IT1059170B - Dispositivo per controllare la qualita superficiale di un ezzo - Google Patents

Dispositivo per controllare la qualita superficiale di un ezzo

Info

Publication number
IT1059170B
IT1059170B IT2240476A IT2240476A IT1059170B IT 1059170 B IT1059170 B IT 1059170B IT 2240476 A IT2240476 A IT 2240476A IT 2240476 A IT2240476 A IT 2240476A IT 1059170 B IT1059170 B IT 1059170B
Authority
IT
Italy
Prior art keywords
ezzo
check
surface quality
quality
Prior art date
Application number
IT2240476A
Other languages
English (en)
Original Assignee
Volpi Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Volpi Ag filed Critical Volpi Ag
Application granted granted Critical
Publication of IT1059170B publication Critical patent/IT1059170B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IT2240476A 1975-04-17 1976-04-16 Dispositivo per controllare la qualita superficiale di un ezzo IT1059170B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH489875A CH575592A5 (it) 1975-04-17 1975-04-17

Publications (1)

Publication Number Publication Date
IT1059170B true IT1059170B (it) 1982-05-31

Family

ID=4284455

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2240476A IT1059170B (it) 1975-04-17 1976-04-16 Dispositivo per controllare la qualita superficiale di un ezzo

Country Status (3)

Country Link
CH (1) CH575592A5 (it)
DE (1) DE2613978C3 (it)
IT (1) IT1059170B (it)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5335567A (en) * 1976-09-13 1978-04-03 Shinetsu Chem Ind Co Apparatus for measuring thickness of semiconductor wafer
DE3037622C2 (de) * 1980-10-04 1987-02-26 Theodor Prof. Dr.-Ing. 1000 Berlin Gast Einrichtung zur Bestimmung der Oberflächengüte
IT1145565B (it) * 1981-06-25 1986-11-05 Riv Officine Di Villar Perosa Apparecchiatura per il rilievo automatico di difetti sulla superficie di un cuscinetto
FR2531776A1 (fr) * 1982-08-13 1984-02-17 Commissariat Energie Atomique Procede et dispositif de determination sans contact de la rugosite d'une surface
IL66788A (en) * 1982-09-14 1985-02-28 Optrotech Ltd Optical scanning apparatus using a wave guide
DE3337468A1 (de) * 1983-10-14 1985-04-25 Optische Werke G. Rodenstock, 8000 München Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen
JPS6428110U (it) * 1987-08-10 1989-02-17
DE4031633A1 (de) * 1990-10-05 1992-04-16 Sick Optik Elektronik Erwin Optische inspektionsvorrichtung
FR2739879B1 (fr) * 1995-10-16 1997-11-21 Ictb Macotex Dispositif pour l'inspection et la detection automatique de defauts sur une bande en defilement, telle qu'une etoffe de textile

Also Published As

Publication number Publication date
DE2613978B2 (de) 1977-06-30
DE2613978C3 (de) 1978-12-14
DE2613978A1 (de) 1976-10-28
CH575592A5 (it) 1976-05-14

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