CA2417790A1 - Measuring response characteristics of an optical component - Google Patents
Measuring response characteristics of an optical component Download PDFInfo
- Publication number
- CA2417790A1 CA2417790A1 CA 2417790 CA2417790A CA2417790A1 CA 2417790 A1 CA2417790 A1 CA 2417790A1 CA 2417790 CA2417790 CA 2417790 CA 2417790 A CA2417790 A CA 2417790A CA 2417790 A1 CA2417790 A1 CA 2417790A1
- Authority
- CA
- Canada
- Prior art keywords
- signal
- modulated
- wavelength
- information
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
A system for determining response characteristics, insertion loss and group delay, of an optical component by applying a sweeping wavelength optical signal that is modulated with an RF signal, measuring the insertion loss and group delay at a series of wavelengths and correlating the measurements to wavelengths. A method for synthesis of an effective modulation frequency in determining the group delay response characteristics of an optical component by obtaining a series of measurements over a sample optical spectrum using, a given modulation frequency and calculating a weighted average of the group delays in the series of measurements giving a result substantially equivalent to a measurement taken using a modulation frequency equal to the effective modulation frequency.
Claims (24)
1. An apparatus for testing an optical component comprising;
a tunable laser for providing a tunable laser signal having a wavelength that varies with time;
a first modulator for modulating the tunable laser signal producing a modulated laser signal defined by a frequency;
an information signal generator for generating an information signal having an indicator that varies with the variations in wavelength of the tunable laser signal;
a test station for receiving the modulated laser signal, and for testing the optical component therewith, providing a plurality of test information samples including an initial and a final phase measurement of the modulated laser signal taken before and after passing through the optical component, respectively, to calculate group delay measurements at various times and corresponding wavelengths;
a correlator for correlating the plurality of test information samples with the information signal to determine the wavelength corresponding to each test information sample independent of the specific optical component.
a tunable laser for providing a tunable laser signal having a wavelength that varies with time;
a first modulator for modulating the tunable laser signal producing a modulated laser signal defined by a frequency;
an information signal generator for generating an information signal having an indicator that varies with the variations in wavelength of the tunable laser signal;
a test station for receiving the modulated laser signal, and for testing the optical component therewith, providing a plurality of test information samples including an initial and a final phase measurement of the modulated laser signal taken before and after passing through the optical component, respectively, to calculate group delay measurements at various times and corresponding wavelengths;
a correlator for correlating the plurality of test information samples with the information signal to determine the wavelength corresponding to each test information sample independent of the specific optical component.
2. The apparatus according to claim 1, further comprising a polarization controller for controlling a polarization of the modulated laser signal.
3. The apparatus according to claim 2, wherein the wavelength of the tunable laser signal increases or decreases between a first wavelength and a second wavelength defining a sweep; and wherein the polarization controller changes the polarization of the modulated laser signal after successive sweeps; whereby the group delay measurements at each polarization are used to calculate a differential group delay.
4. The apparatus according to claim 1, wherein a first portion of the tunable laser signal is tapped therefrom for use by the information signal generator in generating the information signal.
5.The apparatus according to claim 1, wherein the information signal generator comprises:
interferometer means for providing the information signal a periodic response with a predetermined free spectral range indicative of incremental wavelength and timing information; and a marker for providing an indication of when the tunable laser signal is at a predetermined wavelength.
interferometer means for providing the information signal a periodic response with a predetermined free spectral range indicative of incremental wavelength and timing information; and a marker for providing an indication of when the tunable laser signal is at a predetermined wavelength.
6. The apparatus according to claim 5, wherein the information signal generator further comprises a second modulator for generating a modulated information signal indicative of an incremental increase in time and wavelength of the tunable laser signal;
wherein the modulated information signal comprises an optical signal having a wavelength outside the wavelengths of the tunable laser signal; and wherein a WDM filter combines the modulated information signal with the modulated laser signal for transmission to the test station.
wherein the modulated information signal comprises an optical signal having a wavelength outside the wavelengths of the tunable laser signal; and wherein a WDM filter combines the modulated information signal with the modulated laser signal for transmission to the test station.
