CA2540584C - Electrode for mass spectrometry - Google Patents
Electrode for mass spectrometry Download PDFInfo
- Publication number
- CA2540584C CA2540584C CA2540584A CA2540584A CA2540584C CA 2540584 C CA2540584 C CA 2540584C CA 2540584 A CA2540584 A CA 2540584A CA 2540584 A CA2540584 A CA 2540584A CA 2540584 C CA2540584 C CA 2540584C
- Authority
- CA
- Canada
- Prior art keywords
- electrode
- projections
- surface portion
- rod
- cavities
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004949 mass spectrometry Methods 0.000 title description 2
- 230000008021 deposition Effects 0.000 claims abstract description 16
- 230000005684 electric field Effects 0.000 claims abstract description 14
- 239000002245 particle Substances 0.000 claims abstract description 14
- 239000000126 substance Substances 0.000 claims abstract description 12
- 230000001788 irregular Effects 0.000 claims abstract description 3
- 150000002500 ions Chemical class 0.000 claims description 27
- 238000000151 deposition Methods 0.000 description 12
- 230000000694 effects Effects 0.000 description 8
- 238000009825 accumulation Methods 0.000 description 5
- 239000000356 contaminant Substances 0.000 description 5
- 238000010884 ion-beam technique Methods 0.000 description 5
- 238000011010 flushing procedure Methods 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 238000009616 inductively coupled plasma Methods 0.000 description 4
- 229930195733 hydrocarbon Natural products 0.000 description 3
- 150000002430 hydrocarbons Chemical class 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000005405 multipole Effects 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 238000005488 sandblasting Methods 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000000538 analytical sample Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 230000005686 electrostatic field Effects 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 230000005226 mechanical processes and functions Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2003905485A AU2003905485A0 (en) | 2003-10-08 | Electrode for mass spectrometry | |
| AU2003905485 | 2003-10-08 | ||
| PCT/AU2004/001357 WO2005034169A1 (en) | 2003-10-08 | 2004-10-06 | Electrode for mass spectrometry |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2540584A1 CA2540584A1 (en) | 2005-04-14 |
| CA2540584C true CA2540584C (en) | 2012-04-03 |
Family
ID=34397670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2540584A Expired - Lifetime CA2540584C (en) | 2003-10-08 | 2004-10-06 | Electrode for mass spectrometry |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7351962B2 (enExample) |
| EP (1) | EP1671348B1 (enExample) |
| JP (1) | JP4907348B2 (enExample) |
| CA (1) | CA2540584C (enExample) |
| WO (1) | WO2005034169A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1930937A4 (en) * | 2005-08-30 | 2010-10-06 | Fang Xiang | ION TRAP, MULTIPLE ELECTRODE POLSYSTEM AND ELECTRODE POLAR FOR MASS SPECTROMETRIC ANALYSIS |
| DE102006016259B4 (de) * | 2006-04-06 | 2010-11-04 | Bruker Daltonik Gmbh | HF-Multipol-Ionenleitsysteme für weiten Massenbereich |
| JP2009152088A (ja) * | 2007-12-21 | 2009-07-09 | Jeol Ltd | 荷電粒子の輸送・貯蔵機構 |
| US20100276063A1 (en) * | 2009-05-02 | 2010-11-04 | Henry Hoang Xuan Bui | Methods of manufacturing quadrupole mass filters |
| GB201509243D0 (en) | 2015-05-29 | 2015-07-15 | Micromass Ltd | Mass filter having extended operational lifetime |
| GB2630318B (en) | 2023-05-23 | 2025-07-23 | Thermo Fisher Scient Bremen Gmbh | Method of operating a multipole device |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3793063A (en) * | 1971-02-22 | 1974-02-19 | Bendix Corp | Method of making electrodes for quadrupole type mass spectrometers |
| GB2099216B (en) * | 1981-05-22 | 1985-05-15 | Vg Gas Analysis Ltd | Method and coating for enhancing performance of mass spectrometers |
| JPS63271858A (ja) * | 1987-04-28 | 1988-11-09 | Hitachi Ltd | 多重電極レンズ系構造 |
| JPH038857A (ja) * | 1989-06-02 | 1991-01-16 | Asahi Shiyueebell Kk | 無機繊維不織布 |
| US5229605A (en) * | 1990-01-05 | 1993-07-20 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Process for the elementary analysis of a specimen by high frequency inductively coupled plasma mass spectrometry and apparatus for carrying out this process |
| JPH07254384A (ja) * | 1994-03-16 | 1995-10-03 | Mitsubishi Electric Corp | 電子ビーム加工装置 |
| US5525084A (en) * | 1994-03-25 | 1996-06-11 | Hewlett Packard Company | Universal quadrupole and method of manufacture |
| JPH10188882A (ja) * | 1996-12-20 | 1998-07-21 | Shimadzu Corp | 四重極質量分析装置 |
| US6180954B1 (en) * | 1997-05-22 | 2001-01-30 | Eaton Corporation | Dual-walled exhaust tubing for vacuum pump |
| GB2391694B (en) * | 2002-08-01 | 2006-03-01 | Microsaic Systems Ltd | Monolithic micro-engineered mass spectrometer |
-
2004
- 2004-10-06 JP JP2006529459A patent/JP4907348B2/ja not_active Expired - Fee Related
- 2004-10-06 EP EP04761392A patent/EP1671348B1/en not_active Expired - Lifetime
- 2004-10-06 WO PCT/AU2004/001357 patent/WO2005034169A1/en not_active Ceased
- 2004-10-06 CA CA2540584A patent/CA2540584C/en not_active Expired - Lifetime
- 2004-10-06 US US10/574,569 patent/US7351962B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005034169A1 (en) | 2005-04-14 |
| EP1671348A4 (en) | 2008-01-30 |
| EP1671348B1 (en) | 2012-09-12 |
| US20070063137A1 (en) | 2007-03-22 |
| JP2007507835A (ja) | 2007-03-29 |
| CA2540584A1 (en) | 2005-04-14 |
| JP4907348B2 (ja) | 2012-03-28 |
| US7351962B2 (en) | 2008-04-01 |
| EP1671348A1 (en) | 2006-06-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |