CH603020A5 - - Google Patents

Info

Publication number
CH603020A5
CH603020A5 CH268176A CH268176A CH603020A5 CH 603020 A5 CH603020 A5 CH 603020A5 CH 268176 A CH268176 A CH 268176A CH 268176 A CH268176 A CH 268176A CH 603020 A5 CH603020 A5 CH 603020A5
Authority
CH
Switzerland
Application number
CH268176A
Inventor
Karl Pousek
Original Assignee
Siemens Ag Oesterreich
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag Oesterreich filed Critical Siemens Ag Oesterreich
Publication of CH603020A5 publication Critical patent/CH603020A5/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/08Optical projection comparators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CH268176A 1975-03-07 1976-03-04 CH603020A5 (cs)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT176775A AT335552B (de) 1975-03-07 1975-03-07 Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten

Publications (1)

Publication Number Publication Date
CH603020A5 true CH603020A5 (cs) 1978-08-15

Family

ID=3520566

Family Applications (1)

Application Number Title Priority Date Filing Date
CH268176A CH603020A5 (cs) 1975-03-07 1976-03-04

Country Status (5)

Country Link
AT (1) AT335552B (cs)
CH (1) CH603020A5 (cs)
DD (1) DD124489A5 (cs)
DE (1) DE2554830C3 (cs)
GB (1) GB1546512A (cs)

Also Published As

Publication number Publication date
DE2554830B2 (de) 1977-11-03
ATA176775A (de) 1976-07-15
DE2554830C3 (de) 1978-06-22
DD124489A5 (cs) 1977-02-23
GB1546512A (en) 1979-05-23
AT335552B (de) 1977-03-25
DE2554830A1 (de) 1976-09-16

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Legal Events

Date Code Title Description
PL Patent ceased
PL Patent ceased