|
CH626169A5
(OSRAM)
*
|
1976-11-25 |
1981-10-30 |
Leitz Ernst Gmbh |
|
|
US4200395A
(en)
*
|
1977-05-03 |
1980-04-29 |
Massachusetts Institute Of Technology |
Alignment of diffraction gratings
|
|
US4178064A
(en)
*
|
1978-04-27 |
1979-12-11 |
Xerox Corporation |
Real time grating clock for galvanometer scanners in laser scanning systems
|
|
GB2067747B
(en)
*
|
1980-01-18 |
1983-08-03 |
Stanley Tools Ltd |
Displacement measuring system
|
|
US4427883A
(en)
*
|
1981-05-27 |
1984-01-24 |
The Stanley Works |
Optical sensing system for extensible tape rules
|
|
US4644157A
(en)
*
|
1982-03-08 |
1987-02-17 |
Matsushita Electric Industrial Co., Ltd. |
Optical rotation detecting apparatus
|
|
DE3325226A1
(de)
*
|
1983-07-13 |
1985-01-24 |
Claudio Dipl.-Ing. 4130 Moers Möller |
Verfahren und geraet zur messung und/oder regelung vorzugsweise langsamer bewegungen, z.b. zur regelung der vorschubgeschwindigkeit von registrierpapier
|
|
GB8320629D0
(en)
*
|
1983-07-30 |
1983-09-01 |
Pa Consulting Services |
Displacement measuring apparatus
|
|
US4684257A
(en)
*
|
1984-02-02 |
1987-08-04 |
Mitutoyo Mfg. |
Measuring instrument
|
|
GB8432574D0
(en)
*
|
1984-12-22 |
1985-02-06 |
Renishaw Plc |
Opto-electronic scale-reading apparatus
|
|
GB8615197D0
(en)
*
|
1986-06-21 |
1986-07-23 |
Renishaw Plc |
Opto-electronic scale reading apparatus
|
|
GB8615196D0
(en)
*
|
1986-06-21 |
1986-07-23 |
Renishaw Plc |
Opto-electronic scale reading apparatus
|
|
DE3621236A1
(de)
*
|
1986-06-25 |
1988-01-14 |
Heidenhain Gmbh Dr Johannes |
Laengen- oder winkelmesseinrichtung
|
|
GB8616240D0
(en)
*
|
1986-07-03 |
1986-08-13 |
Renishaw Plc |
Opto-electronic scale reading apparatus
|
|
US4808832A
(en)
*
|
1986-09-11 |
1989-02-28 |
Synergy Computer Graphics Corp. |
Registration system for a moving substrate
|
|
GB2195179B
(en)
*
|
1986-09-11 |
1991-05-15 |
Synergy Computer Graphics |
Registration system for a moving substrate
|
|
US4722600A
(en)
*
|
1986-10-14 |
1988-02-02 |
Chiang Fu Pen |
Apparatus and method for measuring strain
|
|
DE3636744C1
(de)
*
|
1986-10-29 |
1988-03-24 |
Heidenhain Gmbh Dr Johannes |
Lichtelektrische Laengen- oder Winkelmesseinrichtung
|
|
JPH07888Y2
(ja)
*
|
1988-02-22 |
1995-01-11 |
株式会社ミツトヨ |
光学式変位検出器
|
|
GB8821837D0
(en)
*
|
1988-09-16 |
1988-10-19 |
Renishaw Plc |
Scale for use with opto-electronic scale reading apparatus
|
|
US4952946A
(en)
*
|
1988-10-19 |
1990-08-28 |
Polaroid Corporation |
Scanning beam position detecting apparatus for use in electronic printer
|
|
US5000574A
(en)
*
|
1989-04-20 |
1991-03-19 |
The United States Of America As Represented By The Secretary Of The Navy |
Interferometric surface distortion detector
|
|
US4981360A
(en)
*
|
1989-05-10 |
1991-01-01 |
Grumman Aerospace Corporation |
Apparatus and method for projection moire mapping
|
|
US5025285A
(en)
*
|
1989-05-10 |
