CH609147A5 - - Google Patents

Info

Publication number
CH609147A5
CH609147A5 CH1063876A CH1063876A CH609147A5 CH 609147 A5 CH609147 A5 CH 609147A5 CH 1063876 A CH1063876 A CH 1063876A CH 1063876 A CH1063876 A CH 1063876A CH 609147 A5 CH609147 A5 CH 609147A5
Authority
CH
Switzerland
Application number
CH1063876A
Inventor
David Georg Brake
Original Assignee
Ferranti Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ferranti Ltd filed Critical Ferranti Ltd
Publication of CH609147A5 publication Critical patent/CH609147A5/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36Forming the light into pulses
    • G01D5/38Forming the light into pulses by diffraction gratings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CH1063876A 1975-08-22 1976-08-20 CH609147A5 (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB34859/75A GB1516536A (en) 1975-08-22 1975-08-22 Measuring apparatus

Publications (1)

Publication Number Publication Date
CH609147A5 true CH609147A5 (xx) 1979-02-15

Family

ID=10370795

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1063876A CH609147A5 (xx) 1975-08-22 1976-08-20

Country Status (8)

Country Link
US (1) US4079252A (xx)
JP (1) JPS5234760A (xx)
CH (1) CH609147A5 (xx)
DE (1) DE2637361A1 (xx)
FR (1) FR2321682A1 (xx)
GB (1) GB1516536A (xx)
IT (1) IT1073677B (xx)
SE (1) SE412287B (xx)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH626169A5 (xx) * 1976-11-25 1981-10-30 Leitz Ernst Gmbh
US4200395A (en) * 1977-05-03 1980-04-29 Massachusetts Institute Of Technology Alignment of diffraction gratings
US4178064A (en) * 1978-04-27 1979-12-11 Xerox Corporation Real time grating clock for galvanometer scanners in laser scanning systems
GB2067747B (en) * 1980-01-18 1983-08-03 Stanley Tools Ltd Displacement measuring system
US4427883A (en) * 1981-05-27 1984-01-24 The Stanley Works Optical sensing system for extensible tape rules
US4644157A (en) * 1982-03-08 1987-02-17 Matsushita Electric Industrial Co., Ltd. Optical rotation detecting apparatus
DE3325226A1 (de) * 1983-07-13 1985-01-24 Claudio Dipl.-Ing. 4130 Moers Möller Verfahren und geraet zur messung und/oder regelung vorzugsweise langsamer bewegungen, z.b. zur regelung der vorschubgeschwindigkeit von registrierpapier
GB8320629D0 (en) * 1983-07-30 1983-09-01 Pa Consulting Services Displacement measuring apparatus
US4684257A (en) * 1984-02-02 1987-08-04 Mitutoyo Mfg. Measuring instrument
GB8432574D0 (en) * 1984-12-22 1985-02-06 Renishaw Plc Opto-electronic scale-reading apparatus
GB8615196D0 (en) * 1986-06-21 1986-07-23 Renishaw Plc Opto-electronic scale reading apparatus
GB8615197D0 (en) * 1986-06-21 1986-07-23 Renishaw Plc Opto-electronic scale reading apparatus
DE3621236A1 (de) * 1986-06-25 1988-01-14 Heidenhain Gmbh Dr Johannes Laengen- oder winkelmesseinrichtung
GB8616240D0 (en) * 1986-07-03 1986-08-13 Renishaw Plc Opto-electronic scale reading apparatus
US4808832A (en) * 1986-09-11 1989-02-28 Synergy Computer Graphics Corp. Registration system for a moving substrate
GB2195179B (en) * 1986-09-11 1991-05-15 Synergy Computer Graphics Registration system for a moving substrate
US4722600A (en) * 1986-10-14 1988-02-02 Chiang Fu Pen Apparatus and method for measuring strain
DE3636744C1 (de) * 1986-10-29 1988-03-24 Heidenhain Gmbh Dr Johannes Lichtelektrische Laengen- oder Winkelmesseinrichtung
JPH07888Y2 (ja) * 1988-02-22 1995-01-11 株式会社ミツトヨ 光学式変位検出器
GB8821837D0 (en) * 1988-09-16 1988-10-19 Renishaw Plc Scale for use with opto-electronic scale reading apparatus
US4952946A (en) * 1988-10-19 1990-08-28 Polaroid Corporation Scanning beam position detecting apparatus for use in electronic printer
US5000574A (en) * 1989-04-20 1991-03-19 The United States Of America As Represented By The Secretary Of The Navy Interferometric surface distortion detector
US5025285A (en) * 1989-05-10 1991-06-18 Grumman Aerospace Corporation Apparatus and method for shadow moire mapping
US4981360A (en) * 1989-05-10 1991-01-01 Grumman Aerospace Corporation Apparatus and method for projection moire mapping
US5073710A (en) * 1989-09-21 1991-12-17 Copal Company Limited Optical displacement detector including a displacement member's surface having a diffractive pattern and a holographic lens pattern
US5075562A (en) * 1990-09-20 1991-12-24 Eastman Kodak Company Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface
US5471307A (en) * 1992-09-21 1995-11-28 Phase Shift Technology, Inc. Sheet flatness measurement system and method
DE4240735C2 (de) * 1992-12-03 1996-07-11 Computer Ges Konstanz Optische Vorrichtung zur Bereitstellung von Meßsignalen
GB9522491D0 (en) * 1995-11-02 1996-01-03 Renishaw Plc Opto-electronic rotary encoder
EP1028309B1 (de) * 1999-02-04 2003-04-16 Dr. Johannes Heidenhain GmbH Optische Positionsmesseinrichtung
US6664538B1 (en) * 2000-05-11 2003-12-16 Infineon Technologies North America Corp Mismatching of gratings to achieve phase shift in an optical position detector
IT1321065B1 (it) * 2000-11-14 2003-12-30 St Microelectronics Srl Trasduttore di lettura/scrittura per dispositivi a disco rigido adoppio stadio di attuazione e relativo processo di fabbricazione.
DE10333772A1 (de) * 2002-08-07 2004-02-26 Dr. Johannes Heidenhain Gmbh Interferenzielle Positionsmesseinrichtung
DE102005013222B4 (de) * 2005-03-17 2015-12-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7659996B2 (en) * 2006-11-08 2010-02-09 Ricoh Company, Ltd. Relative position detection device and detector for rotary body and image forming apparatus including the relative position detection device
CN102192761B (zh) * 2010-04-22 2013-06-05 廊坊开发区莱格光电仪器有限公司 敞开式激光限束扫描标尺光栅传感器
US9018578B2 (en) 2011-12-23 2015-04-28 Mitutoyo Corporation Adaptable resolution optical encoder having structured illumination and spatial filtering
US8941052B2 (en) 2011-12-23 2015-01-27 Mitutoyo Corporation Illumination portion for an adaptable resolution optical encoder
US9029757B2 (en) 2011-12-23 2015-05-12 Mitutoyo Corporation Illumination portion for an adaptable resolution optical encoder
US9080899B2 (en) 2011-12-23 2015-07-14 Mitutoyo Corporation Optical displacement encoder having plural scale grating portions with spatial phase offset of scale pitch
CN106931887B (zh) * 2015-12-30 2019-11-26 上海微电子装备(集团)股份有限公司 双频光栅测量装置
US10243668B2 (en) * 2016-04-27 2019-03-26 Industrial Technology Research Institute Positioning measurement device and the method thereof