7. The apparatus according to claim 6, further comprising:
a first sputter for splitting the modulated information signal combined with the modulated laser signal into at least two portions;
at least one additional test station, each additional test station for receiving one of the portions of the modulated information signal combined with modulated laser signal, and for testing additional optical components.
a first sputter for splitting the modulated information signal combined with the modulated laser signal into at least two portions;
at least one additional test station, each additional test station for receiving one of the portions of the modulated information signal combined with modulated laser signal, and for testing additional optical components.
8. The apparatus according to claim 1, wherein the test station includes a phase detector for determining the group delay based on the initial and final phase measurements, and the frequency of the modulated laser signal.
9. The apparatus according to claim 8, wherein the phase detector determines an average group delay over a series of successive test information samples based on an effective frequency of the modulated laser signal; wherein the effective frequency is a multiple of the frequency of the modulated laser signal.
10. The apparatus according to claim 9, wherein the information signal is a periodic information signal defined by a frequency, the periodic information signal indicative of an incremental change in time and wavelength of the tunable laser signal; wherein the test station obtains a test information sample after each incremental change; wherein the phase detector determines an average group delay over an odd number of successive test information samples; and wherein the effective frequency is an integer multiple of the frequency of the modulated laser signal, whereby the initial and final phase measurements of the successive test information samples cancel each other out, except a first initial phase measurement and a last final phase measurement used to calculate the average group delay.
11. The apparatus according to claim 9, wherein the information signal is a periodic information signal defined by a frequency, the periodic information signal indicative of an incremental change in time and wavelength of the tunable laser signal; wherein the test station obtains a test information sample after each incremental change; wherein the phase detector determines an average group delay over any number of successive test information samples; and wherein the effective frequency is a multiple of the frequency of the modulated laser signal, whereby a first initial phase measurement and a last final phase measurement used to calculate the average group delay are calculated using linear interpolation techniques.
12. The apparatus according to claim 3, wherein the test station includes:
a tap for separating a first portion of the modulated laser signal from a remainder of the modulated laser signal before entry into the optical component;
a first detector for receiving the first portion, and providing a preliminary power intensity reading;
a second detector for receiving at least a portion of the remainder of the modulated laser signal after passage through the optical component, and for providing a final power intensity reading; and wherein an insertion loss measurement for each wavelength is determined from the preliminary and final power intensity readings.
a tap for separating a first portion of the modulated laser signal from a remainder of the modulated laser signal before entry into the optical component;
a first detector for receiving the first portion, and providing a preliminary power intensity reading;
a second detector for receiving at least a portion of the remainder of the modulated laser signal after passage through the optical component, and for providing a final power intensity reading; and wherein an insertion loss measurement for each wavelength is determined from the preliminary and final power intensity readings.
13. The apparatus according to claim 12, wherein the polarization controller changes the polarization of the modulated laser signal after successive sweeps; whereby the insertion loss measurements at each polarization are used to calculate a polarization dependent loss.
14. A method for testing an optical component, comprising the steps of:
a) providing a first optical signal that varies in wavelength over time;
b) generating a second signal that has an indication therein related to variations in wavelength and time of the first optical signal;
c) modulating the first optical signal providing a modulated optical signal defined by a frequency;
d) testing the optical component with at least a portion of the modulated optical signal to acquire test information comprising initial and final phase measurements for calculating group delay measurements at a plurality of wavelengths;
e) deriving wavelength information relating to the first optical signal, or a signal derived therefrom, from the second signal; and f) correlating the acquired test information with the derived wavelength information to match the test information with a corresponding wavelength independent of the optical component.
a) providing a first optical signal that varies in wavelength over time;
b) generating a second signal that has an indication therein related to variations in wavelength and time of the first optical signal;
c) modulating the first optical signal providing a modulated optical signal defined by a frequency;
d) testing the optical component with at least a portion of the modulated optical signal to acquire test information comprising initial and final phase measurements for calculating group delay measurements at a plurality of wavelengths;
e) deriving wavelength information relating to the first optical signal, or a signal derived therefrom, from the second signal; and f) correlating the acquired test information with the derived wavelength information to match the test information with a corresponding wavelength independent of the optical component.
