CH575592A5 - - Google Patents

Info

Publication number
CH575592A5
CH575592A5 CH489875A CH489875A CH575592A5 CH 575592 A5 CH575592 A5 CH 575592A5 CH 489875 A CH489875 A CH 489875A CH 489875 A CH489875 A CH 489875A CH 575592 A5 CH575592 A5 CH 575592A5
Authority
CH
Switzerland
Application number
CH489875A
Original Assignee
Volpi Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Volpi Ag filed Critical Volpi Ag
Priority to CH489875A priority Critical patent/CH575592A5/xx
Priority to DE19762613978 priority patent/DE2613978C3/de
Priority to IT2240476A priority patent/IT1059170B/it
Publication of CH575592A5 publication Critical patent/CH575592A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
CH489875A 1975-04-17 1975-04-17 CH575592A5 (da)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CH489875A CH575592A5 (da) 1975-04-17 1975-04-17
DE19762613978 DE2613978C3 (de) 1975-04-17 1976-04-01 Meßanordnung zum Kontrollieren der Oberflächengüte eines Werkstücks
IT2240476A IT1059170B (it) 1975-04-17 1976-04-16 Dispositivo per controllare la qualita superficiale di un ezzo

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH489875A CH575592A5 (da) 1975-04-17 1975-04-17

Publications (1)

Publication Number Publication Date
CH575592A5 true CH575592A5 (da) 1976-05-14

Family

ID=4284455

Family Applications (1)

Application Number Title Priority Date Filing Date
CH489875A CH575592A5 (da) 1975-04-17 1975-04-17

Country Status (3)

Country Link
CH (1) CH575592A5 (da)
DE (1) DE2613978C3 (da)
IT (1) IT1059170B (da)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2491615A1 (fr) * 1980-10-04 1982-04-09 Gast Theodor Procede de mesure optoelectronique et dispositifs pour la determination de la qualite de surfaces a reflexion diffuse
FR2508629A1 (fr) * 1981-06-25 1982-12-31 Riv Officine Di Villar Perosa Equipement de detection automatique de defauts sur la surface d'un roulement
FR2531776A1 (fr) * 1982-08-13 1984-02-17 Commissariat Energie Atomique Procede et dispositif de determination sans contact de la rugosite d'une surface
EP0303448A2 (en) * 1987-08-10 1989-02-15 Yoshida Kogyo K.K. Apparatus for inspecting slide fastener elements
EP0768526A1 (fr) * 1995-10-16 1997-04-16 Icbt Macotex Dispositif pour l'inspection et la détection automatique de défauts sur une bande en défilement, telle qu'une étoffe de textile

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5335567A (en) * 1976-09-13 1978-04-03 Shinetsu Chem Ind Co Apparatus for measuring thickness of semiconductor wafer
IL66788A (en) * 1982-09-14 1985-02-28 Optrotech Ltd Optical scanning apparatus using a wave guide
DE3337468A1 (de) * 1983-10-14 1985-04-25 Optische Werke G. Rodenstock, 8000 München Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen
DE4031633A1 (de) * 1990-10-05 1992-04-16 Sick Optik Elektronik Erwin Optische inspektionsvorrichtung

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2491615A1 (fr) * 1980-10-04 1982-04-09 Gast Theodor Procede de mesure optoelectronique et dispositifs pour la determination de la qualite de surfaces a reflexion diffuse
FR2508629A1 (fr) * 1981-06-25 1982-12-31 Riv Officine Di Villar Perosa Equipement de detection automatique de defauts sur la surface d'un roulement
FR2531776A1 (fr) * 1982-08-13 1984-02-17 Commissariat Energie Atomique Procede et dispositif de determination sans contact de la rugosite d'une surface
EP0101375A1 (fr) * 1982-08-13 1984-02-22 Commissariat à l'Energie Atomique Procédé et dispositif de détermination sans contact de la rugosité d'une surface
EP0303448A2 (en) * 1987-08-10 1989-02-15 Yoshida Kogyo K.K. Apparatus for inspecting slide fastener elements
EP0303448A3 (en) * 1987-08-10 1990-03-14 Yoshida Kogyo Co., Ltd. Apparatus for inspecting slide fastener elements
EP0768526A1 (fr) * 1995-10-16 1997-04-16 Icbt Macotex Dispositif pour l'inspection et la détection automatique de défauts sur une bande en défilement, telle qu'une étoffe de textile
FR2739879A1 (fr) * 1995-10-16 1997-04-18 Ictb Macotex Dispositif pour l'inspection et la detection automatique de defauts sur une bande en defilement, telle qu'une etoffe de textile
US5742398A (en) * 1995-10-16 1998-04-21 Icbt Macotex Device for the automatic detection and inspection of defects on a running web, such as a textile fabric

Also Published As

Publication number Publication date
DE2613978C3 (de) 1978-12-14
IT1059170B (it) 1982-05-31
DE2613978A1 (de) 1976-10-28
DE2613978B2 (de) 1977-06-30

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Legal Events

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