CA974652A - Error correcting system and method for monolithic memories - Google Patents
Error correcting system and method for monolithic memoriesInfo
- Publication number
- CA974652A CA974652A CA144,163A CA144163A CA974652A CA 974652 A CA974652 A CA 974652A CA 144163 A CA144163 A CA 144163A CA 974652 A CA974652 A CA 974652A
- Authority
- CA
- Canada
- Prior art keywords
- error correcting
- correcting system
- monolithic memories
- monolithic
- memories
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0766—Error or fault reporting or storing
- G06F11/0772—Means for error signaling, e.g. using interrupts, exception flags, dedicated error registers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
- Debugging And Monitoring (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15232471A | 1971-06-11 | 1971-06-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
CA974652A true CA974652A (en) | 1975-09-16 |
Family
ID=22542442
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA144,163A Expired CA974652A (en) | 1971-06-11 | 1972-06-08 | Error correcting system and method for monolithic memories |
Country Status (7)
Country | Link |
---|---|
US (1) | US3735105A (de) |
JP (1) | JPS5128484B1 (de) |
CA (1) | CA974652A (de) |
DE (1) | DE2225841C3 (de) |
FR (1) | FR2141094A5 (de) |
GB (1) | GB1340283A (de) |
IT (1) | IT953759B (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3814922A (en) * | 1972-12-01 | 1974-06-04 | Honeywell Inf Systems | Availability and diagnostic apparatus for memory modules |
US3999051A (en) * | 1974-07-05 | 1976-12-21 | Sperry Rand Corporation | Error logging in semiconductor storage units |
US3906200A (en) * | 1974-07-05 | 1975-09-16 | Sperry Rand Corp | Error logging in semiconductor storage units |
US3958110A (en) * | 1974-12-18 | 1976-05-18 | Ibm Corporation | Logic array with testing circuitry |
US4371949A (en) * | 1977-05-31 | 1983-02-01 | Burroughs Corporation | Time-shared, multi-phase memory accessing system having automatically updatable error logging means |
IT1108375B (it) * | 1978-03-09 | 1985-12-09 | Cselt Centro Studi Lab Telecom | Memoria di massa allo stato solido con autocorrezione e organizzata a parole per un sistema di controllo a programma registrato |
IT1109655B (it) * | 1978-06-28 | 1985-12-23 | Cselt Centro Studi Lab Telecom | Memoria di massa allo stato solido organizzata a bit autocorrettiva e riconfigurabile per un sistema di controllo a programma registrato |
US4223382A (en) * | 1978-11-30 | 1980-09-16 | Sperry Corporation | Closed loop error correct |
JPS598852B2 (ja) * | 1979-07-30 | 1984-02-28 | 富士通株式会社 | エラ−処理方式 |
US4317201A (en) * | 1980-04-01 | 1982-02-23 | Honeywell, Inc. | Error detecting and correcting RAM assembly |
US4335459A (en) * | 1980-05-20 | 1982-06-15 | Miller Richard L | Single chip random access memory with increased yield and reliability |
US4359771A (en) * | 1980-07-25 | 1982-11-16 | Honeywell Information Systems Inc. | Method and apparatus for testing and verifying the operation of error control apparatus within a memory |
US4488300A (en) * | 1982-12-01 | 1984-12-11 | The Singer Company | Method of checking the integrity of a source of additional memory for use in an electronically controlled sewing machine |
US4532628A (en) * | 1983-02-28 | 1985-07-30 | The Perkin-Elmer Corporation | System for periodically reading all memory locations to detect errors |
CA1258134A (en) * | 1985-04-13 | 1989-08-01 | Yoichiro Sako | Error correction method |
EP0211358A1 (de) * | 1985-07-29 | 1987-02-25 | Siemens Nixdorf Informationssysteme Aktiengesellschaft | Verfahren zur Überwachung von Halbleiterspeichern mit Einrichtungen zur Sicherung gespeicherter Daten und nach diesem Verfahren arbeitende Speichersteuereinrichtungen für Halbleiterspeicher |
US5495491A (en) * | 1993-03-05 | 1996-02-27 | Motorola, Inc. | System using a memory controller controlling an error correction means to detect and correct memory errors when and over a time interval indicated by registers in the memory controller |
EP0643351A1 (de) * | 1993-08-11 | 1995-03-15 | Siemens Nixdorf Informationssysteme Aktiengesellschaft | Verfahren zur Erhöhung der Fehlerfreiheit von in Mikroprogrammspeichern einer Datenverarbeitungsanlage gespeicherten Mikrobefehlen und entsprechend arbeitende Mikroprogrammsteuerung |
GB2289779B (en) * | 1994-05-24 | 1999-04-28 | Intel Corp | Method and apparatus for automatically scrubbing ECC errors in memory via hardware |
US5535226A (en) * | 1994-05-31 | 1996-07-09 | International Business Machines Corporation | On-chip ECC status |
US5987628A (en) * | 1997-11-26 | 1999-11-16 | Intel Corporation | Method and apparatus for automatically correcting errors detected in a memory subsystem |
US7590918B2 (en) * | 2004-09-10 | 2009-09-15 | Ovonyx, Inc. | Using a phase change memory as a high volume memory |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3222653A (en) * | 1961-09-18 | 1965-12-07 | Ibm | Memory system for using a memory despite the presence of defective bits therein |
US3353669A (en) * | 1965-06-30 | 1967-11-21 | Ibm | Electrical component tester with duplexed handlers |
US3492572A (en) * | 1966-10-10 | 1970-01-27 | Ibm | Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits |
US3549582A (en) * | 1967-10-11 | 1970-12-22 | Dexter Corp | Epoxy resin powders of enhanced shelf stability with a trimellitic anhydride dimer as curing agent |
US3631229A (en) * | 1970-09-30 | 1971-12-28 | Ibm | Monolithic memory array tester |
-
1971
- 1971-06-11 US US00152324A patent/US3735105A/en not_active Expired - Lifetime
-
1972
- 1972-04-26 IT IT23520/72A patent/IT953759B/it active
- 1972-05-24 FR FR7219229A patent/FR2141094A5/fr not_active Expired
- 1972-05-25 GB GB2456072A patent/GB1340283A/en not_active Expired
- 1972-05-27 DE DE2225841A patent/DE2225841C3/de not_active Expired
- 1972-06-08 CA CA144,163A patent/CA974652A/en not_active Expired
- 1972-06-08 JP JP47056518A patent/JPS5128484B1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
FR2141094A5 (de) | 1973-01-19 |
US3735105A (en) | 1973-05-22 |
IT953759B (it) | 1973-08-10 |
GB1340283A (en) | 1973-12-12 |
DE2225841B2 (de) | 1979-10-04 |
DE2225841A1 (de) | 1973-01-04 |
DE2225841C3 (de) | 1980-06-26 |
JPS5128484B1 (de) | 1976-08-19 |
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