15. The method according to claim 14, wherein step b) includes:
tapping a first portion of the first optical signal;
providing the first portion to an interferometric device, with a predetermined free spectral range, for generating a periodic response;
tapping a second portion of the first optical signal;
providing the second portion to a marker for providing an indication of when the first optical signal has a predetermined wavelength.
tapping a first portion of the first optical signal;
providing the first portion to an interferometric device, with a predetermined free spectral range, for generating a periodic response;
tapping a second portion of the first optical signal;
providing the second portion to a marker for providing an indication of when the first optical signal has a predetermined wavelength.
16. The method according to claim 15, wherein step b) further comprises generating a pulsed modulation signal from the first portion indicative of an incremental increase in time and wavelength of the first optical signal; and wherein step d) includes acquiring test information corresponding to each pulse in the pulsed modulation signal.
17. The method according to claim 16, wherein step d) also includes:
tapping a first portion of the modulated optical signal;
determining an initial phase of the modulated optical signal from the first portion of the modulated optical signal; and determining a final phase of the modulated optical signal from the modulated optical signal after passing through the optical component.
tapping a first portion of the modulated optical signal;
determining an initial phase of the modulated optical signal from the first portion of the modulated optical signal; and determining a final phase of the modulated optical signal from the modulated optical signal after passing through the optical component.
18. The method according to claim 17, wherein the wavelength of the tunable laser signal increases or decreases between a first wavelength and a second wavelength defining a sweep; and wherein step d) includes changing the polarization of the modulated laser signal after successive sweeps; whereby the group delay measurements at each polarization are used to calculate a differential group delay.
19. The method according to claim 18, wherein step d) also includes:
tapping a second portion of the modulated optical signal;
measuring an intensity of the second portion of the modulated optical signal;
measuring an intensity of the modulated optical signal after passing through the optical component;
and calculating insertion loss based on the intensity of the second portion and the intensity of the modulated optical signal after passing through the optical component at the plurality of wavelengths.
tapping a second portion of the modulated optical signal;
measuring an intensity of the second portion of the modulated optical signal;
measuring an intensity of the modulated optical signal after passing through the optical component;
and calculating insertion loss based on the intensity of the second portion and the intensity of the modulated optical signal after passing through the optical component at the plurality of wavelengths.
20. The method according to claim 19, wherein wherein step d) also includes changing the polarization of the modulated optical signal after successive sweeps; whereby the insertion loss measurements at each polarization are used to calculate a polarization dependent loss for each wavelength.
21. The method according to claim 14, wherein step d) includes determining the group delay at each wavelength based on the initial and final phase measurements, and the frequency of the modulated optical signal.
22. The method according to claim 21, wherein step d) includes determining an average group delay over a series of successive test information samples based on an effective frequency of the modulated optical signal; wherein the effective frequency is a multiple of the frequency of the modulated optical signal.
23. The method according to claim 22, wherein the second signal is a periodic information signal defined by a frequency, the periodic information signal indicative of an incremental change in time and wavelength of the first optical signal; wherein step d) includes obtaining a test information sample after each incremental change; wherein step d) includes determining an average group delay over an odd number of successive test information samples; and wherein the effective frequency is an integer multiple of the frequency of the modulated optical signal, whereby the initial and final phase measurements of the successive test information samples cancel each other out, except a first initial phase measurement and a last final phase measurement.
