connected in second end of aforementioned resistance, second end is connected in second end of aforementioned first switch;
One electric capacity, tool one first end and one second end, this first end ground connection, second end is connected in second end of aforementioned first switch;
One comparer is the voltage and a reference voltage of second end of comparison of aforementioned first switch, and exports a comparison signal; And
One Logical processing unit is to receive aforementioned comparison signal, and exports aforementioned test result signal according to the voltage of this comparison signal;
Wherein aforementioned first switch opened circuit after elder generation's conducting a period of time, and aforementioned afterwards second switch is conducting a period of time again, and perseveration one predetermined period.
14. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 13 is characterized in that, wherein aforementioned second switch control signal is the reverse signal of aforementioned first switch controlling signal.
15. the Thin Film Transistor-LCD of tool function of restoring disconnection as claimed in claim 13 is characterized in that, conducting when wherein aforementioned second switch opens circuit at aforementioned first switch makes aforementioned electric capacity via this second switch discharge.
16. the Thin Film Transistor-LCD as claim 13 a described tool function of restoring disconnection is characterized in that, wherein aforementioned Logical processing unit comprises:
One counter is that the aforementioned comparison signal of counting is the number of times of first state; And
One comparer is the count value and a critical value of comparison of aforementioned counter, when this count value is higher than this critical value, and with the activation of aforementioned test result signal, otherwise with aforementioned test result signal forbidden energy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CNB2004101016573A CN100365494C (en) | 2004-12-20 | 2004-12-20 | LCD device of thin film transistor possessing function of restoring disconnection, and detection circuit with high impedance |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2004101016573A CN100365494C (en) | 2004-12-20 | 2004-12-20 | LCD device of thin film transistor possessing function of restoring disconnection, and detection circuit with high impedance |
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| CN1797141A CN1797141A (en) | 2006-07-05 |
| CN100365494C true CN100365494C (en) | 2008-01-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2004101016573A Expired - Fee Related CN100365494C (en) | 2004-12-20 | 2004-12-20 | LCD device of thin film transistor possessing function of restoring disconnection, and detection circuit with high impedance |
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| WO2012075651A1 (en) * | 2010-12-10 | 2012-06-14 | 深圳市华星光电技术有限公司 | Repairing circuit for display panel and method thereof |
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| CN1797141A (en) | 2006-07-05 |
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