1991-06-18 |
Grumman Aerospace Corporation |
Apparatus and method for shadow moire mapping
|
|
US5073710A
(en)
*
|
1989-09-21 |
1991-12-17 |
Copal Company Limited |
Optical displacement detector including a displacement member's surface having a diffractive pattern and a holographic lens pattern
|
|
US5075562A
(en)
*
|
1990-09-20 |
1991-12-24 |
Eastman Kodak Company |
Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface
|
|
US5471307A
(en)
*
|
1992-09-21 |
1995-11-28 |
Phase Shift Technology, Inc. |
Sheet flatness measurement system and method
|
|
DE4240735C2
(de)
*
|
1992-12-03 |
1996-07-11 |
Computer Ges Konstanz |
Optische Vorrichtung zur Bereitstellung von Meßsignalen
|
|
GB9522491D0
(en)
*
|
1995-11-02 |
1996-01-03 |
Renishaw Plc |
Opto-electronic rotary encoder
|
|
EP1028309B1
(de)
*
|
1999-02-04 |
2003-04-16 |
Dr. Johannes Heidenhain GmbH |
Optische Positionsmesseinrichtung
|
|
RU2144651C1
(ru)
*
|
1999-06-16 |
2000-01-20 |
Государственное унитарное предприятие "Государственное научно-производственное предприятие "Сплав" |
Боевая часть
|
|
US6664538B1
(en)
*
|
2000-05-11 |
2003-12-16 |
Infineon Technologies North America Corp |
Mismatching of gratings to achieve phase shift in an optical position detector
|
|
IT1321065B1
(it)
*
|
2000-11-14 |
2003-12-30 |
St Microelectronics Srl |
Trasduttore di lettura/scrittura per dispositivi a disco rigido adoppio stadio di attuazione e relativo processo di fabbricazione.
|
|
DE10333772A1
(de)
*
|
2002-08-07 |
2004-02-26 |
Dr. Johannes Heidenhain Gmbh |
Interferenzielle Positionsmesseinrichtung
|
|
DE102005013222B4
(de)
*
|
2005-03-17 |
2015-12-31 |
Dr. Johannes Heidenhain Gmbh |
Positionsmesseinrichtung
|
|
US7659996B2
(en)
*
|
2006-11-08 |
2010-02-09 |
Ricoh Company, Ltd. |
Relative position detection device and detector for rotary body and image forming apparatus including the relative position detection device
|
|
CN102192761B
(zh)
*
|
2010-04-22 |
2013-06-05 |
廊坊开发区莱格光电仪器有限公司 |
敞开式激光限束扫描标尺光栅传感器
|
|
US8941052B2
(en)
|
2011-12-23 |
2015-01-27 |
Mitutoyo Corporation |
Illumination portion for an adaptable resolution optical encoder
|
|
US9080899B2
(en)
|
2011-12-23 |
2015-07-14 |
Mitutoyo Corporation |
Optical displacement encoder having plural scale grating portions with spatial phase offset of scale pitch
|
|
US9029757B2
(en)
|
2011-12-23 |
2015-05-12 |
Mitutoyo Corporation |
Illumination portion for an adaptable resolution optical encoder
|
|
US9018578B2
(en)
|
2011-12-23 |
2015-04-28 |
Mitutoyo Corporation |
Adaptable resolution optical encoder having structured illumination and spatial filtering
|
|
CN106931887B
(zh)
*
|
2015-12-30 |
2019-11-26 |
上海微电子装备(集团)股份有限公司 |
双频光栅测量装置
|
|
US10243668B2
(en)
*
|
2016-04-27 |
2019-03-26 |
Industrial Technology Research Institute |
Positioning measurement device and the method thereof
|