24. The apparatus according to claim 22, wherein the information signal is a periodic information signal defined by a frequency, the periodic information signal indicative of an incremental change in time and wavelength of the first optical signal; wherein step d) includes obtaining a test information sample after each incremental change; wherein step d) includes determining an average group delay over any number of successive test information samples; and wherein the effective frequency is a multiple of the frequency of the modulated optical signal, whereby a first initial phase measurement and a last final please measurement are calculated using linear interpolation techniques on the obtained test information samples.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US33580902P | 2002-02-13 | 2002-02-13 | |
| US60/335,809 | 2002-02-13 | ||
| US10/081,230 | 2002-02-25 | ||
| US10/081,230 US6552782B2 (en) | 1997-02-14 | 2002-02-25 | Apparatus and method for generation of optical signals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2417790A1 true CA2417790A1 (en) | 2003-08-13 |
| CA2417790C CA2417790C (en) | 2010-03-23 |
Family
ID=27791161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2417790 Expired - Fee Related CA2417790C (en) | 2002-02-13 | 2003-01-30 | Measuring response characteristics of an optical component |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA2417790C (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9791346B1 (en) | 2016-04-20 | 2017-10-17 | Stmicroelectronics Sa | Semiconductor device and wafer with reference circuit and related methods |
| US10921370B2 (en) | 2018-02-13 | 2021-02-16 | Stmicroelectronics (Crolles 2) Sas | Optoelectronic chip and method for testing photonic circuits of such chip |
| US11555852B2 (en) | 2018-02-13 | 2023-01-17 | Stmicroelectronics (Crolles 2) Sas | Optoelectronic chip and method for testing photonic circuits of such chip |
-
2003
- 2003-01-30 CA CA 2417790 patent/CA2417790C/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9791346B1 (en) | 2016-04-20 | 2017-10-17 | Stmicroelectronics Sa | Semiconductor device and wafer with reference circuit and related methods |
| US10274395B2 (en) | 2016-04-20 | 2019-04-30 | Stmicroelectronics Sa | Semiconductor device and wafer with reference circuit and related methods |
| US10677684B2 (en) | 2016-04-20 | 2020-06-09 | Stmicroelectronics (Crolles 2) Sas | Opto electrical test measurement system for integrated photonic devices and circuits |
| US11187613B2 (en) | 2016-04-20 | 2021-11-30 | Stmicroelectronics (Crolles 2) Sas | Opto electrical test measurement system for integrated photonic devices and circuits |
| US11680870B2 (en) | 2016-04-20 | 2023-06-20 | Stmicroelectronics (Crolles 2) Sas | Opto electrical test measurement system for integrated photonic devices and circuits |
| US10921370B2 (en) | 2018-02-13 | 2021-02-16 | Stmicroelectronics (Crolles 2) Sas | Optoelectronic chip and method for testing photonic circuits of such chip |
| US11555852B2 (en) | 2018-02-13 | 2023-01-17 | Stmicroelectronics (Crolles 2) Sas | Optoelectronic chip and method for testing photonic circuits of such chip |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2417790C (en) | 2010-03-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2229298C (en) | Apparatus and method for generation of optical signals | |
| CN102047092B (en) | Beam path monitoring device, and beam path monitoring system | |
| EP1506373B1 (en) | Fibre-optic interferometric remote sensor | |
| EP1191321A1 (en) | Determination of properties of an optical device | |
| CN110646805B (en) | Frequency modulation continuous wave laser ranging system based on virtual sweep frequency light source | |
| JP2007024881A (en) | Light reflection measuring analysis for adjusting time of partial response | |
| EP2631627A1 (en) | Wavelength dispersion measuring device and wavelength dispersion measuring method using same | |
| JPH04215B2 (en) | ||
| US6614512B1 (en) | System for measuring wavelength dispersion of optical fiber | |
| US6940588B2 (en) | Measuring response characteristics of an optical component | |
| CN109612601B (en) | Power equipment temperature and partial discharge integrated detection system and method | |
| US6552782B2 (en) | Apparatus and method for generation of optical signals | |
| CA2417790A1 (en) | Measuring response characteristics of an optical component | |
| JP5613627B2 (en) | Laser optical coherence function measuring method and measuring apparatus | |
| EP4386371A2 (en) | Optical fiber distribution measurement system and signal processing method for optical fiber distribution measurement | |
| JPH0354292B2 (en) | ||
| WO2023058160A1 (en) | Rayleigh intensity pattern measurement device and rayleigh intensity pattern measurement method | |
| CN115290176A (en) | Quasi-distributed vibration sensing system and method based on low-coherence light source | |
| TW201024692A (en) | Apparatus and method for monitoring extinction ratio of optical signals | |
| CN111257283B (en) | Refractive index sensing measurement device and method | |
| EP1367376A1 (en) | Method and apparatus for measuring chromatic dispersion | |
| Götten et al. | Detection limits of optical autocorrelations with a CDM interrogator for overlapping FBG spectra | |
| JPH04248434A (en) | Remote tester of optical line | |
| JPH07103828A (en) | Estimation unit for variable frequency characteristics | |
| RU2672794C1 (en) | Physical effects distributed control method and device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20170130 |