CA946985A - Adjusting device for a particle beam - Google Patents

Adjusting device for a particle beam

Info

Publication number
CA946985A
CA946985A CA121,181A CA121181A CA946985A CA 946985 A CA946985 A CA 946985A CA 121181 A CA121181 A CA 121181A CA 946985 A CA946985 A CA 946985A
Authority
CA
Canada
Prior art keywords
adjusting device
particle beam
particle
adjusting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA121,181A
Other versions
CA121181S (en
Inventor
Wilhelmus Kuijpers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of CA946985A publication Critical patent/CA946985A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1471—Arrangements for directing or deflecting the discharge along a desired path for centering, aligning or positioning of ray or beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Beam Exposure (AREA)
CA121,181A 1970-08-27 1971-08-24 Adjusting device for a particle beam Expired CA946985A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7012671A NL7012671A (en) 1970-08-27 1970-08-27

Publications (1)

Publication Number Publication Date
CA946985A true CA946985A (en) 1974-05-07

Family

ID=19810865

Family Applications (1)

Application Number Title Priority Date Filing Date
CA121,181A Expired CA946985A (en) 1970-08-27 1971-08-24 Adjusting device for a particle beam

Country Status (6)

Country Link
US (1) US3777211A (en)
CA (1) CA946985A (en)
DE (1) DE2138766A1 (en)
FR (1) FR2106022A5 (en)
GB (1) GB1367940A (en)
NL (1) NL7012671A (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4376249A (en) * 1980-11-06 1983-03-08 International Business Machines Corporation Variable axis electron beam projection system
DE3138896A1 (en) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München ELECTRONIC OPTICAL SYSTEM WITH VARIO SHAPED BEAM FOR THE GENERATION AND MEASUREMENT OF MICROSTRUCTURES
US5949076A (en) * 1996-02-26 1999-09-07 Kabushiki Kaisha Toshiba Charged beam applying apparatus
WO2002103337A2 (en) * 2001-06-15 2002-12-27 Ebara Corporation Electron beam apparatus and method for using said apparatus
EP1401007B1 (en) * 2002-09-18 2005-06-15 Staib Instrumente GmbH An electron diffraction system for use in production environment and for high pressure deposition techniques
US9159527B2 (en) 2003-10-16 2015-10-13 Carl Zeiss Microscopy, Llc Systems and methods for a gas field ionization source
US7786452B2 (en) 2003-10-16 2010-08-31 Alis Corporation Ion sources, systems and methods
US8110814B2 (en) 2003-10-16 2012-02-07 Alis Corporation Ion sources, systems and methods
US7786451B2 (en) 2003-10-16 2010-08-31 Alis Corporation Ion sources, systems and methods
US7804068B2 (en) 2006-11-15 2010-09-28 Alis Corporation Determining dopant information
EP2342734A2 (en) * 2008-09-30 2011-07-13 Carl Zeiss NTS, LLC. Aligning charged particle beams
CN102612719B (en) * 2009-11-10 2014-02-19 三菱电机株式会社 Particle beam radiation system and particle beam radiation method
JP5364112B2 (en) 2011-01-25 2013-12-11 株式会社日立ハイテクノロジーズ Charged particle beam equipment
FR3123597B1 (en) 2021-06-08 2023-04-21 Psa Automobiles Sa COMPACT SUB-ASSEMBLY FOR MOTOR VEHICLE ELECTROMOTOR GROUP

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2418349A (en) * 1945-12-13 1947-04-01 Rca Corp Method of and means for correcting for distortion in electron lens systems
GB687207A (en) * 1950-02-23 1953-02-11 Vickers Electrical Co Ltd Improvements relating to electron microscopes
US3371206A (en) * 1964-02-04 1968-02-27 Jeol Ltd Electron beam apparatus having compensating means for triangular beam distortion
DE1299088C2 (en) * 1966-06-10 1974-10-17 Siemens AG, Berlin und München, 8000 München DEFLECTION DEVICE FOR THE BODY BEAM IN A BODY BEAM DEVICE, IN PARTICULAR ELECTRON MICROSCOPE
US3588586A (en) * 1968-04-26 1971-06-28 Jeol Ltd Apparatus for correcting electron beam deflection

Also Published As

Publication number Publication date
FR2106022A5 (en) 1972-04-28
US3777211A (en) 1973-12-04
DE2138766A1 (en) 1972-03-02
NL7012671A (en) 1972-02-29
GB1367940A (en) 1974-09-25

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