CA2430527C - Mass spectrometer - Google Patents
Mass spectrometer Download PDFInfo
- Publication number
- CA2430527C CA2430527C CA2430527A CA2430527A CA2430527C CA 2430527 C CA2430527 C CA 2430527C CA 2430527 A CA2430527 A CA 2430527A CA 2430527 A CA2430527 A CA 2430527A CA 2430527 C CA2430527 C CA 2430527C
- Authority
- CA
- Canada
- Prior art keywords
- mass spectrometer
- transient
- ions
- electrodes
- fragmentation device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
- H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0212511A GB0212511D0 (en) | 2002-05-30 | 2002-05-30 | Mass spectrometer |
GB0212511.0 | 2002-05-30 | ||
GB0308346A GB0308346D0 (en) | 2002-05-30 | 2003-04-11 | Mass spectrometer |
GB0308346.6 | 2003-04-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2430527A1 CA2430527A1 (en) | 2003-11-30 |
CA2430527C true CA2430527C (en) | 2012-03-27 |
Family
ID=26247076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2430527A Expired - Lifetime CA2430527C (en) | 2002-05-30 | 2003-05-30 | Mass spectrometer |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1367632B1 (de) |
AT (1) | ATE372587T1 (de) |
CA (1) | CA2430527C (de) |
DE (1) | DE60316070T2 (de) |
GB (1) | GB2391698B (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050242281A1 (en) * | 2004-04-30 | 2005-11-03 | Gangqiang Li | Unevenly segmented multipole |
GB0426900D0 (en) * | 2004-12-08 | 2005-01-12 | Micromass Ltd | Mass spectrometer |
US7312442B2 (en) * | 2005-09-13 | 2007-12-25 | Agilent Technologies, Inc | Enhanced gradient multipole collision cell for higher duty cycle |
DE102005044307B4 (de) | 2005-09-16 | 2008-04-17 | Bruker Daltonik Gmbh | Ionisierung desorbierter Moleküle |
GB0723183D0 (en) * | 2007-11-23 | 2008-01-09 | Micromass Ltd | Mass spectrometer |
JP5201220B2 (ja) * | 2009-02-05 | 2013-06-05 | 株式会社島津製作所 | Ms/ms型質量分析装置 |
GB201104665D0 (en) * | 2011-03-18 | 2011-05-04 | Shimadzu Res Lab Europe Ltd | Ion analysis apparatus and methods |
GB201111568D0 (en) * | 2011-07-06 | 2011-08-24 | Micromass Ltd | Apparatus and method of mass spectrometry |
GB201504817D0 (en) * | 2015-03-23 | 2015-05-06 | Micromass Ltd | Pre-filter fragmentation |
US11600480B2 (en) | 2020-09-22 | 2023-03-07 | Thermo Finnigan Llc | Methods and apparatus for ion transfer by ion bunching |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5206506A (en) * | 1991-02-12 | 1993-04-27 | Kirchner Nicholas J | Ion processing: control and analysis |
WO1994001883A1 (en) * | 1992-07-01 | 1994-01-20 | United States Department Of Energy | A method for discriminative particle separation |
JPH11510946A (ja) * | 1995-08-11 | 1999-09-21 | エムディーエス ヘルス グループ リミテッド | 軸電界を有する分光計 |
GB2341270A (en) * | 1998-09-02 | 2000-03-08 | Shimadzu Corp | Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes |
CA2391140C (en) * | 2001-06-25 | 2008-10-07 | Micromass Limited | Mass spectrometer |
CA2391148C (en) * | 2001-06-25 | 2008-02-19 | Micromass Limited | Mass spectrometer |
-
2003
- 2003-05-30 CA CA2430527A patent/CA2430527C/en not_active Expired - Lifetime
- 2003-05-30 AT AT03253411T patent/ATE372587T1/de not_active IP Right Cessation
- 2003-05-30 DE DE60316070T patent/DE60316070T2/de not_active Expired - Lifetime
- 2003-05-30 EP EP03253411A patent/EP1367632B1/de not_active Expired - Lifetime
- 2003-05-30 GB GB0312482A patent/GB2391698B/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE60316070T2 (de) | 2008-06-05 |
GB2391698A (en) | 2004-02-11 |
GB0312482D0 (en) | 2003-07-09 |
EP1367632A3 (de) | 2004-09-29 |
EP1367632B1 (de) | 2007-09-05 |
DE60316070D1 (de) | 2007-10-18 |
CA2430527A1 (en) | 2003-11-30 |
ATE372587T1 (de) | 2007-09-15 |
GB2391698B (en) | 2004-07-21 |
EP1367632A2 (de) | 2003-12-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20230530 |