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1548868A1 (de) * 1966-08-20 1970-04-09 Wenczler & Heidenhain Anordnung zum Bestimmen der Groesse von Bewegungen eines Gegenstandes
US3578979A (en) * 1968-04-23 1971-05-18 Tajima Seisakusho Kk Electrical signal generating apparatus having a scale grid
CH502580A (de) * 1969-01-24 1971-01-31 Oerlikon Buehrle Ag Vorrichtung mit einer Photozellenanordnung zur Bestimmung der Lage eines äquidistant geteilten Massstabes
DE1921507C2 (de) * 1969-04-26 1971-02-11 Zeiss Carl Fa Einrichtung zur Erzeugung phasenverschobener elektrischer Signale
GB1353470A (en) * 1970-10-19 1974-05-15 Post D Position measuring apparatus utilizing moire fringe multiplication
US3748043A (en) * 1972-03-20 1973-07-24 Bendix Corp Photoelectric interpolating arrangement for reading displacements of divided scales
US3812352A (en) * 1972-08-28 1974-05-21 Itek Corp Encoder readout system

Also Published As

Publication number Publication date
FR2321682A1 (fr) 1977-03-18
GB1516536A (en) 1978-07-05
JPS5234760A (en) 1977-03-16
DE2637361A1 (de) 1977-03-03
SE412287B (sv) 1980-02-25
US4079252A (en) 1978-03-14
IT1073677B (it) 1985-04-17
SE7609238L (sv) 1977-02-23

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Legal Events

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