CH374494A - Structural X-ray goniometer for the direct measurement of lattice plane spacings enlarged by an integral factor - Google Patents

Structural X-ray goniometer for the direct measurement of lattice plane spacings enlarged by an integral factor

Info

Publication number
CH374494A
CH374494A CH7907459A CH7907459A CH374494A CH 374494 A CH374494 A CH 374494A CH 7907459 A CH7907459 A CH 7907459A CH 7907459 A CH7907459 A CH 7907459A CH 374494 A CH374494 A CH 374494A
Authority
CH
Switzerland
Prior art keywords
enlarged
structural
direct measurement
lattice plane
integral factor
Prior art date
Application number
CH7907459A
Other languages
German (de)
Inventor
Khol Rndr Frantisek
Original Assignee
Khol Rndr Frantisek
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Khol Rndr Frantisek filed Critical Khol Rndr Frantisek
Publication of CH374494A publication Critical patent/CH374494A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH7907459A 1958-10-07 1959-10-06 Structural X-ray goniometer for the direct measurement of lattice plane spacings enlarged by an integral factor CH374494A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS503158 1958-10-07

Publications (1)

Publication Number Publication Date
CH374494A true CH374494A (en) 1964-01-15

Family

ID=5394374

Family Applications (1)

Application Number Title Priority Date Filing Date
CH7907459A CH374494A (en) 1958-10-07 1959-10-06 Structural X-ray goniometer for the direct measurement of lattice plane spacings enlarged by an integral factor

Country Status (6)

Country Link
BE (1) BE583396A (en)
CH (1) CH374494A (en)
DE (1) DE1105194B (en)
FR (1) FR1239513A (en)
GB (1) GB894796A (en)
NL (1) NL244115A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1245164B (en) * 1964-05-23 1967-07-20 Chirana Praha Np Diffraction goniometers, in particular X-ray goniometers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1245164B (en) * 1964-05-23 1967-07-20 Chirana Praha Np Diffraction goniometers, in particular X-ray goniometers

Also Published As

Publication number Publication date
NL244115A (en)
FR1239513A (en) 1960-08-26
DE1105194B (en) 1961-04-20
BE583396A (en) 1960-02-01
GB894796A (en) 1962-04-26

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