AT335552B - Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten - Google Patents

Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten

Info

Publication number
AT335552B
AT335552B AT176775A AT176775A AT335552B AT 335552 B AT335552 B AT 335552B AT 176775 A AT176775 A AT 176775A AT 176775 A AT176775 A AT 176775A AT 335552 B AT335552 B AT 335552B
Authority
AT
Austria
Prior art keywords
circuit boards
test device
electric circuit
optical test
component fitting
Prior art date
Application number
AT176775A
Other languages
German (de)
English (en)
Other versions
ATA176775A (de
Inventor
Karl Dipl Ing Pousek
Original Assignee
Siemens Ag Oesterreich
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag Oesterreich filed Critical Siemens Ag Oesterreich
Priority to AT176775A priority Critical patent/AT335552B/de
Priority to DE19752554830 priority patent/DE2554830C3/de
Priority to DD19155076A priority patent/DD124489A5/xx
Priority to CH268176A priority patent/CH603020A5/xx
Priority to GB885876A priority patent/GB1546512A/en
Publication of ATA176775A publication Critical patent/ATA176775A/de
Application granted granted Critical
Publication of AT335552B publication Critical patent/AT335552B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/08—Optical projection comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AT176775A 1975-03-07 1975-03-07 Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten AT335552B (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
AT176775A AT335552B (de) 1975-03-07 1975-03-07 Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten
DE19752554830 DE2554830C3 (de) 1975-03-07 1975-12-05 Optische Prüfeinrichtung für die Bauteilbestückung elektrischer Leiterplatten
DD19155076A DD124489A5 (cs) 1975-03-07 1976-02-26
CH268176A CH603020A5 (cs) 1975-03-07 1976-03-04
GB885876A GB1546512A (en) 1975-03-07 1976-03-05 Optical checking devices for electric circuit boards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT176775A AT335552B (de) 1975-03-07 1975-03-07 Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten

Publications (2)

Publication Number Publication Date
ATA176775A ATA176775A (de) 1976-07-15
AT335552B true AT335552B (de) 1977-03-25

Family

ID=3520566

Family Applications (1)

Application Number Title Priority Date Filing Date
AT176775A AT335552B (de) 1975-03-07 1975-03-07 Optische prufeinrichtung fur die bauteilbestuckung elektrischer leiterplatten

Country Status (5)

Country Link
AT (1) AT335552B (cs)
CH (1) CH603020A5 (cs)
DD (1) DD124489A5 (cs)
DE (1) DE2554830C3 (cs)
GB (1) GB1546512A (cs)

Also Published As

Publication number Publication date
DE2554830B2 (de) 1977-11-03
ATA176775A (de) 1976-07-15
DE2554830C3 (de) 1978-06-22
DD124489A5 (cs) 1977-02-23
GB1546512A (en) 1979-05-23
DE2554830A1 (de) 1976-09-16
CH603020A5 (cs) 1978-08-15

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee